low energy electron diffraction

low energy electron diffraction, Total:96 items.

The international standard classification for "low energy electron diffraction" includes: Physicochemical methods of analysis , Other methods of testing of metals , Other standards related to analytical chemistry , Other standards related to protection against fire , Chemical analysis .

The Chinese standard classification for "low energy electron diffraction" includes: Basic standards and general methods , Metallographic testing method , Electrochemical, thermochemistry and optical profile type analyzer , Fire-fighting in general .

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 36165-2018 Determination of average grain size of metal—Electron backscatter diffraction (EBSD)method
GB/T 19501-2004 General guide for electron backscatter diffraction analysis
GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes
GB/T 18907-2013 Microbeam analysis—Analytical electron microscopy—Selected-area electron diffraction analysis using a transmission electron microscope
GB/T 30703-2014 Microbeam analysis―Guidelines for orientation measurement using electron backscatter diffraction
GB/T 19501-2013 Microbeam analysis—General guide for electron backscatter diffraction analysis
GB/T 20724-2006 Method of thickness measurement for thin crystal by convergent beam electron diffraction
GB/T 38532-2020 Microbeam analysis—Electron backscatter diffraction—Measurement of average grain size

Shanghai Provincial Standard of the People's Republic of China

DB31/T 1156-2019 The identification of electrical fire melted mark—Electronic back scattering diffraction method

工业和信息化部

YB/T 4677-2018 Precision seamless steel tubes for motorcycle shock absorber

Professional Standard - Non-ferrous Metal

YS/T 1652-2023 Texture testing of zirconium and zirconium alloy— Electron backscatter diffraction method

未注明发布机构

DIN ISO 13067 E:2021-01 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size
DIN EN ISO 15902 E:2019-10 Optics and Photonics Diffractive Optics Glossary (Draft)

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 41076-2021 Microbeam analysis—Electron backscatter diffraction—Quantitative determination of austenite in steel
GB/T 20724-2021 Microbeam analysis—Method of thickness measurement for thin crystals by convergent beam electron diffraction

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 34172-2017 Microbeam analysis--Electron backscatter diffraction--Phase analysis method of metal and alloy

Professional Standard - Nuclear Industry

EJ/T 805-1993 Low Energy Photon Sources for X-ray Fluorescence Analysis

Group Standards of the People's Republic of China

T/CSTM 00922-2024 Determination of grain orientation of electrical steel strip ( sheet )for power transformer—Electron backscatter diffraction (EBSD) method

Professional Standard - Energy

NB/SH/T 6033-2021 Standard test method for determination of the unit cell dimension of zeolite ZSM-22 X-ray Diffraction
NB/SH/T 6024-2021 Standard test method for determination of relative crystallinity of zeolite ZSM-5 X-ray diffraction
NB/SH/T 6015-2020 Standard test method for determination of lattice parameters of zeolite ZSM-23 by X-ray diffraction

Professional Standard - Electron

SJ 20566-1996 Methods of measurement of electrical performance for LF/VLF transmiters

United States Navy

NAVY UFGS-01 33 29-2010 LEED(TM) DOCUMENTATION

International Organization for Standardization (ISO)

ISO/CD 23699 Microbeam Analysis — Electron Backscattered Electron Diffraction — Vocabulary
ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
ISO/DIS 25498:2024 Microbeam analysis-Analytical electron microscopy-Selected area electron diffraction analysis using a transmission electron microscope
ISO 13067:2011 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size
ISO 23749:2022 Microbeam analysis — Electron backscatter diffraction — Quantitative determination of austenite in steel
ISO 13067:2020 Microbeam analysis — Electron backscatter diffraction — Measurement of average grain size
ISO 19830:2015 Surface chemical analysis - Electron spectroscopies - Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
ISO/DIS 24173:2023 Microbeam analysis — Guidelines for orientation measurement using electron backscatter diffraction
ISO 24173:2009 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction
ISO 15902:2004 Optics and photonics - Diffractive optics - Vocabulary
ISO 15902:2019 Optics and photonics — Diffractive optics — Vocabulary
ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
ISO 25498:2018 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
ISO/TTA 3:2001 Polycrystalline materials - Determination of residual stresses by neutron diffraction

Association Francaise de Normalisation

NF ISO 24173:2009 Microbeam Analysis - Guidelines for Orientation Measurement by Backscattered Electron Diffraction
NF X21-014:2012 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size.
NF X21-011*NF ISO 24173:2009 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction
NF EN ISO 15902:2020 Optique et photonique - Optique diffractive - Vocabulaire
NF S10-133*NF EN ISO 15902:2020 Optics and photonics - Diffractive optics - Vocabulary
NF M60-517-2:1998 Reference sources for the calibration of surface contamination monitors. Part 2 : electrons of energy less than 0,15 MeV and photons of energy less than 1,5 MeV.

