characteristic x-ray spectroscopy

characteristic x-ray spectroscopy, Total:328 items.

The international standard classification for "characteristic x-ray spectroscopy" includes: Optical measuring instruments , Chemical analysis , Other standards related to analytical chemistry , Optical equipment , IT applications in science , Chemical analysis of metals , Wood-based panels in general , Iron ores , Nuclear energy in general , Construction materials , Refractories , Other methods of testing of metals , Other iron and steel products , Testing of metals , Other standards related to optics and optical measurements , Cement. Gypsum. Lime. Mortar .

The Chinese standard classification for "characteristic x-ray spectroscopy" includes: Electron optics and other physical optics instrument , Basic standards and general methods , Electrochemical, thermochemistry and optical profile type analyzer , Computer application , Metallochemistry analysis method in general , Artificial board , Iron ore , Nuclear instrument and detector in general , Cement , Fireproof material in general , Steel and iron alloy analysis method , Beneficiation reagent , Siliceous refractory , Technical Management , Ionizating Radiation Measurement .

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 18873-2002 General specification of transmission electron microscope(TEM)-X-ray energy dispersive spectrum(EDS) quantitative microanalysis for thin biological specimens
GB/T 11685-2003 Measurement procedures for semiconductor X-ray detector system and semiconductor X-ray energy spectrometers
GB/T 30704-2014 Surface chemical analysis―X-ray photoelectron spectroscopy―Guidelines for analysis
GB/T 29513-2013 Chemical analysis of ferric-containing dust and sludge by XRF―Fused cast bead method
GB/T 17507-2008 General specification of thin biological standards for X-ray EDS microanalysis in transmission electron microscope
GB/T 18873-2008 General guide of transmission electron microscope (TEM)-X - Ray energy dispersive spectrometry(EDS)quantitative microanalysis for thin biological specimens
GB/T 17362-2008 Analysis method for gold products with X-ray EDS in SEM
GB/T 19500-2004 General rules for X-ray photoelectron spectroscopic analysis method
GB/T 22571-2008 Surface chemical analysis ? X-ray photoelectron spectrometers ? Calibration of energy scales
GB/T 21006-2007 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
GB/T 17362-1998 Nondestructive method of X-ray EDS analysis with SEM for gold jewelry
GB/T 29556-2013 Surface chemical analysis—Auger electron spectroscopy and X-ray photoelectron spectroscopy—Determination of lateral resolution,analysis area, and sample area viewed by the analyser
GB/T 28633-2012 Surface chemical analysis—X-ray photoelectron spectroscopy—Repeatability and constancy of intensity scale
GB/T 20726-2015 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy dispersive X-ray spectrometers for use in electron probe microanalysis
GB/Z 42520-2023 Guidelines for X-ray fluorescence spectrometric laboratory practice for the analysis of iron ores
GB/T 19140-2003 Technologic rules for X-ray fluorescence analysis of cements
GB/T 17723-1999 Surface composition analysis method of gold-plated products by EDX
GB/T 25185-2010 Surface chemical analysis—X-ray photoelectron spectroscopy—Reporting of methods used for charge control and charge correction
GB/T 25184-2010 Verification method for X-ray photoelectron spectrometers
GB/T 16597-1996 Analytical methods of metallurgical products General rule for X-ray fluorescence spectrometric methods
GB/T 28892-2024 Surface chemical analysis—X-ray photoelectron spectroscopy—Description of selected instrumental performance parameters
GB/T 42360-2023 Surface chemical analysis―Total reflection X-ray fluorescence analysis of water
GB/T 17359-1998 General specification of X-ray EDS quantitative analysis for EPMA and SEM
GB/T 17507-1998 General specification of thin biological STANDARDs for X-ray EDS microanalysis in electron microscope
GB/T 21114-2007 Chemical analysis of refractory products by XRF—Fused cast bead method
GB/T 28632-2012 Surface chemical analysis—Auger electron spectroscopy and X-ray photoelectron spectroscopy—Determination of lateral resolution
GB/T 32774-2016 X-ray inspection method for internal structure characteristics of wooden door
GB/T 28892-2012 Surface chemical analysis - X-ray photoelectron spectroscopy -Description of selected instrumental performance parameters
GB/T 20726-2006 Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
GB/Z 32490-2016 Surface chemical analysis--X-ray photoelectron spectroscopy--Procedures for determining backgrounds

