YB/T 172-2000 in English

VALID

Phase quantitative analysis of silica bricks-X-ray diffraction method

Issued on:2000-07-26
Implemented on:2000-12-01
File Format:PDF
Delivery:Via email within 1~3 business days

Price(USD)： $100.00
$97.00

Standard No:	YB/T 172-2000
Document status:	VALID
Title in English:	Phase quantitative analysis of silica bricks-X-ray diffraction method
Title in Chinese:	硅砖定量相分析 X射线衍射法
Language:	English
File Format:	Electronic (PDF)
Delivery:	Via email within 1~3 business days
Issued on:	2000-07-26
Implemented on:	2000-12-01
ICS Classification:	81.080-Refractories
Chinese Classification:	Q41-Siliceous refractory
Professional Classification:	YB-Metallurgy
Related Keywords:	silica bricks-x-ray diffraction method quantitative analysis bricks-x-ray diffraction quantitative
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