Diffraction peak position
Diffraction peak position, Total:6 items.
The international standard classification for "Diffraction peak position" includes: Springs , Semiconducting materials .
The Chinese standard classification for "Diffraction peak position" includes: Mass spectrometer, liquid spectrometer, energy spectrometer and combined devices of them , Spring , Semimetal and semiconductor material in general .
Group Standards of the People's Republic of China
- T/CASAS 014-2021 Measuring method for basal plane bending of SiC substrate — High resolution X-ray diffractometry
工业和信息化部
- YB/T 5338-2019 Quantitative determination of austenite in steel X-ray diffractometer method
Professional Standard - Nuclear Industry
- EJ/T 553-1991 Determination of Mineral Cell Parameters Powder X-ray Diffraction Method
Professional Standard - Education
- JY/T 009-1996 General rules for X-ray polycrystalline diffractometry
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 39520-2020 Test method for determination the residual stress of spring by X-ray diffraction
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 24576-2009 Test method for measuring the Al fraction in AlGaAs on GaAs substrates by high resolution X-ray diffraction
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