How to analyze electron diffraction
How to analyze electron diffraction, Total:71 items.
The international standard classification for "How to analyze electron diffraction" includes: Physicochemical methods of analysis , Particle size analysis. sieving , Chemical analysis , Other standards related to analytical chemistry .
The Chinese standard classification for "How to analyze electron diffraction" includes: Basic standards and general methods , Sieving, Sieve Plate and Sieve Screen , Powder metallurgy analysis method , Electrochemical, thermochemistry and optical profile type analyzer .
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 30703-2014 Microbeam analysis―Guidelines for orientation measurement using electron backscatter diffraction
- GB/T 19501-2013 Microbeam analysis—General guide for electron backscatter diffraction analysis
- GB/T 19077-2016 Particle size analysis―Laser diffraction methods
- GB/T 38532-2020 Microbeam analysis—Electron backscatter diffraction—Measurement of average grain size
- GB/T 19501-2004 General guide for electron backscatter diffraction analysis
- GB/T 19077.1-2003 Particle size analysis-Laser diffraction method
- GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes
- GB/T 18907-2013 Microbeam analysis—Analytical electron microscopy—Selected-area electron diffraction analysis using a transmission electron microscope
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 20724-2021 Microbeam analysis—Method of thickness measurement for thin crystals by convergent beam electron diffraction
- GB/T 41076-2021 Microbeam analysis—Electron backscatter diffraction—Quantitative determination of austenite in steel
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会
- GB/T 34172-2017 Microbeam analysis--Electron backscatter diffraction--Phase analysis method of metal and alloy
工业和信息化部
- YS/T 1178-2017 Phase analysis for aluminum slag-X-ray diffraction spectroscopy
International Organization for Standardization (ISO)
- ISO/CD 23699 Microbeam Analysis — Electron Backscattered Electron Diffraction — Vocabulary
- ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
- ISO/DIS 25498:2024 Microbeam analysis-Analytical electron microscopy-Selected area electron diffraction analysis using a transmission electron microscope
- ISO 25498:2018 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
- ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
- ISO 13067:2011 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size
- ISO 13067:2020 Microbeam analysis — Electron backscatter diffraction — Measurement of average grain size
- ISO 23749:2022 Microbeam analysis — Electron backscatter diffraction — Quantitative determination of austenite in steel
- ISO/DIS 24173:2023 Microbeam analysis — Guidelines for orientation measurement using electron backscatter diffraction
- ISO 24173:2009 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction
- ISO 23703:2022 Microbeam analysis — Guidelines for misorientation analysis to assess mechanical damage of austenitic stainless steel by electron backscatter diffraction (EBSD)
British Standards Institution (BSI)
- BS ISO 25498:2018 Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
- 24/30479937 DC BS ISO 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
- BS ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
- BS ISO 13067:2020 Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size
- BS ISO 13067:2011 Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size
- BS ISO 23749:2022 Microbeam analysis. Electron backscatter diffraction. Quantitative determination of austenite in steel
- BS ISO 24173:2024 Microbeam analysis. Guidelines for orientation measurement using electron backscatter diffraction
- BS ISO 24173:2009 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction
- 19/30365236 DC BS ISO 13067. Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size
- 21/30398224 DC BS ISO 23749. Microbeam analysis. Electron backscatter diffraction. Quantitative determination of austenite in steel
- BS ISO 13320:2020 Particle size analysis. Laser diffraction methods
- 23/30435799 DC BS ISO 24173. Microbeam analysis. Guidelines for orientation measurement using electron backscatter diffraction
- BS ISO 13320:2009 Particle size analysis - Laser diffraction methods
GSO
- BH GSO ISO 25498:2017 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
- OS GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
- GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
- OS GSO ISO 13067:2015 Microbeam analysis -- Electron backscatter diffraction -- Measurement of average grain size
- GSO ISO 13067:2015 Microbeam analysis -- Electron backscatter diffraction -- Measurement of average grain size
- GSO ISO 24173:2015 Microbeam analysis -- Guidelines for orientation measurement using electron backscatter diffraction
- BH GSO ISO 13320:2016 Particle size analysis -- Laser diffraction methods
- GSO ISO 13320:2013 Particle size analysis -- Laser diffraction methods
- OS GSO ISO 13320:2013 Particle size analysis -- Laser diffraction methods
Korean Agency for Technology and Standards (KATS)
- KS D 1950-1999 Methods for determination of cobalt in nickel materials for electron tubes
- KS M 0043-2009 General rules for X-ray diffractometric analysis
- KS M 0043-2019 General rules for X-ray diffractometric analysis
- KS A ISO 13320:2022 Particle size analysis — Laser diffraction methods
- KS M 0043-2009(2019) General rules for X-ray diffractometric analysis
- KS A ISO 13320-2014(2019) Particle size analysis — Laser diffraction methods
Association Francaise de Normalisation
- NF ISO 24173:2009 Microbeam Analysis - Guidelines for Orientation Measurement by Backscattered Electron Diffraction
- NF X21-014:2012 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size.
- NF X21-011*NF ISO 24173:2009 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction
German Institute for Standardization
- DIN ISO 13067:2021-08 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size (ISO 13067:2020)
- DIN ISO 13067 E:2021-01 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size
- DIN ISO 24173:2013-04 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction (ISO 24713:2009)
- DIN ISO 13067:2015 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size (ISO 13067:2011)
- DIN ISO 13067:2021 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size (ISO 13067:2020)
- DIN ISO 13320:2022-12 Particle size analysis - Laser diffraction methods (ISO 13320:2020)
- DIN ISO 13320 E:2022-05 Particle size analysis - Laser diffraction methods
- DIN ISO 24173:2013 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction (ISO 24713:2009)
PT-IPQ
- E E 14-1971 X-ray diffraction analysis
SCC
- 10/30195133 DC BS ISO 13067. Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size
- 08/30133935 DC ISO 24173. Microbeam analysis. Guidelines for orientation measurement using electron backscatter diffraction
- DANSK DS/ISO 13320:2020 Particle size analysis – Laser diffraction methods
Japanese Industrial Standards Committee (JISC)
- JIS Z 8825:2022 Particle size analysis -- Laser diffraction methods
- JIS Z 8825:2013 Particle size analysis.Laser diffraction methods
KR-KS
- KS A ISO 13320-2022 Particle size analysis — Laser diffraction methods
Danish Standards Foundation
- DS/ISO 13320:2009 Particle size analysis - Laser diffraction methods
United States Navy
- NAVY UFGS-01 33 29-2010 LEED(TM) DOCUMENTATION
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