First-Order Diffraction and Multi-Order Diffraction of Crystals

First-Order Diffraction and Multi-Order Diffraction of Crystals, Total:69 items.

The international standard classification for "First-Order Diffraction and Multi-Order Diffraction of Crystals" includes: Testing of metals , Other standards related to analytical chemistry .

The Chinese standard classification for "First-Order Diffraction and Multi-Order Diffraction of Crystals" includes: Mass spectrometer, liquid spectrometer, energy spectrometer and combined devices of them , Metal physical property test method , Electrochemical, thermochemistry and optical profile type analyzer , Material composition analysis instrument and environment detection instrument in general .

Professional Standard - Education

JY/T 0587-2020 General rules for X-ray polycrystalline diffractometry
JY/T 009-1996 General rules for X-ray polycrystalline diffractometry

National Metrological Verification Regulations of the People's Republic of China

JJG 629-2014 Polycrystalline X-Ray Diffractometers
JJG(地质) 1014-1990 Verification Regulations for Polycrystalline X-ray Diffractometer
JJG 629-1989 Polycrystalline X-ray Diffractometer

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 20724-2006 Method of thickness measurement for thin crystal by convergent beam electron diffraction
GB/T 42676-2023 Test method for crystalline quality of semiconductive single crystal―X-ray diffraction method

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 34612-2017 Measurement method for X-ray double crystal diffraction rocking curve of sapphire crystals

工业和信息化部

SH/T 1827-2019 Plastics - Determination of crystallinity - X-ray diffractometry

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 37983-2019 Testing methods of X-ray diffraction for determining the orientation of crystal materials by rotation

Professional Standard - Nuclear Industry

EJ/T 553-1991 Determination of Mineral Cell Parameters Powder X-ray Diffraction Method

British Standards Institution (BSI)

BS EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Procedures
BS EN 13925-3:2005(2009) Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Instruments
BS EN 13925-3:2005 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Instruments
BS EN 13925-2:2003(2008) Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Procedures
BS EN 13925-1:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - General principles
BS EN 13925-1:2003(2008) Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - General principles
BS EN 1330-11:2007 Non-destructive testing - Terminology - Terms used in X-ray diffraction from polycrystalline and amorphous materials

SCC

DANSK DS/EN 13925-1:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous material - Part 1: General principles
NS-EN 13925-1:2003 Non-destructive testing — X-ray diffraction from polycrystalline and amorphous material — Part 1: General principles
AENOR UNE-EN 13925-1:2006 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous material - Part 1: General principles
AENOR UNE-EN 13925-3:2006 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
NS-EN 13925-3:2005 Non destructive testing — X ray diffraction from polycrystalline and amorphous materials — Part 3: Instruments
DANSK DS/EN 13925-3:2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
NS-EN 13925-2:2003 Non-destructive testing — X-ray diffraction from polycrystalline and amorphous materials — Part 2: Procedures
DANSK DS/EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 2: Procedures
NS-EN 1330-11:2007 Non-destructive testing — Terminology — Terms used in X-ray diffraction from polycrystalline and amorphous materials
AENOR UNE-EN 1330-11:2008 Non-destructive testing - Terminology - Terms used in X-ray diffraction from polycrystalline and amorphous materials
DANSK DS/EN 1330-11:2007 Non-destructive testing - Terminology - Terms used in X-ray diffraction from polycrystalline and amorphous materials
04/19973037 DC BS EN 1330-11. Non-destructive testing. Terminology. Part 11. X-ray diffraction from polycrystalline and amorphous materials
AENOR UNE-EN 13925-2:2004 Non destructive essays. X-ray diffraction applied to polycrystalline and amorphous materials. Part 2: Procedures

Danish Standards Foundation

DS/EN 13925-1:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous material - Part 1: General principles
DS/EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 2: Procedures
DS/EN 13925-3:2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
DS/EN 1330-11:2007 Non-destructive testing - Terminology - Terms used in X-ray diffraction from polycrystalline and amorphous materials

