X-ray measurement of polycrystalline orientation

X-ray measurement of polycrystalline orientation, Total:64 items.

The international standard classification for "X-ray measurement of polycrystalline orientation" includes: Materials for aerospace construction , Semiconducting materials , Other standards related to optics and optical measurements , Other standards related to analytical chemistry , Testing of metals .

The Chinese standard classification for "X-ray measurement of polycrystalline orientation" includes: Basic standards for aviation and aerospace materials , Semimetal and semiconductor material in general , Metal physical property test method , X ray, magnetic powder, fluorescent light and other defectoscope , Electron optics and other physical optics instrument , Mass spectrometer, liquid spectrometer, energy spectrometer and combined devices of them , Material composition analysis instrument and environment detection instrument in general .

Professional Standard - Aviation

HB 6742-1993 Determination of Crystal Orientation for Monocrystal Blade - X-ray Back-reflection Laue Photograph Method

Professional Standard - Commodity Inspection

SN/T 3514-2013 Identification method of texture analysis for grain oriented and non-oriented electrical steels. X-ray diffraction(XRD)

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 13388-1992 Method for measuring crystallographic orientation of flats on single crystal silicon slices and wafers by X-ray techniques
GB/T 13388-2009 Method for measuring crystallographic orientation of flats on single-crystal silicon slices and wafers by X-ray techniques

Professional Standard - Machinery

JB/T 5482-2011 X-ray Orientation apparatus
JB/T 5482-2004 The specification for X-ray Crystal Orientation apparatus

National Metrological Verification Regulations of the People's Republic of China

JJG 629-2014 Polycrystalline X-Ray Diffractometers
JJG 629-1989 Polycrystalline X-ray Diffractometer
JJG(地质) 1014-1990 Verification Regulations for Polycrystalline X-ray Diffractometer

Professional Standard - Education

JY/T 009-1996 General rules for X-ray polycrystalline diffractometry
JY/T 0587-2020 General rules for X-ray polycrystalline diffractometry

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 37983-2019 Testing methods of X-ray diffraction for determining the orientation of crystal materials by rotation

National Metrological Technical Specifications of the People's Republic of China

JJF 1256-2010 Calibration Specification for X-ray Monocrystal Orientation Equipment

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 34612-2017 Measurement method for X-ray double crystal diffraction rocking curve of sapphire crystals

British Standards Institution (BSI)

BS EN 13925-1:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - General principles
BS EN 13925-1:2003(2008) Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - General principles
BS EN 13925-3:2005 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Instruments
BS EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Procedures
BS EN 13925-3:2005(2009) Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Instruments
BS EN 13925-2:2003(2008) Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Procedures

German Institute for Standardization

DIN EN 13925-1:2003-07 Non-destructive testing - X-ray diffraction from polycristalline and amorphous material - Part 1: General principles; German version EN 13925-1:2003
DIN EN 13925-3:2005-07 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments; German version EN 13925-3:2005
DIN EN 13925-2:2003-07 Non-destructive testing - X-ray diffraction from polycristalline and amorphous material - Part 2: Procedures; German version EN 13925-2:2003
DIN 50433-1:1976 Testing of semi-conducting inorganic materials; determining the orientation of single crystals by means of X-ray diffraction
DIN 51418-1:2008 X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: Definitions and basic principles
DIN EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycristalline and amorphous material - Part 2: Procedures; German version EN 13925-2:2003
DIN EN 13925-1:2003 Non-destructive testing - X-ray diffraction from polycristalline and amorphous material - Part 1: General principles; German version EN 13925-1:2003
DIN EN 13925-3:2005 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments; German version EN 13925-3:2005

Association Francaise de Normalisation

NF EN 13925-1:2003 Essais non destructifs - Diffraction des rayons X appliquée aux matériaux polycristallins et amorphes - Partie 1 : principes généraux
NF A09-280-1*NF EN 13925-1:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous material - Part 1 : general principles.
NF EN 1330-11:2007 Non-destructive testing - Terminology - Part 11: X-ray diffraction of polycrystalline and amorphous materials
NF EN 13925-2:2003 Essais non destructifs - Diffraction des rayons X appliquée aux matériaux polycristallins et amorphes - Partie 2 : procédures
NF EN 13925-3:2005 Essais non destructifs - Diffraction des rayons X appliquée aux matériaux polycristallins et amorphes - Partie 3 : appareillage
NF A09-280-3*NF EN 13925-3:2005 Non destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3 : instruments.
NF A09-280-2*NF EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycristalline and amorphous materials - Part 2 : procedures

SCC

NS-EN 13925-1:2003 Non-destructive testing — X-ray diffraction from polycrystalline and amorphous material — Part 1: General principles
AENOR UNE-EN 13925-1:2006 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous material - Part 1: General principles
DANSK DS/EN 13925-1:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous material - Part 1: General principles
DANSK DS/EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 2: Procedures
DANSK DS/EN 13925-3:2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
AENOR UNE-EN 13925-3:2006 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
NS-EN 13925-3:2005 Non destructive testing — X ray diffraction from polycrystalline and amorphous materials — Part 3: Instruments
NS-EN 13925-2:2003 Non-destructive testing — X-ray diffraction from polycrystalline and amorphous materials — Part 2: Procedures
AENOR UNE-EN 1330-11:2008 Non-destructive testing - Terminology - Terms used in X-ray diffraction from polycrystalline and amorphous materials
DANSK DS/EN 1330-11:2007 Non-destructive testing - Terminology - Terms used in X-ray diffraction from polycrystalline and amorphous materials
NS-EN 1330-11:2007 Non-destructive testing — Terminology — Terms used in X-ray diffraction from polycrystalline and amorphous materials
DIN 51418-1 E:2007 Draft Document - X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: Definitions and basic principles

Danish Standards Foundation

DS/EN 13925-1:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous material - Part 1: General principles
DS/EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 2: Procedures
DS/EN 13925-3:2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
DS/EN 1330-11:2007 Non-destructive testing - Terminology - Terms used in X-ray diffraction from polycrystalline and amorphous materials

Lithuanian Standards Office

LST EN 13925-1-2004 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous material - Part 1: General principles
LST EN 13925-2-2004 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 2: Procedures
LST EN 13925-3-2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
LST EN 1330-11-2007 Non-destructive testing - Terminology - Terms used in X-ray diffraction from polycrystalline and amorphous materials

AENOR

UNE-EN 13925-1:2006 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous material - Part 1: General principles
UNE-EN 13925-3:2006 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
UNE-EN 13925-2:2004 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 2: Procedures

American Society for Testing and Materials (ASTM)

ASTM F847-94(1999) Standard Test Methods for Measuring Crystallographic Orientation of Flats on Single Crystal Silicon Wafers by X-Ray Techniques
ASTM E975-00 Standard Practice for X-Ray Determination of Retained Austenite in Steel with Near Random Crystallographic Orientation
ASTM E975-22 Standard Test Method for X-Ray Determination of Retained Austenite in Steel with Near Random Crystallographic Orientation

European Committee for Standardization (CEN)

EN 13925-1:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 1: General principles
EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 2: Procedures
EN 13925-3:2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments

Others: