GB/T 38532-2020 in English

VALID

Microbeam analysis—Electron backscatter diffraction—Measurement of average grain size

Issued on:2020-03-06
Implemented on:2021-02-01
File Format:PDF
Delivery:Via email within 5 business days

Price(USD)： $310.00
$301.00

Standard No:	GB/T 38532-2020
Document status:	VALID
Title in English:	Microbeam analysis—Electron backscatter diffraction—Measurement of average grain size
Title in Chinese:	微束分析电子背散射衍射平均晶粒尺寸的测定
Language:	English
File Format:	Electronic (PDF)
Delivery:	Via email within 5 business days
Issued on:	2020-03-06
Implemented on:	2021-02-01
Professional Classification:	GB-National Standard
Related Keywords:	average grain size average grain size introduction analysis grain size estimated average grain size first ebsd grain size standard
Related Topics:	Grain grain size grain size Secondary electron diffraction Grain and Grain Size by grain size scattering Electron Diffraction Secondary Diffraction half peak width and grain size grain size at half peak width grain size Grain Grain grain size diffraction electron backscatter electron backscatter grain shape About scattering grain size at half peak width backscatter Electron Backscatter Diffraction System Electron Backscatter Diffraction System reflection high energy electron diffraction Electron Backscatter Diffraction grain shape Grain size smaller than microbeam analysis grain size Crystal grain backscatter diffraction Grain crystal backscatter diffraction Grain Size vs. Phase Size Electron diffraction brightness Scherrer formula grain size Half width and grain size electron second diffraction backscattered phase Secondary electron diffraction analysis Grain Size Phase Size Diffraction peak analysis Handheld Backscatter Electron Diffraction Secondary Diffraction grain size backscatter directional backscatter Secondary electron diffraction Backscatter particle size analysis zero diffraction peak grain size grain size peak Standard Grain Size size grain Diffraction peak crystal form Backscatter vs Backscatter electron scattering backscattered field General Grain Size Grain particles grain primary particle electron diffraction scattering Grain Size Analysis backscatter orientation What about the diffraction peaks for transmission? Grain size and half width Diffraction peak homogeneity electron backscatter electron backscatter electron diffraction phase rescattering of electrons Handheld Backscatter How to analyze electron diffraction Homogenizer backscattering particle size neutron diffraction lithium Grain size Diffraction peaks of molybdenum Backscattered electron diffraction analysis Grain Size Formula Grain Grain Size transmission microdiffraction electron diffraction twin electron diffraction Electron Diffraction of Twins Diffraction peak broadening size micro-diffraction Diffraction and Transmission What phase is backscattered average grain size Grain Size Half Width twin electron diffraction electron scattering Secondary electrons and backscattered electrons Scherrer formula grain size air particle size What about the grain size second order diffraction backscattered lithium diffracted beam in electron microscope Grain size according to The half peak width and grain size of the electronic back Diffraction in English Diffraction of electrons backscatter Domestic Neutron Diffraction medium energy electron scattering Electron Diffraction and Electron Scattering twinning, double diffraction Die 3 Die 10 Analytical Balance Micrograms Diffraction Peak Grains Secondary Diffraction, Electron Diffraction micellar particles grain effect Electron diffraction brightness Electron Backscatter Diffraction secondary electron scattering molecular scattering Scattering Diffraction Neutron Diffraction Peaks Electron Diffraction Microdisk Size Standard Particles Diffraction half-point analysis neutron diffraction pair Diffraction semi-quantitative analysis broad diffraction peaks electron-electron scattering twinning + electron diffraction twin crystal diffraction electron backscattered electrons electron diffraction plane Crystal Size and Grain Size How to analyze electron diffraction Backscatter of the first kind electron diffraction disorder electron light scattering grain and Neutron Diffraction Technique Diffraction grain size at half peak width How to analyze electron backscatter diffraction Scattering Diffraction average low energy electron diffraction Backscatter sample preparation equipment backscattered phase analysis homogeneous analysis electron diffraction twins Backscatter sample preparation equipment foreign neutron diffraction shape grain complex scattering particle diffraction cobalt diffraction peak Grain Size and Dimensions intercrystalline diffraction electronic micrometer use grain shape twin crystal diffraction spin electron diffraction backscattered electron phase twinned electrons double scattered electrons forward scatter and back scatter backscattered electron phase Grain Size vs. Crystal Size average grain size electron diffraction twins Diffraction backscattered phase analysis How to analyze electron diffraction scattering of electrons Scattering and Diffraction microbeam electron diffraction Secondary Electron Diffraction Electron Molybdenum diffraction peak primary grain size Diffraction peaks of water Analysis of crystal form secondary electron backscattered electrons Analyzing grain size Scherrer Grain Size gold diffraction peaks Secondary electrons and backscattering microbeam Grain Size Determination cobalt diffraction peak Backscattering and Secondary Electrons Diffraction concept Grain Size Standard backscattering and rescattering How to analyze the diffraction double beam Half width and grain size half maximum grain size How is diffraction graded Ten 8 Electron Particles homogeneous and dispersed Single crystal diffractometer analysis Secondary Diffraction Analysis The grain size is generally backscattered electron diffraction Aluminum grain size twinned half point scattered by electrons Grain Diffraction Peak Crystal grain Electron bulk backscattered secondary crystal grain size How to Determine Grain Size Grain size and half width back shot Twin Secondary Diffraction three-point diffraction average grain size backscatter backscatter Neutron Diffraction Sample Preparation Backscatter Backscattering and Secondary Electrons Analysis of crystal form primary diffracted beam Electron Scattering and Electron Diffraction Grain Analysis Particle Scattering Size Electron Scatterer electron diffraction together electron diffraction? secondary electron backscattering Electron Diffraction and Electron Diffraction electron scattering electron diffraction Electron Diffraction and Scattering Grain Size Analysis backscattered electrons secondary electrons Backscattering, secondary electrons Secondary electrons and backscattered electrons EBSD Die GBT38532 GB/T 38532-2020 polycrystalline electron diffraction The difference between backscattered electrons and secondary electrons Magnetic particles and microparticles Polymer spherulite size BSE backscattered electrons nanobeam electron diffraction Grain size calculation electronic analytical balance backscatter enterprise Micro jet homogenizer Transmission Calibration Standard Electron Diffraction Pattern Calibration method of single crystal electron diffraction pattern Single crystal diffraction analysis method

