x-ray spectroscopy
x-ray spectroscopy, Total:33 items.
The international standard classification for "x-ray spectroscopy" includes: Other standards related to analytical chemistry , Optical equipment , Nuclear energy in general , Optical measuring instruments , Protection against crime .
The Chinese standard classification for "x-ray spectroscopy" includes: Electron optics and other physical optics instrument , Electrochemical, thermochemistry and optical profile type analyzer , Nuclear instrument and detector in general , Basic standards and general methods , Crime judging technology .
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 11685-2003 Measurement procedures for semiconductor X-ray detector system and semiconductor X-ray energy spectrometers
- GB/T 17361-1998 Identification method of authigenic clay mineral in sedimentary rock by SEM and XEDS
- GB/T 17507-1998 General specification of thin biological STANDARDs for X-ray EDS microanalysis in electron microscope
- GB/T 18873-2008 General guide of transmission electron microscope (TEM)-X - Ray energy dispersive spectrometry(EDS)quantitative microanalysis for thin biological specimens
- GB/T 17362-1998 Nondestructive method of X-ray EDS analysis with SEM for gold jewelry
- GB/T 17723-1999 Surface composition analysis method of gold-plated products by EDX
- GB/T 17507-2008 General specification of thin biological standards for X-ray EDS microanalysis in transmission electron microscope
- GB/T 18873-2002 General specification of transmission electron microscope(TEM)-X-ray energy dispersive spectrum(EDS) quantitative microanalysis for thin biological specimens
- GB/T 17359-1998 General specification of X-ray EDS quantitative analysis for EPMA and SEM
- GB/T 17362-2008 Analysis method for gold products with X-ray EDS in SEM
- GB/T 20726-2006 Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
- GB/T 20726-2015 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy dispersive X-ray spectrometers for use in electron probe microanalysis
Professional Standard - Judicatory
- SF/T 0139-2023 Examination of soil—Scanning electron microscope/X-ray energy dispersive spectrometry
Professional Standard - Public Safety Standards
- GA/T 1938-2021 Forensic sciences- Examination methods for metal-Scanning electron microscope/energy dispersive X-ray spectrometry
- GA/T 1522-2018 Forensic science―Examination methods for gun shot residue―Scanning electron microscope/energy dispersive X-ray spectrometry
- GA/T 1939-2021 Forensic sciences-Examination methods for electric marks-Scanning electron microscopy/energy dispersive X-ray spectrometry
- GA/T 1519-2018 Forensic science―Examinaton methods for elements of toner―Scanning electron microscope/energy dispersive X-ray analysis
- GA/T 1521-2018 Forensic science—Examination methods for elements of plastic—Scanning electron microscope/energy dispersive X-ray analysis
- GA/T 1937-2021 Forensic sciences-Examination methods for rubber- Scanning electron microscope/energy dispersive X-ray spectrometry
Guangdong Provincial Standard of the People's Republic of China
- DB44/T 1216-2013 Characterization of graphene using scanning electron microscopy and X-ray spectroscopy
- DB44/T 1215-2013 Characterization of Single-Walled Carbon Nanotubes Using Scanning Electron Microscopy and Energy Spectroscopy
Fujian Provincial Standard of the People's Republic of China
- DB35/T 110-2000 Electron probe and scanning electron microscope X-ray energy spectrum analysis method for paint physical evidence detection
Korean Agency for Technology and Standards (KATS)
- KS C IEC 60759-2019 Standard test procedures for semiconductor X-ray energy spectrometers
- KS C IEC 60759:2009 Standard test procedures for semiconductor X-ray energy spectrometers
- KS C IEC 60759-2009(2019) Standard test procedures for semiconductor X-ray energy spectrometers
CZ-CSN
- CSN 35 6575 Z1-1997 Standard test procedureds for semiconductor X-ray energy spectrometers
GSO
- GSO IEC 60759:2015 Standard test procedures for semiconductor X-ray energy spectrometers
- OS GSO IEC 60759:2015 Standard test procedures for semiconductor X-ray energy spectrometers
International Electrotechnical Commission (IEC)
- IEC 60759:1983 Standard test procedures for semiconductor X-ray energy spectrometers
- IEC 60759:1983/AMD1:1991 Standard test procedures for semiconductor X-ray energy spectrometers; amendment 1
Institute of Electrical and Electronics Engineers (IEEE)
- IEEE 759-1984 Test procedures for semiconductor X-ray energy spectrometers
- ANSI/IEEE Std 759-1984 IEEE Standard Test Procedures for Semiconductor X-Ray Energy Spectrometers
SE-SIS
- SIS SS IEC 759:1986 Nuclear instrumentation —Test procedures for semiconductor X-ray energy spectrometers
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