Diffraction concept
Diffraction concept, Total:196 items.
The international standard classification for "Diffraction concept" includes: Other standards related to optics and optical measurements , Optical measuring instruments , Particle size analysis. sieving , Radiation protection , Chemical analysis of metals , Physicochemical methods of analysis , Testing of metals , Non-destructive testing of metals , Inorganic chemicals in general , Other methods of testing of metals , Refractories , Protection against crime , Cosmetics. Toiletries , Springs , Other standards related to analytical chemistry , Cement. Gypsum. Lime. Mortar , Occupational safety. Industrial hygiene , Other standards related to protection against fire .
The Chinese standard classification for "Diffraction concept" includes: Electron optics and other physical optics instrument , Powder metallurgy analysis method , Sieving, Sieve Plate and Sieve Screen , Radiological sanitation protection , Metal physical property test method , Basic standards and general methods , Inorganic chemicals in general , Metallographic testing method , Office supplies and office implements , Mass spectrometer, liquid spectrometer, energy spectrometer and combined devices of them , Siliceous refractory , Crime judging technology , Cosmetics , Spring , Material composition analysis instrument and environment detection instrument in general , Fire-fighting in general .
Professional Standard - Machinery
- JB/T 9400-1999 Specification for X-ray diffractometer
- JB/T 9400-2010 Specification of X-ray diffractometer
- JB/T 8239.1-1999 Basic parameters for diffraction grating
- JB/T 8239.2-1999 Specification for diffraction grating
- JB/T 11144-2011 X-ray diffractometer
- JB/T 8426-1996 Metal coating. X-ray diffraction test method for nickel-phosphorus alloy coating
Professional Standard - Agriculture
- 77药典 四部-2015 0451 X-ray diffraction method
- 57药典 四部-2020 0451 X-ray diffraction method
- 2355药典 二部-2010 Appendix IX FX-Ray Powder Diffraction Method
- SN/T 5579-2023 Determination of the graphitization degree of carbon materials - X-ray diffraction method
- 784兽药典 一部-2015 Appendix Contents 0400 Spectroscopy 0451 X-ray Diffraction
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes
- GB/T 43690-2024 Test method for diffraction efficiency of imaging diffractive optical elements
- GB/T 42676-2023 Test method for crystalline quality of semiconductive single crystal―X-ray diffraction method
- GB/T 8359-1987 Carbides in high speed steel; Quantitative phase analysis; Method of X-ray diffractometer
- GB/T 5225-1985 Metal materials-Quantitative phase analysis-Value Kmethod of X-ray diffraction
- GB 16355-1996 Radiation protection standards for X-ray diffraction and fluorescence analysis equipment
- GB/T 19501-2004 General guide for electron backscatter diffraction analysis
- GB/T 38532-2020 Microbeam analysis—Electron backscatter diffraction—Measurement of average grain size
- GB/T 19077-2016 Particle size analysis―Laser diffraction methods
- GB/T 30904-2014 Inorganic chemicals for industrial use―Crystal form analysis―X-ray diffraction method
- GB/T 36165-2018 Determination of average grain size of metal—Electron backscatter diffraction (EBSD)method
- GB/T 19077.1-2008 Particle size analysis - Laser diffraction methods - Part 1: General principles
- GB/T 8362-1987 Retained austenite in steel; Quantitative determination; Method of X-ray diffractometer
- GB/T 19501-2013 Microbeam analysis—General guide for electron backscatter diffraction analysis
- GB/T 8360-1987 The lattice constant determination of metals--Method of X-ray diffractometer
- GB/T 30703-2014 Microbeam analysis―Guidelines for orientation measurement using electron backscatter diffraction
- GB/T 19077.1-2003 Particle size analysis-Laser diffraction method
National Metrological Verification Regulations of the People's Republic of China
- JJG 629-2014 Polycrystalline X-Ray Diffractometers
- JJG 629-1989 Polycrystalline X-ray Diffractometer
