Single crystal test
Single crystal test, Total:15 items.
The international standard classification for "Single crystal test" includes: Testing of metals , Optics and optical measurements , Semiconducting materials .
The Chinese standard classification for "Single crystal test" includes: Metal physical property test method , Optical Measurement , Compound semiconductor material , Technical management .
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 42676-2023 Test method for crystalline quality of semiconductive single crystal―X-ray diffraction method
- GB/T 22453-2008 Non-linear optical borate crystal devices measuring method
- GB/T 43724-2024 Test method for liquid crystal monomers
- GB/T 30866-2014 Test method for measuring diameter of monocrystalline silicon carbide wafers
- GB/T 20229-2006 Gallium phosphide single crystal
- GB/T 41751-2022 Test method for radius of curvature of crystal plane in GaN single crystal substrate wafers
Military Standard of the People's Republic of China-General Armament Department
- GJB 1927-1994 Gallium arsenide single crystal material testing method
- GJB 1927A-2021 Gallium arsenide single crystal material testing method
Professional Standard - Electron
- SJ/T 10333-1993 Methods of measurement for uni-junction transistors
- SJ/T 11500-2015 Test method for measuring crystallographic orientation of monocrystalline silicon carbide
- SJ 20607-1996 Specification for molybdenate crystal
- SJ/T 11501-2015 Test method for determining crystal type of monocrystalline silicon carbide
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 5252-2020 Test method for dislocation density of monocrystal germanium
American Society for Testing and Materials (ASTM)
- ASTM F40-83 Standard Method for PREPARING MONOCRYSTALLINE TEST INGOTS OF SILICON BY THE VERTICAL-PULLING (CZOCHRALSKI) TECHNIQUE
International Electrotechnical Commission (IEC)
- IEC PAS 62277:2001 Test-fixture of surface mounting quartz crystal units
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