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Database: 365,228(8 Aug 2026)
  1. HOME
  2. Standards for molecular single crystal

molecular single crystal

molecular single crystal, Total:401 items.

The international standard classification for "molecular single crystal" includes: Other non-ferrous metals and their alloys , Semiconducting materials , Insulating gases , Cadmium, cobalt and their alloys , Testing of metals , Electric furnaces , Piezoelectric and dielectric devices , Non-destructive testing of metals , Electronic display devices , Optics and optical measurements , Measurement of electrical and magnetic quantities , Abrasives , Other products of non-ferrous metals , Sugar. Sugar products. Starch , Fiber and cables .

The Chinese standard classification for "molecular single crystal" includes: Mass spectrometer, liquid spectrometer, energy spectrometer and combined devices of them , Rare scattered metals and their alloys , Compound semiconductor material , Elemental semiconductor material , Semimetal , Rare refractory metals and their compounds , Metal physical property test method , Semimetal and semiconductor material analysis method , Semimetal and semiconductor material in general , Industrial electric heating equipment , Special electronic technology material , Quartz crystal and piezoelectric element , Metal nondestructive testing method , Semiconductor emitting device , Artificial lens , Grinding material and apparatus , Processed sugar , Technical management , Technical management , Technical Management , Technical management , Technical management , Other petroleum products , Optical communication equipment .

Professional Standard - Education

  • JY/T 0588-2020 General rules for crystal and molecular structure determinationof small molecules by single crystal X-ray diffractometer
  • JY/T 008-1996 General rules for crystal and molecular structure determination of small molecules by four-circle single crystal X-ray diffractometer

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

国家市场监督管理总局、中国国家标准化管理委员会

  • GB/T 20228-2021 Gallium arsenide single crystal
  • GB/T 20229-2022 Gallium phosphide single crystal
  • GB/T 12965-2018 Monocrystalline silicon as cut wafers and lapped wafers
  • GB/T 19346.3-2021 Methods of measurement of amorphous and nanocrystalline alloys-Part 3:AC magnetic properties of Fe-based amorphous strip using a single sheet specimen
  • GB/T 25076-2018 Monocrystalline silicon for solar cell
  • GB/T 36648-2018 Specification for TFT liquid crystal monomers
  • GB/T 20230-2022 Indium phosphide single crystal
  • GB/T 26069-2022 Annealed monocrystalline silicon wafers
  • GB/T 12964-2018 Monocrystalline silicon polished wafers
  • GB/T 5238-2019 Monocrystalline germanium and monocrystalline germanium slices
  • GB/T 39865-2021 Method for measuring refractive index of uniaxial optical crystals
  • GB/T 18910.202-2021 Liquid crystal display devices—Part 20-2:Visual inspection—Monochrome matrix liquid crystal display modules
  • GB/T 18910.201-2021 Liquid crystal display devices—Part 20-1:Visual inspection—Monochrome liquid crystal display cells
  • GB/T 36647-2018 Specification for liquid crystal monomers
  • GB/T 39137-2020 Determination for the orientation of refractory metal single crystal
  • GB/T 26071-2018 Monocrystalline silicon wafers for solar cells
  • GB/T 41153-2021 Determination of boron,aluminum and nitrogen impurity content in silicon carbide single crystal―Secondary ion mass spectrometry

Professional Standard - Machinery

  • JB/T 5203-2012 Chemical analysis methods for monocrystalline fused alumina
  • JB/T 7996-2012 Conventional abrasive － Monocrystalline fuesd alumina
  • JB/T 7996-1999 Common abrasive Single alundum
  • JB/T 12068-2014 TDR-Z Germanium Mono-crystal Growing Furnace by Czochralski Method
  • JB/T 5203-2023 Chemical analysis methods for monocrystalline fused alumina
  • JB/T 5633-1991 Single-crystal furnace. Grading of energy consumption
  • JB/T 5203-1991 Monocrystalline Fused Alumina - Method for Chemical Analysis
  • JB/T 10439-2004 Crystal growing furnaces TDR-series crystal growing furnaces by Czochralski method