- JJG(地质) 1014-1990 Verification Regulations for Polycrystalline X-ray Diffractometer
Professional Standard - Education
- JY/T 0587-2020 General rules for X-ray polycrystalline diffractometry
- JY 141-1982 Demonstration Instrument for Interference, Diffraction and Polarization of Light
- JY/T 009-1996 General rules for X-ray polycrystalline diffractometry
工业和信息化部
- YB/T 4677-2018 Precision seamless steel tubes for motorcycle shock absorber
- SH/T 1827-2019 Plastics - Determination of crystallinity - X-ray diffractometry
- YS/T 1178-2017 Phase analysis for aluminum slag-X-ray diffraction spectroscopy
- YB/T 5338-2019 Quantitative determination of austenite in steel X-ray diffractometer method
- YB/T 5360-2020 Metal Materials-Determination of quantitative pole figure- XRD method
- YB/T 172-2020 Phase quantitative analysis of silica bricks-X-ray diffraction method
未注明发布机构
- DIN ISO 13320 E:2022-05 Particle size analysis - Laser diffraction methods
- DIN EN ISO 15902 E:2019-10 Optics and Photonics Diffractive Optics Glossary (Draft)
- DIN ISO 13067 E:2021-01 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size
国家质量监督检验检疫总局
- SN/T 4760-2017 Identification of import zinc concentrates-X-ray diffraction method
Professional Standard - Ferrous Metallurgy
- YB/T 5337-2006 The lattice constant determination of metals -- Method of X-ray diffractometer
- YB/T 5338-2006 Retained austenite in steel - Quantitative deternination - Method of X-ray diffractometer
- YB/T 5336-2006 Carbides in high speed steel -- Quantitative phase analysis -- Method of X-ray diffractometer
- YB/T 5320-2006 Metal materials -- Quantitative phase analysis -- Value K method of X-ray diffraction
- YB/T 172-2000 Phase quantitative analysis of silica bricks-X-ray diffraction method
National Metrological Technical Specifications of the People's Republic of China
- JJF 1967-2022 Calibration Specification for Reflection Gratings by Laser Diffraction
- JJF 1447-2014 Calibration specification for ultrasonic flaw detector by time-of-flight diffraction
Professional Standard - Commodity Inspection
- SN/T 3975-2014 Identification method of bauxite - X ray diffractometry
- SN/T 4008-2013 Rapid qualitative screening of talc powder - Powder X-ray diffraction method
Professional Standard - Public Safety Standards
- GA/T 2079-2023 Forensic sciences-Examination methods for minerals-X-ray diffractometry
- GA/T 1422-2017 Analysis of dynamite in forensics—X-ray diffraction(XRD)
水利部
- SL 547-2011 Residual stress analysis for hydraulic steel structure by X-ray diffraction method
- SL 536-2011 Standard test method for verifying the alignment of X-ray diffraction instrumentation for residual stress measurement
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 37983-2019 Testing methods of X-ray diffraction for determining the orientation of crystal materials by rotation
- GB/T 36923-2018 Identification of pearl powder—X-ray diffraction analysis
- GB/T 39520-2020 Test method for determination the residual stress of spring by X-ray diffraction
- GB/T 40407-2021 X-ray powder diffraction analysis method for determining the phases in portland cement clinker
Professional Standard - Nuclear Industry
- EJ/T 553-1991 Determination of Mineral Cell Parameters Powder X-ray Diffraction Method
Occupational Health Standard of the People's Republic of China
- GBZ 115-2002 Radiological standards for X-ray Diffraction and fluorescence analysis equipment
海关总署
- HS/T 49-2016 Talc powder particle size determination laser diffraction method
Group Standards of the People's Republic of China
- T/CSTM 00166.2-2020 Characterization for graphene materials Part 2 X-ray diffraction
Shanghai Provincial Standard of the People's Republic of China
- DB31/T 1156-2019 The identification of electrical fire melted mark—Electronic back scattering diffraction method
Professional Standard - Energy
- NB/SH/T 6015-2020 Standard test method for determination of lattice parameters of zeolite ZSM-23 by X-ray diffraction
- NB/SH/T 6033-2021 Standard test method for determination of the unit cell dimension of zeolite ZSM-22 X-ray Diffraction
