JY/T 009-1996 in English

SUPERSEDED

General rules for X-ray polycrystalline diffractometry

Issued on:1997-01-23
Implemented on:1997-04-01
File Format:PDF
Delivery:Via email within 1~3 business days

Price(USD)： $250.00
$243.00

Standard No:	JY/T 009-1996
Document status:	SUPERSEDED
Superseded by:	JY/T 0587-2020 General rules for X-ray polycrystalline diffractometry
Superseded on:	2020-12-01
Title in English:	General rules for X-ray polycrystalline diffractometry
Title in Chinese:	现代分析仪器分析方法通则转靶多晶体X射线衍射方法通则
Language:	English
File Format:	Electronic (PDF)
Delivery:	Via email within 1~3 business days
Issued on:	1997-01-23
Implemented on:	1997-04-01
Chinese Classification:	N54-Mass spectrometer, liquid spectrometer, energy spectrometer and combined devices of them
Professional Classification:	JY-Education
Related Keywords:	x-ray polycrystalline diffractometry x-ray appendix g polycrystal x-ray diffractometer general determination method various polycrystalline materials
Related Topics:	x-ray diffraction group Ray standard crystal diffraction crystal diffraction Diffraction peak intensity Diffraction peaks p2 polycrystalline x-ray diffractometer turn target X-ray single crystal diffractometer X-ray single crystal diffractometer Four-circle single crystal X-ray diffractometer Diffraction peak intensity x-ray standard sample crystal French jy x-ray single crystal diffraction X-ray Diffraction of Crystals x-ray polycrystal diffraction Diffraction peaks jy/t003-1996 X-ray diffraction sample preparation jy/t+017-1996 rotating target x-ray xrd diffraction target Crystallinity by X-ray Diffraction x-ray diffraction reverse zero diffraction jy t 021 1996 x-ray diffraction particle size target single crystal Target polycrystal x-ray diffractometer Principles of X-ray Polycrystal Diffraction jy.t Why X-ray Diffraction Diffraction peak crystal form jy/t 009-1996 single crystal x-ray analysis X-ray diffraction abroad target method X-ray Diffraction and Polycrystalline X-ray Diffraction multiple diffraction target x-ray diffractometer Single crystal x-ray diffractometer tens of thousands jy/t007-1996 jy/t+015-1996 jy/t-009 How to use x-ray diffraction Target system jy t 017 1996 Mini X-ray Diffraction X-ray diffraction analysis of crystal form target diffractometer single crystal x-ray analysis Crystalline X-ray Diffraction X-ray diffraction peak at 27 degrees X-ray diffraction parameters v target x-ray X-ray diffraction peak width Derived jy/t020-1996 x-ray diffraction and x-rays single crystal x-ray diffractometer jy/t015-1996 multi-sample multi-target Target function twin electron diffraction Electron Diffraction of Twins X-ray diffractometer target X-ray chromium target wavelength polychromatic rays X-ray diffractometry x-crystal diffractometer x-ray rotary target rotating target x-ray xrd x-ray diffraction x-ray polycrystal diffraction twin electron diffraction Target + x-ray diffractometer Target device Crystal X Diffraction x-ray diffractometer, target multi-level diffractive second order diffraction method of producing crystals Novel X-ray Diffraction X-ray diffractometer target type X-ray diffractometer target X-ray Diffraction Intermediate x-ray crystallography multi-target Automated X-ray Diffraction X-ray single crystal diffractometer Crystal Crystal Diffraction High Energy X-ray Diffraction Alloy x-ray diffraction x-ray sample preparation method Principle of Polycrystalline Diffraction x-ray diffractometer crystal X-ray crystallography twinning, double diffraction Single crystal diffractometer crystal x-diffraction + crystals x-ray diffraction crystallinity Crystal X-ray diffractometer xrd target crystal x-crystal ray diffractometer Rotating Target Single Crystal Analyzer x-ray rotating target Multiple diffraction peak intensity Diffraction Peak Grains Broadening of x-diffraction peaks x-crystal diffraction Crystal diffractometer single crystal target Secondary Diffraction Diffraction Spot X-ray crystallography xrd multi-level diffraction Diffraction of Polycrystalline and Amorphous Crystalline X-ray Diffractionx X-ray crystallography High Energy X-ray Diffraction X-ray crystal diffraction curve X-ray crystallography method method of making crystals twinning + electron diffraction twin crystal diffraction x diffraction + crystallinity Determination of Polycrystals by X-ray Diffraction jy/t021-1996 x-ray diffraction polycrystal x-ray copper target X-ray diffractometers and single crystals polycrystal diffraction Polycrystal Diffraction target algorithm Polycrystalline X-ray Diffraction Principles multi-level diffraction Ray Diffraction X-ray crystallographic analysis: X-ray diffraction equipment X-ray Diffraction Amorphous diffractive amorphous Amorphous Diffraction 6 X-ray multi-crystal diffraction method First-Order Diffraction and Multi-Order Diffraction of Crystals target crystal X-ray diffraction grains JY+T+017+1996 targeted therapy x-crystal