x-ray ash analyzer

x-ray ash analyzer, Total:159 items.

The international standard classification for "x-ray ash analyzer" includes: Other standards related to optics and optical measurements , Chemical analysis of metals , Non-destructive testing , Radiation protection , Nuclear energy in general , Chemical analysis , Other standards related to analytical chemistry , Non-destructive testing of metals , Cement. Gypsum. Lime. Mortar , Measuring instruments , Radiation measurements , Radiographic equipment , Occupational safety. Industrial hygiene , Solid fuels , Electricity. Magnetism. General aspects , Non-metalliferous minerals .

The Chinese standard classification for "x-ray ash analyzer" includes: Electron optics and other physical optics instrument , X ray, magnetic powder, fluorescent light and other defectoscope , Optical instrument in general , Radiological sanitation protection , Nuclear instrument and detector in general , Basic standards and general methods , Metal physical property test method , Cement , Length Measurement , Ionizating Radiation Measurement , Medical radiographic equipment , Coke , Electromagnetic Measurement , Material composition analysis instrument and environment detection instrument in general .

Professional Standard - Machinery

JB/T 11608-2013 Non-destructive testing instruments — lndustrial X-ray apparatus for radiographic testing
JB/T 5482-2004 The specification for X-ray Crystal Orientation apparatus
JB/T 9400-1999 Specification for X-ray diffractometer
JB/T 11234-2011 Non-destructive testing instruments — Industry soft X-ray apparatus
JB/T 9394-1999 Specifications for the X-ray stressometers
JB/T 12457-2015 Non-destructive testing instruments-Testing method of X-ray delector for circuit board detection
JB/T 9400-2010 Specification of X-ray diffractometer
JB/T 9399-1999 Main parameter series for the X-ray analytical instrumentation
JB/T 5482-2011 X-ray Orientation apparatus
JB/T 9394-2011 Non-destructive testing instruments — Specifications for the X-ray stressometers
JB/T 6215-2011 Non-destructive testing instruments —The series typal table to industrial X-ray tube
JB/T 12456-2015 Non-destructive testintg instruments-Technical requirements of X-ray delector for circuit board detection
JB/T 11145-2011 X-ray fluorescence spectrometer
JB/T 9399-2010 Main parameter series for the X-ray analytical instrumentation
JB/T 11144-2011 X-ray diffractometer

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 8359-1987 Carbides in high speed steel; Quantitative phase analysis; Method of X-ray diffractometer
GB/T 8360-1987 The lattice constant determination of metals--Method of X-ray diffractometer
GB/Z 41286-2022 Non-destructive testing instruments—X-ray pipeline crawlers
GB 16355-1996 Radiation protection standards for X-ray diffraction and fluorescence analysis equipment
GB/T 26595-2011 Non-destructive testing instruments—Specification for panoramic X-ray tube
GB/T 11685-2003 Measurement procedures for semiconductor X-ray detector system and semiconductor X-ray energy spectrometers
GB/T 8362-1987 Retained austenite in steel; Quantitative determination; Method of X-ray diffractometer
GB/T 20726-2006 Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
GB/T 25184-2010 Verification method for X-ray photoelectron spectrometers

Professional Standard - Building Materials

JC/T 1085-2008 X-ray fluorescence analyzer for cement

Professional Standard - Nuclear Industry

EJ/T 1100-1999 Bore-hole apparatus for X-ray fluorescence analysis
EJ/T 1078-1998 γ Radiation coal ash monitor
EJ/T 684-1992 Portable source excited X-ray fluorescence analyzer
EJ/T 684-2016 Portable energy dispersive X ray fluorescence analyzer
EJ/T 767-1993 X-ray fluorescence analyzer excited by radioactive sources

National Metrological Verification Regulations of the People's Republic of China

JJG 629-1989 Polycrystalline X-ray Diffractometer
JJG 480-2007 Verification Regulation of X-Ray Thickness Gauge
JJG(地质) 1006-1990 Verification regulations for 3080E X-ray fluorescence spectrometer
JJG 480-1987 Verification Regulation of X-Ray Thickness Gauge
JJG(地质) 1014-1990 Verification Regulations for Polycrystalline X-ray Diffractometer
JJG 629-2014 Polycrystalline X-Ray Diffractometers
JJG 1050-2009 X、gamma-ray Densitometry for Bone Mineral Density

