x-ray ash analyzer
x-ray ash analyzer, Total:149 items.
The international standard classification for "x-ray ash analyzer" includes: Other standards related to optics and optical measurements , Chemical analysis of metals , Non-destructive testing , Radiation protection , Nuclear energy in general , Chemical analysis , Other standards related to analytical chemistry , Non-destructive testing of metals , Cement. Gypsum. Lime. Mortar , Measuring instruments , Radiation measurements , Radiographic equipment , Occupational safety. Industrial hygiene , Solid fuels , Electricity. Magnetism. General aspects , Non-metalliferous minerals .
The Chinese standard classification for "x-ray ash analyzer" includes: Electron optics and other physical optics instrument , X ray, magnetic powder, fluorescent light and other defectoscope , Optical instrument in general , Radiological sanitation protection , Nuclear instrument and detector in general , Basic standards and general methods , Metal physical property test method , Cement , Length Measurement , Ionizating Radiation Measurement , Medical radiographic equipment , Coke , Electromagnetic Measurement , Material composition analysis instrument and environment detection instrument in general .
Professional Standard - Machinery
- JB/T 11234-2011 Non-destructive testing instruments — Industry soft X-ray apparatus
- JB/T 9394-2011 Non-destructive testing instruments — Specifications for the X-ray stressometers
- JB/T 9399-2010 Main parameter series for the X-ray analytical instrumentation
- JB/T 9399-1999 Main parameter series for the X-ray analytical instrumentation
- JB/T 11145-2011 X-ray fluorescence spectrometer
- JB/T 9400-2010 Specification of X-ray diffractometer
- JB/T 12456-2015 Non-destructive testintg instruments-Technical requirements of X-ray delector for circuit board detection
- JB/T 5482-2011 X-ray Orientation apparatus
- JB/T 9394-1999 Specifications for the X-ray stressometers
- JB/T 5482-2004 The specification for X-ray Crystal Orientation apparatus
- JB/T 9400-1999 Specification for X-ray diffractometer
- JB/T 11144-2011 X-ray diffractometer
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 11685-2003 Measurement procedures for semiconductor X-ray detector system and semiconductor X-ray energy spectrometers
- GB 16355-1996 Radiation protection standards for X-ray diffraction and fluorescence analysis equipment
- GB/Z 41286-2022 Non-destructive testing instruments—X-ray pipeline crawlers
- GB/T 25184-2010 Verification method for X-ray photoelectron spectrometers
- GB/T 8362-1987 Retained austenite in steel; Quantitative determination; Method of X-ray diffractometer
- GB/T 8359-1987 Carbides in high speed steel; Quantitative phase analysis; Method of X-ray diffractometer
- GB/T 8360-1987 The lattice constant determination of metals--Method of X-ray diffractometer
- GB/T 20726-2006 Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
Professional Standard - Building Materials
- JC/T 1085-2008 X-ray fluorescence analyzer for cement
Professional Standard - Nuclear Industry
- EJ/T 767-1993 X-ray fluorescence analyzer excited by radioactive sources
- EJ/T 1100-1999 Bore-hole apparatus for X-ray fluorescence analysis
- EJ/T 684-2016 Portable energy dispersive X ray fluorescence analyzer
- EJ/T 684-1992 Portable source excited X-ray fluorescence analyzer
- EJ/T 1078-1998 γ Radiation coal ash monitor
National Metrological Verification Regulations of the People's Republic of China
- JJG 629-1989 Polycrystalline X-ray Diffractometer
- JJG(地质) 1014-1990 Verification Regulations for Polycrystalline X-ray Diffractometer
- JJG(地质) 1006-1990 Verification regulations for 3080E X-ray fluorescence spectrometer
- JJG 480-1987 Verification Regulation of X-Ray Thickness Gauge
- JJG 1050-2009 X、gamma-ray Densitometry for Bone Mineral Density
- JJG 480-2007 Verification Regulation of X-Ray Thickness Gauge
- JJG 629-2014 Polycrystalline X-Ray Diffractometers
Group Standards of the People's Republic of China
- T/ACEF 153-2024 Technical guidelines for radiation protection of X-ray stressometers
- T/CSTM 00901-2023 Calibration specification for handheld X-ray fluorescence spectrometer
