High Energy X-ray Scattering Instrument
High Energy X-ray Scattering Instrument, Total:329 items.
The international standard classification for "High Energy X-ray Scattering Instrument" includes: Other standards related to optics and optical measurements , Chemical analysis of metals , Non-destructive testing , Other standards related to nuclear energy , Other standards related to analytical chemistry , Nuclear energy in general , Chemical analysis , Radiation protection , Iron ores , Particle size analysis. sieving , Non-destructive testing of metals , Crude petroleum , Measuring instruments , Radiation measurements , Radiographic equipment , Cement. Gypsum. Lime. Mortar , Occupational safety. Industrial hygiene .
The Chinese standard classification for "High Energy X-ray Scattering Instrument" includes: Electron optics and other physical optics instrument , Optical instrument in general , X ray, magnetic powder, fluorescent light and other defectoscope , General nuclear instrument , Nuclear instrument and detector in general , Basic standards and general methods , Radiological sanitation protection , Metal physical property test method , Iron ore , Crude petroleum , Optical Measurement , Length Measurement , Ionizating Radiation Measurement , Medical radiographic equipment , Cement , Material composition analysis instrument and environment detection instrument in general .
Professional Standard - Nuclear Industry
- EJ/T 1100-1999 Bore-hole apparatus for X-ray fluorescence analysis
- EJ/T 684-2016 Portable energy dispersive X ray fluorescence analyzer
- EJ/T 767-1993 X-ray fluorescence analyzer excited by radioactive sources
National Metrological Technical Specifications of the People's Republic of China
- JJF 1952-2021 Calibration Specification for Sulfur X-ray Fluorescence Spectrometry Analyzers
- JJF 1613-2017 Calibration Specification for Thin Film Thickness Measurement Instruments by Grazing Incidence X-Ray Reflectivity
- JJF 1275-2011 Calibration specification forx-ray security inspection equipment
- JJF 2024-2023 Calibration Specification for Energy Dispersive X-Ray Fluorescence Spectrometers
Professional Standard - Machinery
- JB/T 9400-1999 Specification for X-ray diffractometer
- JB/T 9399-2010 Main parameter series for the X-ray analytical instrumentation
- JB/T 8387-2010 Non-destructive testing instruments Main parameter for the industrial detection X-ray tube
- JB/T 9400-2010 Specification of X-ray diffractometer
- JB/T 5482-2011 X-ray Orientation apparatus
- JB/T 9394-1999 Specifications for the X-ray stressometers
- JB/T 6215-2011 Non-destructive testing instruments —The series typal table to industrial X-ray tube
- JB/T 12456-2015 Non-destructive testintg instruments-Technical requirements of X-ray delector for circuit board detection
- JB/T 5453-2011 Non-destructive testing instruments —Industrial X-ray image intensifier imaging system
- JB/T 12457-2015 Non-destructive testing instruments-Testing method of X-ray delector for circuit board detection
- JB/T 11234-2011 Non-destructive testing instruments — Industry soft X-ray apparatus
- JB/T 9399-1999 Main parameter series for the X-ray analytical instrumentation
- JB/T 11145-2011 X-ray fluorescence spectrometer
- JB/T 5482-2004 The specification for X-ray Crystal Orientation apparatus
- JB/T 11144-2011 X-ray diffractometer
- JB/T 11608-2013 Non-destructive testing instruments — lndustrial X-ray apparatus for radiographic testing
- JB/T 9394-2011 Non-destructive testing instruments — Specifications for the X-ray stressometers
未注明发布机构
- DIN ISO 16129 E:2020-01 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- DIN ISO 15632 E:2015-05 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
- DIN ISO 15632 E:2022-03 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
- JIS Z 8891:2023 Particle size analysis -- Small angle X-ray scattering (SAXS)
- AS 2563:1996(R2016) Wavelength dispersive X-ray fluorescence spectrometers - Determination of precision
- DIN ISO 15472 E:2019-09 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 8359-1987 Carbides in high speed steel; Quantitative phase analysis; Method of X-ray diffractometer
- GB/T 13221-2004 Nanometer powder—Determinaiton of particle size distribution—Small angle X-ray
- GB/T 28892-2012 Surface chemical analysis - X-ray photoelectron spectroscopy -Description of selected instrumental performance parameters
- GB/T 25184-2010 Verification method for X-ray photoelectron spectrometers
- GB/T 8360-1987 The lattice constant determination of metals--Method of X-ray diffractometer
- GB/T 13221-1991 Ultrafine powder-Determination of particle size distribution-Small-angle X-ray scattering method
- GB/T 26593-2011 Non-destructive testing instruments—Properties test method for performance of industrial X-ray computed tomography(CT) equipment
- GB/T 11685-2003 Measurement procedures for semiconductor X-ray detector system and semiconductor X-ray energy spectrometers
- GB/T 26594-2011 Non-destructive testing instruments—Properties test methods of industrial X-ray tube