《GB/T 38532-2020微束分析电子背散射衍射平均晶粒尺寸的测定》由TC38（全国微束分析标准化技术委员会）归口，主管部门为国家标准化管理委员会。

Introduction

Analysis of the core content of the standard

This standard is equivalent to ISO 13067:2011, which specifies the method for determining the average grain size of a polished section using an electron backscatter diffraction system. The main technical breakthroughs include:

1. The first clear definition of the EBSD grain size measurement terminology system

Establish 23 professional terms such as step size, pixel, and orientation difference angle
Distinguish between grain boundaries (>5° orientation difference) and subgrain boundaries (1-5° orientation difference)

Comparison of key technical requirements

Parameters	Traditional metallographic method	EBSD method	Advantages
Spatial resolution	≥0.5μm	≥0.05μm	Increase by 10 times
Orientation analysis	Not quantifiable	0.5° orientation difference can be measured	Complete crystallographic information
Applicable materials	Mainly single-phase	Multiphase composite materials	Expanded application range

Detailed explanation of operation specifications

Sample preparation requirements:

High-quality Kikuchi diffraction patterns need to be obtained. Recommendations:

Mechanical polishing followed by electrolytic polishing to remove the deformation layer
Samples with poor conductivity need to be coated with ≤10nm carbon film
Avoid grain boundary over-corrosion (calibration rate should be >95%)

Key parameters for data acquisition:

Step size selection formula: D_step ≤ 0.1×D_avg (D_avg is the estimated average grain size)

Minimum statistics: ≥500 grains (uncertainty <10% at 95% confidence level)

Technology Evolution Analysis

This standard marks an important breakthrough in materials characterization technology:

1990s: EBSD technology laboratory stage
2011: ISO releases the first EBSD grain size standard
2020: China adopts the standard and adds a dual-phase material measurement guide

Typical application cases

The test of a nickel-based high-temperature alloy showed that the grain size measured by the traditional method was 15.2±2.1μm, while that measured by the EBSD method was 14.8±0.9μm, and the data dispersion was reduced by 57%.

Implementation recommendations

Deformed materials require Kuwahara filtering
It is recommended to use a hexagonal scanning grid (12% more accurate than a square grid)
The report should include a comparison of the original data with the processed data

Uncertainty control

Main sources of error:

Sample tilt angle error 1° → step size error 5%
Data cleaning results in dimensional deviation ≤6%
It is recommended to regularly calibrate the SEM magnification (according to ISO 16700)

More samples: NB/T 47013.2-2015 QC/T 942-2021 YD/T 3934-2021

Sample only — not a preview of GB/T 38532-2020

Loading PDF document...

Error loading PDF. Please make sure the file is valid and try again.

We also recommend

GB 9395.1-1988 in English

Potassium silicate solution for use in electronic industry-Generality for analytical methods
-
GB 50704-2011 in English

Code for Design of Crystalian Silicon Solar Cell Plant
2011-07-26
GB/T 38353-2019 in English

Specification for construction and management of public toilets in rural area
2019-12-31
GB/T 3757-2008 in English

24° cone connectors - Weld-in bulkhead straight connector
2008-05-07
GB 16999-2010 in English

Universal technical requirements of RMB—Banknote discriminating device
2010-09-26
GB 39220-2020 in English

Limits and monitor ing methods of total electric field of DC transmi ssion project
2020-05-20
GB 9028.1-1988 in English

performance requirements for meteorogical facsimile (analogue)
-
GB/T 17766-2020 in English

Classifications for mineral resources and mineral reserves
2020-03-31
GB/T 15105-2024 in English

Molding products from wood particles
2024-03-15
GB/T 13181-2024 in English

Methods of performance measurement for solid scintilators
2024-05-28