Electron Diffraction Secondary Diffraction

Electron Diffraction Secondary Diffraction, Total:198 items.

The international standard classification for "Electron Diffraction Secondary Diffraction" includes: Physicochemical methods of analysis , Other methods of testing of metals , Other standards related to analytical chemistry , Particle size analysis. sieving , Radiation protection , Pigments and extenders , Non-destructive testing , Chemical analysis of metals , Other standards related to optics and optical measurements , Optical measuring instruments , Other standards related to protection against fire , Chemical analysis , Cosmetics. Toiletries , Springs , Refractories , Protection against crime .

The Chinese standard classification for "Electron Diffraction Secondary Diffraction" includes: Basic standards and general methods , Metallographic testing method , Electrochemical, thermochemistry and optical profile type analyzer , Sieving, Sieve Plate and Sieve Screen , Powder metallurgy analysis method , Radiological sanitation protection , Basic standard and general method for pigment , Basic standards and general methods , Metal physical property test method , Electron optics and other physical optics instrument , Fire-fighting in general , Cosmetics , Spring , Office supplies and office implements , Siliceous refractory , Crime judging technology .

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 43690-2024 Test method for diffraction efficiency of imaging diffractive optical elements
GB/T 26140-2023 Non-destructive testing—Standard test method for determining residual stresses by neutron diffraction
GB/T 19501-2013 Microbeam analysis—General guide for electron backscatter diffraction analysis
GB/T 20724-2006 Method of thickness measurement for thin crystal by convergent beam electron diffraction
GB/T 38532-2020 Microbeam analysis—Electron backscatter diffraction—Measurement of average grain size
GB/T 19077-2016 Particle size analysis―Laser diffraction methods
GB/T 26140-2010 Non-destructive testing—Standards test method for determining residual stresses by neutron diffraction
GB/T 36165-2018 Determination of average grain size of metal—Electron backscatter diffraction (EBSD)method
GB/T 30703-2014 Microbeam analysis―Guidelines for orientation measurement using electron backscatter diffraction
GB/T 18907-2013 Microbeam analysis—Analytical electron microscopy—Selected-area electron diffraction analysis using a transmission electron microscope
GB/T 5225-1985 Metal materials－Quantitative phase analysis－Value Kmethod of X-ray diffraction
GB/T 30793-2014 Measuring ratio of anatase to rutile in titanium dioxide pigments by X-ray diffraction
GB 16355-1996 Radiation protection standards for X-ray diffraction and fluorescence analysis equipment
GB/T 19077.1-2003 Particle size analysis-Laser diffraction method
GB/T 19501-2004 General guide for electron backscatter diffraction analysis
GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes

Professional Standard - Agriculture

57药典四部-2020 0451 X-ray diffraction method
784兽药典一部-2015 Appendix Contents 0400 Spectroscopy 0451 X-ray Diffraction
2355药典二部-2010 Appendix IX FX-Ray Powder Diffraction Method
SN/T 5579-2023 Determination of the graphitization degree of carbon materials - X-ray diffraction method
77药典四部-2015 0451 X-ray diffraction method

Professional Standard - Machinery

JB/T 9400-2010 Specification of X-ray diffractometer
JB/T 8239.2-1999 Specification for diffraction grating
JB/T 11144-2011 X-ray diffractometer
JB/T 9400-1999 Specification for X-ray diffractometer
JB/T 8239.1-1999 Basic parameters for diffraction grating

工业和信息化部

HG/T 5705-2020 Determination of titanium dioxide phase concent in hydrogenation catalysts- X-ray diffractometry
YB/T 4677-2018 Precision seamless steel tubes for motorcycle shock absorber
YS/T 1178-2017 Phase analysis for aluminum slag-X-ray diffraction spectroscopy
YS/T 1160-2016 Silicon powder-quantitative phase analysis. Determination of silicon dioxide content. Value K method of X-ray diffraction
SH/T 1827-2019 Plastics - Determination of crystallinity - X-ray diffractometry
YB/T 172-2020 Phase quantitative analysis of silica bricks-X-ray diffraction method
YB/T 5338-2019 Quantitative determination of austenite in steel X-ray diffractometer method

