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Single crystal diffractometer analysis

Single crystal diffractometer analysis, Total:39 items.

The international standard classification for "Single crystal diffractometer analysis" includes: Radiation protection , Testing of metals , Salts , Inorganic chemicals in general , Chemical analysis of metals , Occupational safety. Industrial hygiene , Other standards related to analytical chemistry , Other standards related to optics and optical measurements .

The Chinese standard classification for "Single crystal diffractometer analysis" includes: Mass spectrometer, liquid spectrometer, energy spectrometer and combined devices of them , Radiological sanitation protection , Metal physical property test method , Inorganic salt , Inorganic chemicals in general , Material composition analysis instrument and environment detection instrument in general , Electron optics and other physical optics instrument .


Professional Standard - Education

  • JY/T 0588-2020 General rules for crystal and molecular structure determinationof small molecules by single crystal X-ray diffractometer
  • JY/T 008-1996 General rules for crystal and molecular structure determination of small molecules by four-circle single crystal X-ray diffractometer

National Metrological Verification Regulations of the People's Republic of China

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

  • GB/T 38532-2020 Microbeam analysis—Electron backscatter diffraction—Measurement of average grain size
  • GB/T 19421.1-2003 Test methods of crystalline layered sodium disilicate―Qualitative analysis of delta-crystalline layered sodium disilicate―Method of X-ray diffractometer
  • GB/T 42676-2023 Test method for crystalline quality of semiconductive single crystal―X-ray diffraction method
  • GB/T 8359-1987 Carbides in high speed steel; Quantitative phase analysis; Method of X-ray diffractometer
  • GB 16355-1996 Radiation protection standards for X-ray diffraction and fluorescence analysis equipment
  • GB/T 30904-2014 Inorganic chemicals for industrial use―Crystal form analysis―X-ray diffraction method

Occupational Health Standard of the People's Republic of China

  • GBZ 115-2002 Radiological standards for X-ray Diffraction and fluorescence analysis equipment

国家市场监督管理总局、中国国家标准化管理委员会

  • GB/T 37983-2019 Testing methods of X-ray diffraction for determining the orientation of crystal materials by rotation

未注明发布机构

  • DIN ISO 13067 E:2021-01 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size

Professional Standard - Machinery

Professional Standard - Ferrous Metallurgy

  • YB/T 5336-2006 Carbides in high speed steel -- Quantitative phase analysis -- Method of X-ray diffractometer

British Standards Institution (BSI)

  • BS EN 13925-3:2005 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Instruments
  • BS EN 13925-3:2005(2009) Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Instruments
  • BS ISO 13067:2020 Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size
  • 19/30365236 DC BS ISO 13067. Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size

SCC

  • DANSK DS/EN 13925-3:2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
  • AENOR UNE-EN 13925-3:2006 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
  • NS-EN 13925-3:2005 Non destructive testing — X ray diffraction from polycrystalline and amorphous materials — Part 3: Instruments
  • 10/30195133 DC BS ISO 13067. Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size

European Committee for Standardization (CEN)

  • EN 13925-3:2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments

German Institute for Standardization

  • DIN EN 13925-3:2005-07 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments; German version EN 13925-3:2005
  • DIN EN 13925-3:2005 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments; German version EN 13925-3:2005
  • DIN ISO 13067:2021-08 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size (ISO 13067:2020)
  • DIN ISO 13067:2021 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size (ISO 13067:2020)

Association Francaise de Normalisation

Danish Standards Foundation

  • DS/EN 13925-3:2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments

AENOR

  • UNE-EN 13925-3:2006 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments

Lithuanian Standards Office

  • LST EN 13925-3-2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments

Japanese Industrial Standards Committee (JISC)

  • JIS H 7805:2005 Method for crystallite size determination in metal catalysts by X-ray diffractometry

GSO

  • OS GSO ISO 13067:2015 Microbeam analysis -- Electron backscatter diffraction -- Measurement of average grain size
  • GSO ISO 13067:2015 Microbeam analysis -- Electron backscatter diffraction -- Measurement of average grain size

PT-IPQ

Korean Agency for Technology and Standards (KATS)

International Organization for Standardization (ISO)

  • ISO 13067:2020 Microbeam analysis — Electron backscatter diffraction — Measurement of average grain size