Guangdong Provincial Standard of the People's Republic of China

DB44/T 1215-2013 Characterization of Single-Walled Carbon Nanotubes Using Scanning Electron Microscopy and Energy Spectroscopy
DB44/T 1216-2013 Characterization of graphene using scanning electron microscopy and X-ray spectroscopy
DB44/T 1602-2015 Analysis Method of Stone Composition--X-ray Fluorescence Spectrometry

Professional Standard - Ferrous Metallurgy

YB/T 172-2000 Phase quantitative analysis of silica bricks-X-ray diffraction method
YB/T 4177-2008 Determination of chemical composition in slag by X-ray fluorescence spectrometry

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 36401-2018 Surface chemical analysis—X-ray photoelectron spectroscopy—Reporting of results of thin-film analysis
GB/T 41064-2021 Surface chemical analysis—Depth profiling—Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
GB/T 21114-2019 Refractories—Chemical analysis by X-ray fluorescence(XRF)—Fused cast-bead method
GB/T 16597-2019 Analytical methods of metallurgical products—General rule for X-ray fluorescence spectrometric methods
GB/T 41073-2021 Surface chemical analysis―Electron spectroscopies―Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 33502-2017 Surface chemical analysis―Recording and reporting data in X-ray photoelectron spectroscopy(XPS）
GB/T 22571-2017 Surface chemical analysis--X-ray photoelectron spectrometers--Calibration of energy scales

工业和信息化部/国家能源局

JB/T 12962.3-2016 Energy dispersive X-ray fluorescence spectrometer. Part 3: Plating thickness analyzer
JB/T 12962.2-2016 Energy dispersive X-ray fluorescence spectrometer. Part 2: Element analyzer

Professional Standard - Electricity

DL/T 1151.22-2012 Analytical Methods of Scale and Corrosion Products in Power Plants - Part 22: Standard Test Methods of X-ray Fluorescence Spectrometry and X-ray Diffraction

Professional Standard - Nuclear Industry

EJ/T 684-2016 Portable energy dispersive X ray fluorescence analyzer
EJ/T 767-1993 X-ray fluorescence analyzer excited by radioactive sources
EJ/T 1067-1998 Americium-241 sources fluorescence analysis for X-ray
EJ/T 1068-1998 Plutonium-238 sources fluorescence analysis for x-ray
EJ/T 805-1993 Low Energy Photon Sources for X-ray Fluorescence Analysis

Group Standards of the People's Republic of China

T/CSTM 00166.2-2020 Characterization for graphene materials Part 2 X-ray diffraction
T/CSTM 01199-2024 Multilayer metal film-Measurement and analysis method of layer structure-X-ray photoelectron spectroscopy

Fujian Provincial Standard of the People's Republic of China

DB35/T 110-2000 Electron probe and scanning electron microscope X-ray energy spectrum analysis method for paint physical evidence detection

Professional Standard - Electron

SJ/Z 733-1973 Preferred series and types of X-ray tubes
SJ/T 10714-1996 Standard practice for checking the operation characteristics of X-ray photoelectron spectrometers

National Metrological Technical Specifications of the People's Republic of China

JJF 1133-2005 Calibration Specification of Gold Gauge Utilizing X-ray Fluorescence Spectrometry

Professional Standard - Commodity Inspection

SN/T 2079-2008 Method for analysis of stainless and alloy steels - X-ray fluorescence spectrometry

工业和信息化部

YB/T 172-2020 Phase quantitative analysis of silica bricks-X-ray diffraction method
YS/T 1178-2017 Phase analysis for aluminum slag-X-ray diffraction spectroscopy

Professional Standard - Machinery

JB/T 9401-1999 Side window fluorescence analysis X-ray tube
JB/T 11145-2011 X-ray fluorescence spectrometer

未注明发布机构

JIS Z 8891:2023 Particle size analysis -- Small angle X-ray scattering (SAXS)

Professional Standard - Building Materials

JC/T 1085-2008 X-ray fluorescence analyzer for cement

Professional Standard - Chemical Industry

HG/T 6227-2023 Analysis method of chemical composition of catalytic cracking catalyst X-ray fluorescence spectrometry

