Semiconductor Energetic Particle Detection

Semiconductor Energetic Particle Detection, Total:24 items.

The international standard classification for "Semiconductor Energetic Particle Detection" includes: Nuclear energy engineering , Radiation measurements , Other standards related to analytical chemistry , Nuclear energy in general .

The Chinese standard classification for "Semiconductor Energetic Particle Detection" includes: Nuclear detector , Nuclear instrument and detector in general , Electron optics and other physical optics instrument .

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General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

• GB/T 5201-2012 Test procedures for semiconductor charged particle detectors
• GB/T 5201-1994 Test procedures for semiconductor charged particle detectors
• GB/T 11685-2003 Measurement procedures for semiconductor X-ray detector system and semiconductor X-ray energy spectrometers
• GB/T 20726-2006 Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors

Professional Standard - Building Materials

• JC/T 2018-2010 Thallium doped cesium iodide crystal for high-energy particles detection

Bureau of Indian Standards

• IS 11425-1985 Test procedures for semiconductor charged particle detectors

International Electrotechnical Commission (IEC)

• IEC 60333:1983 Test procedures for semiconductor charged-particle detectors
• IEC 60333:1993 Nuclear instrumentation; semiconductor charged-particle detectors; test procedures
• IEC 60749-16:2003 Semiconductor devices - Mechanical and climatic test methods - Part 16: Particle impact noise detection (PIND)

GCC Standardization Organization

• GSO IEC 60333:2009 Nuclear instrumentation - Semiconductor charged-particle detectors - Test procedures
• BH GSO IEC 60333:2024 Nuclear instrumentation - Semiconductor charged-particle detectors - Test procedures

Institute of Electrical and Electronics Engineers (IEEE)

• IEEE 300-1988 Standard Test Procedures for Semiconductor Charged-Particle Detectors
• IEEE 300-1982 STANDARD TEST PROCEDURES FOR SEMICONDUCTOR CHARGED-PARTICLE DETECTORS
• IEEE Std 300-1988 IEEE Standard Test Procedures for Semiconductor Charged-Particle Detectors
• ANSI/IEEE Std 300-1982 IEEE Standard Test Procedures for Semiconductor Charged-Particle Detectors
• IEEE Std 300-1988(R2006) IEEE Standard Test Procedures for Semiconductor Charged-Particle Detectors

The Directorate General of Specifications and Metrology (DGSM)

• OS GSO IEC 60333:2009 Nuclear instrumentation - Semiconductor charged-particle detectors - Test procedures

German Institute for Standardization

• DIN IEC 333:1995 Test methods for charged particle semiconductor detectors of nuclear instruments
• DIN IEC 60333:1995 Nuclear instrumentation - Semiconductor charged-particle detectors - Test procedures (IEC 60333:1993)
• DIN EN 60749-16:2003 Semiconductor devices - Mechanical and climatic test methods - Part 16: Particle impact noise detection (PIND) (IEC 60749-16:2003); German version EN 60749-16:2003

British Standards Institution (BSI)

• BS EN 60749-16:2003 Semiconductor devices - Mechanical and climatic test methods - Particle impact noise detection (PIND)

SE-SIS

• SIS SS IEC 333:1986 Nuclear instrumentation - Testprocedures for semiconductor chargedparticle detectors

Korean Agency for Technology and Standards (KATS)

• KS C IEC 60749-16:2006 Semiconductor devices－Mechanical and climatic test methods－Part 16：Particle impact noise detection(PIND)

American National Standards Institute （ANSI)

• ANSI/IEEE 300:1988 Test Procedures for Semiconductor Charged-Particle Detectors

Others: Energetic Particle Detection,High Energy Particle Detector,Semiconductor Energetic Particle Detection