x-ray diffractometer
x-ray diffractometer, Total:14 items.
The international standard classification for "x-ray diffractometer" includes: Other standards related to optics and optical measurements , Radiation protection , Non-destructive testing of metals , Other standards related to analytical chemistry .
The Chinese standard classification for "x-ray diffractometer" includes: Electron optics and other physical optics instrument , Radiological sanitation protection , Metal physical property test method , Material composition analysis instrument and environment detection instrument in general .
Professional Standard - Machinery
- JB/T 11144-2011 X-ray diffractometer
- JB/T 9400-2010 Specification of X-ray diffractometer
- JB/T 9400-1999 Specification for X-ray diffractometer
National Metrological Verification Regulations of the People's Republic of China
- JJG 629-1989 Polycrystalline X-ray Diffractometer
- JJG 629-2014 Polycrystalline X-Ray Diffractometers
- JJG(地质) 1014-1990 Verification Regulations for Polycrystalline X-ray Diffractometer
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 8362-1987 Retained austenite in steel; Quantitative determination; Method of X-ray diffractometer
- GB/T 8360-1987 The lattice constant determination of metals--Method of X-ray diffractometer
- GB 16355-1996 Radiation protection standards for X-ray diffraction and fluorescence analysis equipment
工业和信息化部
- YB/T 5338-2019 Quantitative determination of austenite in steel X-ray diffractometer method
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 37983-2019 Testing methods of X-ray diffraction for determining the orientation of crystal materials by rotation
Professional Standard - Ferrous Metallurgy
- YB/T 5337-2006 The lattice constant determination of metals -- Method of X-ray diffractometer
- YB/T 5338-2006 Retained austenite in steel - Quantitative deternination - Method of X-ray diffractometer
American National Standards Institute （ANSI)
- ANSI/ASTM E915:1996 Method for Verifying the Alignment of X-Ray Diffraction Instrumentation for Residual Stress Measurement
x-ray diffractometer,x-ray diffraction,x-ray scattering instrument x-ray diffractometer,x-diffractometer,x-ray diffractometer,x-ray polycrystal diffraction,X-ray diffraction analyzer,X-ray thin film diffractometer,x-ray diffraction spectrum,polycrystalline x-ray diffractometer,X-ray single crystal diffractometer,x-ray diffraction minerals,mineral x-ray diffraction,Single crystal x-ray diffractometer analysis,X-ray diffraction measurements,x-ray polycrystal diffractometer,single crystal x-ray diffractometer,x-ray diffraction test,X-ray diffraction identification
