GB/T 34172-2017 in English

VALID

Microbeam analysis--Electron backscatter diffraction--Phase analysis method of metal and alloy

Issued on:2017-09-07
Implemented on:2018-08-01
File Format:PDF
Delivery:Via email within 1~3 business days

Price(USD)： $220.00
$214.00

Standard No:	GB/T 34172-2017
Document status:	VALID
Title in English:	Microbeam analysis--Electron backscatter diffraction--Phase analysis method of metal and alloy
Title in Chinese:	微束分析电子背散射衍射金属及合金的相分析方法
Language:	English
File Format:	Electronic (PDF)
Delivery:	Via email within 1~3 business days
Issued on:	2017-09-07
Implemented on:	2018-08-01
ICS Classification:	71.040.40-Chemical analysis
Chinese Classification:	G04-Basic standards and general methods
Professional Classification:	GB-National Standard
Related Keywords:	microbeam analysis electron backscatter diffraction phase analysis method electron backscatter diffraction alloys introduction electron backscatter diffraction phase analysis method analysis method
Related Topics:	Secondary electron diffraction Electron Diffraction Secondary Diffraction electron backscatter electron backscatter Analyze heavy metals backscatter Metallographic Analysis System Metallographic Analysis System Electron Backscatter Diffraction System Electron Backscatter Diffraction System Analyzing Metallic Second Phases backscatter diffraction electron second diffraction backscattered phase Secondary electron diffraction analysis semi-microanalysis Diffraction peak analysis Handheld Backscatter Electron Diffraction Secondary Diffraction Secondary electron diffraction Metallographic test analysis Analytical metallography Atomic Scale Dispersion of Metals Backscatter vs Backscatter backscattered field electron diffraction scattering Analytical method derivatization By analyzing the diffraction peaks electron backscatter electron diffraction phase ebsd phase dual beam analysis rescattering of electrons Handheld Backscatter Metal Flow Analysis How to analyze electron diffraction Sodium Metal Analysis neutron diffraction lithium metallographic analysis Metal Microbeam Analysis Backscattered electron diffraction analysis micro-diffraction Metallographic analysis 6 non-metal elements What phase is backscattered Trinocular metallographic analysis electron scattering metallographic analysis Metal Microanalysis metallographic analysis Secondary electrons and backscattered electrons Instrument metallographic analysis Metallographic analysis method Diffraction Semiquantitative Phase Analysis Metallographic analysis method backscattered lithium diffracted beam in electron microscope Metallographic Analysis Series Metallographic Analysis Series electronic back Normal phase analysis or reversed phase analysis For metallographic analysis backscatter Metallographic Analysis of Metals molecular mutual gold Electron Diffraction and Electron Scattering phase diffraction surface Heavy metal trace analyzer Heavy metal trace analyzer solid phase analysis Secondary Diffraction, Electron Diffraction secondary electron scattering molecular scattering Scattering Diffraction Neutron Diffraction Peaks Electron Diffraction Microdisk Diffraction half-point analysis Diffraction semi-quantitative analysis electron backscattered electrons How to analyze electron diffraction molecular metal Application of Metallographic Analysis Metal Correlation Analysis Backscatter of the first kind electron diffraction disorder electron light scattering Metallographic analysis method How to analyze electron backscatter diffraction Scattering Diffraction low energy electron diffraction Backscatter sample preparation equipment backscattered phase analysis Backscatter sample preparation equipment Metallographic analysis trinocular complex scattering Metal Flow Analysis Alloy Diffraction Peak gold scattering backscattered electron phase double scattered electrons forward scatter and back scatter backscattered electron phase scatter autocorrelation Domestic Neutron Diffraction Method backscattered phase analysis How to analyze electron diffraction Scattering and Diffraction microbeam electron diffraction Secondary Electron Diffraction Electron secondary electron backscattered electrons Metallographic analysis method Derivative analysis method Alloy Diffraction Peaks gold diffraction peaks Secondary electrons and backscattering Backscattering and Secondary Electrons Basis for Metallographic Analysis backscattering and rescattering How to analyze the diffraction double beam metallographic instrument Metallographic analysis method Analysis method of titanium metal How is diffraction graded Secondary Diffraction Analysis Application of metallographic structure analysis backscattered electron diffraction scattered by electrons Metal Analyzer Metal Analyzer Electron bulk Substance Metal Analysis backscattered secondary Analysis method of titanium metal back shot three-point diffraction Diffraction Analysis Spectral Analysis Qualitative Analysis Metal structure analysis How to analyze metallographic Differential Hot Pressure Analysis backscatter backscatter metal electron scattering Neutron Diffraction Sample Preparation Backscatter Backscattering and Secondary Electrons primary diffracted beam Alloy Diffraction Peak Electron Scattering and Electron Diffraction metallographic analysis Transmission analysis method Electron Scatterer electron diffraction together electron diffraction? secondary electron backscattering Electron Diffraction and Electron Diffraction electron scattering electron diffraction Electron Diffraction and Scattering backscattered electrons secondary electrons Backscattering, secondary electrons Secondary electrons and backscattered electrons GBT34172 GB/T 34172-2017 Fracture metallographic analysis The difference between backscattered electrons and secondary electrons Aluminum alloy XRD diffraction metal precipitation phase Metallographic analysis technology BSE backscattered electrons X-ray diffraction micro analysis nanobeam electron diffraction Error analysis of light diffraction experiment Principles and methods of electron diffraction Pretreatment methods for analyzing trace metals in pharmaceuticals Microplastic Analysis Methods Electronic nose analysis method Analytical methods for organometallic complexes Metallographic diagram analysis backscatter enterprise The linearity of the liquid phase analysis method does not meet the requirements Advantages and Disadvantages of Metal Analysis Methods in Water Diffraction analysis sampling Single crystal diffraction analysis method Analytical method specificity Metallographic analysis and testing Metal fracture analysis Analysis method of electronic tongue Analytical Methods of Electronic Tongue Technology Methods for measuring metal dispersion and analysis of advantages and disadvantages Electronic nose analysis method? Qualitative analysis method of electronic tongue Metallographic analysis and testing charges Preparation method of electron diffraction sample The preparation methods of polymer alloys can be divided into:

