diffraction

diffraction, Total:72 items.

The international standard classification for "diffraction" includes: Other standards related to optics and optical measurements , Optical measuring instruments , Particle size analysis. sieving , Radiation protection , Physicochemical methods of analysis , Inorganic chemicals in general , Other standards related to analytical chemistry , Non-destructive testing , Paints and varnishes , Pigments and extenders , Refractories , Non-destructive testing of metals , Chemical analysis of metals , Springs , Cement. Gypsum. Lime. Mortar , Chemical analysis , Welded joints , Rubber and plastics products in general , Non-metalliferous minerals .

The Chinese standard classification for "diffraction" includes: Electron optics and other physical optics instrument , Sieving, Sieve Plate and Sieve Screen , Powder metallurgy analysis method , Radiological sanitation protection , Basic standards and general methods , Inorganic chemicals in general , Electrochemical, thermochemistry and optical profile type analyzer , Basic standards and general methods , X ray, magnetic powder, fluorescent light and other defectoscope , Basic standard and general method for coating , Basic standard and general method for pigment , Siliceous refractory , Metal physical property test method , Office supplies and office implements , Spring , Welding and cutting , Ultrasonic wave and sound radiation defectoscope , Latex products , Metal chemical property test method .

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Professional Standard - Machinery

• JB/T 8239.2-1999 Specification for diffraction grating
• JB/T 8239.1-1999 Basic parameters for diffraction grating
• JB/T 9400-1999 Specification for X-ray diffractometer
• JB/T 9400-2010 Specification of X-ray diffractometer
• JB/T 8426-1996 Metal coating. X-ray diffraction test method for nickel-phosphorus alloy coating
• JB/T 11144-2011 X-ray diffractometer

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

• GB/T 43690-2024 Test method for diffraction efficiency of imaging diffractive optical elements
• GB 16355-1996 Radiation protection standards for X-ray diffraction and fluorescence analysis equipment
• GB/T 23413-2009 Determination of crystallite size and micro - strain of nano - Materials - X - ray diffraction line broadening method
• GB/T 19077.1-2003 Particle size analysis-Laser diffraction method
• GB/T 19077-2016 Particle size analysis―Laser diffraction methods
• GB/T 20724-2006 Method of thickness measurement for thin crystal by convergent beam electron diffraction
• GB/T 30904-2014 Inorganic chemicals for industrial use―Crystal form analysis―X-ray diffraction method
• GB/T 18907-2013 Microbeam analysis—Analytical electron microscopy—Selected-area electron diffraction analysis using a transmission electron microscope
• GB/T 19501-2013 Microbeam analysis—General guide for electron backscatter diffraction analysis
• GB/T 38532-2020 Microbeam analysis—Electron backscatter diffraction—Measurement of average grain size
• GB/T 19077.1-2008 Particle size analysis - Laser diffraction methods - Part 1: General principles
• GB/T 19501-2004 General guide for electron backscatter diffraction analysis
• GB/T 30703-2014 Microbeam analysis―Guidelines for orientation measurement using electron backscatter diffraction
• GB/T 21782.13-2009 Coating powders—Part 13:Particle size analysis by laser diffraction
• GB/T 30793-2014 Measuring ratio of anatase to rutile in titanium dioxide pigments by X-ray diffraction
• GB/T 26140-2010 Non-destructive testing—Standards test method for determining residual stresses by neutron diffraction
• GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes

National Metrological Verification Regulations of the People's Republic of China

• JJG 629-1989 Polycrystalline X-ray Diffractometer
• JJG 629-2014 Polycrystalline X-Ray Diffractometers

工业和信息化部

• YB/T 5338-2019 Quantitative determination of austenite in steel X-ray diffractometer method
• SH/T 1827-2019 Plastics - Determination of crystallinity - X-ray diffractometry

Professional Standard - Ferrous Metallurgy

• YB/T 5320-2006 Metal materials -- Quantitative phase analysis -- Value K method of X-ray diffraction
• YB/T 5338-2006 Retained austenite in steel - Quantitative deternination - Method of X-ray diffractometer
• YB/T 5337-2006 The lattice constant determination of metals -- Method of X-ray diffractometer
• YB/T 5336-2006 Carbides in high speed steel -- Quantitative phase analysis -- Method of X-ray diffractometer
• YB/T 172-2000 Phase quantitative analysis of silica bricks-X-ray diffraction method

Professional Standard - Education

• JY 141-1982 Demonstration Instrument for Interference, Diffraction and Polarization of Light