Professional Standard - Agriculture

58药典四部-2020 0461 X-ray fluorescence spectrometry

German Institute for Standardization

DIN ISO 16129:2020-11 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
DIN ISO 16129 E:2020-01 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
DIN ISO 15472 E:2019-09 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
DIN 51418-2:2015 X-ray spectrometry - X-ray emission and X-ray fluorescence analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results
DIN 51418-1:2008 X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: Definitions and basic principles
DIN 51418-2:1996 X-ray spectrometry - X-ray emission- and X-ray fluorescense analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results
DIN ISO 16129:2020 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
DIN 51418-1:2008-08 X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: Definitions and basic principles
DIN 51418-1:1996 X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: Definitions and basic principles
DIN ISO 15472:2020-05 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English
DIN 51418-2:2015-03 X-ray spectrometry - X-ray emission and X-ray fluorescence analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results
DIN ISO 15472:2020 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English
DIN 51418-2 E:2014-06 X-ray spectrometry - X-ray emission and X-ray fluorescence analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results
DIN ISO 15632:2022-09 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA) (ISO 15632:2...

International Organization for Standardization (ISO)

ISO/TS 10798:2011 Nanotechnologies - Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
ISO 16129:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
ISO 10810:2019 Surface chemical analysis — X-ray photoelectron spectroscopy — Guidelines for analysis
ISO 16129:2012 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
ISO 10810:2010 Surface chemical analysis - X-ray photoelectron spectroscopy - Guidelines for analysis
ISO 13424:2013 Surface chemical analysis — X-ray photoelectron spectroscopy — Reporting of results of thin-film analysis
ISO 15472:2001 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
ISO 15472:2010 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
ISO 21270:2004 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
ISO 18554:2016 Surface chemical analysis - Electron spectroscopies - Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy
ISO/CD TR 18392:2023 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for determining backgrounds
ISO 15470:2017 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
ISO 19830:2015 Surface chemical analysis - Electron spectroscopies - Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
ISO 14701:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Measurement of silicon oxide thickness
ISO 14701:2011 Surface chemical analysis - X-ray photoelectron spectroscopy - Measurement of silicon oxide thickness
ISO 16243:2011 Surface chemical analysis - Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
ISO 17867:2015 Particle size analysis - Small-angle X-ray scattering
ISO/TR 19319:2003 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution, analysis area, and sample area viewed by the analyser
ISO 15470:2004 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
ISO 17109:2015 Surface chemical analysis - Depth profiling - Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
ISO 17867:2020 Particle size analysis — Small angle X-ray scattering (SAXS)
ISO/TS 18507:2015 Surface chemical analysis - Use of Total Reflection X-ray Fluorescence spectroscopy in biological and environmental analysis
ISO 20289:2018 Surface chemical analysis - Total reflection X-ray fluorescence analysis of water
ISO/TS 13762:2001 Particle size analysis - Small angle X-ray scattering method
ISO/TR 18392:2005 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for determining backgrounds
ISO 17470:2004 Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry

British Standards Institution (BSI)

BS ISO 16129:2018 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
BS ISO 10810:2019 Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
BS ISO 16129:2012 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
BS ISO 10810:2010 Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
BS ISO 13424:2013 Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of results of thin-film analysis
BS ISO 18554:2016 Surface chemical analysis. Electron spectroscopies. Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy
BS ISO 21270:2004(2010) Surface chemical analysis — X - ray photoelectron and Auger electron spectrometers — Linearity of intensity scale
BS ISO 21270:2004 Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale
BS DD ISO/TS 10798:2011 Nanotechnologies. Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
BS ISO 19830:2015 Surface chemical analysis. Electron spectroscopies. Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
DD ISO/TS 10798:2011 Nanotechnologies. Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
BS ISO 18516:2006(2010) Surface chemical analysis — Auger electron spectroscopy and X - ray photoelectron spectroscopy — Determination of lateral resolution
BS ISO 14701:2018 Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
BS ISO 14701:2011 Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
BS ISO 16243:2011 Surface chemical analysis. Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
BS ISO 17867:2015 Particle size analysis. Small-angle X-ray scattering
21/30433862 DC BS ISO 17109 AMD1. Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and…
BS ISO 17109:2022 Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter dept profiling using single and multi-layer thin…
BS ISO 17867:2020 Particle size analysis. Small angle X-ray scattering (SAXS)
DD ISO/TS 13762:2001 Particle size analysis. Small angle X-ray scattering method
PD ISO/TS 18507:2015 Surface chemical analysis. Use of Total Reflection X-ray Fluorescence spectroscopy in biological and environmental analysis
BS ISO 15470:2005 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
BS ISO 15470:2017 Surface chemical analysis. X-ray photoelectron spectroscopy. Description of selected instrumental performance parameters
BS ISO 17109:2015 Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
BS PD ISO/TS 18507:2015 Surface chemical analysis. Use of Total Reflection X-ray Fluorescence spectroscopy in biological and environmental analysis
BS ISO 20289:2018 Surface chemical analysis. Total reflection X-ray fluorescence analysis of water
BS DD ISO/TS 13762:2002 Particle size analysis - Small angle X-ray scattering method
BS ISO 15632:2021 Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA)
BS ISO 15632:2012 Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis

GSO

GSO ISO 10810:2013 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Guidelines for analysis
OS GSO ISO 10810:2013 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Guidelines for analysis
OS GSO ISO 16129:2014 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
BH GSO ISO 10810:2016 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Guidelines for analysis
BH GSO ISO 16129:2015 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
GSO ISO 16129:2014 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
GSO ISO 15472:2013 Surface chemical analysis -- X-ray photoelectron spectrometers -- Calibration of energy scales
OS GSO ISO 13424:2015 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Reporting of results of thin-film analysis
GSO ISO 13424:2015 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Reporting of results of thin-film analysis
BH GSO ISO 13424:2017 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Reporting of results of thin-film analysis
OS GSO ISO 18554:2017 Surface chemical analysis -- Electron spectroscopies -- Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy
GSO ISO 18554:2017 Surface chemical analysis -- Electron spectroscopies -- Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy
BH GSO ISO 15472:2016 Surface chemical analysis -- X-ray photoelectron spectrometers -- Calibration of energy scales
BH GSO ISO 21270:2016 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
GSO ISO 21270:2014 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
OS GSO ISO 21270:2014 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
GSO ISO 14701:2013 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Measurement of silicon oxide thickness
GSO ISO/TR 18392:2013 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for determining backgrounds
OS GSO ISO 18516:2013 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Determination of lateral resolution
BH GSO ISO 18516:2016 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Determination of lateral resolution
GSO ISO 18516:2013 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Determination of lateral resolution
BH GSO ISO 19830:2017 Surface chemical analysis -- Electron spectroscopies -- Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
GSO ISO 19830:2016 Surface chemical analysis -- Electron spectroscopies -- Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
GSO ISO 15470:2013 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Description of selected instrumental performance parameters
BH GSO ISO 16243:2017 Surface chemical analysis -- Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
OS GSO ISO 16243:2015 Surface chemical analysis -- Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
GSO ISO 16243:2015 Surface chemical analysis -- Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
OS GSO ISO 17867:2017 Particle size analysis -- Small-angle X-ray scattering
GSO ISO 17867:2017 Particle size analysis -- Small-angle X-ray scattering
GSO ISO 24237:2013 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Repeatability and constancy of intensity scale
BH GSO ISO 17470:2017 Microbeam analysis -- Electron probe microanalysis -- Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
DL/T 1151.22-2023 Analysis methods for scale and corrosion products in thermal power plants Part 22: Wavelength dispersive X-ray fluorescence spectrometry and X-ray diffraction
OS GSO ISO 19318:2013 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Reporting of methods used for charge control and charge correction
GSO IEC 61976:2014 Nuclear instrumentation - Spectrometry - Characterization of the spectrum background in HPGe gamma-ray spectrometry
BH GSO ISO 19318:2016 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Reporting of methods used for charge control and charge correction
GSO IEC 60759:2015 Standard test procedures for semiconductor X-ray energy spectrometers
OS GSO IEC 60759:2015 Standard test procedures for semiconductor X-ray energy spectrometers

Electronic Components, Assemblies and Materials Association

ECA TEP197-A-1997 Preparation of X-Radiation Characteristic Curves for Cathode Ray Tubes

Institute of Electrical and Electronics Engineers (IEEE)