- GB/T 26838-2024 Non-destructive testing instruments—Portable industrial X-ray radiographic equipment
- GB/T 28892-2024 Surface chemical analysis—X-ray photoelectron spectroscopy—Description of selected instrumental performance parameters
- GB/Z 42358-2023 Iron ores—Wavelength dispersive X-ray fluorescence spectrometers—Determination of precision
- GB/T 26595-2011 Non-destructive testing instruments—Specification for panoramic X-ray tube
- GB/T 8362-1987 Retained austenite in steel; Quantitative determination; Method of X-ray diffractometer
- GB/T 20726-2006 Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
- GB/Z 41286-2022 Non-destructive testing instruments—X-ray pipeline crawlers
- GB/T 26592-2011 Non-destructive testing instruments—Properties test methods of industrial X-ray apparatus
- GB 16355-1996 Radiation protection standards for X-ray diffraction and fluorescence analysis equipment
- GB/T 31364-2015 Test methods for main performance of energy dispersive X-ray fluorescence spectrometer
- GB/T 17606-2009 Determination of sulfur in crude-oil by energy-dispersive X-ray fluorescence spectrometry
- GB/T 26838-2011 Non-destructive testing instruments - Portable industrial X-ray radiographic equipment
- GB/Z 41399-2022 Non-destructive testing instruments—Industrial digital X-ray imaging system
- GB/T 26830-2011 Non-destructive testing instruments - High frequency constant potential X-ray equipment
工业和信息化部/国家能源局
- JB/T 12962.2-2016 Energy dispersive X-ray fluorescence spectrometer. Part 2: Element analyzer
- JB/T 12962.1-2016 Energy dispersive X-ray fluorescence spectrometer. Part 1: General specification
- JB/T 12962.3-2016 Energy dispersive X-ray fluorescence spectrometer. Part 3: Plating thickness analyzer
National Metrological Verification Regulations of the People's Republic of China
- JJG(地质) 1014-1990 Verification Regulations for Polycrystalline X-ray Diffractometer
- JJG 480-2007 Verification Regulation of X-Ray Thickness Gauge
- JJG 629-2014 Polycrystalline X-Ray Diffractometers
- JJG 629-1989 Polycrystalline X-ray Diffractometer
- JJG 480-1987 Verification Regulation of X-Ray Thickness Gauge
- JJG 810-1993 Wavelength Dispersive X-Ray Fluorescence Spectrometers
- JJG 1050-2009 X、gamma-ray Densitometry for Bone Mineral Density
Group Standards of the People's Republic of China
- T/CSCM 05-2020 Measurement of microvoids in fibers Small-angle X-ray scattering method
- T/CSBME 061-2022 Mammography high voltage generator
- T/QGCML 3980-2024 X-ray detector intelligent data acquisition system
- T/CAME 42-2022 Technical standard for X-ray skeletal age instrument
Professional Standard - Agriculture
- 57药典 四部-2020 0451 X-ray diffraction method
- 77药典 四部-2015 0451 X-ray diffraction method
- JJG(教委) 016-1996 Verification rules for wavelength dispersive X-ray fluorescence spectrometer
未注明发布机构
- DIN ISO 16129 E:2020-01 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- DIN ISO 15472 E:2019-09 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
- DIN ISO 15632 E:2015-05 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
- JIS Z 8891:2023 Particle size analysis -- Small angle X-ray scattering (SAXS)
- AS 2563:1996(R2016) Wavelength dispersive X-ray fluorescence spectrometers - Determination of precision
- DIN ISO 15632 E:2022-03 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
Professional Standard - Ferrous Metallurgy
- YB/T 5338-2006 Retained austenite in steel - Quantitative deternination - Method of X-ray diffractometer
- YB/T 5336-2006 Carbides in high speed steel -- Quantitative phase analysis -- Method of X-ray diffractometer
- YB/T 5337-2006 The lattice constant determination of metals -- Method of X-ray diffractometer
Professional Standard - Medicine
- YY/T 0724-2009 Particular specifications for dual energy X-ray bone densitometer
国家药监局
- YY/T 0724-2021 Particular specifications for dual-energy X-ray absorptiometry
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会
- GB/T 36017-2018 Non-destructive testing instruments—X-ray fluorescence analysis tube
Professional Standard - Meteorology
- QX/T 698-2023 Forward scattering visibility meter
机械电子工业部
- JB/T 5982-1991 X-ray directional instrument technical conditions
Professional Standard - Building Materials
- JC/T 1085-2008 X-ray fluorescence analyzer for cement
工业和信息化部
- YB/T 5338-2019 Quantitative determination of austenite in steel X-ray diffractometer method
Professional Standard - Geology
- DZ 0029-1992 HYX-3 microcomputer X-ray fluorescence instrument
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 37929-2019 Non-destructive testing instruments—Testing methods for life of X-ray tubes
- GB/T 37983-2019 Testing methods of X-ray diffraction for determining the orientation of crystal materials by rotation
Occupational Health Standard of the People's Republic of China
- GBZ 115-2002 Radiological standards for X-ray Diffraction and fluorescence analysis equipment
国家能源局
- SY/T 7324-2016 X-ray fluorescence logging instrument calibration method
Military Standard of the People's Republic of China-General Armament Department
