Single Crystal Meter

Single Crystal Meter, Total:96 items.

The international standard classification for "Single Crystal Meter" includes: Testing of metals , Other non-ferrous metals and their alloys , Piezoelectric and dielectric devices , Semiconducting materials , Measuring instruments , Insulating gases , Cadmium, cobalt and their alloys , Electric furnaces , Dividing and tool-workpiece holding devices , Other products of non-ferrous metals .

The Chinese standard classification for "Single Crystal Meter" includes: Metal physical property test method , Rare scattered metals and their alloys , Quartz crystal and piezoelectric element , Compound semiconductor material , Elemental semiconductor material , Semimetal , Measuring tool and instrument , Rare refractory metals and their compounds , Industrial electric heating equipment , Technical management , Length Measurement , Processed sugar .

Group Standards of the People's Republic of China

T/ZZB 1372-2019 Crystalline silicon terrestrial single side double glass photovoltaic(PV) modules
T/CECA 69-2022 Single-crystal thin film substrates for SAW devices
T/ZZB 0497-2018 Single crystal wafers for surface acoustic wave device applications

National Metrological Technical Specifications of the People's Republic of China

JJF 1256-2010 Calibration Specification for X-ray Monocrystal Orientation Equipment

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 12962-1996 Monocrystalline silicon
GB/T 5238-2009 Monocrystalline germanium and monocrystalline germanium slices
GB/T 12962-2005 Monoccrystalline silicon
GB/T 20230-2006 Indium phosphide single crystal
GB/T 5238-1995 Monocrystalline germanium
GB/T 29504-2013 300 mm monocrystalline silicon
GB/T 14843-1993 Lithium niobate single crystals
GB/T 31092-2014 Monocrystalline sapphire ingot
GB/T 5238-2009(英文版) Monocrystalline germanium and monocrystalline germanium slices
GB/T 1555-1997 Test methods for determining the orientation of a semiconductor single crystal
GB/T 15713-1995 Monocrystalline germanium slices
GB/T 12962-2015 Monocrystalline silicon
GB/T 26091-2010 Gear single-flank meshing integrated error measuring instrument
GB/T 20228-2006 Gallium arsenide single crystal
GB/T 30118-2013 Single Crystal Wafers for Surface Acoustic Wave (SAW) Device Applications - Specifications and Measuring Methods
GB/T 31092-2022 Monocrystalline sapphire bar
GB/T 41751-2022 Test method for radius of curvature of crystal plane in GaN single crystal substrate wafers
GB/T 5238-2009e Monocrystalline germanium and monocrystalline germanium slices

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 5238-2019 Monocrystalline germanium and monocrystalline germanium slices
GB/T 20229-2022 Gallium phosphide single crystal
GB/T 20228-2021 Gallium arsenide single crystal
GB/T 20230-2022 Indium phosphide single crystal

Hebei Provincial Standard of the People's Republic of China

DB13/T 1314-2010 Solar grade monocrystalline silicon square rod, monocrystalline silicon wafer
DB13/T 5865-2023 Wafer surface particle size inspection instrument calibration method

Taiwan Provincial Standard of the People's Republic of China

CNS 11364-1985 Method for Determination of the Unit Cell Dimension of a Faujasite-Type Zeolite

Professional Standard - Machinery

JB/T 10029-1999 Gear single - Flank meshing integrated error measuring instrument
JB/T 10439-2004 Crystal growing furnaces TDR-series crystal growing furnaces by Czochralski method

Professional Standard - Electron

SJ 20605-1996 Specification for lithium tantalate single crystal used in SAW devices
SJ/T 9550.29-1993 Terrestrial silicon solar cells--Quality grading standard
SJ/T 11503-2015 Test methods for measuring surface roughness of polished monocrystalline silicon carbide wafers
SJ/T 11504-2015 Test method for measuring surface quality of polished monocrystalline silicon carbide