Group Standards of the People's Republic of China

T/CSTM 00901-2023 Calibration specification for handheld X-ray fluorescence spectrometer
T/ACEF 153-2024 Technical guidelines for radiation protection of X-ray stressometers
T/CAME 42-2022 Technical standard for X-ray skeletal age instrument

机械电子工业部

JB/T 5982-1991 X-ray directional instrument technical conditions

Occupational Health Standard of the People's Republic of China

GBZ 115-2002 Radiological standards for X-ray Diffraction and fluorescence analysis equipment

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 36017-2018 Non-destructive testing instruments—X-ray fluorescence analysis tube
GB/T 34534-2017 Coke - Determination of ash composition - X-ray fluorescence spectrometric method

Professional Standard - Geology

DZ 0029-1992 HYX-3 microcomputer X-ray fluorescence instrument

Professional Standard - Commodity Inspection

SN/T 2696-2010 Determination of major and minor elements in coal ash and coke ash-X-ray fluorescence spectrometric method

国家能源局

SY/T 7324-2016 X-ray fluorescence logging instrument calibration method

National Metrological Technical Specifications of the People's Republic of China

JJF 1133-2005 Calibration Specification of Gold Gauge Utilizing X-ray Fluorescence Spectrometry
JJF 1613-2017 Calibration Specification for Thin Film Thickness Measurement Instruments by Grazing Incidence X-Ray Reflectivity
JJF 1275-2011 Calibration specification forx-ray security inspection equipment
JJF 1952-2021 Calibration Specification for Sulfur X-ray Fluorescence Spectrometry Analyzers
JJF 1256-2010 Calibration Specification for X-ray Monocrystal Orientation Equipment
JJF 1306-2011 Calibration Specification for X-Ray Fluorescence Coating Thickness Instruments

工业和信息化部/国家能源局

JB/T 12962.2-2016 Energy dispersive X-ray fluorescence spectrometer. Part 2: Element analyzer
JB/T 12962.3-2016 Energy dispersive X-ray fluorescence spectrometer. Part 3: Plating thickness analyzer

工业和信息化部

YB/T 5338-2019 Quantitative determination of austenite in steel X-ray diffractometer method

Professional Standard - Ferrous Metallurgy

YB/T 5336-2006 Carbides in high speed steel -- Quantitative phase analysis -- Method of X-ray diffractometer
YB/T 5337-2006 The lattice constant determination of metals -- Method of X-ray diffractometer
YB/T 5338-2006 Retained austenite in steel - Quantitative deternination - Method of X-ray diffractometer

Professional Standard - Public Safety Standards

GA/T 1064-2013 Calibration specifications for X-ray generator aging testers

Anhui Provincial Standard of the People's Republic of China

DB34/T 2375-2015 Determination of silica content in fly ash by X-ray fluorescence method

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 37983-2019 Testing methods of X-ray diffraction for determining the orientation of crystal materials by rotation

Professional Standard - Medicine

YY/T 0724-2009 Particular specifications for dual energy X-ray bone densitometer

国家药监局

YY/T 0724-2021 Particular specifications for dual-energy X-ray absorptiometry

Professional Standard - Customs

HS/T 12-2006 Quantitative Analysis of Talc, Chlorite, Magnesite Mixed Phase - Method of X-ray Diffractometer

RU-GOST R

GOST 22091.4-1986 X-ray devices. The methods of measuring of the voltage of X-ray tube
GOST 22091.5-1986 X-ray devices. The methods of measuring X-ray tube current
GOST 22091.7-1984 X-ray devices. The methods of the measuring of the uniformity of the distribution of the energe flyx density of the X-ray over the X-ray coverage
GOST 20337-1974 X-ray devices. Terms and definitions
GOST 22091.3-1984 X-ray devices. Methods of measuring radiation field and beam angle of X-radiation
GOST 22091.10-1984 X-ray devices. The method of measuring AL(CU) equivalent of X-ray device envelope
GOST 22091.14-1986 X-ray devices. The method of measuring the energy flow density (photon flux density) of X-radiation
GOST 22091.2-1984 X-ray devices. The methods of measuring of the current and the voltage of injection of X-ray betatrons
GOST 22091.6-1984 X-ray devices. Methods of measuring X-radiation exposure dose power and X-radiation exposure dose per pulse
GOST 22091.11-1980 X-ray devices. The method of the measuring of the time operation readiness of the device
GOST 29025-1991 Non-destructive testing. X-ray television flaw detectors with X-ray electronic optical transducers electric radiographic flaw detectors. General technical requirements
GOST 22091.15-1986 X-ray devices. The method of electric strenght test
GOST 22091.0-1984 X-ray devices. General requirements for measuring of parameters
GOST 22091.13-1984 X-ray devices. The method of measuring of grid-cathode capacity
GOST 22091.9-1986 X-ray devices. The methods of measuring effective focus spot size
GOST 22091.1-1984 X-ray devices. The methods of measuring of heater current and heater voltage