- GJB 6298-2008 General specification for forward scatter visibility meter
Japanese Industrial Standards Committee (JISC)
- JIS C 3407:1987 High tension cables for X-ray apparatus
- JIS C 3407:2003 High voltage cables for X-ray apparatus
- JIS Z 4302:2002 Gamma-ray and hard X-ray film badges
- JIS Z 4910:1983 Anti-scatter grids
- JIS Z 4328:1984 Radiation survey meters for X and gamma rays
- JIS Z 4302:1997 Gamma-ray and hard X-ray film badges
- JIS Z 4816:1975 Back scattering X-ray reducing paints
- JIS Z 4818:1984 Reducing materials for back scattering X-rays
- JIS Z 4606:2007 Industrial X-ray apparatus for radiographic testing
- JIS Z 4324:1997 Area monitors for X and gamma rays
- JIS Z 4503:1989 Methods of evaluating dose equivalent by film badges for gamma rays and hard X-ray
- JIS Z 4913:1981 Film hangers for X-ray films
- JIS M 8205:2000 Iron ores -- X-ray fluorescence spectrometric analysis
- JIS Z 4324:2009 Area monitors for X and Gamma rays
- JIS Z 4311:1978 Personal exposure alarm meters for X and gamma-rays
SCC
- BS ISO 15632:2002 Microbeam analysis. Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
- DANSK DS/ISO 17867:2020 Particle size analysis – Small angle X-ray scattering (SAXS)
- BS DD ISO/TS 13762:2001 Particle size analysis. Small angle X-ray scattering method
- 10/30156853 DC BS EN 62495. Nuclear instrumentation. Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube
- DANSK DS/EN 60627:2015 Diagnostic X-ray imaging equipment - Characteristics of general purpose and mammographic anti-scatter grids
- BS 326:1928 Electrical performance of transformers for X-ray purposes
- CEI 45-20:1997 Exposure rate meters, indicators and exposure rate monitors installed for X-ray radiation or energy range between 80 keV and 3 MeV
- AS 2563:1982 Wavelength dispersive X-ray fluorescence spectrometers - Methods of test for determination of precision
- 11/30230635 DC BS ISO 16129. Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- 11/30199190 DC BS ISO 15632. Microbeam analysis. Instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
- BS 2000-336:1990 Methods of test for petroleum and its products-Sulphur in petroleum products by energy-dispersive X-ray fluorescence (non-dispersive X-ray fluorescence)
- DANSK DS/ISO 23484:2023 Determination of particle concentration by small-angle X-ray scattering (SAXS)
- 12/30244684 DC BS IEC 62709. Radiation protection instrumentation. Measuring the imaging performance of X-ray systems for security screening of humans
- DIN IEC 62495 E:2010 Draft Document - Nuclear instrumentation - Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube (IEC 45/702/CDV:2010)
- DIN IEC 62709 E:2014 Draft Document - Radiation protection instrumentation - Security screening of humans - Measuring the imaging performance of X-ray systems (IEC 62709:2014)
- BS ISO 15470:2004 Surface chemical analysis. X-ray photoelectron spectroscopy. Description of selected instrumental performance parameters
- DIN IEC 60627 E:2011 Draft Document - Diagnostic X-ray imaging equipment - Characteristics of general purpose and mammographic anti-scatter grids (IEC 62B/823/CD:2011)
- DANSK DS/EN 13925-3:2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
- AENOR UNE-EN 13925-3:2006 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
- NS-EN 13925-3:2005 Non destructive testing — X ray diffraction from polycrystalline and amorphous materials — Part 3: Instruments
- BS 5913:1980 Method of measuring and defining the characteristics of anti-scatter grids used in X-ray equipment
- VDI/VDE 5575 BLATT 4:2018 X-ray optical systems — X-ray mirrors and X-ray mirror systems — Total reflection and multilayer mirrors
- VDI/VDE 5575 BLATT 7-2019 X-ray optical systems - Refractive X-ray lenses
International Organization for Standardization (ISO)
- ISO 15632:2012 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
- ISO 15632:2021 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA)
- ISO 15632:2002 Microbeam analysis - Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
- ISO 17867:2015 Particle size analysis - Small-angle X-ray scattering
- ISO 17867:2020 Particle size analysis — Small angle X-ray scattering (SAXS)
- ISO 16129:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- ISO/TR 18231:2016 Iron ores - Wavelength dispersive X-ray fluorescence spectrometers - Determination of precision
- ISO 16129:2012 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- ISO/FDIS 23484 Determination of particle concentration by small-angle X-ray scattering (SAXS)
- ISO 23484:2023 Determination of particle concentration by small-angle X-ray scattering (SAXS)
- ISO 15470:2017 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
Association Francaise de Normalisation
- NF X21-008:2012 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive ray spectrometers for use in electron probe microanalysis
- NF C74-111:1985 Electromedical equipment. Radiology equipment. X radiation equipment. Radiodiagnostic X-ray tube assemblies. Construction and tests. Requirements.