- NB/SH/T 6024-2021 Standard test method for determination of relative crystallinity of zeolite ZSM-5 X-ray diffraction
- NB/SH/T 0339-2021 Standard test method for determination of the unit cell dimension of faujasite-type zeolite by X-ray diffraction
Professional Standard - Non-ferrous Metal
- YS/T 1652-2023 Texture testing of zirconium and zirconium alloy— Electron backscatter diffraction method
Professional Standard - Petroleum
- SY/T 5983-1994 X-ray Diffraction Identification Method of Illite/Smectite Interlayer Minerals
- SY/T 5163-1995 X-ray Diffraction Analysis Method for Relative Content of Clay Minerals in Sedimentary Rocks
Guangdong Provincial Standard of the People's Republic of China
- DB44/T 1078-2012 Laser Diffraction Method for Particle Size Analysis of Ceramic Raw Materials
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会
- GB/T 34612-2017 Measurement method for X-ray double crystal diffraction rocking curve of sapphire crystals
SCC
- ITU-R P.526-15-2019 Propagation by diffraction
- VDI/VDE 5575 BLATT 10-2019 X-ray optical systems - diffraction gratings
- DANSK DS/ISO 13320:2020 Particle size analysis – Laser diffraction methods
- DANSK DS/ISO 15902:2020 Optics and photonics – Diffractive optics – Vocabulary
- 07/30168945 DC BS ISO 13320. Particle size analysis. Laser diffraction methods
- BS ISO 15902:2004 Optics and photonics. Diffractive optics. Vocabulary
- BS ISO 13320-1:1999 Particle size analysis. Laser diffraction methods-General principles
- DANSK DS/EN 15305:2008 Non-destructive Testing - Test Method for Residual Stress analysis by X-ray Diffraction
- NS-EN 15305:2008 Non-destructive Testing — Test Method for Residual Stress analysis by X-ray Diffraction
- AENOR UNE-EN 15305:2010 Non-destructive Testing - Test Method for Residual Stress analysis by X-ray Diffraction
- DIN ISO 13320 E:2022 Draft Document - Particle size analysis - Laser diffraction methods (ISO 13320:2020); Text in German and English
- DANSK DS/EN 15305/AC:2009 Non-destructive Testing - Test Method for Residual Stress analysis by X-ray Diffraction
ITU-R - International Telecommunication Union/ITU Radiocommunication Sector
- ITU-R P.526-2-1992 Propagation by Diffraction
- ITU-R P.526-7-2001 Propagation by Diffraction
- ITU-R P.526-14-2018 Propagation by diffraction
- ITU-R P.526-5-1997 Propagation by Diffraction
- ITU-R P.526-9-2005 Propagation by diffraction
- ITU-R P.526-12-2012 Propagation by diffraction
- ITU-R P.526-4-1995 Propagation by Diffraction
- ITU-R P.526-3-1994 Propagation by Diffraction
- ITU-R P.526-6-1999 Propagation by Diffraction
- ITU-R P.526-8-2003 Propagation by diffraction (Question ITU-R 202/3)
International Telecommunication Union (ITU)
- ITU-R P.526-2013 Propagation by diffraction
- ITU-R P.526-11-2009 Propagation by diffraction
- ITU-R P.526-11 FRENCH-2009 Propagation by diffraction Propagation par diffraction
- ITU-R P.526-10-2007 Propagation by diffraction
- ITU-R P.526-11 SPANISH-2009 Propagation by diffraction Propagaci髇 por difracci髇
PT-IPQ
- E E 14-1971 X-ray diffraction analysis
Korean Agency for Technology and Standards (KATS)
- KS M 0043-2009 General rules for X-ray diffractometric analysis
- KS M 0043-2019 General rules for X-ray diffractometric analysis
- KS M 0043-2009(2019) General rules for X-ray diffractometric analysis
- KS A ISO 13320:2022 Particle size analysis — Laser diffraction methods
- KS A ISO 13320-2014(2019) Particle size analysis — Laser diffraction methods
- KS B ISO 15902:2008 Optics and photonics-Diffractive optics-Vocabulary
- KS B ISO 15902:2018 Optics and photonics — Diffractive optics — Vocabulary
- KS B ISO 15902:2013 Optics and optical instruments ― DiffrN optics ― Vocabulary
- KS A ISO 13320:2014 Particle size analysis — Laser diffraction methods
IET - Institution of Engineering and Technology
- GEOMET THEO DIFF-1994 Geometrical Theory of Diffraction
- THEO EDGE DIFF ELECTRO-2009 Theory of Edge Diffraction in Electromagnetics: Origination and validation of the physical theory of diffraction