- T/CAME 42-2022 Technical standard for X-ray skeletal age instrument
机械电子工业部
- JB/T 5982-1991 X-ray directional instrument technical conditions
Occupational Health Standard of the People's Republic of China
- GBZ 115-2002 Radiological standards for X-ray Diffraction and fluorescence analysis equipment
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会
- GB/T 36017-2018 Non-destructive testing instruments—X-ray fluorescence analysis tube
- GB/T 34534-2017 Coke - Determination of ash composition - X-ray fluorescence spectrometric method
Professional Standard - Geology
- DZ 0029-1992 HYX-3 microcomputer X-ray fluorescence instrument
Professional Standard - Commodity Inspection
- SN/T 2696-2010 Determination of major and minor elements in coal ash and coke ash-X-ray fluorescence spectrometric method
国家能源局
- SY/T 7324-2016 X-ray fluorescence logging instrument calibration method
National Metrological Technical Specifications of the People's Republic of China
- JJF 1306-2011 Calibration Specification for X-Ray Fluorescence Coating Thickness Instruments
- JJF 1133-2005 Calibration Specification of Gold Gauge Utilizing X-ray Fluorescence Spectrometry
- JJF 1256-2010 Calibration Specification for X-ray Monocrystal Orientation Equipment
- JJF 1613-2017 Calibration Specification for Thin Film Thickness Measurement Instruments by Grazing Incidence X-Ray Reflectivity
- JJF 1275-2011 Calibration specification forx-ray security inspection equipment
- JJF 1952-2021 Calibration Specification for Sulfur X-ray Fluorescence Spectrometry Analyzers
工业和信息化部/国家能源局
- JB/T 12962.3-2016 Energy dispersive X-ray fluorescence spectrometer. Part 3: Plating thickness analyzer
- JB/T 12962.2-2016 Energy dispersive X-ray fluorescence spectrometer. Part 2: Element analyzer
工业和信息化部
- YB/T 5338-2019 Quantitative determination of austenite in steel X-ray diffractometer method
Professional Standard - Ferrous Metallurgy
- YB/T 5337-2006 The lattice constant determination of metals -- Method of X-ray diffractometer
- YB/T 5336-2006 Carbides in high speed steel -- Quantitative phase analysis -- Method of X-ray diffractometer
- YB/T 5338-2006 Retained austenite in steel - Quantitative deternination - Method of X-ray diffractometer
Professional Standard - Public Safety Standards
- GA/T 1064-2013 Calibration specifications for X-ray generator aging testers
Anhui Provincial Standard of the People's Republic of China
- DB34/T 2375-2015 Determination of silica content in fly ash by X-ray fluorescence method
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 37983-2019 Testing methods of X-ray diffraction for determining the orientation of crystal materials by rotation
Professional Standard - Medicine
- YY/T 0724-2009 Particular specifications for dual energy X-ray bone densitometer
国家药监局
- YY/T 0724-2021 Particular specifications for dual-energy X-ray absorptiometry
Professional Standard - Customs
- HS/T 12-2006 Quantitative Analysis of Talc, Chlorite, Magnesite Mixed Phase - Method of X-ray Diffractometer
RU-GOST R
- GOST 22091.5-1986 X-ray devices. The methods of measuring X-ray tube current
- GOST 22091.4-1986 X-ray devices. The methods of measuring of the voltage of X-ray tube
- GOST 22091.7-1984 X-ray devices. The methods of the measuring of the uniformity of the distribution of the energe flyx density of the X-ray over the X-ray coverage
- GOST 20337-1974 X-ray devices. Terms and definitions
- GOST 22091.3-1984 X-ray devices. Methods of measuring radiation field and beam angle of X-radiation
- GOST 22091.10-1984 X-ray devices. The method of measuring AL(CU) equivalent of X-ray device envelope
- GOST 22091.14-1986 X-ray devices. The method of measuring the energy flow density (photon flux density) of X-radiation
- GOST 22091.2-1984 X-ray devices. The methods of measuring of the current and the voltage of injection of X-ray betatrons
- GOST 22091.6-1984 X-ray devices. Methods of measuring X-radiation exposure dose power and X-radiation exposure dose per pulse
- GOST 22091.11-1980 X-ray devices. The method of the measuring of the time operation readiness of the device