Shanghai Provincial Standard of the People's Republic of China

DB31/T 1156-2019 The identification of electrical fire melted mark—Electronic back scattering diffraction method

Professional Standard - Non-ferrous Metal

YS/T 1652-2023 Texture testing of zirconium and zirconium alloy— Electron backscatter diffraction method

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 20724-2021 Microbeam analysis—Method of thickness measurement for thin crystals by convergent beam electron diffraction
GB/T 39520-2020 Test method for determination the residual stress of spring by X-ray diffraction
GB/T 41076-2021 Microbeam analysis—Electron backscatter diffraction—Quantitative determination of austenite in steel
GB/T 36923-2018 Identification of pearl powder—X-ray diffraction analysis

Professional Standard - Energy

NB/SH/T 6033-2021 Standard test method for determination of the unit cell dimension of zeolite ZSM-22 X-ray Diffraction
NB/SH/T 0339-2021 Standard test method for determination of the unit cell dimension of faujasite-type zeolite by X-ray diffraction
NB/SH/T 6024-2021 Standard test method for determination of relative crystallinity of zeolite ZSM-5 X-ray diffraction
NB/SH/T 6015-2020 Standard test method for determination of lattice parameters of zeolite ZSM-23 by X-ray diffraction

National Metrological Verification Regulations of the People's Republic of China

JJG 629-2014 Polycrystalline X-Ray Diffractometers
JJG 629-1989 Polycrystalline X-ray Diffractometer
JJG(地质) 1014-1990 Verification Regulations for Polycrystalline X-ray Diffractometer

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 34172-2017 Microbeam analysis--Electron backscatter diffraction--Phase analysis method of metal and alloy

Professional Standard - Education

JY 141-1982 Demonstration Instrument for Interference, Diffraction and Polarization of Light
JY/T 0587-2020 General rules for X-ray polycrystalline diffractometry

Professional Standard - Ferrous Metallurgy

YB/T 172-2000 Phase quantitative analysis of silica bricks-X-ray diffraction method

国家质量监督检验检疫总局

SN/T 4760-2017 Identification of import zinc concentrates-X-ray diffraction method

National Metrological Technical Specifications of the People's Republic of China

JJF 1967-2022 Calibration Specification for Reflection Gratings by Laser Diffraction

Professional Standard - Public Safety Standards

GA/T 2079-2023 Forensic sciences-Examination methods for minerals-X-ray diffractometry

Group Standards of the People's Republic of China

T/CSTM 00922-2024 Determination of grain orientation of electrical steel strip ( sheet )for power transformer—Electron backscatter diffraction (EBSD) method

Professional Standard - Commodity Inspection

SN/T 3975-2014 Identification method of bauxite - X ray diffractometry

水利部

SL 536-2011 Standard test method for verifying the alignment of X-ray diffraction instrumentation for residual stress measurement

Professional Standard - Nuclear Industry

EJ/T 553-1991 Determination of Mineral Cell Parameters Powder X-ray Diffraction Method

International Organization for Standardization (ISO)

ISO/CD 23699 Microbeam Analysis — Electron Backscattered Electron Diffraction — Vocabulary
ISO 13067:2011 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size
ISO 15902:2004 Optics and photonics - Diffractive optics - Vocabulary
ISO 15902:2019 Optics and photonics — Diffractive optics — Vocabulary
ISO 23749:2022 Microbeam analysis — Electron backscatter diffraction — Quantitative determination of austenite in steel
ISO 13067:2020 Microbeam analysis — Electron backscatter diffraction — Measurement of average grain size
ISO/DIS 24173:2023 Microbeam analysis — Guidelines for orientation measurement using electron backscatter diffraction
ISO 24173:2009 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction
ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
ISO/DIS 25498:2024 Microbeam analysis-Analytical electron microscopy-Selected area electron diffraction analysis using a transmission electron microscope
ISO/TTA 3:2001 Polycrystalline materials - Determination of residual stresses by neutron diffraction
ISO 13320:2020 Particle size analysis — Laser diffraction methods
ISO 13320:2009 Particle size analysis - Laser diffraction methods
ISO/CD TS 5973.2:2023 Good practice for laser diffraction measurements
ISO 15902:2004/cor 1:2005 Optics and photonics - Diffractive optics - Vocabulary; Technical Corrigendum 1
ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
ISO/CD TS 5973 Good practice for laser diffraction measurements
ISO 25498:2018 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope

United States Navy

NAVY UFGS-01 33 29-2010 LEED(TM) DOCUMENTATION

ITU-R - International Telecommunication Union/ITU Radiocommunication Sector

ITU-R P.526-2-1992 Propagation by Diffraction
ITU-R P.526-7-2001 Propagation by Diffraction
ITU-R P.526-4-1995 Propagation by Diffraction
ITU-R P.526-12-2012 Propagation by diffraction
ITU-R P.526-3-1994 Propagation by Diffraction
ITU-R P.526-5-1997 Propagation by Diffraction
ITU-R P.526-14-2018 Propagation by diffraction
ITU-R P.526-9-2005 Propagation by diffraction
ITU-R P.526-6-1999 Propagation by Diffraction
ITU-R P.526-8-2003 Propagation by diffraction (Question ITU-R 202/3)

SCC

ITU-R P.526-15-2019 Propagation by diffraction
DANSK DS/ISO 15902:2020 Optics and photonics – Diffractive optics – Vocabulary
BS ISO 15902:2004 Optics and photonics. Diffractive optics. Vocabulary
VDI/VDE 5575 BLATT 10-2019 X-ray optical systems - diffraction gratings
DANSK DS/ISO 13320:2020 Particle size analysis – Laser diffraction methods
10/30195133 DC BS ISO 13067. Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size
DANSK DS/EN ISO 15902:2020 Optics and photonics – Diffractive optics – Vocabulary (ISO 15902:2019)
NS-EN ISO 15902:2020 Optics and photonics — Diffractive optics — Vocabulary (ISO 15902:2019)
08/30133935 DC ISO 24173. Microbeam analysis. Guidelines for orientation measurement using electron backscatter diffraction
DIN ISO 24173 E:2012 Draft Document - Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction (ISO 24713:2009)

International Telecommunication Union (ITU)

ITU-R P.526-2013 Propagation by diffraction
ITU-R P.526-11-2009 Propagation by diffraction
ITU-R P.526-11 SPANISH-2009 Propagation by diffraction Propagaci髇 por difracci髇
ITU-R P.526-11 FRENCH-2009 Propagation by diffraction Propagation par diffraction
ITU-R P.526-10-2007 Propagation by diffraction

PT-IPQ

E E 14-1971 X-ray diffraction analysis

Association Francaise de Normalisation

NF ISO 24173:2009 Microbeam Analysis - Guidelines for Orientation Measurement by Backscattered Electron Diffraction
NF X21-014:2012 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size.
NF EN ISO 15902:2020 Optique et photonique - Optique diffractive - Vocabulaire
NF S10-133*NF EN ISO 15902:2020 Optics and photonics - Diffractive optics - Vocabulary
NF X21-011*NF ISO 24173:2009 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction

Korean Agency for Technology and Standards (KATS)

KS M 0043-2009 General rules for X-ray diffractometric analysis
KS B ISO 15902:2008 Optics and photonics-Diffractive optics-Vocabulary
KS B ISO 15902:2018 Optics and photonics — Diffractive optics — Vocabulary
KS B ISO 15902:2013 Optics and optical instruments ― DiffrN optics ― Vocabulary
KS M 0043-2019 General rules for X-ray diffractometric analysis
KS M 0043-2009(2019) General rules for X-ray diffractometric analysis
KS A ISO 13320:2022 Particle size analysis — Laser diffraction methods
KS A ISO 13320-2014(2019) Particle size analysis — Laser diffraction methods