《GB/T 34172-2017微束分析电子背散射衍射金属及合金的相分析方法》由TC38（全国微束分析标准化技术委员会）归口，主管部门为国家标准化管理委员会。

Introduction

National Standard of the People's Republic of China GB/T 34172—2017

Microbeam Analysis Electron Backscatter Diffraction Phase Analysis Method for Metals and Alloys

Introduction

Electron backscatter diffraction (EBSD) is an analysis method based on the electron beam in a scanning electron microscope (SEM) or a focused ion beam (SEM-FIB) exciting backscattered electrons on the inclined sample surface and diffracting through the surface atoms of the sample to form Kikuchi bands. This technology is widely used in the study of crystal structure, phase distribution and orientation relationship of metal and alloy materials.

GB/T 34172—2017 standard provides unified technical specifications for the application of EBSD in metals and alloys, including parameter correction, data acquisition and analysis methods.

Scope of application

Applicable to the phase qualitative and quantitative analysis of metal and alloy samples by EBSD technology.
Standardizes parameter calibration and data acquisition methods to ensure the accuracy and reliability of the results.
EBSD phase analysis of other polycrystalline or single crystal materials can be performed for reference.

Standard dimensions	GB/T 34172—2017 requirements	International comparison
Sample preparation	The surface is flat and clean, without deformation layer and oxidation pollution.	Consistent with international standard requirements.
Accelerating voltage range	15~30 kV	In line with the international recommended range.
Step size selection	It is recommended to take 1/10 of the average grain size of the sample.	Similar to ASTM standard.

Implementation suggestions

1. Parameter optimization:Adjust the accelerating voltage, beam current and working distance according to the characteristics of the sample to ensure data quality.

2. Data acquisition:Preferably use high-quality CCD pixel integration (such as 1×1 or 2×2) to improve the resolution of the diffraction pattern.

3. Background correction:Use low-magnification rapid scanning to obtain background information to ensure the quality of EBSP.

4. Quantitative analysis:Combined with EDS/WDS element analysis results, the reliability of phase identification is improved.

Conclusion

GB/T 34172—2017 provides comprehensive technical specifications for the application of EBSD technology in metals and alloys, and clearly defines the requirements for the entire process from sample preparation to data processing. Following this standard can effectively improve the accuracy and consistency of phase analysis results.

It is recommended to optimize parameter settings in combination with specific material properties in actual operation, and to ensure system stability by regularly calibrating the equipment.

More samples: NB/T 47013.2-2015 JGJ 94-2008 QC/T 942-2021

Sample only — not a preview of GB/T 34172-2017

Loading PDF document...

Error loading PDF. Please make sure the file is valid and try again.

We also recommend

GB/T 25187-2024 in English

Surface chemical analysis—Auger electron spectroscopy—Description of selected instrumental performance parameters
2024-11-28
GB/T 22461.3-2026 in English

Surface chemical analysis—Vocabulary—Part 3: Terms used in optical interface analysis
2026-01-28
GB/T 29556-2013 in English

Surface chemical analysis—Auger electron spectroscopy and X-ray photoelectron spectroscopy—Determination of lateral resolution,analysis area, and sample area viewed by the analyser
2013-07-19
GB/T 15244-2013 in English

Microbeam analysis—Quantitative analysis of silicate glass by wavelength dispersive X-ray spectrometry and energy dispersive X-ray spectrometry
2013-07-19
GB/T 34002-2017 in English

Microbeam analysis―Analytical transmission electron microscopy―Methods for calibrating image magnification by using reference materials having periodic structures
2017-07-12
GB/T 25184-2010 in English

Verification method for X-ray photoelectron spectrometers
2010-09-26