Hebei Provincial Standard of the People's Republic of China

  • DB13/T 5631-2022 Technical specifications for the production of quartz crucibles for the growth of single crystal silicon for electronic materials
  • DB13/T 1828-2013 Solar grade monocrystalline silicon wafer
  • DB13/T 1314-2010 Solar grade monocrystalline silicon square rod, monocrystalline silicon wafer

Professional Standard - Non-ferrous Metal

轻工业部

机械电子工业部

  • JB 5203-1991 Single crystal corundum chemical analysis method

Group Standards of the People's Republic of China

Professional Standard - Light Industry

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

  • GB/T 34210-2017 Test method for determining the orientation of sapphire single crystal

未注明发布机构

Professional Standard - Electron

  • SJ/T 10173-1991 TDA75 single crystalline silicon solar cell
  • SJ/T 9570.2-1995 Quality grading standard for quartz crystal monolithic filters
  • SJ/T 10065-1991 Detail specification for electronic components. PN silicon unijunction transistors for type BT 33
  • SJ/T 11500-2015 Test method for measuring crystallographic orientation of monocrystalline silicon carbide
  • SJ 3241-1989 Gallium arsenide single-crystal bar and wafer
  • SJ/T 11502-2015 Specification for polished monocrystalline silicon carbide wafers
  • SJ/T 10066-1991 Detail specification for electronic component. PN silicon unijunction transistors for type BT 37
  • SJ 3243-1989 Indium phosphide single-crystal bar and wafers
  • SJ 20607-1996 Specification for molybdenate crystal
  • SJ/T 11854-2022 Czochralski monocrystalline silicon furnace for photovoltaic
  • SJ/Z 2655-1986 Collection of single crystal Germaninm defects
  • SJ 20606-1996 Specification for tellurium dioxide single crystal
  • SJ/T 10333-1993 Methods of measurement for uni-junction transistors
  • SJ/T 10064-1991 Detail specification for electronic.component PN silicon unijunction transistors for type BT 32
  • SJ/T 11450-2013 Specification for energy consumption norm of silicon single crystal grower
  • SJ/T 11505-2015 Sapphire single crystal polished wafers specification
  • SJ/T 11501-2015 Test method for determining crystal type of monocrystalline silicon carbide
  • SJ/T 10067-1991 Detail specification for electronic component programmble unijunction transistors for type BT 40
  • SJ/T 11450-2023 Specification for energy consumption norm of silicon single crystal grower
  • SJ 3244.3-1989 Methods of measurement for crystal-orientation of single crystal of Gallium arsenide and Indium phosphide
  • SJ 20444-1994 Specification for Lithium Niobate singlecrystal

Professional Standard - Petrochemical Industry

  • SH/T 0339-1992 Determination method for cell parameter of NaY molecular sieve
  • SH/T 0340-1992 Determination method for crystallinity of NaY molecular sieve

Military Standard of the People's Republic of China-General Armament Department

Shandong Provincial Standard of the People's Republic of China

廊坊市市场监督管理局

  • DB1310/T 227-2020 Technical specification for quartz crucible process for growth of single crystal silicon, a special electronic material

工业和信息化部

Professional Standard - Ferrous Metallurgy

  • YB 1603-1983 Monocrystalline silicon as cut slices and lapped slices

Jiangxi Provincial Standard of the People's Republic of China

  • DB36/ 771-2013 Energy consumption quota per unit product of Czochralski monocrystalline silicon

Professional Standard - Building Materials

  • JC/T 1048-2007 Fused quartz crucibles for single crystal silicon growth
  • JC/T 1048-2018 Fused quartz crucibles for single crystal silicon growth

Inner Mongolia Provincial Standard of the People's Republic of China

  • DB15/T 2234-2021 Energy consumption quota per unit product of Czochralski monocrystalline silicon