diffraction Polycrystalline X-ray single crystal diffractometer electron diffraction twins polycrystal diffraction X+ ray single crystal diffractometer x-ray solid cobalt diffraction peak intercrystalline diffraction Liquid target single crystal Polycrystalline and Amorphous Diffraction twin crystal diffraction Single crystal x-ray diffractometer analysis X-ray crystallography Near Field High Energy X-ray Diffraction jy/t010-1996 copper target x-ray wavelength spin electron diffraction copper target x-ray wavelength What target is used for x-ray Second order diffraction and first order diffraction X-ray Diffraction and Crystals x-ray diffraction size X-ray diffractometer test method electron diffraction twins x-ray diffraction crystals Single crystal x-ray analysis Molybdenum target x-ray wavelength Secondary Diffraction of Crystals Out-of-Plane Diffraction In-Plane Diffraction Crystals in X-ray Diffraction x-ray diffraction half width Molybdenum diffraction peak x-ray diffraction scan Diffraction peaks of x-diffraction silicon x-ray single crystal X-ray diffraction peak width First Order Diffraction Second Order Diffraction x-diffraction crystallinity What kind of rays are used in x-ray diffraction copper target x-ray X-ray Diffraction Analysis Crystal Orientation target+x+ray diffractometer What is x-ray diffraction used for? Diffraction plate cobalt diffraction peak X diffractometer single crystal Principle of Polycrystalline Diffraction In crystal diffraction, why use x-rays Diffraction concept X-ray single crystal diffractometer and x-ray X-ray Diffraction Microscopic jy/t 020 1996 Powder Diffraction Target multiple emitter transistor Liquid target single crystal X-ray diffraction sample preparation volume X-ray diffraction peak position x-ray polycrystal diffractometer X-ray diffraction equipment Intensity of x-ray diffraction peaks Grain Diffraction Peak x-ray rotating target Molybdenum target x-ray wavelength modern x-ray polycrystal diffraction Twin Secondary Diffraction Test mammography x-ray X-ray diffraction peak broadening Diffraction polycrystalline and amorphous Polycrystalline X-ray Diffraction Test method for rotational orientation of crystal materials by x-ray diffractometer X-ray diffraction lines fixed target x-ray sample preparation method Crystal X-ray Diffraction Method x-ray diffraction and Copper Target X-ray Spectroscopy X-ray crystallography x-ray target material X-ray spectrum of copper target Crystal diffractometer Diffraction peak position Diffraction line x-ray rotary target Solid and gas targets double diffraction method Derived target receptor hand-held x-diffraction X-ray diffraction peak broadening Diffraction of x-ray single crystals X-ray diffraction crystal form x-ray off-target Single crystal silicon target Amorphous and Polycrystalline Diffraction D8 polycrystalline X-ray diffractometer What does x-ray diffraction measure? Multi-diffraction Diffraction of amorphous and polycrystalline Pigment X-ray Diffraction polycrystalline electron diffraction Whole Rock X-ray Diffraction Whole-rock X-ray diffraction Rays Single Crystal X-ray Diffraction Analysis polycrystal analysis X-ray single crystal diffractometer composition Why X-ray diffraction can analyze crystal structure X-ray measurement of polycrystalline orientation How to determine single crystal and polycrystalline Single target research methods Single crystal diffraction calibration method Single crystal diffraction analysis method Multifunctional target drone jy/t 015 1996 How to distinguish single crystals from polycrystalline

This standard specifies the qualitative analysis and quantitative analysis for the phase composition of various polycrystalline materials with polycrystal X-ray diffractometer under room temperature, high and low temperature, the determination of granular size (about 1~200nm) and intragranular lattice distortion and the general determination method for the lattice constant of crystals in cubic system.
This standard is applicable to various polycrystal materials, like metal, alloy, mineral, soil, ceramic, building material, organic and inorganic compound, medicine, polymer and environmentally-friendly specimen. It is primarily applicable to diffractometer method. However, photographic method may be applied by reference.

Foreword I
1. Scope
2. Normative References
3. Definitions
4. Method Principle
5. Reagent and Material
6. Instrument
7. Specimen
8. Analysis Procedure
9. Expression of Analysis Result
10. Safety Precautions
Appendix A (Normative) Calibration of Diffraction Peak Position (2θ)
Appendix B (Normative) Experimental Data Record
Appendix C (Informative) Description for PDF
Appendix D (Informative) References
Appendix E (Informative) Various Standard Material and Standard Data
Appendix F (Informative) Experimental Data and Record Format for Phase Qualitative Analysis of X-ray
Appendix G (Informative) Sign of Ionizing Radiation