X-ray crystallography

X-ray crystallography, Total:61 items.

The international standard classification for "X-ray crystallography" includes: Other standards related to optics and optical measurements , Other standards related to analytical chemistry , Testing of metals , Radiation protection , Non-destructive testing of metals , Inorganic chemicals in general , Occupational safety. Industrial hygiene .

The Chinese standard classification for "X-ray crystallography" includes: Electron optics and other physical optics instrument , X ray, magnetic powder, fluorescent light and other defectoscope , Material composition analysis instrument and environment detection instrument in general , Mass spectrometer, liquid spectrometer, energy spectrometer and combined devices of them , Metal physical property test method , Radiological sanitation protection , Inorganic chemicals in general .

National Metrological Verification Regulations of the People's Republic of China

JJG(地质) 1014-1990 Verification Regulations for Polycrystalline X-ray Diffractometer
JJG 629-1989 Polycrystalline X-ray Diffractometer
JJG 629-2014 Polycrystalline X-Ray Diffractometers

Professional Standard - Machinery

JB/T 11144-2011 X-ray diffractometer
JB/T 5482-2004 The specification for X-ray Crystal Orientation apparatus
JB/T 9400-1999 Specification for X-ray diffractometer
JB/T 5482-2011 X-ray Orientation apparatus
JB/T 9400-2010 Specification of X-ray diffractometer

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 37983-2019 Testing methods of X-ray diffraction for determining the orientation of crystal materials by rotation

Professional Standard - Education

JY/T 008-1996 General rules for crystal and molecular structure determination of small molecules by four-circle single crystal X-ray diffractometer
JY/T 0588-2020 General rules for crystal and molecular structure determinationof small molecules by single crystal X-ray diffractometer
JY/T 0587-2020 General rules for X-ray polycrystalline diffractometry
JY/T 009-1996 General rules for X-ray polycrystalline diffractometry

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB 16355-1996 Radiation protection standards for X-ray diffraction and fluorescence analysis equipment
GB/T 8362-1987 Retained austenite in steel; Quantitative determination; Method of X-ray diffractometer
GB/T 42676-2023 Test method for crystalline quality of semiconductive single crystal―X-ray diffraction method
GB/T 30904-2014 Inorganic chemicals for industrial use―Crystal form analysis―X-ray diffraction method

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 34612-2017 Measurement method for X-ray double crystal diffraction rocking curve of sapphire crystals

工业和信息化部

YB/T 5338-2019 Quantitative determination of austenite in steel X-ray diffractometer method
SH/T 1827-2019 Plastics - Determination of crystallinity - X-ray diffractometry

Professional Standard - Ferrous Metallurgy

YB/T 5338-2006 Retained austenite in steel - Quantitative deternination - Method of X-ray diffractometer

National Metrological Technical Specifications of the People's Republic of China

JJF 1256-2010 Calibration Specification for X-ray Monocrystal Orientation Equipment

Professional Standard - Agriculture

77药典四部-2015 0451 X-ray diffraction method
57药典四部-2020 0451 X-ray diffraction method

Professional Standard - Nuclear Industry

EJ/T 553-1991 Determination of Mineral Cell Parameters Powder X-ray Diffraction Method

Professional Standard - Energy

NB/SH/T 6033-2021 Standard test method for determination of the unit cell dimension of zeolite ZSM-22 X-ray Diffraction
NB/SH/T 6015-2020 Standard test method for determination of lattice parameters of zeolite ZSM-23 by X-ray diffraction
NB/SH/T 6024-2021 Standard test method for determination of relative crystallinity of zeolite ZSM-5 X-ray diffraction

Occupational Health Standard of the People's Republic of China

GBZ 115-2002 Radiological standards for X-ray Diffraction and fluorescence analysis equipment

Japanese Industrial Standards Committee (JISC)

JIS H 7805:2005 Method for crystallite size determination in metal catalysts by X-ray diffractometry

British Standards Institution (BSI)

BS EN 13925-3:2005 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Instruments
BS EN 13925-3:2005(2009) Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Instruments
BS EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Procedures
BS EN 13925-2:2003(2008) Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Procedures
BS EN 13925-1:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - General principles
BS EN 13925-1:2003(2008) Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - General principles

Spanish Association for Standardization (UNE)

UNE-EN 13925-3:2006 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
UNE-EN 13925-2:2004 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 2: Procedures

Danish Standards Foundation

DS/EN 13925-3:2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
DS/EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 2: Procedures

Association Francaise de Normalisation

NF A09-280-3*NF EN 13925-3:2005 Non destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3 : instruments.
NF A09-280-2*NF EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycristalline and amorphous materials - Part 2 : procedures
NF EN 1330-11:2007 Non-destructive testing - Terminology - Part 11: X-ray diffraction of polycrystalline and amorphous materials

German Institute for Standardization

DIN EN 13925-3:2005-07 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments; German version EN 13925-3:2005
DIN EN 13925-3:2005 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments; German version EN 13925-3:2005
DIN EN 13925-1:2003 Non-destructive testing - X-ray diffraction from polycristalline and amorphous material - Part 1: General principles; German version EN 13925-1:2003
DIN EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycristalline and amorphous material - Part 2: Procedures; German version EN 13925-2:2003
DIN EN 13925-2:2003-07 Non-destructive testing - X-ray diffraction from polycristalline and amorphous material - Part 2: Procedures; German version EN 13925-2:2003

SCC

NS-EN 13925-3:2005 Non destructive testing — X ray diffraction from polycrystalline and amorphous materials — Part 3: Instruments
AENOR UNE-EN 13925-3:2006 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
DANSK DS/EN 13925-3:2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
DANSK DS/EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 2: Procedures
NS-EN 13925-2:2003 Non-destructive testing — X-ray diffraction from polycrystalline and amorphous materials — Part 2: Procedures

European Committee for Standardization (CEN)

EN 13925-3:2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 2: Procedures

Lithuanian Standards Office

LST EN 13925-3-2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
LST EN 13925-2-2004 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 2: Procedures

PT-IPQ

E E 14-1971 X-ray diffraction analysis

Korean Agency for Technology and Standards (KATS)

KS M 0043-2009 General rules for X-ray diffractometric analysis

IT-UNI

UNI 6966-1971 Determination of the number of polar patterns in polycrystals by X-ray diffraction

GSO

NB/SH/T 6058-2022 Determination of relative crystallinity of ZSM-22 molecular sieve by X-ray diffraction method