ES-UNE

  • UNE-EN 120007:1992 BDS: LIQUID CRISTAL DISPLAYS. MONOCHROME LCDS WITHOUT ELECTRONIC CIRCUIT. (Endorsed by AENOR in September of 1996.)
  • UNE-EN 168100:1993 SS: QUARTZ CRYSTAL UNITS. (Endorsed by AENOR in November of 1996.)
  • UNE-EN 61747-3:2006 Liquid crystal display devices -- Part 3: Liquid crystal diplay (LCD) cells - Sectional specification (IEC 61747-3:2006). (Endorsed by AENOR in January of 2007.)
  • UNE-EN 60444-9:2007 Measurement of quartz crystal unit parameters -- Part 9: Measurement of spurious resonances of piezoelectric crystal units (IEC 60444-9:2007). (Endorsed by AENOR in August of 2007.)

UNKNOWN

German Institute for Standardization

  • DIN EN 120007:1993-06 Blank detail specification: Liquid Crystal Displays; monochrome LCDs without electronic circuit; German version EN 120007:1992
  • DIN EN 120007:1993 Blank detail specification: Liquid Crystal Displays; monochrome LCDs without electronic circuit; German version EN 120007:1992
  • DIN EN IEC 60122-4:2019-10 Quartz crystal units of assessed quality - Part 4: Crystal units with thermistors (IEC 60122-4:2019); German version EN IEC 60122-4:2019
  • DIN EN 60444-9:2007-12 Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units (IEC 60444-9:2007); German version EN 60444-9:2007
  • DIN EN 60444-8:2017-11 Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units (IEC 60444-8:2016); German version EN 60444-8:2017 / Note: DIN EN 60444-8 (2004-03) remains valid alongside this standard until 2020-01-19.
  • DIN EN 60444-7:2004-11 Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency dips of quartz crystal units (IEC 60444-7:2004); German version EN 60444-7:2004

Lithuanian Standards Office

  • LST EN 120007-2001 Blank detail specification. Liquid crystal displays. Monochrome LCDs without electronic circuit
  • LST EN 61747-3-2007 Liquid crystal display devices - Part 3: Liquid crystal diplay (LCD) cells - Sectional specification (IEC 61747-3:2006)
  • LST EN 60444-9-2007 Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units (IEC 60444-9:2007)
  • LST EN 60444-8-2004 Measurement of quartz crystal unit parameters. Part 8: Test fixture for surface mounted quartz crystal units (IEC 60444-8:2003)
  • LST EN 60444-7-2004 Measurement of quartz crystal unit parameters. Part 7: Measurement of activity and frequency dips of quartz crystal units (IEC 60444-7:2004)

GSO

  • GSO IEC 61747-20-1:2016 Liquid crystal display devices - Part 20-1: Visual inspection - Monochrome liquid crystal display cells (excluding all active matrix liquid crystal display cells)
  • BH GSO IEC 61747-20-1:2017 Liquid crystal display devices - Part 20-1: Visual inspection - Monochrome liquid crystal display cells (excluding all active matrix liquid crystal display cells)
  • OS GSO IEC 61747-3:2014 Liquid crystal display devices - Part 3: Liquid crystal display (LCD) cells - Sectional specification
  • GSO IEC 60444-7:2014 Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency dips of quartz crystal units
  • GSO IEC 61747-3:2014 Liquid crystal display devices - Part 3: Liquid crystal display (LCD) cells - Sectional specification
  • BH GSO IEC 60444-7:2016 Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency dips of quartz crystal units
  • OS GSO IEC 61747-3-1:2014 Liquid crystal display devices - Part 3-1: Liquid crystal display (LCD) cells - Blank detail specification
  • OS GSO IEC 61178-2:2014 Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 2: Sectional specification - Capability approval
  • BH GSO IEC 61178-3:2016 Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 3: Sectional specification - Qualification approval
  • GSO IEC 61178-3:2014 Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 3: Sectional specification - Qualification approval
  • OS GSO IEC 61178-3:2014 Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 3: Sectional specification - Qualification approval

