Gallium Arsenide Single Crystal
Gallium Arsenide Single Crystal, Total:20 items.
The international standard classification for "Gallium Arsenide Single Crystal" includes: Semiconducting materials , Testing of metals , Powder metallurgy , Chemical analysis of metals , Testing of metals in general .
The Chinese standard classification for "Gallium Arsenide Single Crystal" includes: Compound semiconductor material , Metal physical property test method , Semimetal and semiconductor material in general , Semimetal , Rare metals and their alloys analysis method , Metallographic testing method .
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 11094-2020 Gallium arsenide single crystal and cutting wafer grown by horizontal bridgman method
- GB/T 8760-2020 Test method for dislocation density of monocrystal gallium arsenide
- GB/T 20228-2021 Gallium arsenide single crystal
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 8760-1988 Gallium arsenide single crystal; Determination of dislocation density
- GB 8760-1988 Gallium arsenide single crystal－Determination of dislocation density
- GB/T 8760-2006 Gallium arsenide single crystal-determination of dislocation density
- GB/T 25075-2010 Gallium arsenide single crystal for solar cell
- GB/T 11094-1989 Boat-grown gallium arsenide single crystals and As-cut slices
- GB/T 11094-2007 Horizontal bridgman grown gallium arsenide single crystal and cutting wafer
- GB/T 11093-2007 Liquid encapsulated czochralski-grown gallium arsenide single crystals and as-cut slices
- GB/T 20228-2006 Gallium arsenide single crystal
- GB/T 11093-1989 Liquid encapaulated czochralski-grouwn gallium arsenide single crystals and As-cut slices
- GB/T 18032-2000 The inspecting method of AB microscopic defect in gallium arsenide single crystal
Professional Standard - Electron
- SJ 3241-1989 Gallium arsenide single-crystal bar and wafer
- SJ 20844-2002 Test method for microzone homogeneity of semi-insulating monocrystal gallium arsenide
- SJ 20843-2002 Quantitative determination of AB microscopic defect density in gallium arsenide single crystal
Military Standard of the People's Republic of China-General Armament Department
- GJB 1927-1994 Gallium arsenide single crystal material testing method
- GJB 1926-1994 Gallium Arsenide Single Crystal Material Specification
- GJB 1927A-2021 Gallium arsenide single crystal material testing method
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会
- GB/T 35305-2017 Monocrystalline gallium arsenide polished wafers for solar cell
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