IEEE 759-1984 Test procedures for semiconductor X-ray energy spectrometers

SCC

11/30230635 DC BS ISO 16129. Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
09/30191895 DC BS ISO 10810. Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
DIN 51418-1 E:2007 Draft Document - X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: Definitions and basic principles
BS ISO 15472:2001 Surface chemical analysis. X-ray photoelectron spectrometers. Calibration of energy scales
DIN ISO 16129 E:2020 Draft Document - Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
ISO 15472:2001/DAmd 1 Chemical analysis of surfaces — X-ray photoelectron spectrometers — Energy calibration — Amendment 1
DANSK DS/ISO/TS 10798:2011 Nanotechnologies - Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
BS ISO 15470:2004 Surface chemical analysis. X-ray photoelectron spectroscopy. Description of selected instrumental performance parameters
BS PD ISO/TR 19319:2003 Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolution, analysis area, and sample area viewed by the analyser
10/30212265 DC BS ISO 14701. Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
DIN 51418-2 E:2014 Draft Document - X-ray spectrometry - X-ray emission and X-ray fluorescence analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results
SPC GB/T 16597-2019 Analytical methods of metallurgical products -- General rule for X-ray fluorescence spectrometric methods (TEXT OF DOCUMENT IS IN CHINESE)
ISO 17109:2015/DAmd 1 Surface chemical analysis — Depth profiling — Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films — A...
BS ISO 17470:2004 Microbeam analysis. Electron probe microanalysis. Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
BS DD ISO/TS 13762:2001 Particle size analysis. Small angle X-ray scattering method
DANSK DS/ISO 17867:2020 Particle size analysis – Small angle X-ray scattering (SAXS)
10/30199175 DC BS ISO 16243. Surface chemical analysis. Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
BS ISO 15632:2002 Microbeam analysis. Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
SN-CEN/TR 16176:2011 Characterization of waste — Screening methods for elemental composition by X-ray fluorescence spectrometry for on-site verification
11/30199190 DC BS ISO 15632. Microbeam analysis. Instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
SN-CEN/TR 10354:2011 Chemical analysis of ferrous materials — Analysis of ferro-silicon — Determination of Si and Al by X-ray fluorescence spectrometry
DANSK DS/CEN/TR 10354:2011 Chemical analysis of ferrous materials - Analysis of ferro-silicon - Determination of Si and Al by X-ray fluorescence spectrometry

American Society for Testing and Materials (ASTM)

