X-ray spectrometer

X-ray spectrometer, Total:13 items.

The international standard classification for "X-ray spectrometer" includes: Other standards related to analytical chemistry , Nuclear energy in general .

The Chinese standard classification for "X-ray spectrometer" includes: Electron optics and other physical optics instrument , Nuclear instrument and detector in general , Basic standards and general methods .

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General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

• GB/T 20726-2006 Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
• GB/T 20726-2015 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy dispersive X-ray spectrometers for use in electron probe microanalysis
• GB/T 11685-2003 Measurement procedures for semiconductor X-ray detector system and semiconductor X-ray energy spectrometers

Korean Agency for Technology and Standards (KATS)

• KS C IEC 60759-2019 Standard test procedures for semiconductor X-ray energy spectrometers
• KS C IEC 60759:2009 Standard test procedures for semiconductor X-ray energy spectrometers
• KS C IEC 60759-2009(2019) Standard test procedures for semiconductor X-ray energy spectrometers

International Electrotechnical Commission (IEC)

• IEC 60759:1983 Standard test procedures for semiconductor X-ray energy spectrometers
• IEC 60759:1983/AMD1:1991 Standard test procedures for semiconductor X-ray energy spectrometers; amendment 1

CZ-CSN

• CSN 35 6575 Z1-1997 Standard test procedureds for semiconductor X-ray energy spectrometers

GSO

• GSO IEC 60759:2015 Standard test procedures for semiconductor X-ray energy spectrometers
• OS GSO IEC 60759:2015 Standard test procedures for semiconductor X-ray energy spectrometers

SE-SIS

• SIS SS IEC 759:1986 Nuclear instrumentation —Test procedures for semiconductor X-ray energy spectrometers

Institute of Electrical and Electronics Engineers (IEEE)

• ANSI/IEEE Std 759-1984 IEEE Standard Test Procedures for Semiconductor X-Ray Energy Spectrometers

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