x-ray diffractometer crystal
x-ray diffractometer crystal, Total:43 items.
The international standard classification for "x-ray diffractometer crystal" includes: Chemical analysis of metals , Other standards related to optics and optical measurements , Other standards related to analytical chemistry , Testing of metals , Radiation protection , Non-destructive testing of metals .
The Chinese standard classification for "x-ray diffractometer crystal" includes: Mass spectrometer, liquid spectrometer, energy spectrometer and combined devices of them , Optical instrument in general , Electron optics and other physical optics instrument , X ray, magnetic powder, fluorescent light and other defectoscope , Material composition analysis instrument and environment detection instrument in general , Metal physical property test method , Radiological sanitation protection .
Professional Standard - Education
- JY/T 008-1996 General rules for crystal and molecular structure determination of small molecules by four-circle single crystal X-ray diffractometer
- JY/T 0588-2020 General rules for crystal and molecular structure determinationof small molecules by single crystal X-ray diffractometer
- JY/T 0587-2020 General rules for X-ray polycrystalline diffractometry
- JY/T 009-1996 General rules for X-ray polycrystalline diffractometry
National Metrological Verification Regulations of the People's Republic of China
- JJG(地质) 1014-1990 Verification Regulations for Polycrystalline X-ray Diffractometer
- JJG 629-2014 Polycrystalline X-Ray Diffractometers
- JJG 629-1989 Polycrystalline X-ray Diffractometer
Professional Standard - Machinery
- JB/T 9400-1999 Specification for X-ray diffractometer
- JB/T 11144-2011 X-ray diffractometer
- JB/T 5482-2011 X-ray Orientation apparatus
- JB/T 5482-2004 The specification for X-ray Crystal Orientation apparatus
- JB/T 9400-2010 Specification of X-ray diffractometer
- JB/T 9399-2010 Main parameter series for the X-ray analytical instrumentation
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB 16355-1996 Radiation protection standards for X-ray diffraction and fluorescence analysis equipment
- GB/T 34612-2017 Measurement method for X-ray double crystal diffraction rocking curve of sapphire crystals
- GB/T 37983-2019 Testing methods of X-ray diffraction for determining the orientation of crystal materials by rotation
- GB/T 42676-2023 Test method for crystalline quality of semiconductive single crystal―X-ray diffraction method
- GB/T 8362-1987 Retained austenite in steel; Quantitative determination; Method of X-ray diffractometer
Professional Standard - Ferrous Metallurgy
- YB/T 5338-2019 Quantitative determination of austenite in steel X-ray diffractometer method
- YB/T 5338-2006 Retained austenite in steel - Quantitative deternination - Method of X-ray diffractometer
Professional Standard - Petrochemical Industry
- SH/T 1827-2019 Plastics - Determination of crystallinity - X-ray diffractometry
National Metrological Technical Specifications of the People's Republic of China
- JJF 1256-2010 Calibration Specification for X-ray Monocrystal Orientation Equipment
Professional Standard - Agriculture
- 77药典 四部-2015 0451 X-ray diffraction method
- 57药典 四部-2020 0451 X-ray diffraction method
Professional Standard - Nuclear Industry
- EJ/T 553-1991 Determination of Mineral Cell Parameters Powder X-ray Diffraction Method
Japanese Industrial Standards Committee (JISC)
- JIS H 7805:2005 Method for crystallite size determination in metal catalysts by X-ray diffractometry
British Standards Institution (BSI)
- BS EN 13925-3:2005 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Instruments
- BS EN 13925-3:2005(2009) Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Instruments
- BS EN 13925-2:2003(2008) Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Procedures
- BS EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Procedures
- BS EN 13925-1:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - General principles
Danish Standards Foundation
- DANSK DS/EN 13925-3:2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
- DS/EN 13925-3:2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
European Committee for Standardization (CEN)
- EN 13925-3:2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
Spanish Association for Standardization (UNE)
- UNE-EN 13925-3:2006 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
- AENOR UNE-EN 13925-3:2006 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
Lithuanian Standards Office
- LST EN 13925-3-2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
German Institute for Standardization
- DIN EN 13925-3:2005 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments; German version EN 13925-3:2005
- DIN EN 13925-3:2005-07 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments; German version EN 13925-3:2005
Association Francaise de Normalisation
- NF A09-280-3*NF EN 13925-3:2005 Non destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3 : instruments.
Standards Norway
- NS-EN 13925-3:2005 Non destructive testing — X ray diffraction from polycrystalline and amorphous materials — Part 3: Instruments
Association of German Mechanical Engineers
- VDI VDE 5575 Blatt 8-2019 X-ray optical systems Monochromator crystals
PT-IPQ
- E E 14-1971 X-ray diffraction analysis
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