JB/T 5482-2011 in English

VALID

X-ray Orientation apparatus

Issued on:2011-12-20
Implemented on:2012-04-01
File Format:PDF
Delivery:Via email within 1~3 business days

Price(USD)： $180.00
$175.00

Standard No:	JB/T 5482-2011
Document status:	VALID
Title in English:	X-ray Orientation apparatus
Title in Chinese:	X射线晶体定向仪
Language:	English
File Format:	Electronic (PDF)
Delivery:	Via email within 1~3 business days
Issued on:	2011-12-20
Implemented on:	2012-04-01
Superseding:	JB/T 5482-2004 The specification for X-ray Crystal Orientation apparatus
ICS Classification:	17.180.99-Other standards related to optics and optical measurements
Chinese Classification:	N78-X ray, magnetic powder, fluorescent light and other defectoscope
Professional Classification:	JB-Machinery
Related Keywords:	x-ray orientation apparatus scopethis standard x-ray crystal orientators double crystal diffraction type orientation meters x-ray various single crystal
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Crystal orientation analysis Crystal Crystal Diffraction x-ray ash analyzer x-ray ash analyzer non-medical x-ray apparatus x-ray diffractometer crystal X-ray crystallography Single crystal diffractometer crystal X-ray spectrometer microdisk x-diffraction + crystals Ray Scattering Instruments Crystal orientation Crystal X-ray diffractometer x-crystal ray diffractometer Crystal diffractometer crystal instrument x-ray rapid orientation method X-ray crystallography x-ray instrument An instrument that detects x-rays X-ray general instrument Crystalline X-ray Diffractionx X-ray crystal diffraction curve X-ray energy spectrometer sample preparation Single Crystal Orienter Determination of Polycrystals by X-ray Diffraction Single crystal angle head Orientation Analyzer Industrial Directional X-Ray Instruments X-ray security detector X-ray diffractometers and single crystals X-ray single crystal orientation instrument X-ray single crystal orientation instrument Rays and Matter x X-ray crystallographic analysis: crystal instrument crystallinity rays Crystallizer window x-ray spectrometer x-ray monochromator x-ray xrd directional finder X-ray diffraction grains x-ray measuring instrument x-ray crystallography space x-ray X-ray single crystal diffractometer X-ray reflectometer x-ray degree x-ray crystallography transmission crystal X-ray goniometer space x-ray X+ ray single crystal diffractometer x-ray solid x-ray circuit slightly incident x-rays X-ray reflectometer dislocation x-ray X-ray dorsal apparatus x-ray effect Multi-directional x-ray construction Single crystal x-ray diffractometer analysis crystal orientation xrd Crystal orientation index directional x-ray machine X-ray Diffraction and Crystals X-ray inspection machine X-ray principle Is an x-ray diffractometer the same as an x-ray scatterometer x-ray diffraction crystals Single crystal x-ray analysis in situ x-ray X-ray energy spectrometer Small X-ray detector Crystals in X-ray Diffraction Crystalline family determination of crystallinity x-ray X-ray quality detector x-ray peak determination x-ray peak broadening x-ray single crystal X-ray Diffraction Analysis Crystal Orientation crystal plane orientation Agricultural Soft X-ray Instrument X-ray machine operation X diffractometer single crystal X-ray machine principle In crystal diffraction, why use x-rays X-ray single crystal diffractometer and x-ray in situ x-ray X-ray machine structure Orientation instrument xrd Crystal direction concentration multiple emitter transistor High Energy X-ray Scattering Instrument X-ray orientation instrument confirmation x-ray crystallinity analysis X-ray spectrometer one x-ray ash analyzer x-ray ash analyzer X-ray tetracircle Silicon Single Wafer Orienter crystal growth x-ray height Basic principles of x-ray equipment transmission crystal Directional finder price Directional finder price atomic x-ray xrd oriented crystal X-ray single crystal analyzer The principle of x-ray machine x ray and water Detect crystal x-rays x-ray crystallography x crystal ray apparatus X-ray single crystal diffractometer and x-ray diffractometer Ray Hardness Tester dorsal x-ray machine Test method for rotational orientation of crystal materials by x-ray diffractometer X-ray energy spectrometer soft x-ray machine Ray Hardness Tester X-ray machine industry principal direction of crystal Crystal orientation measuring machine Crystal diffractometer Gas Calibrator X-ray energy spectrometer X-ray diffraction crystal form X-ray spectrometer detection X-ray monochromator Crystal direction 2 Crystal instrument x-ray device small x-ray scattering instrument x-shot X-ray dispersometer X-ray single crystal analyzer Rays Single Crystal X-ray Diffraction Analysis X-ray single crystal diffractometer composition crystal orientation of x-rays X-ray spectrometer principle X-ray measurement of polycrystalline orientation Instruments for determining crystal structure

本标准规定了X射线晶体定向仪的要求，试验方法、检验规则以及标志、包装、运输和贮存的基本要求。
本标准适用于各种单晶、双晶衍射型定向仪。

Scope

This standard specifies the requirements for X-ray crystal orientators (hereinafter referred to as orientators), test methods, inspection rules and basic requirements for marking, packaging, transportation and storage. This standard is applicable to various single crystal and double crystal diffraction type orientation meters.

More samples: YD/T 3934-2021 GB 50021-2001(2009) JJG 21-2008

Sample only — not a preview of JB/T 5482-2011

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