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solar cell technology solar cell introduction interpretation monocrystalline gallium solar cells standard frameworks standard dimensions gb/t oil-bearing material temperature calibration general use scopethis part
GB/T 35305-2017 in English

GB/T 35305-2017 in English

SUPERSEDED

Monocrystalline gallium arsenide polished wafers for solar cell

  • Issued on:2017-12-29
  • Implemented on:2018-07-01
  • File Format:PDF
  • Delivery:Via email within 1~3 business days
Price(USD): $160.00
$156.00
Standard No: GB/T 35305-2017
Document status: SUPERSEDED
Superseded by: GB/T 35305-2026 Gallium arsenide monocrystalline and monocrystalline polished wafers for solar cell
Superseded on: 2026-08-01
Title in English: Monocrystalline gallium arsenide polished wafers for solar cell
Title in Chinese: 太阳能电池用砷化镓单晶抛光片
Language: English
File Format: Electronic (PDF)
Delivery: Via email within 1~3 business days
Issued on: 2017-12-29
Implemented on: 2018-07-01
ICS Classification: 29.045-Semiconducting materials
Chinese Classification: H83-Compound semiconductor material
Professional Classification: GB-National Standard
Related Keywords: solar cell technology
solar cell introduction interpretation
monocrystalline gallium
solar cells
standard frameworks standard dimensions gb/t
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《GB/T 35305-2017太阳能电池用砷化镓单晶抛光片》由TC203(全国半导体设备和材料标准化技术委员会)归口,TC203SC2(全国半导体设备和材料标准化技术委员会材料分会)执行,主管部门为国家标准化管理委员会。


Introduction

Interpretation of GB/T 35305-2017 National Standard of the People's Republic of China

1. Background and significance of standard formulation

GB/T 35305-2017 "GaAs single crystal polished wafer for solar cells" was formulated to meet the needs of the development of solar cell technology. With the continuous advancement of solar cell technology, the quality requirements for GaAs single crystal polished wafers are also increasing. This standard specifies the requirements, test methods, inspection rules, as well as marking, packaging, transportation, storage and quality certificates for GaAs polished wafers, providing a normative basis for production and application.

2. Comparison of standard frameworks

Standard dimensions GB/T 35305—2017 International comparison (reference IEEE 1684-2020) Implementation suggestions
Technical requirements Specify the physical, chemical and electrical performance indicators of GaAs polishing sheets, such as resistivity and carrier concentration. In line with international standards, some indicators are more stringent. It is recommended that enterprises establish internal standards to further optimize process parameters.
Inspection methods Specify the inspection methods for items such as diameter, thickness, and surface quality. Adopt advanced non-contact testing technology. It is recommended to use automated testing equipment to improve efficiency.
Quality control Emphasis on inspection rules and defective product handling procedures. International standards focus on full-process quality management. It is recommended to introduce statistical process control (SPC) methods.

3. Detailed explanation of technical requirements

The technical requirements of gallium arsenide polishing sheets are mainly divided into the following aspects:

  • Classification by conductivity type and diameter:According to the conductivity type, it is divided into N type and P type, and according to the diameter, it is divided into three specifications: φ50.8mm, φ76.2mm, and φ100.0mm.
  • Physical and chemical and electrical properties:Indicators such as resistivity and carrier concentration must comply with the provisions of GB/T 25075 to ensure the conductivity and optical properties of the material.
  • Geometric parameters:Including diameter deviation, center point thickness, total thickness variation (TTV), etc., see Table 1 for specific requirements.

4. Implementation suggestions

In order to ensure that the quality of GaAs polishing sheets meets the standard requirements, the following measures are recommended:

  1. Production process control:Establish a strict process parameter monitoring system, especially real-time monitoring of key indicators such as diameter and thickness.
  2. Inspection method optimization:It is recommended to use high-precision measurement equipment, such as laser scanning thickness gauges and non-contact warpage testers.
  3. Surface quality control: Strengthen the management of polishing process to ensure there are no defects such as scratches and pits, and regularly calibrate the testing equipment.

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