ASTM E1621-21 Standard Guide for X-Ray Emission Spectrometric Analysis
ASTM E1621-05 Standard Guide for X-Ray Emission Spectrometric Analysis
ASTM E996-94(1999) Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
ASTM E1085-95(2000) Standard Test Method for X-Ray Emission Spectrometric Analysis of Low-Alloy Steels
ASTM E1085-95(2004) Standard Test Method for X-Ray Emission Spectrometric Analysis of Low-Alloy Steels
ASTM E1085-95(2004)e1 Standard Test Method for X-Ray Emission Spectrometric Analysis of Low-Alloy Steels
ASTM E572-02a(2006) Standard Test Method for Analysis of Stainless and Alloy Steels by X-ray Fluorescence Spectrometry
ASTM E572-02a Standard Test Method for Analysis of Stainless and Alloy Steels by X-ray Fluorescence Spectrometry
ASTM E1361-90(1999) Standard Guide for Correction of Interelement Effects in X-Ray Spectrometric Analysis
ASTM E1361-02(2021) Standard Guide for Correction of Interelement Effects in X-Ray Spectrometric Analysis
ASTM E572-94(2000)e1 Standard Test Method for X-Ray Emission Spectrometric Analysis of Stainless Steel
ASTM E572-02a(2006)e1 Standard Test Method for Analysis of Stainless and Alloy Steels by X-ray Fluorescence Spectrometry
ASTM E572-94(2000) Standard Test Method for X-Ray Emission Spectrometric Analysis of Stainless Steel
ASTM E322-96e1 Standard Test Method for X-Ray Emission Spectrometric Analysis of Low-Alloy Steels and Cast Irons
ASTM D5381-93(1998) Standard Guide for X-Ray Fluorescence (XRF) Spectroscopy of Pigments and Extenders
ASTM D5381-93(2003) Standard Guide for X-Ray Fluorescence (XRF) Spectroscopy of Pigments and Extenders
ASTM E1588-10e1 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
ASTM C1271-99(2020) Standard Test Method for X-ray Spectrometric Analysis of Lime and Limestone
ASTM C1271-99 Standard Test Method for X-ray Spectrometric Analysis of Lime and Limestone
ASTM C1271-99(2006) Standard Test Method for X-ray Spectrometric Analysis of Lime and Limestone
ASTM E1588-16 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry
ASTM E2465-11e1 Standard Test Method for Analysis of Ni-Base Alloys by Wavelength Dispersive X-Ray Fluorescence Spectrometry
ASTM C1271-99(2012) Standard Test Method for X-ray Spectrometric Analysis of Lime and Limestone
ASTM E902-94(1999) Standard Practice for Checking the Operating Characteristics of X-Ray Photoelectron Spectrometers
ASTM E322-96(2004) Standard Test Method for X-Ray Emission Spectrometric Analysis of Low-Alloy Steels and Cast Irons
ASTM E1621-13 Standard Guide for Elemental Analysis by Wavelength Dispersive X-Ray Fluorescence Spectrometry
ASTM C1255-93(1999) Standard Test Method for Analysis of Uranium and Thorium in Soils by Energy Dispersive X-Ray Fluorescence Spectroscopy
ASTM C1255-11 Standard Test Method for Analysis of Uranium and Thorium in Soils by Energy Dispersive X-Ray Fluorescence Spectroscopy
ASTM C1255-18 Standard Test Method for Analysis of Uranium and Thorium in Soils by Energy Dispersive X-Ray Fluorescence Spectroscopy
ASTM C1255-93(2005) Standard Test Method for Analysis of Uranium and Thorium in Soils by Energy Dispersive X-Ray Fluorescence Spectroscopy
ASTM F2547-06(2013) Standard Test Method for Determining the Attenuation Properties in a Primary X-ray Beam of Materials Used to Protect Against Radiation Generated During the Use of X-ray Equipment
ASTM F2547-06 Standard Test Method for Determining the Attenuation Properties in a Primary X-ray Beam of Materials Used to Protect Against Radiation Generated During the Use of X-ray Equipment
ASTM E1588-17 Standard Practice for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry
ASTM E1588-16a Standard Practice for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry
ASTM E2465-19 Standard Test Method for Analysis of Ni-Base Alloys by X-ray Fluorescence Spectrometry
ASTM F2547-18 Standard Test Method for Determining the Attenuation Properties in a Primary X-ray Beam of Materials Used to Protect Against Radiation Generated During the Use of X-ray Equipment

Association Francaise de Normalisation

NF X21-071:2011 Surface Chemical Analysis - X-ray photoelectron Spectroscopy - Guidelines for analysis.
NF X21-055:2006 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales.
FD T16-203:2011 Nanotechnologies - Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
NF X21-073*NF ISO 16243:2012 Surface chemical analysis - Recording and reporting data in X-ray photoelectron spectroscopy (XPS).
NF ISO 16243:2012 Chemical Analysis of Surfaces - X-ray Photoelectron Spectroscopy (XPS) Data Logging and Reporting
NF A11-103:1977 Chemical analysis of ferroniobium. Determination of niobium by X ray fluorescence spectrometry.
NF X21-003:2006 Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry.

Japanese Industrial Standards Committee (JISC)

JIS G 1256:1997 Iron and steel -- Method for X-ray fluorescence spectrometric analysis
JIS M 8205:2000 Iron ores -- X-ray fluorescence spectrometric analysis
JIS R 2216:2005 Methods for X-ray fluorescence spectrometric analysis of refractory products
JIS G 1256 AMD 1:2010 Iron and steel -- Method for X-ray fluorescence spectrometric analysis (Amendment 1)
JIS G 1351:2006 Ferroalloys -- Method of X-ray fluorescence spectrometric analysis
JIS H 1631:2008 Titanium alloys -- Method for X-ray fluorescence spectrometric analysis
JIS H 1292:1997 Method for X-ray fluorescence spectrometric analysis of copper and copper alloys
JIS H 1287:2015 Nickel and nickel alloys -- Methods for X-ray fluorescence spectrometric analysis
JIS K 0152:2014 Surface chemical analysis.X-ray photoelectron spectroscopy.Repeatability and constancy of intensity scale
JIS G 1256 AMD 2:2013 Iron and steel.Method for X-ray fluorescence spectrometric analysis (Amendment 2)
JIS G 1351:1987 Method for X-ray fluorescence spectrometric analysis of ferroalloys
JIS H 1669:1990 Method for X-ray fluorescence spectrometric analysis of zirconium alloys
JIS R 2216:1995 Method for X-ray fluorescence spectrometric analysis of refractory bricks and refractory mortars
JIS K 0162:2010 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Description of selected instrumental performance parameters
JIS T 61267:2014 Medical diagnostic X-ray equipment -- Radiation conditions for use in the determination of characteristics
JIS K 0181:2021 Surface chemical analysis -- Total reflection X-ray fluorescence analysis of water
JIS G 1256:1982 Fluorescence X-ray analysis method of steel

