target diffractometer
target diffractometer, Total:29 items.
The international standard classification for "target diffractometer" includes: Other standards related to optics and optical measurements , Radiation protection , Non-destructive testing of metals , Rubber and plastics products in general , Other standards related to analytical chemistry , Non-destructive testing , Other products of non-ferrous metals , Occupational safety. Industrial hygiene .
The Chinese standard classification for "target diffractometer" includes: Mass spectrometer, liquid spectrometer, energy spectrometer and combined devices of them , Office supplies and office implements , Electron optics and other physical optics instrument , Radiological sanitation protection , Metal physical property test method , Latex products , Material composition analysis instrument and environment detection instrument in general , Ultrasonic wave and sound radiation defectoscope , Rare refractory metals and their compounds , Precious metals and their alloys .
Professional Standard - Education
- JY 141-1982 Demonstration Instrument for Interference, Diffraction and Polarization of Light
- JY/T 009-1996 General rules for X-ray polycrystalline diffractometry
Professional Standard - Machinery
- JB/T 9400-1999 Specification for X-ray diffractometer
- JB/T 11144-2011 X-ray diffractometer
- JB/T 9400-2010 Specification of X-ray diffractometer
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 8360-1987 The lattice constant determination of metals--Method of X-ray diffractometer
- GB 16355-1996 Radiation protection standards for X-ray diffraction and fluorescence analysis equipment
- GB/T 8362-1987 Retained austenite in steel; Quantitative determination; Method of X-ray diffractometer
National Metrological Verification Regulations of the People's Republic of China
- JJG(地质) 1014-1990 Verification Regulations for Polycrystalline X-ray Diffractometer
- JJG 629-1989 Polycrystalline X-ray Diffractometer
- JJG 629-2014 Polycrystalline X-Ray Diffractometers
Group Standards of the People's Republic of China
- T/CAS 304-2018 Magnetron sputtering silicon targets and bound targets
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 37983-2019 Testing methods of X-ray diffraction for determining the orientation of crystal materials by rotation
- GB/T 39860-2021 Rapid identification of the surface residual mineral powder on latex products—X-ray diffraction spectrometry
- GB/T 40023-2021 Non-destructive testing instruments - Ultrasonic time-of-flight diffraction instrument - Technical requirements
工业和信息化部
- SH/T 1827-2019 Plastics - Determination of crystallinity - X-ray diffractometry
- YB/T 5338-2019 Quantitative determination of austenite in steel X-ray diffractometer method
- JB/T 13935-2020 Nondestructive testing instrument - UltrasonicUltrasonic time-of-flight diffraction testing instrument
Professional Standard - Non-ferrous Metal
- YS/T 718-2009 Flat magneting sputtering target—Niobium target for optical coating
- YS/T 719-2009 Flat magneting sputtering target—Silicon target for optical coating
- YS/T 1024-2015 Tantalum sputtering targets
Occupational Health Standard of the People's Republic of China
- GBZ 115-2002 Radiological standards for X-ray Diffraction and fluorescence analysis equipment
Professional Standard - Ferrous Metallurgy
- YB/T 5337-2006 The lattice constant determination of metals -- Method of X-ray diffractometer
- YB/T 5338-2006 Retained austenite in steel - Quantitative deternination - Method of X-ray diffractometer
National Metrological Technical Specifications of the People's Republic of China
- JJF 1447-2014 Calibration specification for ultrasonic flaw detector by time-of-flight diffraction
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会
- GB/T 34649-2017 Magnetron sputtering ruthenium target
Fujian Provincial Standard of the People's Republic of China
- DB35/T 1914-2020 Determination of β-crystal content in β-crystal polypropylene pipes and fittings (X-ray diffraction method)
Association Francaise de Normalisation
- NF S10-133:2005 Optics and optical instruments - Diffractive optics - Vocabulary.
American National Standards Institute （ANSI)
- ANSI/ASTM E915:1996 Method for Verifying the Alignment of X-Ray Diffraction Instrumentation for Residual Stress Measurement
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