- NF M60-522:1998 X and gamma radiation. Indirect- or direct-reading capacitor-type pocket dosemeters.
- NF M07-053:1995 Petroleum products. Determination of sulfur content. Energy-dispersive-X-ray fluorescence method.
- NF EN 60627:2015 X-ray imaging diagnostic equipment - Characteristics of anti-scattering grids for general use and mammography
- NF A09-280-3*NF EN 13925-3:2005 Non destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3 : instruments.
RU-GOST R
- GOST 25645.118-1984 Cosmic X-rays of the discrete sources. Energy spectra and angular coordinates
- GOST 22091.4-1986 X-ray devices. The methods of measuring of the voltage of X-ray tube
- GOST 22091.5-1986 X-ray devices. The methods of measuring X-ray tube current
- GOST 22091.7-1984 X-ray devices. The methods of the measuring of the uniformity of the distribution of the energe flyx density of the X-ray over the X-ray coverage
- GOST 22091.14-1986 X-ray devices. The method of measuring the energy flow density (photon flux density) of X-radiation
- GOST R IEC 61953-2001 Diagnostic X-ray imaging equipment. Characteristics of mammographic anti-scatter grids
- GOST 22091.3-1984 X-ray devices. Methods of measuring radiation field and beam angle of X-radiation
- GOST 20337-1974 X-ray devices. Terms and definitions
- GOST 22091.10-1984 X-ray devices. The method of measuring AL(CU) equivalent of X-ray device envelope
- GOST 25645.131-1986 Galactic diffuse gamma and X-rays. Characteristics of angular and energy distributions
- GOST 22091.2-1984 X-ray devices. The methods of measuring of the current and the voltage of injection of X-ray betatrons
- GOST 25645.117-1984 Extragalactic diffuse gamma-and X-radiation. Characteristics of angular and energy distributions
- GOST 29025-1991 Non-destructive testing. X-ray television flaw detectors with X-ray electronic optical transducers electric radiographic flaw detectors. General technical requirements
- GOST 22091.6-1984 X-ray devices. Methods of measuring X-radiation exposure dose power and X-radiation exposure dose per pulse
- GOST 22091.11-1980 X-ray devices. The method of the measuring of the time operation readiness of the device
- GOST R 53203-2008 Petroleum products. Determination of sulfur by method of wavelength dispersive X-ray fluorescence spectrometry
SE-SIS
- SIS SS IEC 627:1986 X-ray equipment - Characteristics of anti-scatter grids used in X-ray equipment
- SIS SS IEC 759:1986 Nuclear instrumentation —Test procedures for semiconductor X-ray energy spectrometers
- SIS SS IEC 656:1981 Nuclear instrumentation — Test procedures for high-purity germanium detectors for X and gamma radiation
- SIS SS IEC 520:1989 X-ray equipment — Entrance fieldsizes of electrooptical X-ray image intensifiers
- SIS SS IEC 463:1983 Nuclear instrumentation - Low energy X or gamma radiation portable exposure r?te meters and monitors for use in radiological protection
- SIS SS IEC 395:1983 Nuclear instrumentation - Portable X or gamma radiation exposure r?te meters and monitors for use in radiological protection
- SIS SS IEC 858:1987 X-ray equipment - Determination of the image distortion of electro-optical X-ray image intensifiers
- SIS SS IEC 580:1986 X-ray equipment - Area exposure product meter
- SIS SS IEC 572:1986 X-ray equipment - Determination ofthe luminance distribution of electro-optical X-ray image intensifiers
- SIS SS IEC 573:1986 X-ray equipment - Measurement of the conversion factor of electro-opticalX-ray image intensifiers
- SIS SS IEC 637:1986 X-ray equipment - Marking of and accompanying documents for X-ray tu bes and X-ray tube assemblies for medical use
Korean Agency for Technology and Standards (KATS)
- KS A 4816-1985 BACK SCATTERING X-RAY REDUCING PAINTS
- KS D ISO 15632:2012 Microbeam analysis-Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
- KS A 4816-1980(1995) BACK SCATTERING X-RAY REDUCING PAINTS
- KS A 4729-1997 Anti - scatter grids