KR-KS

KS D 1655-2008(2024) Method for X-ray fluorescence spectrometric analysis of iron and steel
KS D ISO 15472-2003(2023) Surface chemical analysis - X-ray photoelectron spectroscopy - Calibration of energy scale
KS D 1655-2008(2019)(英文版) Method for X-ray fluorescence spectrometric analysis of iron and steel

Korean Agency for Technology and Standards (KATS)

KS D 1654-1993 General Rules for X-ray Fluorescence Spectrometric Analysis of Iron and Steel
KS D 2710-2019 Methods for X-ray fluorescence spectrometric analysis of ferroniobium
KS D 1654-2021 General rules for X-ray fluorescence spectrometric analysis of iron and steel
KS D 1654-2003(2016) General rules for X-ray fluorescence spectrometric analysis of iron and steel
KS D 1655-1993 Method for X-Ray Fluorescence Spectrometric Analysis of Iron and Steel
KS D 1898-2019 Copper alloys —Methods for X-ray fluorescence spectrometric analysis
KS D ISO 15470-2005(2020) Surface chemical analysis－X-ray photoelectron spectroscopy－Description of selected instrumental performance parameters
KS M 0017-2020 General rules for X-ray fluorescence spectrometric analysis
KS M 0017-1995 General rules for X-ray fluorescence spectrometric analysis
KS D 1655-2019 Method for X-ray fluorescence spectrometric analysis of iron and steel
KS D ISO 21270-2020 Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
KS D ISO 21270:2005 Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
KS M 0043-2009 General rules for X-ray diffractometric analysis
KS D ISO 21270-2005(2020) Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
KS L 3316-1988 Method for X-ray fluorescence spectrometric analysis of refractory products
KS L 3316-1998 Method for X-ray fluorescence spectrometric analysis of refractory products
KS D 1686-2011(2021) Method for x-ray fluorescence spectrometric analysis of ferroalloys
KS L 3316-2014(2019) Method for X-ray fluorescence spectrometric analysis of refractory products
KS D ISO 15472:2003 Surface chemical analysis-X-ray photoelectron spectrometers-Calibration of energy scales
KS L 3316-2014 Method for X-ray fluorescence spectrometric analysis of refractory products
KS D 1686-2021 Method for x-ray fluorescence spectrometric analysis of ferroalloys
KS L 3316-2019 Method for X-ray fluorescence spectrometric analysis of refractory products
KS D ISO 15470-2020 Surface chemical analysis－X-ray photoelectron spectroscopy－Description of selected instrumental performance parameters
KS D ISO 19319-2005(2020) Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
KS A 4901-2002(2012) X-RAY GRIDS
KS D 2597-1996(2021) Method for X-ray fluorescence spectrometric analysis of zirconium and zirconium alloys
KS E 3076-2017 Methods for X－ray fluorescence spectrometric analysis of silica stone and silica sand
KS E 3076-2022 Methods for X-ray fluorescence spectrometric analysis of silica stone and silica sand
KS D 2597-2021 Method for X-ray fluorescence spectrometric analysis of zirconium and zirconium alloys
KS E 3075-2002 Method for X－ray fluorescence spectrometric analysis of limestone and dolomite
KS L 3316-2009 Method for X-ray fluorescence spectrometric analysis of refractory brikcs and refractory mortars
KS D 1655-2008(2019) Method for X-ray fluorescence spectrometric analysis of iron and steel
KS D ISO 19319-2020 Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
KS D ISO 19319:2005 Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
KS E 3075-2017 Method for X－ray fluorescence spectrometric analysis of limestone and dolomite
KS E 3075-2022 Method for X-ray fluorescence spectrometric analysis of limestone and dolomite
KS D 1686-2011(2016) Method for x-ray fluorescence spectrometric analysis of ferroalloys
KS M 0043-2009(2019) General rules for X-ray diffractometric analysis
KS M 0017-2010 General rules for X-ray fluorescence spectrometric analysis
KS D ISO 15470:2005 Surface chemical analysis－X-ray photoelectron spectroscopy－Description of selected instrumental performance parameters
KS D ISO 19318-2005(2020) Surface chemical analysis－X-ray photoelectron spectroscopy－Reporting of methods used for charge control and charge correction
KS D 2597-1996(2016) Method for X-ray fluorescence spectrometric analysis of zirconium and zirconium alloys
KS D ISO 19318-2020 Surface chemical analysis－X-ray photoelectron spectroscopy－Reporting of methods used for charge control and charge correction
KS C IEC 60759-2019 Standard test procedures for semiconductor X-ray energy spectrometers
KS C IEC 60759:2009 Standard test procedures for semiconductor X-ray energy spectrometers
KS D 1898-1993 Method for fluorescent X-ray analysis of copper alloys
KS D ISO 17054:2018 Routine method for analysis of high alloy steel by X-ray fluorescence spectrometry (XRF) by using a near-by technique