SCC

Korean Agency for Technology and Standards (KATS)

  • KS C IEC 60122-4:2022 Quartz crystal units of assessed quality —Part 4: Crystal units with thermistors
  • KS D 0257-2022 Measuring of minority - carrier lifetime in silicon single crystal by photoconductive decay method
  • KS C IEC 61747-3-2002(2017) Liquid crystal and solid state display devices－Part 3：Sectional specification of liquid crystal display (LCD) cells
  • KS C IEC 61747-20-1-2015(2020) LIQUID CRYSTAL DISPLAY DEVICES ― Part 20-3: Visual inspection ― Monochrome LCD display cells (excluding all active matrix liquid crystal cells)
  • KS D 0257-2002(2022) Measuring of minority - carrier lifetime in silicon single crystal by photoconductive decay method
  • KS C IEC 61747-3-2002(2022) Liquid crystal and solid state display devices－Part 3：Sectional specification of liquid crystal display (LCD) cells
  • KS D 0257-2002(2017) Measuring of minority - carrier lifetime in silicon single crystal by photoconductive decay method
  • KS C IEC 60444-9-2021 Measurement of quartz crystal unit parameters ― Part 9: Measurement of spurious resonance of piezoelectric crystal units
  • KS C IEC 61747-20-1:2015 LIQUID CRYSTAL DISPLAY DEVICES ― Part 20-3: Visual inspection ― Monochrome LCD display cells (excluding all active matrix liquid crystal cells)
  • KS C IEC 60444-8:2016 Measurement of quartz crystal unit parameters ― Part 8: Test fixture for surface mounted quartz crystal units
  • KS C IEC 61747-20-1-2020 LIQUID CRYSTAL DISPLAY DEVICES ― Part 20-3: Visual inspection ― Monochrome LCD display cells (excluding all active matrix liquid crystal cells)
  • KS C IEC 60444-9:2016 Measurement of quartz crystal unit parameters ― Part 9: Measurement of spurious resonance of piezoelectric crystal units
  • KS D 2715-2006 Tensile specimen of single- and poly-crystal nano/micro thin film materials
  • KS C IEC 61747-3-2022 Liquid crystal and solid state display devices－Part 3：Sectional specification of liquid crystal display (LCD) cells
  • KS C IEC 60444-7-2021 Measurement of quartz crystal unit parameters ― Part 7: Measurement of activity and frequency dips of quartz crystal units
  • KS D 2715-2017 Tensile specimen of single- and poly-crystal nano/micro thin film materials
  • KS C IEC 61747-3-1-2002(2017) Liquid crystal and solid-state display devices - Part 3-1 : Liquid crystal display(LCD) cells - Blank detail specification

Danish Standards Foundation

  • DS/EN 61747-3:2007 Liquid crystal display devices -- Part 3: Liquid crystal display (LCD) cells - Sectional specification
  • DS/EN 60444-9:2007 Measurement of quartz crystal unit parameters -- Part 9: Measurement of spurious resonances of piezoelectric crystal units
  • DS/EN 61747-3-1:2007 Liquid crystal display devices - Part 3-1: Liquid crystal display (LCD) cells - Blank detail specification
  • DS/EN 60444-8:2003 Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units

KR-KS

  • KS C IEC 60122-4-2022 Quartz crystal units of assessed quality —Part 4: Crystal units with thermistors
  • KS C IEC 61178-3-2018(2023) Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) -Part 3: Sectional specification - Qualification approval
  • KS C IEC 61178-2-2018(2023) Quartz crystal units — A specification in the IEC Quality Assessment System for Electronic Components (IECQ) — Part 2: Sectional specification – Capability approval
  • KS C IEC 60122-2-2003(2023) Crystals for Frequency Control and Selection - Part 2: A Guide to Using Crystals for Frequency Control and Selection