- GOST 29025-1991 Non-destructive testing. X-ray television flaw detectors with X-ray electronic optical transducers electric radiographic flaw detectors. General technical requirements
- GOST 22091.15-1986 X-ray devices. The method of electric strenght test
- GOST 22091.13-1984 X-ray devices. The method of measuring of grid-cathode capacity
- GOST 22091.0-1984 X-ray devices. General requirements for measuring of parameters
- GOST 22091.9-1986 X-ray devices. The methods of measuring effective focus spot size
- GOST 22091.1-1984 X-ray devices. The methods of measuring of heater current and heater voltage
Japanese Industrial Standards Committee (JISC)
- JIS Z 4328:1984 Radiation survey meters for X and gamma rays
- JIS Z 4606:2007 Industrial X-ray apparatus for radiographic testing
- JIS C 3407:1987 High tension cables for X-ray apparatus
- JIS Z 4324:1997 Area monitors for X and gamma rays
- JIS C 3407:2003 High voltage cables for X-ray apparatus
- JIS M 8205:2000 Iron ores -- X-ray fluorescence spectrometric analysis
- JIS R 2216:1995 Method for X-ray fluorescence spectrometric analysis of refractory bricks and refractory mortars
Association Francaise de Normalisation
- NF C74-111:1985 Electromedical equipment. Radiology equipment. X radiation equipment. Radiodiagnostic X-ray tube assemblies. Construction and tests. Requirements.
- NF A09-280-3*NF EN 13925-3:2005 Non destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3 : instruments.
Korean Agency for Technology and Standards (KATS)
- KS A 4902-1987 Resolution test charts for X- ray apparatus
- KS A 4902-1979 Resolution test charts for X- ray apparatus
- KS E 3075-2002 Method for X-ray fluorescence spectrometric analysis of limestone and dolomite
- KS E 3075-2017 Method for X-ray fluorescence spectrometric analysis of limestone and dolomite
- KS E 3075-2022 Method for X-ray fluorescence spectrometric analysis of limestone and dolomite
- KS A 4610-2006 Portable photon ambient dose equivalent ratemeters for radiation protection
- KS M 0043-2009 General rules for X-ray diffractometric analysis
- KS C IEC 60601-2-8:2012 Medical electrical equipment-Part 2-8:Particular requirements for the basic safety and essential performance of therapeutic X-ray equipment operating in the range 10 kV to 1 MV
- KS C IEC 60601-2-8:2017 Medical electrical equipment — Part 2-8: Particular requirements for the basic safety and essential performance of therapeutic X-ray equipment operating in the range 10 kV to 1 MV
American Society for Testing and Materials (ASTM)
- ASTM C1271-99(2020) Standard Test Method for X-ray Spectrometric Analysis of Lime and Limestone
- ASTM C1271-99 Standard Test Method for X-ray Spectrometric Analysis of Lime and Limestone
- ASTM C1271-99(2006) Standard Test Method for X-ray Spectrometric Analysis of Lime and Limestone
- ASTM C1271-99(2012) Standard Test Method for X-ray Spectrometric Analysis of Lime and Limestone
- ASTM E1172-87(2003) Standard Practice for Describing and Specifying a Wavelength-Dispersive X-Ray Spectrometer
- ASTM F1467-18 Standard Guide for Use of an X-Ray Tester (≈10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
- ASTM E1172-87(2001) Standard Practice for Describing and Specifying a Wavelength-Dispersive X-Ray Spectrometer
SCC
- 10/30156853 DC BS EN 62495. Nuclear instrumentation. Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube
- DIN IEC 62495 E:2010 Draft Document - Nuclear instrumentation - Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube (IEC 45/702/CDV:2010)
- DIN 51418-1 E:2007 Draft Document - X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: Definitions and basic principles
- DANSK DS/EN 13925-3:2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
- 11/30230635 DC BS ISO 16129. Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- NS-EN 13925-3:2005 Non destructive testing — X ray diffraction from polycrystalline and amorphous materials — Part 3: Instruments
- AENOR UNE-EN 13925-3:2006 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
GSO
- BH GSO IEC 62495:2016 Nuclear instrumentation - Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube
- GSO IEC 61335:2014 Nuclear instrumentation - Bore-hole apparatus for X-ray fluorescence analysis
