x-ray scattering instrument x-ray diffractometer
x-ray scattering instrument x-ray diffractometer, Total:33 items.
The international standard classification for "x-ray scattering instrument x-ray diffractometer" includes: Other standards related to optics and optical measurements , Radiation protection , Non-destructive testing of metals , Occupational safety. Industrial hygiene , Other standards related to analytical chemistry , Chemical analysis of metals .
The Chinese standard classification for "x-ray scattering instrument x-ray diffractometer" includes: Electron optics and other physical optics instrument , X ray, magnetic powder, fluorescent light and other defectoscope , Radiological sanitation protection , Metal physical property test method , Material composition analysis instrument and environment detection instrument in general .
Professional Standard - Machinery
- JB/T 11145-2011 X-ray fluorescence spectrometer
- JB/T 9400-2010 Specification of X-ray diffractometer
- JB/T 11144-2011 X-ray diffractometer
- JB/T 9400-1999 Specification for X-ray diffractometer
- JB/T 5482-2011 X-ray Orientation apparatus
National Metrological Verification Regulations of the People's Republic of China
- JJG(地质) 1014-1990 Verification Regulations for Polycrystalline X-ray Diffractometer
- JJG 629-2014 Polycrystalline X-Ray Diffractometers
- JJG 629-1989 Polycrystalline X-ray Diffractometer
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB 16355-1996 Radiation protection standards for X-ray diffraction and fluorescence analysis equipment
- GB/T 8362-1987 Retained austenite in steel; Quantitative determination; Method of X-ray diffractometer
- GB/T 8360-1987 The lattice constant determination of metals--Method of X-ray diffractometer
Professional Standard - Agriculture
- 57药典 四部-2020 0451 X-ray diffraction method
- 77药典 四部-2015 0451 X-ray diffraction method
工业和信息化部
- YB/T 5338-2019 Quantitative determination of austenite in steel X-ray diffractometer method
Occupational Health Standard of the People's Republic of China
- GBZ 115-2002 Radiological standards for X-ray Diffraction and fluorescence analysis equipment
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 37983-2019 Testing methods of X-ray diffraction for determining the orientation of crystal materials by rotation
Professional Standard - Ferrous Metallurgy
- YB/T 5337-2006 The lattice constant determination of metals -- Method of X-ray diffractometer
- YB/T 5336-2006 Carbides in high speed steel -- Quantitative phase analysis -- Method of X-ray diffractometer
- YB/T 5338-2006 Retained austenite in steel - Quantitative deternination - Method of X-ray diffractometer
Professional Standard - Nuclear Industry
- EJ/T 1100-1999 Bore-hole apparatus for X-ray fluorescence analysis
RU-GOST R
- GOST 22091.4-1986 X-ray devices. The methods of measuring of the voltage of X-ray tube
- GOST 22091.5-1986 X-ray devices. The methods of measuring X-ray tube current
- GOST 22091.3-1984 X-ray devices. Methods of measuring radiation field and beam angle of X-radiation
Japanese Industrial Standards Committee (JISC)
- JIS Z 4328:1984 Radiation survey meters for X and gamma rays
- JIS Z 4606:2007 Industrial X-ray apparatus for radiographic testing
PT-IPQ
- E E 14-1971 X-ray diffraction analysis
Korean Agency for Technology and Standards (KATS)
- KS M 0043-2009 General rules for X-ray diffractometric analysis
Association Francaise de Normalisation
- NF C74-111:1985 Electromedical equipment. Radiology equipment. X radiation equipment. Radiodiagnostic X-ray tube assemblies. Construction and tests. Requirements.
American National Standards Institute （ANSI)
- ANSI/ASTM E915:1996 Method for Verifying the Alignment of X-Ray Diffraction Instrumentation for Residual Stress Measurement
Indonesia Standards
- SNI 18-6938-2002 Specification of X-rays or Y-rays radiation portable surveymeter
British Standards Institution (BSI)
- BS EN 13925-3:2005 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Instruments
- BS EN 13925-3:2005(2009) Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Instruments
SE-SIS
- SIS SS IEC 627:1986 X-ray equipment - Characteristics of anti-scatter grids used in X-ray equipment
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