CEN - European Committee for Standardization

  • EN IEC 60122-4:2019 Quartz crystal units of assessed quality - Part 4: Crystal units with thermistors

Association Francaise de Normalisation

  • NF EN 120007:1992 Particular specification framework: liquid crystal display devices - monochrome LCDs without electronic circuit
  • NF C93-120-007*NF EN 120007:1992 Blank Detail Specification: Liquid cristal displays - Monochrome LCDs without electronic circuit
  • NF EN 61747-3:2007 Dispositifs d'affichage à cristaux liquides - Partie 3 : cellules d'affichage à cristaux liquides (LCD) - Spécification intermédiaire
  • NF EN 61747-3-1:2006 Dispositifs d'affichage à cristaux liquides - Partie 3-1 : cellules d'affichage à cristaux liquides (LCD) - Spécification particulière cadre
  • NF C93-621-8*NF EN 60444-8:2017 Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units

RU-GOST R

  • GOST R IEC 61747-20-1-2017 Liquid crystal display devices. Part 20-1. Visual inspection. Monochrome liquid crystal display cells (excluding all active matrix liquid crystal display cells)
  • GOST R IEC 61747-3-2017 Liquid crystal display devices. Part 3. Liquid crystal display (LCD) cells. Sectional specification
  • GOST 16153-1980 Monocrystalline germanium. Specifications

IEC - International Electrotechnical Commission

  • IEC 61747-20-1:2015 Liquid crystal display devices - Part 20-1: Visual inspection - Monochrome liquid crystal display cells (excluding all active matrix liquid crystal display cells) (Edition 1.0)

IN-BIS

  • IS 4570 Pt.11-1989 Specification for crystal unit holders Part 11 Metal, welded, two-pin crystal unit holders type DQ
  • IS 4570 Pt.8-1985 Specification for crystal unit brackets Part 8 Metal, welded, three-wire crystal unit bracket type DK
  • IS 4570 Pt.7-1985 Crystal Unit Support Specification Part 7 Micro, Metal, Solder-sealed, Two-Wire Crystal Unit Support Type DJ
  • IS 4570 Pt.12-1989 Specification for crystal unit supports Part 12 Micro, metal, cold welded, two-wire crystal unit supports Type EB
  • IS 4570 Pt.13/Sec.5-1993 Crystal Unit Holders—Specification Part 13 Overview of Automatic Handling Quartz Crystal Unit Holders Section 5: Metal, Sealed, Two-Needle Crystal Unit Holders Type CU 05
  • IS 4570 Pt.6-1984 Crystal Unit Holder Specification Part 6 Metal, Solder Sealed, Two-needle Crystal Unit Holder Type CX
  • IS 4570 Pt.13/Sec.4-1993 Crystal Unit Holders—Specification Part 13 Overview of Automatic Handling Quartz Crystal Unit Holders Section 4: Metal, Sealed, Two-Needle Crystal Unit Holders Type CU 04
  • IS 4570 Pt.13/Sec.2-1993 Crystal Unit Holders—Specification Part 13 Overview of Automatically Processed Quartz Crystal Unit Holders Section 2: Metal, Sealed, Two-Needle Crystal Unit Holders Type CU 02
  • IS 4570 Pt.13/Sec.3-1993 Crystal Unit Holders—Specification Part 13 Overview of Automatically Processed Quartz Crystal Unit Holders Section 3: Metal, Sealed, Two-Needle Crystal Unit Holders Type CU 03
  • IS 9709-1980 Specifications for Synthetic Quartz Single Crystal
  • IS 4570 Pt.3-1984 Specifications for crystal unit holders Part 3 Tubular crystal unit holders (glass) types AP, AR, AS, AT and AU
  • IS 4570 Pt.13/Sec.1-1993 Crystal Unit Holders—Specification Part 13 Overview of Automatically Processed Quartz Crystal Unit Holders Section 1: Metal, Sealed, Two-Needle Crystal Unit Holders Type CU 01
  • IS 4570 Pt.5-1984 Crystal unit holder specification Part 5 ftfiETAL, solder sealed, two-wire crystal unit holder types BF, EF/1 and BG, BG 1
  • IS 8271 Pt.2/Sec.4-1981 Specification for Quartz Crystal Units Used in Oscillators Part II AA Series Section 4: Quartz Crystal Unit Type AA-04
  • IS 8271 Pt.3/Sec.7-1982 Specification for Quartz Crystal Units Used in Oscillators Part III Series BC Section 7: Quartz Crystal Unit Types BC-07