- KS A IEC 61137-2003(2013) Radiation protection instrumentation-Installed personnel surface contamination monitoring assembly-Low energy X and gamma emitters
- KS A 4816-2000 BACK SCATTERING X-RAY REDUCING PAINTS
- KS A 4902-1987 Resolution test charts for X- ray apparatus
- KS A 4902-1979 Resolution test charts for X- ray apparatus
- KS C IEC 61283-2016 Radiation protection instrumentation-Direct reading personal dose equivalent(rate) monitors-X, gamma and high energy beta radiation
- KS C IEC 61283-2005(2015) Radiation protection instrumentation-Direct reading personal dose equivalent(rate) monitors-X, gamma and high energy beta radiation
- KS A 4901-2002 Characteristics of anti-scatter grids used in X-ray equipment
- KS C IEC 60627:2003 Diagnostic X-ray imaging equipment-Characteristics of general purpose and mammographic anti-scatter grids
- KS C 3612-2008 High tension cables for X-ray apparatus
- KS C IEC 60759:2009 Standard test procedures for semiconductor X-ray energy spectrometers
- KS C IEC 60759-2019 Standard test procedures for semiconductor X-ray energy spectrometers
- KS C IEC 60759-2009(2019) Standard test procedures for semiconductor X-ray energy spectrometers
- KS C IEC 61283:2005 Radiation protection instrumentation-Direct reading personal dose equivalent(rate) monitors-X, gamma and high energy beta radiation
- KS C 3612-1987 High tension cables for X-ray apparatus
- KS C 3612-2008(2018) High tension cables for X-ray apparatus
- KS C IEC 61283:2016 Radiation protection instrumentation-Direct reading personal dose equivalent(rate) monitors-X, gamma and high energy beta radiation
- KS A 4901-2002(2012) X-RAY GRIDS
- KS D ISO 15470-2020 Surface chemical analysis-X-ray photoelectron spectroscopy-Description of selected instrumental performance parameters
- KS A IEC 61525-2003(2013) Radiation protection instrumentation-X, gamma, high energy beta and neutron radiations-Direct reading personal dose equivalent and/or dose equivalent rate monitors
- KS A IEC 61525-2016 Radiation protection instrumentation-X, gamma, high energy beta and neutron radiations-Direct reading personal dose equivalent and/or dose equivalent rate monitors
- KS C IEC 60627:2019 Diagnostic X-ray imaging equipment — Characteristics of general purpose and mammographic anti-scatter grids
- KS D ISO 15632:2018 Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
- KS A IEC 61525:2016 Radiation protection instrumentation-X, gamma, high energy beta and neutron radiations-Direct reading personal dose equivalent and/or dose equivalent rate monitors
- KS C 3612-2023 High tension cables for X-ray apparatus
- KS A ISO 14146:2007 Radiation protection-Criteria and performance limits for the periodic evaluation of processors of personal dosemeters for X and gamma radiation
- KS C IEC 60601-2-7-2002(2012) High-voltage generators of diagnostic X-ray generators
- KS M ISO 8754:2019 Petroleum products-Determination of sulfur content-Energy dispersive X-ray fluorescence method
- KS M ISO 8754:2016 Petroleum products-Determination of sulfur content-Energy dispersive X-ray fluorescence method
- KS A 4610-2006 Portable photon ambient dose equivalent ratemeters for radiation protection
- KS C IEC 61452-2022 Nuclear instrumentation — Measurement of gamma-ray emission rates of radionuclides — Calibration and use of germanium spectrometers
British Standards Institution (BSI)
- BS ISO 17867:2015 Particle size analysis. Small-angle X-ray scattering
- BS ISO 17867:2020 Particle size analysis. Small angle X-ray scattering (SAXS)
- DD ISO/TS 13762:2001 Particle size analysis. Small angle X-ray scattering method
- BS DD ISO/TS 13762:2002 Particle size analysis - Small angle X-ray scattering method
- BS EN 61953:1998 Diagnostic X-ray imaging equipment. Characteristics of mammographic anti-scatter grids
- BS ISO 16129:2018 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- BS ISO 16129:2012 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- BS IEC 62709:2014 Radiation protection instrumentation. Security screening of humans. Measuring the imaging performance of X-ray systems
