Secondary electron diffraction analysis

Secondary electron diffraction analysis, Total:81 items.

The international standard classification for "Secondary electron diffraction analysis" includes: Physicochemical methods of analysis , Particle size analysis. sieving , Chemical analysis , Other standards related to analytical chemistry .

The Chinese standard classification for "Secondary electron diffraction analysis" includes: Basic standards and general methods , Sieving, Sieve Plate and Sieve Screen , Powder metallurgy analysis method , Electrochemical, thermochemistry and optical profile type analyzer .

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes
GB/T 19077-2016 Particle size analysis―Laser diffraction methods
GB/T 19501-2013 Microbeam analysis—General guide for electron backscatter diffraction analysis
GB/T 30703-2014 Microbeam analysis―Guidelines for orientation measurement using electron backscatter diffraction
GB/T 19077.1-2003 Particle size analysis-Laser diffraction method
GB/T 19501-2004 General guide for electron backscatter diffraction analysis
GB/T 38532-2020 Microbeam analysis—Electron backscatter diffraction—Measurement of average grain size
GB/T 18907-2013 Microbeam analysis—Analytical electron microscopy—Selected-area electron diffraction analysis using a transmission electron microscope

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 41076-2021 Microbeam analysis—Electron backscatter diffraction—Quantitative determination of austenite in steel
GB/T 20724-2021 Microbeam analysis—Method of thickness measurement for thin crystals by convergent beam electron diffraction
GB/T 40129-2021 Surface chemical analysis—Secondary ion mass spectrometry—Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
GB/T 41064-2021 Surface chemical analysis—Depth profiling—Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 34172-2017 Microbeam analysis--Electron backscatter diffraction--Phase analysis method of metal and alloy

未注明发布机构

DIN ISO 13067 E:2021-01 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size
DIN ISO 13320 E:2022-05 Particle size analysis - Laser diffraction methods

工业和信息化部

YS/T 1178-2017 Phase analysis for aluminum slag-X-ray diffraction spectroscopy
YB/T 172-2020 Phase quantitative analysis of silica bricks-X-ray diffraction method

International Organization for Standardization (ISO)

ISO/CD 23699 Microbeam Analysis — Electron Backscattered Electron Diffraction — Vocabulary
ISO/DIS 25498:2024 Microbeam analysis-Analytical electron microscopy-Selected area electron diffraction analysis using a transmission electron microscope
ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
ISO 25498:2018 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
ISO 13067:2011 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size
ISO 13067:2020 Microbeam analysis — Electron backscatter diffraction — Measurement of average grain size
ISO 23749:2022 Microbeam analysis — Electron backscatter diffraction — Quantitative determination of austenite in steel
ISO/DIS 24173:2023 Microbeam analysis — Guidelines for orientation measurement using electron backscatter diffraction
ISO 24173:2009 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction
ISO 13084:2011 Surface chemical analysis - Secondary-ion mass spectrometry - Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
ISO 23703:2022 Microbeam analysis — Guidelines for misorientation analysis to assess mechanical damage of austenitic stainless steel by electron backscatter diffraction (EBSD)
ISO 17109:2015 Surface chemical analysis - Depth profiling - Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films

British Standards Institution (BSI)

BS ISO 25498:2018 Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
24/30479937 DC BS ISO 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
BS ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
BS ISO 13067:2020 Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size
BS ISO 13067:2011 Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size
BS ISO 23749:2022 Microbeam analysis. Electron backscatter diffraction. Quantitative determination of austenite in steel
BS ISO 24173:2024 Microbeam analysis. Guidelines for orientation measurement using electron backscatter diffraction
BS ISO 24173:2009 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction
19/30365236 DC BS ISO 13067. Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size
BS ISO 13084:2018 Surface chemical analysis. Secondary ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
21/30398224 DC BS ISO 23749. Microbeam analysis. Electron backscatter diffraction. Quantitative determination of austenite in steel
21/30433862 DC BS ISO 17109 AMD1. Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and…
BS ISO 13320:2020 Particle size analysis. Laser diffraction methods
BS ISO 20411:2018 Surface chemical analysis. Secondary ion mass spectrometry. Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry
BS ISO 17109:2022 Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter dept profiling using single and multi-layer thin…
23/30435799 DC BS ISO 24173. Microbeam analysis. Guidelines for orientation measurement using electron backscatter diffraction
BS ISO 17109:2015 Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
BS ISO 13320:2009 Particle size analysis - Laser diffraction methods

GSO

BH GSO ISO 25498:2017 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
OS GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
OS GSO ISO 13067:2015 Microbeam analysis -- Electron backscatter diffraction -- Measurement of average grain size
GSO ISO 13067:2015 Microbeam analysis -- Electron backscatter diffraction -- Measurement of average grain size
GSO ISO 24173:2015 Microbeam analysis -- Guidelines for orientation measurement using electron backscatter diffraction
BH GSO ISO 13320:2016 Particle size analysis -- Laser diffraction methods
OS GSO ISO 13320:2013 Particle size analysis -- Laser diffraction methods
GSO ISO 13320:2013 Particle size analysis -- Laser diffraction methods

Association Francaise de Normalisation

NF ISO 24173:2009 Microbeam Analysis - Guidelines for Orientation Measurement by Backscattered Electron Diffraction
NF X21-014:2012 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size.
NF X21-011*NF ISO 24173:2009 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction

German Institute for Standardization

DIN ISO 13067:2021-08 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size (ISO 13067:2020)
DIN ISO 24173:2013-04 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction (ISO 24713:2009)
DIN ISO 13067:2015 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size (ISO 13067:2011)
DIN ISO 13067:2021 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size (ISO 13067:2020)
DIN ISO 13320:2022-12 Particle size analysis - Laser diffraction methods (ISO 13320:2020)
DIN ISO 24173:2013 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction (ISO 24713:2009)

PT-IPQ

E E 14-1971 X-ray diffraction analysis

Korean Agency for Technology and Standards (KATS)

KS M 0043-2009 General rules for X-ray diffractometric analysis
KS M 0043-2019 General rules for X-ray diffractometric analysis
KS A ISO 13320:2022 Particle size analysis — Laser diffraction methods
KS M 0043-2009(2019) General rules for X-ray diffractometric analysis
KS A ISO 13320-2014(2019) Particle size analysis — Laser diffraction methods

SCC

10/30195133 DC BS ISO 13067. Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size
ISO 17109:2015/DAmd 1 Surface chemical analysis — Depth profiling — Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films — A...
08/30133935 DC ISO 24173. Microbeam analysis. Guidelines for orientation measurement using electron backscatter diffraction
DANSK DS/ISO 13320:2020 Particle size analysis – Laser diffraction methods

Japanese Industrial Standards Committee (JISC)

JIS Z 8825:2022 Particle size analysis -- Laser diffraction methods
JIS Z 8825:2013 Particle size analysis.Laser diffraction methods

KR-KS

KS A ISO 13320-2022 Particle size analysis — Laser diffraction methods

Danish Standards Foundation

DS/ISO 13320:2009 Particle size analysis - Laser diffraction methods

United States Navy

NAVY UFGS-01 33 29-2010 LEED(TM) DOCUMENTATION