Japanese Industrial Standards Committee (JISC)

JIS Z 4328:1984 Radiation survey meters for X and gamma rays
JIS Z 4606:2007 Industrial X-ray apparatus for radiographic testing
JIS C 3407:1987 High tension cables for X-ray apparatus
JIS Z 4324:1997 Area monitors for X and gamma rays
JIS C 3407:2003 High voltage cables for X-ray apparatus
JIS M 8205:2000 Iron ores -- X-ray fluorescence spectrometric analysis
JIS R 2216:1995 Method for X-ray fluorescence spectrometric analysis of refractory bricks and refractory mortars

Association Francaise de Normalisation

NF C74-111:1985 Electromedical equipment. Radiology equipment. X radiation equipment. Radiodiagnostic X-ray tube assemblies. Construction and tests. Requirements.
NF A09-280-3*NF EN 13925-3:2005 Non destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3 : instruments.
NF M60-522:1998 X and gamma radiation. Indirect- or direct-reading capacitor-type pocket dosemeters.

Korean Agency for Technology and Standards (KATS)

KS A 4902-1987 Resolution test charts for X- ray apparatus
KS A 4902-1979 Resolution test charts for X- ray apparatus
KS E 3075-2002 Method for X－ray fluorescence spectrometric analysis of limestone and dolomite
KS E 3075-2017 Method for X－ray fluorescence spectrometric analysis of limestone and dolomite
KS E 3075-2022 Method for X-ray fluorescence spectrometric analysis of limestone and dolomite
KS A 4610-2006 Portable photon ambient dose equivalent ratemeters for radiation protection
KS M 0043-2009 General rules for X-ray diffractometric analysis
KS C IEC 60601-2-8:2017 Medical electrical equipment — Part 2-8: Particular requirements for the basic safety and essential performance of therapeutic X-ray equipment operating in the range 10 kV to 1 MV
KS C IEC 60601-2-8:2012 Medical electrical equipment－Part 2-8：Particular requirements for the basic safety and essential performance of therapeutic X-ray equipment operating in the range 10 kV to 1 MV

American Society for Testing and Materials (ASTM)

ASTM C1271-99(2020) Standard Test Method for X-ray Spectrometric Analysis of Lime and Limestone
ASTM C1271-99 Standard Test Method for X-ray Spectrometric Analysis of Lime and Limestone
ASTM C1271-99(2006) Standard Test Method for X-ray Spectrometric Analysis of Lime and Limestone
ASTM C1271-99(2012) Standard Test Method for X-ray Spectrometric Analysis of Lime and Limestone
ASTM E1172-87(2003) Standard Practice for Describing and Specifying a Wavelength-Dispersive X-Ray Spectrometer
ASTM F1467-18 Standard Guide for Use of an X-Ray Tester (≈10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
ASTM E1172-87(2001) Standard Practice for Describing and Specifying a Wavelength-Dispersive X-Ray Spectrometer

SCC

10/30156853 DC BS EN 62495. Nuclear instrumentation. Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube
DIN IEC 62495 E:2010 Draft Document - Nuclear instrumentation - Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube (IEC 45/702/CDV:2010)
DIN 51418-1 E:2007 Draft Document - X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: Definitions and basic principles
DANSK DS/EN 13925-3:2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
NS-EN 13925-3:2005 Non destructive testing — X ray diffraction from polycrystalline and amorphous materials — Part 3: Instruments
AENOR UNE-EN 13925-3:2006 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
11/30230635 DC BS ISO 16129. Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer

Indonesia Standards

SNI 18-6938-2002 Specification of X-rays or Y-rays radiation portable surveymeter

