copper target x-ray
copper target x-ray, Total:20 items.
The international standard classification for "copper target x-ray" includes: Copper products , Lead, zinc and tin products .
The Chinese standard classification for "copper target x-ray" includes: Mass spectrometer, liquid spectrometer, energy spectrometer and combined devices of them , Heavy metals and their alloys .
Professional Standard - Education
- JY/T 009-1996 General rules for X-ray polycrystalline diffractometry
Group Standards of the People's Republic of China
- T/CAS 304-2018 Magnetron sputtering silicon targets and bound targets
- T/CAB 0144-2022 Recycled Anode Metal Target for X-Ray Tube of CT Scanner
Taiwan Provincial Standard of the People's Republic of China
- CNS 11942.23-2000 Method for X-ray fluorescence spectrometric analysis of copper and copper alloys
- CNS 11942-23-2000 Method for X-ray fluorescence spectrometric analysis of copper and copper alloys
Professional Standard - Non-ferrous Metal
- YS/T 819-2012 High-purity Sputtering Copper Target Used in Electronic Film
工业和信息化部
- YS/T 1156-2016 Copper-indium-gallium selenide target
RU-GOST R
- GOST 22091.10-1984 X-ray devices. The method of measuring AL(CU) equivalent of X-ray device envelope
- GOST 22091.4-1986 X-ray devices. The methods of measuring of the voltage of X-ray tube
- GOST 22091.5-1986 X-ray devices. The methods of measuring X-ray tube current
Korean Agency for Technology and Standards (KATS)
- KS D 1898-1993 Method for fluorescent X-ray analysis of copper alloys
- KS D 1898-2009 Methods for X-ray fluorescence spectrometric analysis of copper alloys
- KS D 1898-2019 Copper alloys —Methods for X-ray fluorescence spectrometric analysis
Japanese Industrial Standards Committee (JISC)
- JIS H 1292:1997 Method for X-ray fluorescence spectrometric analysis of copper and copper alloys
- JIS H 1292:2018 Copper alloys -- Methods for X-ray fluorescence spectrometric analysis
- JIS H 1292:2005 Methods for X-ray fluorescence spectrometric analysis of copper alloys
VDI - Verein Deutscher Ingenieure
- VDI/VDE 5575 Blatt 3-2009 X-Ray optical systems - Cappilary x-ray optics
- VDI/VDE 5575 BLATT 4-2018 X-ray optical systems - X-ray mirrors and X-ray mirror systems - Total reflection mirrors and multilayer mirrors
- VDI/VDE 5575 BLATT 4-2017 X-ray optical systems - X-ray mirrors and X-ray mirror systems - Total reflection mirrors and multilayer mirrors
SE-SIS
- SIS SS IEC 637:1986 X-ray equipment - Marking of and accompanying documents for X-ray tu bes and X-ray tube assemblies for medical use
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