National Metrological Verification Regulations of the People's Republic of China

JJG 95-1986 Verification Regulation of Single-Flank Gear Rolling Tester

Professional Standard - Education

JY/T 0588-2020 General rules for crystal and molecular structure determinationof small molecules by single crystal X-ray diffractometer

Professional Standard - Non-ferrous Metal

YS/T 42-2010 Lithium tantalate single crystals
YS/T 554-2006 Lithium niobate single crystals

轻工业部

QB 1173-1991 Monocrystal Rock Sugar

工业和信息化部

QC/T 1169-2022 Liquid ecrystal instrument for automobile

Professional Standard - Light Industry

QB/T 1173-1991 Monocrystal rock sugar

VDI - Verein Deutscher Ingenieure

VDI/VDE 5575 BLATT 8-2018 Roentgenoptische Systeme - Monochromatorkristalle
VDI/VDE 5575 Blatt 8-2011 Roentgenoptische Systeme - Monochromatorkristalle
VDI/VDE 5575 BLATT 8-2019 Roentgenoptische Systeme - Monochromatorkristalle

Association Francaise de Normalisation

NF C93-616:2013 Single Crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
NF EN 61747-3:2007 Dispositifs d'affichage à cristaux liquides - Partie 3 : cellules d'affichage à cristaux liquides (LCD) - Spécification intermédiaire
NF C93-616*NF EN 62276:2018 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
NF C93-616:2006 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods.

Defense Logistics Agency

DLA DSCC-DWG-94023 REV B-2007 CRYSTAL UNIT, QUARTZ, MINIATURE, SURFACE MOUNT
DLA A-A-50685 VALID NOTICE 2-2001 LEVEL, PRECISION MASTER, SINGLE FACE
DLA A-A-50685 VALID NOTICE 1-1995 LEVEL, PRECISION MASTER, SINGLE FACE
DLA A-A-50685-1989 LEVEL, PRECISION MASTER, SINGLE FACE
DLA A-A-50685 VALID NOTICE 3-2006 LEVEL, PRECISION MASTER, SINGLE FACE
DLA MIL-S-19500/425 VALID NOTICE 2-2004 SEMICONDUCTOR DEVICE, TRANSISTOR, PN, SILICON, UNIJUNCTION JAN2N5431, AND JANTX2N5431

Japanese Industrial Standards Committee (JISC)

JIS C 6760:2014 Single crystal wafers for surface acoustic wave (SAW) device applications .Specifications and measuring methods

GSO

OS GSO IEC 61747-3:2014 Liquid crystal display devices - Part 3: Liquid crystal display (LCD) cells - Sectional specification
OS GSO IEC 62276:2014 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
GSO IEC 62276:2014 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods

SCC

DANSK DS/EN 168100:2016 Sectional Specification: Quartz crystal units (Capability approval)
IEC PAS 62277:2001 Test-fixture of surface mounting quartz crystal units
CEI EN 60444-8:2017 Measurement of quartz crystal unit parameters Part 8: Test fixture for surface mounted quartz crystal units
BS ISO 5861:2024 Surface chemical analysis. X-ray photoelectron spectroscopy. Method of intensity calibration for quartz-crystal monochromated Al Kα XPS instruments
DANSK DS/EN 62276:2016 Single crystal wafers for surface acoustic wave (SAW) device applications – Specifications and measuring methods
CEI EN 62276:2017 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
BS PD IEC/PAS 62276:2002 Single crystal wafers applied for surface acoustic wave device. Specification and measuring method
DIN EN 60444-8:2017 Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units (IEC 60444-8:2016); German version EN 60444-8:2017
DIN EN 62276:2017 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (IEC 62276:2016); German version EN 62276:2016

Standard Association of Australia （SAA）

ISO 5861:2024 Surface chemical analysis - X-ray photoelectron spectroscopy - Method of intensity calibration for quartz-crystal monochromated Al Kα XPS instruments