- APRT ANT DIFF THEO-1981 Aperture Antennas and Diffraction Theory
- GEOMET THEO DIFF ELECTRO WAV-1979 Geometrical Theory of Diffraction for Electromagnetic Waves
Association of German Mechanical Engineers
- VDI/VDE 5575 Blatt 10-2015 X-ray optical systems - Diffraction gratings
VDI - Verein Deutscher Ingenieure
- VDI/VDE 5575 Blatt 10-2014 Roentgenoptische Systeme - Beugungsgitter
American Society for Testing and Materials (ASTM)
- ASTM UOP905-08 Platinum Agglomeration by X-Ray Diffraction
- ASTM UOP905-91 Platinum Agglomeration by X-Ray Diffraction
- ASTM UOP905-20 Platinum Agglomeration by X-Ray Diffraction
Universal Oil Products Company (UOP)
- UOP 905-2008 Platinum Agglomeration by X-Ray Diffraction
British Standards Institution (BSI)
- BS ISO 13320:2020 Particle size analysis. Laser diffraction methods
- BS ISO 13320:2009 Particle size analysis - Laser diffraction methods
- BS ISO 13320:2010 Particle size analysis. Laser diffraction methods
- BS EN ISO/IEC 15408-4:2023 Information security, cybersecurity and privacy protection. Evaluation criteria for IT security - Framework for the specification of evaluation methods and activities
- BS EN ISO 15902:2005 Optics and photonics - Diffractive optics - Vocabulary
- 19/30333249 DC BS ISO 13320. Particle size analysis. Laser diffraction methods
- BS EN ISO 15902:2020 Optics and photonics. Diffractive optics. Vocabulary
- BS EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Procedures
- BS EN 13925-3:2005(2009) Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Instruments
- BS EN 13925-3:2005 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Instruments
- BS EN 13925-2:2003(2008) Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Procedures
- BS ISO 13320-1:2000 Particle size analysis - Laser diffraction methods - General principles
- BS ISO 13067:2020 Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size
- BS EN 15305:2008(2009) Non - destructive Testing — Test Method for Residual Stress analysis by X - ray Diffraction
- BS ISO 13067:2011 Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size
SAE - SAE International
- SAE J784A-1971 Residual Stress Measurement by X-Ray Diffraction
Society of Automotive Engineers (SAE)
- SAE J784-1971 Residual Stress Measurement by X-Ray Diffraction
- SAE HS-784-2003 SAE Residual Stress Measurement by X-Ray Diffraction, 2003 Edition
Japanese Industrial Standards Committee (JISC)
- JIS Z 8825:2022 Particle size analysis -- Laser diffraction methods
- JIS Z 8825:2013 Particle size analysis.Laser diffraction methods
- JIS K 0131:1996 General rules for X-ray diffractometric analysis
GSO
- BH GSO ISO 13320:2016 Particle size analysis -- Laser diffraction methods
- GSO ISO 13320:2013 Particle size analysis -- Laser diffraction methods
- OS GSO ISO 13320:2013 Particle size analysis -- Laser diffraction methods
- ISO/TS 5973:2024 Laser diffraction measurements — Good practice
- BH GSO ISO 15902:2016 Optics and photonics -- Diffractive optics -- Vocabulary
- OS GSO ISO 15902:2013 Optics and photonics -- Diffractive optics -- Vocabulary
- GSO ISO 15902:2013 Optics and photonics -- Diffractive optics -- Vocabulary
- NB/SH/T 6058-2022 Determination of relative crystallinity of ZSM-22 molecular sieve by X-ray diffraction method
- OS GSO ISO 13067:2015 Microbeam analysis -- Electron backscatter diffraction -- Measurement of average grain size
- GSO ISO 13067:2015 Microbeam analysis -- Electron backscatter diffraction -- Measurement of average grain size
KR-KS
- KS A ISO 13320-2022 Particle size analysis — Laser diffraction methods
- KS B ISO 15902-2018 Optics and photonics — Diffractive optics — Vocabulary
- KS B ISO 15902-2023 Optics and photonics — Diffractive optics — Vocabulary
German Institute for Standardization
- DIN ISO 13320:2022-12 Particle size analysis - Laser diffraction methods (ISO 13320:2020)
- DIN EN ISO 15902:2020-05 Optics and photonics - Diffractive optics - Vocabulary (ISO 15902:2019); German version EN ISO 15902:2020