International Electrotechnical Commission (IEC)

  • IEC 60122-4:2019 Quartz crystal units of assessed quality - Part 4: Crystal units with thermistors
  • IEC 61747-3:2015 Liquid crystal display devices - Part 3: Liquid crystal display (LCD) cells - Sectional specification
  • IEC 62435-5:2017 Electronic components - Long-term storage of electronic semiconductor devices - Part 5: Die and wafer devices
  • IEC 61178-1:1993 Quartz crystal units; a specification in the IEC quality assessment system for electronic components (IECQ); part 1: generic specification

American National Standards Institute （ANSI)

  • ANSI/ASTM D6056:2001 Test Method for Determining Concentration of Airborne Single-Crystal Ceramic Whiskers in the Workplace Environment by Transmission Electron Microscopy
  • ANSI/ASTM D6059:2001 Test Method for Determining Concentration of Airborne Single-Crystal Ceramic Whiskers in the Workplace Environment by Scanning Electron Microscopy

European Committee for Electrotechnical Standardization（CENELEC）

  • EN 120007:1992 Blank Detail Specification: Liquid Crystal Displays Monochrome LCDs without Electronic Circuit

British Standards Institution (BSI)

  • BS EN 120007:1993 Harmonized system of quality assessment for electronic components. Blank detail specification. Liquid crystal displays. Monochrome LCDs without electronic circuit
  • 13/30276532 DC BS EN 61747-20-1. Liquid crystal display devices. Part 20-1. Visual inspection. Monochrome liquid crystal display cells (Excluding all active matrix liquid crystal display cells)
  • BS EN 120007:1991 Harmonized system of quality assessment for electronic components - Blank detail specification - Liquid crystal displays - Monochrome LCDs without electronic circuit
  • BS EN 62435-5:2017 Electronic components - Long-term storage of electronic semiconductor devices. - Part 5: Die and wafer devices
  • BS EN 168000:1996(1999) Harmonized system ofquality assessment for electronic components Generic specification : Quartz crystal units
  • 14/30277702 DC BS EN 61747-3. Liquid crystal display devices. Part 3. Liquid crystal display (LCD) cells. Sectional specification

SE-SIS

IECQ - IEC: Quality Assessment System for Electronic Components

  • QC 720200-1998 Liquid Crystal and Solid State Display Devices - Part 3: Sectional Specification for Liquid Crystal Display (LCD) Cells

Defense Logistics Agency

U.S. Military Regulations and Norms

Japanese Industrial Standards Committee (JISC)

  • JIS H 0604:1995 Measuring of minority-carrier lifetime in silicon single crystal by photoconductive decay method

American Society for Testing and Materials (ASTM)

  • ASTM D6056-96(2011) Standard Test Method for Determining Concentration of Airborne Single-Crystal Ceramic Whiskers in the Workplace Environment by Transmission Electron Microscopy
  • ASTM D605-82(1996)e1 Standard Specification for Magnesium Silicate Pigment (Talc)
  • ASTM D6059-96(2011) Standard Test Method for Determining Concentration of Airborne Single-Crystal Ceramic Whiskers in the Workplace Environment by Scanning Electron Microscopy

Standard Association of Australia （SAA）

  • ISO 5861:2024 Surface chemical analysis - X-ray photoelectron spectroscopy - Method of intensity calibration for quartz-crystal monochromated Al Kα XPS instruments

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