German Institute for Standardization

DIN EN 13925-1:2003-07 Non-destructive testing - X-ray diffraction from polycristalline and amorphous material - Part 1: General principles; German version EN 13925-1:2003
DIN EN 13925-2:2003-07 Non-destructive testing - X-ray diffraction from polycristalline and amorphous material - Part 2: Procedures; German version EN 13925-2:2003
DIN EN 13925-3:2005-07 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments; German version EN 13925-3:2005
DIN EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycristalline and amorphous material - Part 2: Procedures; German version EN 13925-2:2003
DIN EN 13925-1:2003 Non-destructive testing - X-ray diffraction from polycristalline and amorphous material - Part 1: General principles; German version EN 13925-1:2003
DIN EN 13925-3:2005 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments; German version EN 13925-3:2005
DIN EN 1330-11:2007-09 Non-destructive testing - Terminology - Part 11: Terms used in X-ray diffraction from polycristalline and amorphous materials; Trilingual version EN 1330-11:2007

Lithuanian Standards Office

LST EN 13925-1-2004 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous material - Part 1: General principles
LST EN 13925-2-2004 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 2: Procedures
LST EN 13925-3-2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
LST EN 1330-11-2007 Non-destructive testing - Terminology - Terms used in X-ray diffraction from polycrystalline and amorphous materials

AENOR

UNE-EN 13925-1:2006 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous material - Part 1: General principles
UNE-EN 13925-2:2004 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 2: Procedures
UNE-EN 13925-3:2006 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
UNE-EN 1330-11:2008 Non-destructive testing - Terminology - Part 11: Terms used in X-ray diffraction from polycrystalline and amorphous materials

European Committee for Standardization (CEN)

EN 13925-3:2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 2: Procedures
EN 13925-1:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 1: General principles
EN 1330-11:2007 Non-destructive testing - Terminology - Terms used in X-ray diffraction from polycrystalline and amorphous materials

IT-UNI

UNI 6966-1971 Determination of the number of polar patterns in polycrystals by X-ray diffraction

Association Francaise de Normalisation

NF A09-280-2*NF EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycristalline and amorphous materials - Part 2 : procedures
NF A09-280-3*NF EN 13925-3:2005 Non destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3 : instruments.
NF EN 1330-11:2007 Non-destructive testing - Terminology - Part 11: X-ray diffraction of polycrystalline and amorphous materials
NF EN 13925-1:2003 Essais non destructifs - Diffraction des rayons X appliquée aux matériaux polycristallins et amorphes - Partie 1 : principes généraux
NF A09-280-1*NF EN 13925-1:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous material - Part 1 : general principles.
NF EN 13925-3:2005 Essais non destructifs - Diffraction des rayons X appliquée aux matériaux polycristallins et amorphes - Partie 3 : appareillage
NF EN 13925-2:2003 Essais non destructifs - Diffraction des rayons X appliquée aux matériaux polycristallins et amorphes - Partie 2 : procédures
NF A09-020-11*NF EN 1330-11:2007 Non-destructive testing - Terminology - Part 11 : Terms used in X-ray diffraction from polycrystalline and amorphous materials.

Japanese Industrial Standards Committee (JISC)

JIS H 7805:2005 Method for crystallite size determination in metal catalysts by X-ray diffractometry

International Organization for Standardization (ISO)

ISO/TTA 3:2001 Polycrystalline materials - Determination of residual stresses by neutron diffraction
ISO 22278:2020 Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for crystalline quality of single-crystal thin film (wafer) using XRD method with parallel X-ray beam

RU-GOST R

GOST R 8.696-2010 State system for ensuring the uniformity of measurements. Interplanar spacings in crystals and the intensity distribution in diffraction patterns. Method for measurement by means of an electron diffractometer

Korean Agency for Technology and Standards (KATS)

KS M 0043-2019 General rules for X-ray diffractometric analysis
KS M 0043-2009(2019) General rules for X-ray diffractometric analysis

Others: First-Order Diffraction and Multi-Order Diffraction of Crystals