GB/T 20726-2006 in English

SUPERSEDED

Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors

Issued on:2006-12-25
Implemented on:2007-08-01
File Format:PDF
Delivery:Via email within 1~3 business days

Price(USD)： $120.00
$117.00

Standard No:	GB/T 20726-2006
Document status:	SUPERSEDED
Superseded by:	GB/T 20726-2015 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy dispersive X-ray spectrometers for use in electron probe microanalysis
Superseded on:	2016-09-01
Title in English:	Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
Title in Chinese:	半导体探测器X射线能谱仪通则
Language:	English
File Format:	Electronic (PDF)
Delivery:	Via email within 1~3 business days
Issued on:	2006-12-25
Implemented on:	2007-08-01
ICS Classification:	71.040.99-Other standards related to analytical chemistry
Chinese Classification:	N33-Electron optics and other physical optics instrument
Professional Classification:	GB-National Standard
Related Keywords:	x-ray energy spectrometers dispersive x-ray spectrometers semiconductor detectors scopethis standard semiconductor detectors detectors eds
Related Topics:	x spectrometer Spectrometer x-ray spectroscopy X-ray spectrometer Ray Spectrum energy spectrum spectrometer X-ray spectrum of plutonium Gold X-ray Spectroscopy Ray standard spectrometer smallest x-ray machine X-ray spectrometer x-ray spectrometer detector x-ray X-ray spectrometer x-ray spectrum x-ray spectroscopy x-ray semiconductor inspection X-ray spectrometer X-ray Spectroscopy and Electron Spectroscopy x-ray spectrometer X-ray spectrometer semiconductor energy gap Spectrum detector x-ray semiconductor inspection x-ray spectroscopy use X-ray spectrometer x energy spectrum microbeam x-ray spectrometer instrumental spectrum synthesis Murphy Spectroscopy Instrument X-ray spectrometer X-ray spectrometer semi-quantitative spectrometer Semiconductor Test Instruments scatter x-ray instrument Scattering+x-ray+meter Spectrum + x-ray energy Measuring x-ray energy spectrum x-ray standard x-ray spectroscopy semiconductor mass spectrometry Spectrum Used spectrometer Instrument semi-dry x-ray scattering instrument X-ray energy spectrum measurement system spectrometer at half height energy spectrum of x-rays Energy X-ray Spectrometer Spectrometer linear X-ray Sensitizer X-ray photoelectron spectrometer and energy spectrometer "General Rules for Semiconductor Detector X-ray Spectrometer" X-ray spectrometer Electron Spectrum Detector Ray Spectrum x-ray tube spectroscopy x-ray internal stress instrument energy spectrometer x-ray Spectrum Detector Half Height semi-dry instrument semiconductor detection x-ray characteristic spectrum x-ray measuring instrument GB/T 20726 High Energy X-ray Spectrometer x-ray gravimeter General rules for X-ray spectrometers with semiconductor detectors Spectrum Instruments spectrum half height x-ray spectrometer gas x-ray spectrometer Spectral detection X-ray radiation detector what about x-ray spectrometer X-ray radiation detector Spectrometer+ Spectral detection Spectrometer detector The detector of the energy spectrometer Spectrometer use Detector spectrometer spectrometer rays x-ray scattering instrument GB/t+20726 X-ray spectrometer Semiconductor equipment A Spectrum Instrument Spectrometer semiconductor Semiconductor detection by energy spectrometer x-ray spectroscopy energy spectrum multispectral instrument x-ray detector Spectrometer detector X-ray spectroscopy test x-ray detector x-ray peak energy spectroscopy semiconductor detector x-ray x-ray ash analyzer dual energy spectrometer energy spectrum Zhe spectrum instrument Semiconductor detector + x-ray x-ray spectroscopy Semiconductor Measuring Instruments Spectrum Instruments Rapid spectrometer Spectrometer sample preparation x-ray spectrometer X-ray energy spectrometer measurement X-ray detection device X-ray detection device channel detector characteristic x-ray spectroscopy organic semiconductor x-ray pair spectrum instrument X-ray spectrometer detects trace amounts x energy spectrometer X-ray spectrometer detector Semiconductor performance x-ray ash analyzer x-ray ash analyzer GB/T 20726-2015 non-medical x-ray apparatus Spectrometer semiconductor X-ray spectrometer microdisk spectrometer Spectrum Association Instrument Ray Scattering Instruments Spectrometer: Energy X-ray Spectroscopy X-ray Spectroscopy Sample Preparation X-ray Instrument Spectroscopy Semi-quantitative analysis by energy spectrometer Chromatography Guidelines x-ray low energy high energy instrument + spectrum x-ray spectroscopy in water Time spectrum instrument x-ray instrument energy spectrometer Spectrometer and Peak An instrument that detects x-rays X-ray general instrument Handheld X-ray Detectors X-ray energy spectrometer sample preparation x spectrum Energy spectrometer abroad semiconductor detector In vitro measurement spectrometer x-ray flat panel detector x-ray spectroscopy lithium mass detector Spectrum + instrument semiconductor detector window x-ray spectrometer semiconductor probe x-ray monochromator energy x-ray detector x-ray energy Semiconductor Instruments Semiconductor Instruments x-ray solid X-ray energy spectrometer New Liquid Detector characteristic x-ray spectroscopy semiconductor energy gap dosimeter detector Spectroscopy and spectrometers X-ray dorsal apparatus Characteristic x-ray and energy spectroscopy Instrument Half Height High Energy X-ray Inspection System Electron Probe and Spectrometer semiconductor probe Three-spectrum instrument x-ray spectrometer Electron Probe Spectrometer X-ray energy spectrometer Small X-ray detector Instrument Spectrum semiconductor radiation detector Instrument Broad Spectrum X-ray spectroscopy sample preparation X-ray Spectrometer Energy Spectrometer Agricultural Soft X-ray Instrument The use of energy spectrometer X-ray machine operation X-ray machine principle x-ray spectrometer X-ray spectrometer Energy X-ray Spectroscopy and X-ray Spectroscopy x-ray width at half maximum Instrument spectrum instrument X-ray machine structure High Energy X-ray Scattering Instrument high energy ray communication X-ray spectrometer one x-ray ash analyzer x-ray ash analyzer X-ray tetracircle multi-energy spectrum x-ray tube Quantum Cube X-ray Detector Ray spectrometer General Rules for Semiconductor Detector X-ray Spectrometer Semiconductor reflectance spectroscopy semiconductor x-ray detector Liquid wall spectrometer High Energy X-ray Inspection The principle of x-ray machine X-ray Spectroscopy Phase Analysis Semiconductor Energetic Particle Detection high energy x-rays and low energy x-rays Portable X-ray Spectrometer dorsal x-ray machine X-ray energy spectrometer soft x-ray machine X-ray machine industry Thermal Field Detection Instrument body detector spectrometerx Ray level Ray level spectrum instrument spectrum x-ray military detection Semiconductor + infrared detection Semi-Preparation Instruments Spectrometer energy + x-ray X-ray energy spectrometer How to analyze by X-ray energy spectrometer X-ray spectroscopy applications X-ray Spectrometer Regulations Spectrometer and energy spectrometer What is x-ray spectrum used for? semi-dry instrument X-ray spectrometer detection X-ray monochromator Lithium spectrometer Multi-Energy X-ray Detector x-ray device Energy spectrometer x-ray energy energy spectrum of rays small x-ray scattering instrument X-ray spectral features GBT20726 GB/T 20726-2006 GB/T 20726-2015 low-energy x-rays and high-energy x-rays Rays edax energy spectrometer NORAN energy spectrometer Oxford x-max energy spectrum detection limit The principle of x-ray energy spectrometer edxrf X-ray spectrometer principle The difference between scintillator detectors and semiconductor detectors Oxford energy spectrometer 100mm Are x-radiation detectors the same as photodetectors? Does a plasma spectrometer have x-ray radiation? X-ray energy spectrometer calibration liquid detector General instrument measurement General Principles of Electron Spectrometer Methods Wireless composite gas detector Hazardous liquid detector gb t 20726 gb/t 20726 2006 gb/t 20726-2006 gb 20726 gb20726 Radiographic detectability

《GB/T 20726-2006半导体探测器X射线能谱仪通则》由TC38（全国微束分析标准化技术委员会）归口，主管部门为国家标准化管理委员会。
本标准规定了表征以半导体探测器、前置放大器和信号处理系统为基本构成的X射线能谱仪特性最重要的量值。

Scope

This standard specifies the most important quantities that characterize the characteristics of X-ray energy spectrometers (EDS) based on semiconductor detectors, preamplifiers and signal processing systems. This standard is only applicable to semiconductor detectors EDS based on the state-of-the-art ionization principle. This standard only stipulates the minimum requirements for this type of EDS used in conjunction with electron probe (EPMA) or scanning electron microscope (SEM). As for how to realize the analysis, it is not within the scope of this standard.

More samples: JC/T 2453-2018 GB 18306-2015 JGJ 94-2008

Sample only — not a preview of GB/T 20726-2006

Loading PDF document...

Error loading PDF. Please make sure the file is valid and try again.