- BS EN 13925-3:2005 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Instruments
- BS EN 13925-3:2005(2009) Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Instruments
- BS ISO 23484:2023 Determination of particle concentration by small-angle X-ray scattering (SAXS)
- BS IEC 62945:2018 Radiation protection instrumentation. Measuring the imaging performance of X-ray computed tomography (CT) security-screening systems
- PD ISO/TR 18231:2016 Iron ores. Wavelength dispersive X-ray fluorescence spectrometers. Determination of precision
- BS PD ISO/TR 18231:2016 Iron ores. Wavelength dispersive X-ray fluorescence spectrometers. Determination of precision
- BS ISO 15632:2012 Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
- BS ISO 15632:2021 Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA)
- 22/30441138 DC BS ISO 23484. Determination of particle concentration by smallangle X-ray scattering (SAXS)
- 22/30451249 DC BS IEC 62709. Radiation protection instrumentation. Security screening of humans. Measuring the imaging performance of X-ray systems
- 22/30451246 DC BS IEC 62463. Radiation protection instrumentation. X-ray systems for the security screening of persons
GSO
- OS GSO ISO 17867:2017 Particle size analysis -- Small-angle X-ray scattering
- GSO ISO 17867:2017 Particle size analysis -- Small-angle X-ray scattering
- GSO IEC 61335:2014 Nuclear instrumentation - Bore-hole apparatus for X-ray fluorescence analysis
- BH GSO IEC 62495:2016 Nuclear instrumentation - Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube
- OS GSO IEC 62495:2014 Nuclear instrumentation - Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube
- BH GSO ISO 16129:2015 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- OS GSO ISO 16129:2014 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- OS GSO IEC 60627:2014 Diagnostic X-ray imaging equipment - Characteristics of general purpose and mammographic anti-scatter grids
- GSO ISO/TR 18231:2021 Iron ores — Wavelength dispersive X-ray fluorescence spectrometers — Determination of precision
- BH GSO ISO/TR 18231:2022 Iron ores — Wavelength dispersive X-ray fluorescence spectrometers — Determination of precision
- GSO IEC 60759:2015 Standard test procedures for semiconductor X-ray energy spectrometers
- GSO ASTM F3094:2021 Standard Test Method for Determining Protection Provided by X-ray Shielding Garments Used in Medical X-ray Fluoroscopy from Sources of Scattered X-Rays
- BH GSO ASTM F3094:2022 Standard Test Method for Determining Protection Provided by X-ray Shielding Garments Used in Medical X-ray Fluoroscopy from Sources of Scattered X-Rays
- OS GSO IEC 60759:2015 Standard test procedures for semiconductor X-ray energy spectrometers
- GSO IEC 62945:2021 Radiation protection instrumentation - Measuring the imaging performance of X-ray computed tomography (CT) security-screening systems
- GSO IEC 60627:2014 Diagnostic X-ray imaging equipment - Characteristics of general purpose and mammographic anti-scatter grids
- GSO 806:1997 PETROLEUM PRODUCTS – DETERMINATION OF SULPHUR CONTENT BY NON-DISPERSIVE X-RAY FLUORESCENCE METHOD
- BH GSO IEC 62945:2022 Radiation protection instrumentation - Measuring the imaging performance of X-ray computed tomography (CT) security-screening systems
- GSO IEC 62495:2014 Nuclear instrumentation - Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube
- BH GSO ISO 15632:2017 Microbeam analysis -- Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
- OS GSO ISO 15632:2015 Microbeam analysis -- Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
- BH GSO IEC 61335:2016 Nuclear instrumentation - Bore-hole apparatus for X-ray fluorescence analysis
- OS GSO IEC 61335:2014 Nuclear instrumentation - Bore-hole apparatus for X-ray fluorescence analysis
German Institute for Standardization
- DIN ISO 15632:2022-09 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA) (ISO 15632:2...
