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Database: 365,228(8 Aug 2026)
gallium arsenide single crystal scopethis standard single crystal ab single crystal ab micro-defects inspection method technical compounds screen seed traditional materials new building materialsmaterials
GB/T 18032-2000 in English

GB/T 18032-2000 in English

VALID

The inspecting method of AB microscopic defect in gallium arsenide single crystal

  • Issued on:2000-04-03
  • Implemented on:2000-09-01
  • File Format:PDF
  • Delivery:Via email within 1~3 business days
Price(USD): $90.00
$88.00
Standard No: GB/T 18032-2000
Document status: VALID
Title in English: The inspecting method of AB microscopic defect in gallium arsenide single crystal
Title in Chinese: 砷化镓单晶AB微缺陷检验方法
Language: English
File Format: Electronic (PDF)
Delivery: Via email within 1~3 business days
Issued on: 2000-04-03
Implemented on: 2000-09-01
ICS Classification: 77.040.01-Testing of metals in general
Chinese Classification: H24-Metallographic testing method
Professional Classification: GB-National Standard
Related Keywords: gallium arsenide
single crystal scopethis standard
single crystal ab
single crystal ab micro-defects
inspection method
Related Topics: single crystal
gallium arsenide
Gallium Arsenide Enthalpy
Minor defect
Gallium+ water quality testing method
Boron Content in Gallium Arsenide
Crystallization detection method
How to test single crystal
gallium reading
one-sided gap method
lack
Gallium detection limit
Gallium Microwire
Crystallization detection method
Trace arsenic detection
Regulatory flaws
Single crystal standard
method disadvantage
Bismuth Telluride Crystal Defects
single crystal method
gallium-arsenide
Defect detection of various metal defects
GaNAs
Defect detection
laboratory defect
second hand ab
Bond defect detection
Arsenic standard
How to detect single crystal
flaws of the sample method
Single crystal detection basis
Gallium Arsenide Process
laboratory defect
negligible
as arsenic
negligible
Single Crystal+
GBT18032
GB/T 18032-2000
Gallium Arsenide Single Crystal
gallium antimonide
arsenic
Defect detection calibration
Is gallium arsenide toxic?
Disadvantages of microcolumn method
Characterization methods of lattice defects
Advantages and Disadvantages of Biochemical Testing Methodology
Crystal defect representation method
Implementation of standard test method for arsenic-to-salt ratio
Lattice defect characterization methods
Inspection methods for metal single crystals and polycrystals
Disadvantages of electrochemical detection methods
Arsenic method validation
Elemental arsenic industry
Gallium arsenide single crystal national standard
Internal crack defect detection method
Disadvantages of electrochemical detection methods
Gallium detection in water
Validation of water quality arsenic detection method
Advantages and Disadvantages of Single Particle Testing Methods
microchemical methods
Arsenic compound detection method
Gallium Arsenide Single Crystal Quality

《GB/T 18032-2000砷化镓单晶AB微缺陷检验方法》由TC203(全国半导体设备和材料标准化技术委员会)归口,主管部门为国家标准化管理委员会。
本标准规定了砷化镓单晶AB微缺陷的检验方法。
本标准适用于砷化镓单晶AB微缺陷密度的检验。


Scope

This standard specifies the inspection method for gallium arsenide single crystal AB micro-defects. This standard applies to the inspection of GaAs single crystal AB micro-defect density (AB-EPD). The inspection surface is (100) surface. Measuring range is less than 5 X 10 cm

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