German Institute for Standardization

DIN ISO 13067:2021-08 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size (ISO 13067:2020)
DIN EN ISO 15902:2020-05 Optics and photonics - Diffractive optics - Vocabulary (ISO 15902:2019); German version EN ISO 15902:2020
DIN ISO 13067 E:2021-01 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size
DIN EN ISO 15902:2005 Optics and photonics - Diffractive optics - Vocabulary (ISO 15902:2004); German version EN ISO 15902:2005
DIN ISO 24173:2013-04 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction (ISO 24713:2009)
DIN ISO 13067:2015 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size (ISO 13067:2011)
DIN EN ISO 15902 E:2019-10 Optics and Photonics Diffractive Optics Glossary (Draft)
DIN ISO 13067:2021 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size (ISO 13067:2020)
DIN ISO 13320:2022-12 Particle size analysis - Laser diffraction methods (ISO 13320:2020)
DIN ISO 13320 E:2022-05 Particle size analysis - Laser diffraction methods
DIN EN ISO 15902:2020 Optics and photonics - Diffractive optics - Vocabulary (ISO 15902:2019)
DIN ISO 24173:2013 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction (ISO 24713:2009)
DIN ISO 13320:2022 Particle size analysis - Laser diffraction methods (ISO 13320:2020)

IET - Institution of Engineering and Technology

THEO EDGE DIFF ELECTRO-2009 Theory of Edge Diffraction in Electromagnetics: Origination and validation of the physical theory of diffraction
GEOMET THEO DIFF-1994 Geometrical Theory of Diffraction
GEOMET THEO DIFF ELECTRO WAV-1979 Geometrical Theory of Diffraction for Electromagnetic Waves
APRT ANT DIFF THEO-1981 Aperture Antennas and Diffraction Theory

GSO

OS GSO ISO 13067:2015 Microbeam analysis -- Electron backscatter diffraction -- Measurement of average grain size
OS GSO ISO 15902:2013 Optics and photonics -- Diffractive optics -- Vocabulary
BH GSO ISO 15902:2016 Optics and photonics -- Diffractive optics -- Vocabulary
GSO ISO 13067:2015 Microbeam analysis -- Electron backscatter diffraction -- Measurement of average grain size
GSO ISO 15902:2013 Optics and photonics -- Diffractive optics -- Vocabulary
GSO ISO 24173:2015 Microbeam analysis -- Guidelines for orientation measurement using electron backscatter diffraction
NB/SH/T 6058-2022 Determination of relative crystallinity of ZSM-22 molecular sieve by X-ray diffraction method
BH GSO ISO 25498:2017 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
OS GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
BH GSO ISO 13320:2016 Particle size analysis -- Laser diffraction methods
GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
NB/SH/T 0972-2018 Determination of unit cell parameters of SAPO-11 molecular sieve by powder X-ray diffraction method
GSO ISO 13320:2013 Particle size analysis -- Laser diffraction methods
OS GSO ISO 13320:2013 Particle size analysis -- Laser diffraction methods
NB/SH/T 0971-2018 Determination of relative crystallinity of SAPO-11 molecular sieve by powder X-ray diffraction method
ISO/TS 5973:2024 Laser diffraction measurements — Good practice

Spanish Association for Standardization (UNE)

UNE-EN ISO 15902:2020 Optics and photonics - Diffractive optics - Vocabulary (ISO 15902:2019) (Endorsed by Asociación Española de Normalización in February of 2020.)
UNE-EN ISO 15902:2007 Optics and photonics - Diffractive optics - Vocabulary (ISO 15902:2004)

British Standards Institution (BSI)

BS EN ISO 15902:2005 Optics and photonics - Diffractive optics - Vocabulary
BS EN ISO 15902:2020 Optics and photonics. Diffractive optics. Vocabulary
BS ISO 13067:2020 Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size
BS ISO 13067:2011 Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size
BS ISO 23749:2022 Microbeam analysis. Electron backscatter diffraction. Quantitative determination of austenite in steel
BS ISO 24173:2024 Microbeam analysis. Guidelines for orientation measurement using electron backscatter diffraction
BS ISO 24173:2009 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction
BS ISO 25498:2018 Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
BS ISO 13320:2020 Particle size analysis. Laser diffraction methods
19/30365236 DC BS ISO 13067. Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size
21/30398224 DC BS ISO 23749. Microbeam analysis. Electron backscatter diffraction. Quantitative determination of austenite in steel
23/30435799 DC BS ISO 24173. Microbeam analysis. Guidelines for orientation measurement using electron backscatter diffraction
BS ISO 13320:2009 Particle size analysis - Laser diffraction methods
24/30479937 DC BS ISO 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
BS ISO 13320:2010 Particle size analysis. Laser diffraction methods
BS EN ISO/IEC 15408-4:2023 Information security, cybersecurity and privacy protection. Evaluation criteria for IT security - Framework for the specification of evaluation methods and activities
BS ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
19/30333249 DC BS ISO 13320. Particle size analysis. Laser diffraction methods