RU-GOST R

GOST 25645.155-1991 Radiation in geomagnetic field. Model of low energy protons and electrons streams

British Standards Institution (BSI)

BS ISO 25498:2018 Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
BS ISO 13067:2020 Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size
BS ISO 13067:2011 Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size
BS ISO 23749:2022 Microbeam analysis. Electron backscatter diffraction. Quantitative determination of austenite in steel
24/30479937 DC BS ISO 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
BS ISO 19830:2015 Surface chemical analysis. Electron spectroscopies. Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
BS EN ISO 15902:2005 Optics and photonics - Diffractive optics - Vocabulary
BS ISO 24173:2024 Microbeam analysis. Guidelines for orientation measurement using electron backscatter diffraction
BS EN ISO 15902:2020 Optics and photonics. Diffractive optics. Vocabulary
BS ISO 24173:2009 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction
BS ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
19/30365236 DC BS ISO 13067. Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size
21/30398224 DC BS ISO 23749. Microbeam analysis. Electron backscatter diffraction. Quantitative determination of austenite in steel
23/30435799 DC BS ISO 24173. Microbeam analysis. Guidelines for orientation measurement using electron backscatter diffraction

German Institute for Standardization

DIN ISO 13067:2021-08 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size (ISO 13067:2020)
DIN EN ISO 15902:2020-05 Optics and photonics - Diffractive optics - Vocabulary (ISO 15902:2019); German version EN ISO 15902:2020
DIN ISO 24173:2013-04 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction (ISO 24713:2009)
DIN ISO 13067:2015 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size (ISO 13067:2011)
DIN EN ISO 15902:2005 Optics and photonics - Diffractive optics - Vocabulary (ISO 15902:2004); German version EN ISO 15902:2005
DIN ISO 13067:2021 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size (ISO 13067:2020)

GSO

BH GSO ISO 25498:2017 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
OS GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
OS GSO ISO 13067:2015 Microbeam analysis -- Electron backscatter diffraction -- Measurement of average grain size
GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
GSO ISO 13067:2015 Microbeam analysis -- Electron backscatter diffraction -- Measurement of average grain size
GSO ISO 24173:2015 Microbeam analysis -- Guidelines for orientation measurement using electron backscatter diffraction
GSO ISO 19830:2016 Surface chemical analysis -- Electron spectroscopies -- Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
BH GSO ISO 19830:2017 Surface chemical analysis -- Electron spectroscopies -- Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
OS GSO ISO 15902:2013 Optics and photonics -- Diffractive optics -- Vocabulary
BH GSO ISO 15902:2016 Optics and photonics -- Diffractive optics -- Vocabulary
GSO ISO 15902:2013 Optics and photonics -- Diffractive optics -- Vocabulary
NB/SH/T 6058-2022 Determination of relative crystallinity of ZSM-22 molecular sieve by X-ray diffraction method

Korean Agency for Technology and Standards (KATS)

KS B ISO 15902:2008 Optics and photonics-Diffractive optics-Vocabulary
KS B ISO 15902:2018 Optics and photonics — Diffractive optics — Vocabulary
KS B ISO 15902:2013 Optics and optical instruments ― DiffrN optics ― Vocabulary
KS A ISO 7503-3:2003 Evaluation of surface contamination－Part 3：Isomeric transition and electron capture emitters, low energy beta-emitters(E βmax < 0.15 MeV)

SCC

DANSK DS/ISO 15902:2020 Optics and photonics – Diffractive optics – Vocabulary
BS ISO 15902:2004 Optics and photonics. Diffractive optics. Vocabulary
10/30195133 DC BS ISO 13067. Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size
08/30133935 DC ISO 24173. Microbeam analysis. Guidelines for orientation measurement using electron backscatter diffraction
AWWA 51768 Identification of Low Pressure Reverse Osmosis Membrane Failure by X-Ray Photoelectron Spectroscopy
DANSK DS/EN ISO 15902:2020 Optics and photonics – Diffractive optics – Vocabulary (ISO 15902:2019)
NS-EN ISO 15902:2020 Optics and photonics — Diffractive optics — Vocabulary (ISO 15902:2019)

ES-UNE

UNE-EN ISO 15902:2020 Optics and photonics - Diffractive optics - Vocabulary (ISO 15902:2019) (Endorsed by Asociación Española de Normalización in February of 2020.)

Danish Standards Foundation

DS/EN ISO 15902:2005 Optics and photonics - Diffractive optics - Vocabulary

European Committee for Standardization (CEN)

EN ISO 15902:2020 Optics and photonics - Diffractive optics - Vocabulary (ISO 15902:2019)

CEN - European Committee for Standardization

EN ISO 15902:2005 Optics and photonics - Diffractive optics - Vocabulary

KR-KS

KS B ISO 15902-2018 Optics and photonics — Diffractive optics — Vocabulary
KS B ISO 15902-2023 Optics and photonics — Diffractive optics — Vocabulary

IET - Institution of Engineering and Technology

THEO EDGE DIFF ELECTRO-2009 Theory of Edge Diffraction in Electromagnetics: Origination and validation of the physical theory of diffraction
GEOMET THEO DIFF ELECTRO WAV-1979 Geometrical Theory of Diffraction for Electromagnetic Waves

American Gear Manufacturers Association

AGMA 08FTM12-2008 In-situ Measurement of Stresses in Carburized Gears via Neutron Diffraction

Others: low energy electron diffraction,Low Energy Electron Diffraction and High Energy Electron Diffraction