- DIN ISO 13320:2022 Particle size analysis - Laser diffraction methods (ISO 13320:2020)
- DIN EN ISO 15902:2005 Optics and photonics - Diffractive optics - Vocabulary (ISO 15902:2004); German version EN ISO 15902:2005
- DIN EN 15305 Berichtigung 1:2009-04 Non-destructive testing - Test method for residual stress analysis by X-ray diffraction; German version EN 15305:2008, Corrigendum to DIN EN 15305:2009-01; German version EN 15305:2008/AC:2009
- DIN ISO 13067:2021-08 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size (ISO 13067:2020)
- DIN EN 15305:2009-01 Non-destructive testing - Test method for residual stress analysis by X-ray diffraction; German version EN 15305:2008
American National Standards Institute (ANSI)
- ANSI/HPS N43.2-2021 Radiation Safety for X-ray Diffraction and Fluorescence Analysis Equipment
- ANSI N43.2-2001 Radiation Safety for X-ray Diffraction and Fluorescence Analysis Equipment
- ANSI/ASTM E1426:1994 Test Method for Determining the Effective Elastic Parameter for X-Ray Diffraction Measurements of Residual Stress
- ANSI/ASTM E915:1996 Method for Verifying the Alignment of X-Ray Diffraction Instrumentation for Residual Stress Measurement
United States Navy
- NAVY UFGS-01 33 29-2010 LEED(TM) DOCUMENTATION
Danish Standards Foundation
- DS/ISO 13320:2009 Particle size analysis - Laser diffraction methods
- DS/EN ISO 15902:2005 Optics and photonics - Diffractive optics - Vocabulary
International Organization for Standardization (ISO)
- ISO 13320:2020 Particle size analysis — Laser diffraction methods
- ISO 13320:2009 Particle size analysis - Laser diffraction methods
- ISO/CD TS 5973.2:2023 Good practice for laser diffraction measurements
- ISO/CD 23699 Microbeam Analysis — Electron Backscattered Electron Diffraction — Vocabulary
- ISO/CD TS 5973 Good practice for laser diffraction measurements
- ISO 15902:2004 Optics and photonics - Diffractive optics - Vocabulary
- ISO 15902:2019 Optics and photonics — Diffractive optics — Vocabulary
- ISO 13067:2011 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size
GOSTR
- GOST 6912.2-1993 Alumina. X-rays difractial method for the determination of alfa-oxide-aluminium
GOST
- GOST R 50152-1992 Alumina. X-rays difractional method for the determination of alfa-oxide-aluminium
Association Francaise de Normalisation
- NF ISO 24173:2009 Microbeam Analysis - Guidelines for Orientation Measurement by Backscattered Electron Diffraction
- NF EN ISO 15902:2020 Optique et photonique - Optique diffractive - Vocabulaire
- NF S10-133*NF EN ISO 15902:2020 Optics and photonics - Diffractive optics - Vocabulary
- NF A09-282:2019 Non-destructive testing - Phase quantification by X-ray diffraction
- NF X21-014:2012 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size.
- NF S10-133:2005 Optics and optical instruments - Diffractive optics - Vocabulary.
- NF EN 15305:2009 Essais non-destructifs - Méthode d'essai pour l'analyse des contraintes résiduelles par diffraction des rayons X
- NF X11-666:1984 PARTICLE SIZE ANALYSIS OF POWDERS. DIFFRACTION METHOD.
- NF X21-011*NF ISO 24173:2009 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction
European Committee for Standardization (CEN)
- EN ISO 15902:2020 Optics and photonics - Diffractive optics - Vocabulary (ISO 15902:2019)
- EN ISO 8130-13:2010 Coating powders - Part 13: Particle size analysis by laser diffraction (ISO 8130-13:2001)
Standard Association of Australia (SAA)
- AS 2879.3:1991 Alumina - Determination of alpha alumina content by X-ray diffraction
- AS 2879.3:2010(R2013) Determination of alpha alumina content in alumina using X-ray diffraction method
- AS 4863.1:2000 Particle size analysis - Laser diffraction methods - General Principles
ES-UNE
- UNE-EN ISO 15902:2020 Optics and photonics - Diffractive optics - Vocabulary (ISO 15902:2019) (Endorsed by Asociación Española de Normalización in February of 2020.)
CEN - European Committee for Standardization
- EN ISO 15902:2005 Optics and photonics - Diffractive optics - Vocabulary
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