- DIN ISO 15632:2015 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis (ISO 15632:2012)
- DIN 51418-1:2008 X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: Definitions and basic principles
- DIN ISO 16129:2020-11 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
- DIN 51418-1:1996 X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: Definitions and basic principles
- DIN EN 60627:2006 Diagnostic X-ray imaging equipment - Characteristics of general purpose and mammographic anti-scatter grids (IEC 60627:2001); German version EN 60627:2001
- DIN IEC 62495:2011 Nuclear instrumentation - Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube (IEC 62495:2011)
- DIN 51418-2:2015 X-ray spectrometry - X-ray emission and X-ray fluorescence analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results
- DIN 51418-2:1996 X-ray spectrometry - X-ray emission- and X-ray fluorescense analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results
- DIN 51577-4:1994 Testing of mineral oil hydrocarbons and similar products; determination of chlorine and bromine content; analysis by energy dispersive X-ray spectrometry with low cost instruments
- DIN 6836:1963 X-ray tubes and single tank X-ray generators; holders for X-ray application tables and stands, dimensions for assembling
- DIN IEC 62709:2015 Radiation protection instrumentation - Security screening of humans - Measuring the imaging performance of X-ray systems (IEC 62709:2014)
- DIN EN 60627:2016-08 Diagnostic X-ray imaging equipment - Characteristics of general purpose and mammographic anti-scatter grids (IEC 60627:2013); German version EN 60627:2015
- DIN EN 13925-3:2005-07 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments; German version EN 13925-3:2005
- DIN EN 13925-3:2005 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments; German version EN 13925-3:2005
- DIN ISO 16129:2020 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
- DIN 6868-4:1987 Image quality assurance in X-ray diagnosis; constancy checking in radioscopy with an X-ray image intensifier and photography from the X-ray image intensifier output screen
VN-TCVN
- TCVN 6596-2000 X ray diagnostic radiography and fluoroscopy.Generator, X ray tube, collimator.Test procedure
American Society for Testing and Materials (ASTM)
- ASTM E1172-87(2003) Standard Practice for Describing and Specifying a Wavelength-Dispersive X-Ray Spectrometer
- ASTM F3094-14(2022) Standard Test Method for Determining Protection Provided By X-ray Shielding Garments Used in Medical X-ray Fluoroscopy from Sources of Scattered X-Rays
- ASTM E1172-87(2001) Standard Practice for Describing and Specifying a Wavelength-Dispersive X-Ray Spectrometer
- ASTM F3094-14 Standard Test Method for Determining Protection Provided by X-ray Shielding Garments Used in Medical X-ray Fluoroscopy from Sources of Scattered X-Rays
- ASTM E1931-97(2003) Standard Guide for X-Ray Compton Scatter Tomography
- ASTM E1931-09 Standard Guide for X-Ray Compton Scatter Tomography
- ASTM E1931-16(2022) Standard Guide for Non-computed X-Ray Compton Scatter Tomography
- ASTM E1931-97 Standard Guide for X-Ray Compton Scatter Tomography
- ASTM E1172-87(1996) Standard Practice for Describing and Specifying a Wavelength-Dispersive X-Ray Spectrometer
- ASTM E1621-05 Standard Guide for X-Ray Emission Spectrometric Analysis
- ASTM E1588-10e1 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
- ASTM E1931-16 Standard Guide for Non-computed X-Ray Compton Scatter Tomography
- ASTM E1172-16 Standard Practice for Describing and Specifying a Wavelength Dispersive X-Ray Spectrometer
- ASTM E1172-22 Standard Practice for Describing and Specifying a Wavelength Dispersive X-Ray Spectrometer
- ASTM E1172-87(2011) Standard Practice for Describing and Specifying a Wavelength-Dispersive X-Ray Spectrometer
- ASTM F1467-18 Standard Guide for Use of an X-Ray Tester (≈10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
Standard Association of Australia (SAA)
- AS 2563:1996 Wavelength dispersive X-ray fluorescence spectrometers - Determination of precision
- AS 2563:2019 Iron ores — Wavelength dispersive X-ray fluorescence spectrometers — Determination of precision
International Electrotechnical Commission (IEC)
- IEC 61953:1997 Diagnostic X-ray imaging equipment - Characteristics of mammographic anti-scatter grids
- IEC 62709:2014 Radiation protection instrumentation - Security screening of humans - Measuring the imaging performance of X-ray systems
- IEC 60759:1983 Standard test procedures for semiconductor X-ray energy spectrometers
- IEC 61283:1995 Radiation protection instrumentation - Direct reading personal dose equivalent (rate) monitors - X, gamma and high energy beta radiation
- IEC 61335:1997 Nuclear instrumentation - Bore-hole apparatus for X-ray fluorescence analysis
- IEC 62945:2018 Radiation protection instrumentation - Measuring the imaging performance of X-ray computed tomography (CT) security-screening systems
- IEC 60627:1978 Characteristics of anti-scatter grids used in X-ray equipment
- IEC 62495:2011 Nuclear instrumentation - Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube
- IEC 60463:1974 Low energy X or gamma radiation portable exposure rate meters and monitors for use in radiological protection
- IEC 61137:1992 Radiation protection instrumentation; installed personnel surface contamination monitoring assemblies; low energy X and gamma emitters
- IEC 60759:1983/AMD1:1991 Standard test procedures for semiconductor X-ray energy spectrometers; amendment 1
Indonesia Standards
- SNI 18-6938-2002 Specification of X-rays or Y-rays radiation portable surveymeter
ES-UNE
- UNE-EN 60627:2015 Diagnostic X-ray imaging equipment - Characteristics of general purpose and mammographic anti-scatter grids (Endorsed by AENOR in July of 2015.)
