X-ray Diffraction of Silica
X-ray Diffraction of Silica, Total:65 items.
The international standard classification for "X-ray Diffraction of Silica" includes: Refractories , Other standards related to optics and optical measurements , Pigments and extenders , Salts , Materials for aluminium production , Aluminium and aluminium alloys , Cement. Gypsum. Lime. Mortar , Other products of the chemical industry .
The Chinese standard classification for "X-ray Diffraction of Silica" includes: Siliceous refractory , Electron optics and other physical optics instrument , Basic standard and general method for pigment , Inorganic salt , Light metals and their alloys analysis method , Chemical raw material ore , Other chemical products in general .
工业和信息化部
- HG/T 5705-2020 Determination of titanium dioxide phase concent in hydrogenation catalysts- X-ray diffractometry
- YB/T 172-2020 Phase quantitative analysis of silica bricks-X-ray diffraction method
- YS/T 1160-2016 Silicon powder-quantitative phase analysis. Determination of silicon dioxide content. Value K method of X-ray diffraction
Professional Standard - Chemical Industry
- HG/T 6149-2023 Determination of Silica Crystal Phase Content in Hydrogenation Catalyst and Its Support X-ray Diffraction Method
Professional Standard - Ferrous Metallurgy
- YB/T 172-2000 Phase quantitative analysis of silica bricks-X-ray diffraction method
- YB/T 190.13-2014 Continuous casting mold powder. The determination of silicon dioxide, aluminium oxide, calcium oxide, magnesium oxide and total iron content. The wavelength dispersive X-ray fluorescence spectrometric method
Professional Standard - Machinery
- JB/T 9400-1999 Specification for X-ray diffractometer
- JB/T 9400-2010 Specification of X-ray diffractometer
- JB/T 11144-2011 X-ray diffractometer
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 6609.32-2009 Chemical analysis methods and determination of physical performance of alumina - Part 32: Determination of a-alumina content by X-ray diffraction
- GB/T 19421.1-2003 Test methods of crystalline layered sodium disilicate―Qualitative analysis of delta-crystalline layered sodium disilicate―Method of X-ray diffractometer
- GB/T 30793-2014 Measuring ratio of anatase to rutile in titanium dioxide pigments by X-ray diffraction
Anhui Provincial Standard of the People's Republic of China
- DB34/T 2375-2015 Determination of silica content in fly ash by X-ray fluorescence method
Professional Standard - Agriculture
- SN/T 3797-2014 Screening method of zirconia fiber in fireproofing for constructure - X-ray diffraction
- 77药典 四部-2015 0451 X-ray diffraction method
- 57药典 四部-2020 0451 X-ray diffraction method
- SN/T 3323.7-2023 Mill scales- Part 7 : Determination of free a -SiO2 content-X-ray diffraction K value method
- SN/T 5579-2023 Determination of the graphitization degree of carbon materials - X-ray diffraction method
Group Standards of the People's Republic of China
- T/CASAS 014-2021 Measuring method for basal plane bending of SiC substrate — High resolution X-ray diffractometry
Professional Standard - Non-ferrous Metal
- YS/T 976-2014 Determination of α-alumina content in calcined alumina by X-ray diffraction
Professional Standard - Commodity Inspection
- SN/T 1097-2002 Determination of phosphorus pentoxide|| calcium oxide|| ferric oxide|| aluminum oxide|| magnesium oxide|| silicon dioxide and potassium oxide content for export phosphate rock by X-ray fluor
- SN/T 2949-2011 Determination of SiO2, Fe2O3, Al2O3, CaO, MgO contents in talc for export - X-ray fluorescence spectrometric method
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 37054-2018 Nanotechnology—Testing ratio of anatase to rutile in nano-titanium dioxide—X-ray diffraction
- GB/T 40407-2021 X-ray powder diffraction analysis method for determining the phases in portland cement clinker
Hebei Provincial Standard of the People's Republic of China
- DB13/T 5588-2022 Determination of steel slag total iron, silicon dioxide, calcium oxide, magnesium oxide and aluminum oxide by wavelength dispersive X-ray fluorescence spectrometry
Korean Agency for Technology and Standards (KATS)
- KS E 3076-2002 Methods for X－ray fluorescence spectrometric analysis of silica stone and silica sand
- KS M 0043-2009 General rules for X-ray diffractometric analysis
- KS M 0043-2009(2019) General rules for X-ray diffractometric analysis
GOSTR
- GOST 6912.2-1993 Alumina. X-rays difractial method for the determination of alfa-oxide-aluminium
GOST
- GOST R 50152-1992 Alumina. X-rays difractional method for the determination of alfa-oxide-aluminium
Standard Association of Australia （SAA）
- AS 2879.3:1991 Alumina - Determination of alpha alumina content by X-ray diffraction
- AS 2879.3:2010(R2013) Determination of alpha alumina content in alumina using X-ray diffraction method
- AS 2879.3:2010 Alumina, Part 3: Determination of alpha alumina content by X-ray diffraction