RU-GOST R

GOST R 55080-2012 Cast iron. Method of X-ray fluorescence (XRF) analysis
GOST 16865-1979 X-ray apparatus for structural and spectral analyses. Terms and definitions
GOST 25645.118-1984 Cosmic X-rays of the discrete sources. Energy spectra and angular coordinates
GOST 28033-1989 Steel. Method of X-ray-fluorescent analysis
GOST R 55410-2013 Refractory. Analysis by X-ray fluorescence (XRF)

SE-SIS

SIS SS IEC 336:1986 X-ray equipment - Characteristics of focal sp?ts in diagnostic X-ray tube assemblies for medical use
SIS SS IEC 627:1986 X-ray equipment - Characteristics of anti-scatter grids used in X-ray equipment

PT-IPQ

E E 14-1971 X-ray diffraction analysis

BE-NBN

NBN 400-4-1969 Radiation equipment: medical X-ray generators and accessories. Structural features that prevent X-ray radioactivity

Standard Association of Australia （SAA）

AS ISO 15472:2006 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
AS ISO 15470:2006(R2016) Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
AS ISO 15470:2006 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
AS 4392.1:1996 Heavy mineral sands - Analysis by wavelength dispersive X-ray fluorescence spectrometry - Titaniferous mineral sands
AS 4392.1:1996/Amdt 1:1996 Analysis of titanium-containing ores by wavelength dispersive X-ray fluorescence spectrometry of heavy mineral sands
AS ISO 19319:2006 Surface chemical analysis - Augur electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution, analysis area and sample area viewed by the analyser
AS 4392.1:1996/Amdt 2:1999 Analysis of titanium-containing ores by wavelength dispersive X-ray fluorescence spectrometry of heavy mineral sands
AS 4392.2:1997 Heavy mineral sands - Analysis by wavelength dispersive X-ray fluorescence spectrometry - Zircon materials

Danish Standards Foundation

DS/ISO/TS 10798:2011 Nanotechnologies - Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis

IN-BIS

IS 12803-1989 Method for analyzing hydraulic cement using X-ray fluorescence spectrometer

Spanish Association for Standardization (UNE)

UNE-EN 60336:1996 X-RAY TUBE ASSEMBLIES FOR MEDICAL DIAGNOSIS. CHARACTERISTICS OF FOCAL SPOTS.

European Committee for Standardization (CEN)

CEN/TR 10354:2011 Chemical analysis of ferrous materials - Analysis of ferro-silicon - Determination of Si and Al by X-ray fluorescence spectrometry

CZ-CSN

CSN 35 6575 Z1-1997 Standard test procedureds for semiconductor X-ray energy spectrometers

International Electrotechnical Commission (IEC)

IEC 60759:1983 Standard test procedures for semiconductor X-ray energy spectrometers