- OS GSO IEC 62495:2014 Nuclear instrumentation - Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube
- GSO IEC 62495:2014 Nuclear instrumentation - Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube
- BH GSO IEC 61335:2016 Nuclear instrumentation - Bore-hole apparatus for X-ray fluorescence analysis
- OS GSO IEC 61335:2014 Nuclear instrumentation - Bore-hole apparatus for X-ray fluorescence analysis
- OS GSO ISO 16129:2014 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- BH GSO ISO 16129:2015 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
Indonesia Standards
- SNI 18-6938-2002 Specification of X-rays or Y-rays radiation portable surveymeter
VN-TCVN
- TCVN 6596-2000 X ray diagnostic radiography and fluoroscopy.Generator, X ray tube, collimator.Test procedure
International Electrotechnical Commission (IEC)
- IEC 62495:2011 Nuclear instrumentation - Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube
- IEC 61335:1997 Nuclear instrumentation - Bore-hole apparatus for X-ray fluorescence analysis
VDE - VDE Verlag GmbH@ Berlin@ Germany
- VDE 0412-20-2011 Strahlungsmessgeraete - Tragbare Roentgenfluoreszenz-Analysegeraete mit Kleinstroentgenroehre (IEC 62495:2011)
German Institute for Standardization
- DIN IEC 62495:2011 Nuclear instrumentation - Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube (IEC 62495:2011)
- DIN ISO 16129:2020-11 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
- DIN 51418-1:2008 X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: Definitions and basic principles
- DIN ISO 16129 E:2020-01 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- DIN 51418-1:1996 X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: Definitions and basic principles
- DIN EN 13925-3:2005-07 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments; German version EN 13925-3:2005
- DIN ISO 15472 E:2019-09 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
- DIN EN 13925-3:2005 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments; German version EN 13925-3:2005
SE-SIS
- SIS SS IEC 580:1986 X-ray equipment - Area exposure product meter
- SIS SS IEC 759:1986 Nuclear instrumentation —Test procedures for semiconductor X-ray energy spectrometers
PT-IPQ
- E E 14-1971 X-ray diffraction analysis
British Standards Institution (BSI)
- BS ISO 16129:2018 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- BS ISO 16129:2012 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- BS EN 13925-3:2005 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Instruments
- BS EN 13925-3:2005(2009) Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Instruments
International Organization for Standardization (ISO)
- ISO 16129:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- ISO 16129:2012 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
IN-BIS
- IS 12803-1989 Method for analyzing hydraulic cement using X-ray fluorescence spectrometer
American National Standards Institute (ANSI)
- ANSI/ASTM E915:1996 Method for Verifying the Alignment of X-Ray Diffraction Instrumentation for Residual Stress Measurement
Spanish Association for Standardization (UNE)
- UNE 80211:1994 EX TEST METHODS FOR CEMENTS. CHEMICAL ANALYSIS. DETERMINATION OF THE CHEMICAL COMPOSITION OF LIMES AND LIMESTONES BY X-RAY FLUORESCENCE.
- UNE-EN 13925-3:2006 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
VDI - Verein Deutscher Ingenieure
- VDI/VDE 5575 Blatt 3-2009 X-Ray optical systems - Cappilary x-ray optics
- VDI/VDE 5575 BLATT 4-2018 X-ray optical systems - X-ray mirrors and X-ray mirror systems - Total reflection mirrors and multilayer mirrors
- VDI/VDE 5575 BLATT 4-2017 X-ray optical systems - X-ray mirrors and X-ray mirror systems - Total reflection mirrors and multilayer mirrors
European Committee for Standardization (CEN)
- EN 13925-3:2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
Danish Standards Foundation
- DS/EN 13925-3:2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
Lithuanian Standards Office
- LST EN 13925-3-2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
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