IEC - International Electrotechnical Commission

PAS 62276-2001 Single Crystal Wafers Applied for Surface Acoustic Wave Device - Specification and Measuring Method (Edition 1.0)
PAS 62277-2001 Test-Fixture of Surface Mounting Quartz Crystal Units (Edition 1.0;)

VDE - VDE Verlag GmbH@ Berlin@ Germany

VDE V 0603-102-2006 Consumer units and meter panels AC 400 V - Part 102: Particular requirements for Consumer units and meter panels for electronic meters (eHZ)

American Society for Testing and Materials (ASTM)

ASTM D3942-03(2008) Standard Test Method for Determination of the Unit Cell Dimension of a Faujasite-Type Zeolite
ASTM F847-94(1999) Standard Test Methods for Measuring Crystallographic Orientation of Flats on Single Crystal Silicon Wafers by X-Ray Techniques
ASTM D3942-97 Standard Test Method for Determination of the Unit Cell Dimension of a Faujasite-Type Zeolite
ASTM D3942-03 Standard Test Method for Determination of the Unit Cell Dimension of a Faujasite-Type Zeolite

UNKNOWN

YB 1602-83 Silicon single crystal
YB 1602-1983 Silicon single crystal

International Organization for Standardization (ISO)

ISO/CD 5861 Surface chemical analysis — X-ray photoelectron spectroscopy — Method of intensity calibration for quartz-crystal monochromated Al Kα XPS instruments
ISO/DIS 5861:2023 Surface chemical analysis — X-ray photoelectron spectroscopy — Method of intensity calibration for quartz-crystal monochromated Al Kα XPS instruments
ISO/PRF 5861:2024 Surface chemical analysis — X-ray photoelectron spectroscopy — Method of intensity calibration for quartz-crystal monochromated Al Kα XPS instruments

Danish Standards Foundation

DS/EN 62276:2013 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods

German Institute for Standardization

DIN EN 60444-8:2017-11 Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units (IEC 60444-8:2016); German version EN 60444-8:2017 / Note: DIN EN 60444-8 (2004-03) remains valid alongside this standard until 2020-01-19.
DIN EN 62276:2017-08 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (IEC 62276:2016); German version EN 62276:2016 / Note: DIN EN 62276 (2013-08) remains valid alongside this standard until 2019-11-28.
DIN EN IEC 62276:2023-05 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (IEC 49/1401/CD:2022); Text in German and English / Note: Date of issue 2023-04-28*Intended as replacement for DIN EN 62276 (2017-08).

Spanish Association for Standardization (UNE)

UNE-EN 62276:2016 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (Endorsed by Asociación Española de Normalización in January of 2017.)

Korean Agency for Technology and Standards (KATS)

KS C IEC 61747-3-2022 Liquid crystal and solid state display devices－Part 3：Sectional specification of liquid crystal display (LCD) cells
KS C IEC 62276:2007 Single crystal wafers for surface acoustic wave(SAW) device applications－Specifications and measuring methods

CENELEC - European Committee for Electrotechnical Standardization

EN 62276:2013 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods

European Committee for Electrotechnical Standardization（CENELEC）

EN 62276:2016 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods

British Standards Institution (BSI)

14/30277702 DC BS EN 61747-3. Liquid crystal display devices. Part 3. Liquid crystal display (LCD) cells. Sectional specification
23/30468947 DC BS EN 62276. Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods

Lithuanian Standards Office

LST EN 62276-2013 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (IEC 62276:2012)
LST EN 60444-8-2004 Measurement of quartz crystal unit parameters. Part 8: Test fixture for surface mounted quartz crystal units (IEC 60444-8:2003)
LST EN 62276-2006 Single crystal wafers for surface acoustic wave (SAW) device appplications. Specifications and measuring methods (IEC 62276:2005)

International Electrotechnical Commission (IEC)

IEC 62276:2005 Single crystal wafers for surface acoustic wave (SAW) device application - Specifications and measuring methods