Professional Standard - Nuclear Industry

• EJ/T 553-1991 Determination of Mineral Cell Parameters Powder X-ray Diffraction Method

国家市场监督管理总局、中国国家标准化管理委员会

• GB/T 39860-2021 Rapid identification of the surface residual mineral powder on latex products—X-ray diffraction spectrometry
• GB/T 40023-2021 Non-destructive testing instruments - Ultrasonic time-of-flight diffraction instrument - Technical requirements
• GB/T 41076-2021 Microbeam analysis—Electron backscatter diffraction—Quantitative determination of austenite in steel
• GB/T 40407-2021 X-ray powder diffraction analysis method for determining the phases in portland cement clinker
• GB/T 20724-2021 Microbeam analysis—Method of thickness measurement for thin crystals by convergent beam electron diffraction
• GB/T 39520-2020 Test method for determination the residual stress of spring by X-ray diffraction
• GB/T 23902-2021 Non-destructive testing - Ultrasonic testing - Time-of-flight diffraction technique as a method for detection and sizing of discontinuities
• GB/T 41115-2021 Non-destructive testing of welds—Ultrasonic testing—Use of time-of-flight diffraction technique (TOFD)
• GB/T 41116-2021 Non-destructive testing of welds—Time-of-flight diffraction technique (TOFD)—Acceptance levels

Group Standards of the People's Republic of China

• T/CSTM 00166.2-2020 Characterization for graphene materials Part 2 X-ray diffraction
• T/CASAS 014-2021 Measuring method for basal plane bending of SiC substrate — High resolution X-ray diffractometry

Professional Standard - Commodity Inspection

• SN/T 2731-2010 Identification of asbestos in nonmetal minerals—X-radial diffraction instrument-microscope observation method
• SN/T 4008-2013 Rapid qualitative screening of talc powder - Powder X-ray diffraction method
• SN/T 3231-2012 Determination of asbestos in talcum―Polarized light microscope and X-ray diffraction method

National Metrological Technical Specifications of the People's Republic of China

• JJF 1447-2014 Calibration specification for ultrasonic flaw detector by time-of-flight diffraction

Professional Standard - Non-ferrous Metal

• YS/T 785-2012 Determination of Relative Crystallinity of Zeolite Sodium A by X-ray Diffraction

Professional Standard - Customs

• HS/T 12-2006 Quantitative Analysis of Talc, Chlorite, Magnesite Mixed Phase - Method of X-ray Diffractometer

Professional Standard - Aviation

• HB 20116-2012 Test method for residual stress analysis on aero-engine blade by x-ray diffraction

Professional Standard - Electron

• SJ 20714-1998 Test method for sub-surface damege of gallium arsenide polished wafer by X-ray double crystal diffraction

Professional Standard - Petroleum

• SY/T 5163-2010 Analysis Method for Clay Minerals and Ordinary Non-clay Minerals in Sedimentary Rocks by the X-ray Diffraction
• SY/T 5983-1994 X-ray Diffraction Identification Method of Illite/Smectite Interlayer Minerals

Fujian Provincial Standard of the People's Republic of China

• DB35/T 1914-2020 Determination of β-crystal content in β-crystal polypropylene pipes and fittings (X-ray diffraction method)

Professional Standard - Electricity

• DL/T 1317-2023 The code of ultrasonic time of flight diffraction technique for butt welds in fossil-fuel power plant

Professional Standard - Energy

• NB/T 47013.10-2010 Nondestructive Testing of Pressure Equipment Part 10: Ultrasonic Testing by Diffraction Time-of-Flight

Professional Standard - Agriculture

• 57药典 四部-2020 0451 X-ray diffraction method
• 77药典 四部-2015 0451 X-ray diffraction method

ITU-R - International Telecommunication Union/ITU Radiocommunication Sector

• ITU-R P.526-2-1992 Propagation by Diffraction
• ITU-R P.526-7-2001 Propagation by Diffraction
• ITU-R P.526-4-1995 Propagation by Diffraction
• ITU-R P.526-12-2012 Propagation by diffraction
• ITU-R P.526-3-1994 Propagation by Diffraction
• ITU-R P.526-5-1997 Propagation by Diffraction
• ITU-R P.526-14-2018 Propagation by diffraction
• ITU-R P.526-9-2005 Propagation by diffraction
• ITU-R P.526-6-1999 Propagation by Diffraction

SCC

• ITU-R P.526-15-2019 Propagation by diffraction

International Telecommunication Union (ITU)

• ITU-R P.526-2013 Propagation by diffraction
• ITU-R P.526-11-2009 Propagation by diffraction

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