x-ray semiconductor inspection
x-ray semiconductor inspection, Total:23 items.
The international standard classification for "x-ray semiconductor inspection" includes: Nuclear energy in general , Other standards related to analytical chemistry , Testing of metals , Non-destructive testing .
The Chinese standard classification for "x-ray semiconductor inspection" includes: Nuclear instrument and detector in general , Electron optics and other physical optics instrument , Metal physical property test method , Basic standards and general methods .
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 11685-2003 Measurement procedures for semiconductor X-ray detector system and semiconductor X-ray energy spectrometers
- GB/T 42676-2023 Test method for crystalline quality of semiconductive single crystal―X-ray diffraction method
- GB/T 20726-2006 Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
- GB/T 24578-2024 Test method for measuring surface metal contamination on semiconductor wafers —Total reflection X-Ray fluorescence spectroscopy
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会
- GB/T 35389-2017 Non-destructive testing—X-ray digital radiography—Guide
Military Standard of the People's Republic of China-General Armament Department
- GJB 7678-2012 Test method for 10KeV X-ray irradiation hardening of semiconductor devices
Group Standards of the People's Republic of China
- T/CEC 526-2021 Technical guidelines for X-ray detection of overhead transmission line clamps
SE-SIS
- SIS SS IEC 759:1986 Nuclear instrumentation —Test procedures for semiconductor X-ray energy spectrometers
CZ-CSN
- CSN 35 6575 Z1-1997 Standard test procedureds for semiconductor X-ray energy spectrometers
GSO
- GSO IEC 60759:2015 Standard test procedures for semiconductor X-ray energy spectrometers
- OS GSO IEC 60759:2015 Standard test procedures for semiconductor X-ray energy spectrometers
Korean Agency for Technology and Standards (KATS)
- KS C IEC 60759-2019 Standard test procedures for semiconductor X-ray energy spectrometers
- KS C IEC 60759-2009(2019) Standard test procedures for semiconductor X-ray energy spectrometers
- KS C IEC 60759:2009 Standard test procedures for semiconductor X-ray energy spectrometers
SCC
- CEI 45-35:1997 Standardized test methods of semiconductor X-ray spectrometers
Institute of Electrical and Electronics Engineers (IEEE)
- ANSI/IEEE Std 759-1984 IEEE Standard Test Procedures for Semiconductor X-Ray Energy Spectrometers
- IEEE 759-1984 Test procedures for semiconductor X-ray energy spectrometers
German Institute for Standardization
- DIN 50443-1:1988 Testing of materials for use in semiconductor technology; detection of crystal defects and inhomogeneities in silicon single crystals by X-ray topography
- DIN 50433-1:1976 Testing of semi-conducting inorganic materials; determining the orientation of single crystals by means of X-ray diffraction
IN-BIS
- IS 12737-1988 Standard test procedures for semiconductor X-ray energy spectrometers
International Electrotechnical Commission (IEC)
- IEC 60759:1983 Standard test procedures for semiconductor X-ray energy spectrometers
- IEC 60759:1983/AMD1:1991 Standard test procedures for semiconductor X-ray energy spectrometers; amendment 1
Association Francaise de Normalisation
- NF EN 13100-2:2019 Essais non destructifs des assemblages soudés sur produits semi-finis en thermoplastiques - Partie 2 : contrôle radiographique par rayons X
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