Danish Standards Foundation

DS/EN ISO 15902:2005 Optics and photonics - Diffractive optics - Vocabulary
DS/ISO 13320:2009 Particle size analysis - Laser diffraction methods

European Committee for Standardization (CEN)

EN ISO 15902:2020 Optics and photonics - Diffractive optics - Vocabulary (ISO 15902:2019)

CEN - European Committee for Standardization

EN ISO 15902:2005 Optics and photonics - Diffractive optics - Vocabulary

KR-KS

KS B ISO 15902-2018 Optics and photonics — Diffractive optics — Vocabulary
KS B ISO 15902-2023 Optics and photonics — Diffractive optics — Vocabulary
KS A ISO 13320-2022 Particle size analysis — Laser diffraction methods

Association of German Mechanical Engineers

VDI/VDE 5575 Blatt 10-2015 X-ray optical systems - Diffraction gratings

VDI - Verein Deutscher Ingenieure

VDI/VDE 5575 Blatt 10-2014 Roentgenoptische Systeme - Beugungsgitter

American Society for Testing and Materials (ASTM)

ASTM UOP905-08 Platinum Agglomeration by X-Ray Diffraction
ASTM UOP905-91 Platinum Agglomeration by X-Ray Diffraction
ASTM UOP905-20 Platinum Agglomeration by X-Ray Diffraction

Universal Oil Products Company (UOP)

UOP 905-2008 Platinum Agglomeration by X-Ray Diffraction

Society of Automotive Engineers (SAE)

SAE J784-1971 Residual Stress Measurement by X-Ray Diffraction
SAE HS-784-2003 SAE Residual Stress Measurement by X-Ray Diffraction, 2003 Edition

SAE - SAE International

SAE J784A-1971 Residual Stress Measurement by X-Ray Diffraction

Japanese Industrial Standards Committee (JISC)

JIS Z 8825:2022 Particle size analysis -- Laser diffraction methods
JIS Z 8825:2013 Particle size analysis.Laser diffraction methods
JIS K 0131:1996 General rules for X-ray diffractometric analysis

American National Standards Institute （ANSI)

ANSI/HPS N43.2-2021 Radiation Safety for X-ray Diffraction and Fluorescence Analysis Equipment
ANSI N43.2-2001 Radiation Safety for X-ray Diffraction and Fluorescence Analysis Equipment
ANSI/ASTM E1426:1994 Test Method for Determining the Effective Elastic Parameter for X-Ray Diffraction Measurements of Residual Stress

American Gear Manufacturers Association

AGMA 08FTM12-2008 In-situ Measurement of Stresses in Carburized Gears via Neutron Diffraction

GOSTR

GOST R 58565-2019 Optics and photonics. Diffractive optics. Terms and definitions
GOST 6912.2-1993 Alumina. X-rays difractial method for the determination of alfa-oxide-aluminium

BSI

BS PD ISO/TS 5973:2024 Laser diffraction measurements. Good practice
DANSK DS/ISO/TS 5973:2024 Laser diffraction measurements – Good practice

GOST

GOST R 50152-1992 Alumina. X-rays difractional method for the determination of alfa-oxide-aluminium

RU-GOST R

GOST R 8.696-2010 State system for ensuring the uniformity of measurements. Interplanar spacings in crystals and the intensity distribution in diffraction patterns. Method for measurement by means of an electron diffractometer

Standard Association of Australia （SAA）

AS 2879.3:1991 Alumina - Determination of alpha alumina content by X-ray diffraction