X-ray diffractometer target
X-ray diffractometer target, Total:31 items.
The international standard classification for "X-ray diffractometer target" includes: Other standards related to optics and optical measurements , Radiation protection , Non-destructive testing of metals , Occupational safety. Industrial hygiene , Other standards related to analytical chemistry , Chemical analysis of metals .
The Chinese standard classification for "X-ray diffractometer target" includes: Electron optics and other physical optics instrument , Mass spectrometer, liquid spectrometer, energy spectrometer and combined devices of them , Radiological sanitation protection , Metal physical property test method , Material composition analysis instrument and environment detection instrument in general .
Professional Standard - Machinery
- JB/T 9400-2010 Specification of X-ray diffractometer
- JB/T 9400-1999 Specification for X-ray diffractometer
- JB/T 11144-2011 X-ray diffractometer
工业和信息化部
- YB/T 5338-2019 Quantitative determination of austenite in steel X-ray diffractometer method
- SH/T 1827-2019 Plastics - Determination of crystallinity - X-ray diffractometry
Professional Standard - Education
- JY/T 009-1996 General rules for X-ray polycrystalline diffractometry
Fujian Provincial Standard of the People's Republic of China
- DB35/T 1914-2020 Determination of β-crystal content in β-crystal polypropylene pipes and fittings (X-ray diffraction method)
National Metrological Verification Regulations of the People's Republic of China
- JJG(地质) 1014-1990 Verification Regulations for Polycrystalline X-ray Diffractometer
- JJG 629-2014 Polycrystalline X-Ray Diffractometers
- JJG 629-1989 Polycrystalline X-ray Diffractometer
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 8362-1987 Retained austenite in steel; Quantitative determination; Method of X-ray diffractometer
- GB/T 13388-1992 Method for measuring crystallographic orientation of flats on single crystal silicon slices and wafers by X-ray techniques
- GB 16355-1996 Radiation protection standards for X-ray diffraction and fluorescence analysis equipment
- GB/T 8360-1987 The lattice constant determination of metals--Method of X-ray diffractometer
Professional Standard - Agriculture
- 57药典 四部-2020 0451 X-ray diffraction method
- 77药典 四部-2015 0451 X-ray diffraction method
Occupational Health Standard of the People's Republic of China
- GBZ 115-2002 Radiological standards for X-ray Diffraction and fluorescence analysis equipment
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 37983-2019 Testing methods of X-ray diffraction for determining the orientation of crystal materials by rotation
Professional Standard - Ferrous Metallurgy
- YB/T 5338-2006 Retained austenite in steel - Quantitative deternination - Method of X-ray diffractometer
- YB/T 5336-2006 Carbides in high speed steel -- Quantitative phase analysis -- Method of X-ray diffractometer
- YB/T 5337-2006 The lattice constant determination of metals -- Method of X-ray diffractometer
PT-IPQ
- E E 14-1971 X-ray diffraction analysis
Korean Agency for Technology and Standards (KATS)
- KS M 0043-2009 General rules for X-ray diffractometric analysis
American National Standards Institute （ANSI)
- ANSI/ASTM E915:1996 Method for Verifying the Alignment of X-Ray Diffraction Instrumentation for Residual Stress Measurement
British Standards Institution (BSI)
- BS EN 13925-3:2005(2009) Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Instruments
- BS EN 13925-3:2005 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Instruments
American Society for Testing and Materials (ASTM)
- ASTM UOP905-08 Platinum Agglomeration by X-Ray Diffraction
- ASTM UOP905-91 Platinum Agglomeration by X-Ray Diffraction
- ASTM UOP905-20 Platinum Agglomeration by X-Ray Diffraction
SCC
- VDI/VDE 5575 BLATT 10-2019 X-ray optical systems - diffraction gratings
Universal Oil Products Company (UOP)
- UOP 905-2008 Platinum Agglomeration by X-Ray Diffraction
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