GSO

BH GSO IEC 62495:2016 Nuclear instrumentation - Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube
OS GSO IEC 62495:2014 Nuclear instrumentation - Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube
GSO IEC 61335:2014 Nuclear instrumentation - Bore-hole apparatus for X-ray fluorescence analysis
GSO IEC 62495:2014 Nuclear instrumentation - Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube
BH GSO IEC 61335:2016 Nuclear instrumentation - Bore-hole apparatus for X-ray fluorescence analysis
OS GSO IEC 61335:2014 Nuclear instrumentation - Bore-hole apparatus for X-ray fluorescence analysis
BH GSO ISO 16129:2015 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
OS GSO ISO 16129:2014 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
GSO IEC 60759:2015 Standard test procedures for semiconductor X-ray energy spectrometers

VN-TCVN

TCVN 6596-2000 X ray diagnostic radiography and fluoroscopy.Generator, X ray tube, collimator.Test procedure

International Electrotechnical Commission (IEC)

IEC 62495:2011 Nuclear instrumentation - Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube
IEC 61335:1997 Nuclear instrumentation - Bore-hole apparatus for X-ray fluorescence analysis

German Institute for Standardization

DIN IEC 62495:2011 Nuclear instrumentation - Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube (IEC 62495:2011)
DIN ISO 16129:2020-11 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
DIN 51418-1:2008 X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: Definitions and basic principles
DIN ISO 16129 E:2020-01 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
DIN 51418-1:1996 X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: Definitions and basic principles
DIN EN 13925-3:2005-07 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments; German version EN 13925-3:2005
DIN EN 13925-3:2005 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments; German version EN 13925-3:2005
DIN ISO 15472 E:2019-09 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
DIN 51418-1:2008-08 X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: Definitions and basic principles

VDE - VDE Verlag GmbH@ Berlin@ Germany

VDE 0412-20-2011 Strahlungsmessgeraete - Tragbare Roentgenfluoreszenz-Analysegeraete mit Kleinstroentgenroehre (IEC 62495:2011)

SE-SIS

SIS SS IEC 580:1986 X-ray equipment - Area exposure product meter
SIS SS IEC 759:1986 Nuclear instrumentation —Test procedures for semiconductor X-ray energy spectrometers
SIS SS IEC 637:1986 X-ray equipment - Marking of and accompanying documents for X-ray tu bes and X-ray tube assemblies for medical use

PT-IPQ

E E 14-1971 X-ray diffraction analysis

British Standards Institution (BSI)

BS ISO 16129:2018 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
BS ISO 16129:2012 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
BS EN 13925-3:2005 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Instruments
BS EN 13925-3:2005(2009) Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Instruments

International Organization for Standardization (ISO)

ISO 16129:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
ISO 16129:2012 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer

IN-BIS

IS 12803-1989 Method for analyzing hydraulic cement using X-ray fluorescence spectrometer

American National Standards Institute （ANSI)

ANSI/ASTM E915:1996 Method for Verifying the Alignment of X-Ray Diffraction Instrumentation for Residual Stress Measurement

Spanish Association for Standardization (UNE)

UNE 80211:1994 EX TEST METHODS FOR CEMENTS. CHEMICAL ANALYSIS. DETERMINATION OF THE CHEMICAL COMPOSITION OF LIMES AND LIMESTONES BY X-RAY FLUORESCENCE.
UNE-EN 13925-3:2006 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments

VDI - Verein Deutscher Ingenieure

VDI/VDE 5575 Blatt 3-2009 X-Ray optical systems - Cappilary x-ray optics
VDI/VDE 5575 BLATT 4-2018 X-ray optical systems - X-ray mirrors and X-ray mirror systems - Total reflection mirrors and multilayer mirrors
VDI/VDE 5575 BLATT 4-2017 X-ray optical systems - X-ray mirrors and X-ray mirror systems - Total reflection mirrors and multilayer mirrors

European Committee for Standardization (CEN)

EN 13925-3:2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments

Lithuanian Standards Office

LST EN 13925-3-2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments

Danish Standards Foundation

DS/EN 13925-3:2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments

CZ-CSN

CSN 35 6575 Z1-1997 Standard test procedureds for semiconductor X-ray energy spectrometers

Standard Association of Australia （SAA）

AS 2563:1996(R2016) Wavelength dispersive X-ray fluorescence spectrometers - Determination of precision

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