GB/T 18032-2000 in English
VALIDThe inspecting method of AB microscopic defect in gallium arsenide single crystal
- Issued on:2000-04-03
- Implemented on:2000-09-01
- File Format:PDF
- Delivery:Via email within 1~3 business days
$88.00
《GB/T 18032-2000砷化镓单晶AB微缺陷检验方法》由TC203(全国半导体设备和材料标准化技术委员会)归口,主管部门为国家标准化管理委员会。
本标准规定了砷化镓单晶AB微缺陷的检验方法。
本标准适用于砷化镓单晶AB微缺陷密度的检验。
Scope
This standard specifies the inspection method for gallium arsenide single crystal AB micro-defects. This standard applies to the inspection of GaAs single crystal AB micro-defect density (AB-EPD). The inspection surface is (100) surface. Measuring range is less than 5 X 10

Loading PDF document...
Error loading PDF. Please make sure the file is valid and try again.
We also recommend
-

GB/T 18876.1-2024 in English
Standard practice for determining the metallographical constituent and inclusion content of steels and other metals by automatic image analysis—Part 1: Determining the inclusion or second-phase constituent content of steels and other metals by automatic image analysis and stereology
2024-08-23