European Committee for Electrotechnical Standardization(CENELEC)
- EN 61953:1998 Diagnostic X-Ray Imaging Equipment Characteristics of Mammographic Anti-Scatter Grids
- EN 60627:2015 Diagnostic X-ray imaging equipment - Characteristics of general purpose and mammographic anti-scatter grids
VDE - VDE Verlag GmbH@ Berlin@ Germany
- VDE 0412-20-2011 Strahlungsmessgeraete - Tragbare Roentgenfluoreszenz-Analysegeraete mit Kleinstroentgenroehre (IEC 62495:2011)
- VDE 0412-12-2015 Strahlenschutzinstrumentierung - Sicherheitskontrolle von Personen - Messung der Bildqualitaet von Roentgensystemen (IEC 62709:2014)
AENOR
- UNE 20617:1981 CHARACTERISTICS OF ANTI-SCATTER GRIDS USED IN X-RAY EQUIPMENT
- UNE-EN 60627:2002 Diagnostic X-ray imaging equipment - Characteristics of general purpose and mammographic anti-scatter grids.
- UNE-EN 13925-3:2006 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
American National Standards Institute (ANSI)
- ANSI N42.26-1995 Radiation Protection Instrumentation - Monitoring Equipment - Personal Warning Devices for X and Gamma Radiations
- ANSI/ASTM E915:1996 Method for Verifying the Alignment of X-Ray Diffraction Instrumentation for Residual Stress Measurement
CZ-CSN
- CSN 35 6575 Z1-1997 Standard test procedureds for semiconductor X-ray energy spectrometers
- CSN 36 4710-1974 X-ray medical apparatus
Association of German Mechanical Engineers
- VDI/VDE 5575 Blatt 9-2012 X-ray optical systems - X-ray filters
VDI - Verein Deutscher Ingenieure
- VDI/VDE 5575 BLATT 4-2018 X-ray optical systems - X-ray mirrors and X-ray mirror systems - Total reflection mirrors and multilayer mirrors
- VDI/VDE 5575 BLATT 4-2017 X-ray optical systems - X-ray mirrors and X-ray mirror systems - Total reflection mirrors and multilayer mirrors
- VDI/VDE 5575 Blatt 3-2009 X-Ray optical systems - Cappilary x-ray optics
- VDI/VDE 5575 Blatt 7-2007 X-Ray optical systems - Refractive X-ray optics - Definition of parameters
Institute of Electrical and Electronics Engineers (IEEE)
- ANSI/IEEE Std 759-1984 IEEE Standard Test Procedures for Semiconductor X-Ray Energy Spectrometers
KR-KS
- KS C 3612-2008(2023) High tension cables for X-ray apparatus
- KS D ISO 15632-2018 Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
- KS C IEC 60627-2019 Diagnostic X-ray imaging equipment — Characteristics of general purpose and mammographic anti-scatter grids
- KS M ISO 8754-2019 Petroleum products-Determination of sulfur content-Energy dispersive X-ray fluorescence method
BE-NBN
- NBN 400-2-1969 Radiation equipment: medical X-ray generators and accessories. ray tube
- NBN 400-4-1969 Radiation equipment: medical X-ray generators and accessories. Structural features that prevent X-ray radioactivity
IN-BIS
- IS 12737-1988 Standard test procedures for semiconductor X-ray energy spectrometers
European Committee for Standardization (CEN)
- EN 13925-3:2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
Lithuanian Standards Office
- LST EN 13925-3-2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
- LST EN 60627+AC-2003 Diagnostic X-ray imaging equipment - Characteristics of general purpose and mammographic anti-scatter grids (IEC 60627:2001)
Danish Standards Foundation
- DS/EN 13925-3:2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
- DS/EN ISO 8754:1995 Petroleum products - Determination of sulfur content - Energy-dispersive-X-ray fluorescence method
PT-IPQ
- E E 14-1971 X-ray diffraction analysis
x-ray scattering instrument,x-ray scattering instrument,High Energy X-ray Scattering Instrument,small x-ray scattering instrument