American Society for Testing and Materials (ASTM)
- ASTM D4926-20 Standard Test Method for Gamma Alumina Content in Catalysts and Catalyst Carriers Containing Silica and Alumina by X-ray Powder Diffraction
- ASTM D4926-89(1994)e1 Standard Test Method for Gamma Alumina Content in Catalysts Containing Silica and Alumina by X-Ray Powder Diffraction
- ASTM RR-D32-1027 1989 D4926-Standard Test Method for Gamma Alumina Content in Catalysts and Catalyst Carriers Containing Silica and Alumina by X-ray Powder Diffraction
- ASTM D3720-90(2005) Standard Test Method for Ratio of Anatase to Rutile in Titanium Dioxide Pigments by X-Ray Diffraction
- ASTM D3720-90(1999) Standard Test Method for Ratio of Anatase to Rutile in Titanium Dioxide Pigments by X-Ray Diffraction
- ASTM D3720-90(2011) Standard Test Method for Ratio of Anatase to Rutile in Titanium Dioxide Pigments by X-Ray Diffraction
- ASTM D3720-90(2019) Standard Test Method for Ratio of Anatase to Rutile in Titanium Dioxide Pigments by X-Ray Diffraction
- ASTM UOP905-08 Platinum Agglomeration by X-Ray Diffraction
- ASTM UOP905-91 Platinum Agglomeration by X-Ray Diffraction
- ASTM UOP905-20 Platinum Agglomeration by X-Ray Diffraction
International Organization for Standardization (ISO)
- ISO 16258-1:2015 Workplace air - Analysis of respirable crystalline silica by X-ray diffraction - Part 1: Direct-on-filter method
- ISO 16258-2:2015 Workplace air - Analysis of respirable crystalline silica by X-ray diffraction - Part 2: Method by indirect analysis
- ISO 14701:2011 Surface chemical analysis - X-ray photoelectron spectroscopy - Measurement of silicon oxide thickness
GSO
- BH GSO ISO 16258-2:2022 Workplace air — Analysis of respirable crystalline silica by X-ray diffraction — Part 2: Method by indirect analysis
- BH GSO ISO 16258-1:2022 Workplace air — Analysis of respirable crystalline silica by X-ray diffraction — Part 1: Direct-on-filter method
- GSO ISO 16258-1:2021 Workplace air — Analysis of respirable crystalline silica by X-ray diffraction — Part 1: Direct-on-filter method
- GSO ISO 16258-2:2021 Workplace air — Analysis of respirable crystalline silica by X-ray diffraction — Part 2: Method by indirect analysis
RU-GOST R
- GOST R ISO 16258-1-2017 Workplace air. Analysis of respirable crystalline silica by X-ray diffraction. Part 1. Direct-on-filter method
Association Francaise de Normalisation
- NF X43-600-2*NF ISO 16258-2:2015 Workplace air - Analysis of respirable crystalline silica by x-ray diffraction - Part 2 : method by indirect analysis
- NF X43-600-1*NF ISO 16258-1:2015 Workplace Air - Analysis of respirable crystalline silica by X-ray diffraction - Part 1: direct-on-filter method
- NF T31-207:1995 Pigments and extenders. Titanium dioxide. Ratio of anatase to rutile by X-ray diffraction.
- NF ISO 16258-2:2015 Air in workplaces - Respirable fraction of crystalline silica by X-ray diffraction - Part 2: indirect method of analysis
- NF ISO 16258-1:2015 Air in workplaces - Respirable fraction of crystalline silica by X-ray diffraction - Part 1: direct filter analysis method
- NF B49-422-2*NF EN 12698-2:2008 Chemical analysis of nitride bonded silicon carbide refractories - Part 2 : XRD methods.
PT-IPQ
- E E 14-1971 X-ray diffraction analysis
British Standards Institution (BSI)
- 23/30446996 DC BS EN ISO 21068-4. Chemical analysis of raw materials and refractory products containing silicon carbide, silicon nitride, silicon oxynitride and sialon - Part 4. XRD methods
- BS ISO 14701:2011 Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
- 24/30456782 DC BS ISO 16206 Phase quantitative analysis of residual quartz in silica bricks. X-ray diffraction method
Universal Oil Products Company (UOP)
- UOP 905-2008 Platinum Agglomeration by X-Ray Diffraction
European Committee for Standardization (CEN)
- EN 12698-2:2007 Chemical analysis of nitride bonded silicon carbide refractories - Part 2: XRD methods
German Institute for Standardization
- DIN EN 12698-2:2007 Chemical analysis of nitride bonded silicon carbide refractories - Part 2: XRD methods English version of DIN EN 12698-2:2007-06
SCC
- VDI/VDE 5575 BLATT 10-2019 X-ray optical systems - diffraction gratings
X-ray Diffraction of Crystals,Measurement parameters of x-ray diffractometer,X-ray Diffraction of Silica,Daily maintenance of x-ray diffractometer,X-ray Diffraction Silica,X-ray Diffraction Method,Alloy x-ray diffraction,Diffraction of x-rays,Analysis of X-ray Diffraction Spectroscopy,Calibration of x-ray diffractometer,What does an x-ray diffractometer measure?,x-ray diffractometer,What kind of rays are used in x-ray diffraction,X-ray diffraction equipment,Intensity of x-ray diffraction peaks,k value in x-ray diffraction,Analysis of X-ray Diffraction Peaks,Parameters of x-ray diffractometer,X-ray Diffraction of Minerals,Principles of X-ray Diffraction
