X-ray single crystal analyzer
X-ray single crystal analyzer, Total:45 items.
The international standard classification for "X-ray single crystal analyzer" includes: Other standards related to optics and optical measurements , Testing of metals , Materials for aerospace construction , Other standards related to analytical chemistry , Physics. Chemistry .
The Chinese standard classification for "X-ray single crystal analyzer" includes: X ray, magnetic powder, fluorescent light and other defectoscope , Electron optics and other physical optics instrument , Metal physical property test method , Mass spectrometer, liquid spectrometer, energy spectrometer and combined devices of them , Basic standards for aviation and aerospace materials , Material composition analysis instrument and environment detection instrument in general , Artificial lens .
National Metrological Technical Specifications of the People's Republic of China
- JJF 1256-2010 Calibration Specification for X-ray Monocrystal Orientation Equipment
Professional Standard - Machinery
- JB/T 9400-2010 Specification of X-ray diffractometer
- JB/T 5482-2011 X-ray Orientation apparatus
- JB/T 11144-2011 X-ray diffractometer
- JB/T 5482-2004 The specification for X-ray Crystal Orientation apparatus
- JB/T 11145-2011 X-ray fluorescence spectrometer
- JB/T 9400-1999 Specification for X-ray diffractometer
National Metrological Verification Regulations of the People's Republic of China
- JJG 629-1989 Polycrystalline X-ray Diffractometer
- JJG(地质) 1014-1990 Verification Regulations for Polycrystalline X-ray Diffractometer
- JJG 629-2014 Polycrystalline X-Ray Diffractometers
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 32188-2015 The method for full width at half maximum of double crystal X-ray rocking curve of GaN single crystal substrate
- GB/T 42676-2023 Test method for crystalline quality of semiconductive single crystal―X-ray diffraction method
Professional Standard - Education
- JY/T 0588-2020 General rules for crystal and molecular structure determinationof small molecules by single crystal X-ray diffractometer
- JY/T 0587-2020 General rules for X-ray polycrystalline diffractometry
- JY/T 008-1996 General rules for crystal and molecular structure determination of small molecules by four-circle single crystal X-ray diffractometer
Professional Standard - Aviation
- HB 6742-1993 Determination of Crystal Orientation for Monocrystal Blade - X-ray Back-reflection Laue Photograph Method
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 37983-2019 Testing methods of X-ray diffraction for determining the orientation of crystal materials by rotation
- GB/T 39123-2020 Specification for cadmium-zinc telluride single crystal material for X-ray and γ-ray detector
Group Standards of the People's Republic of China
- T/IAWBS 016-2022 X-ray double crystal rocking curve FWHM test method for silicon carbide single wafer
- T/IAWBS 017-2022 Test method for full width at half maximum of double crystal X-rayrocking curve of diamond single crystal substrate
- T/IAWBS 015-2021 Test method for full width at half maximum of double crystal X-ray rocking curve of Ga2O3 single crystal substrate
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会
- GB/T 34612-2017 Measurement method for X-ray double crystal diffraction rocking curve of sapphire crystals
Professional Standard - Nuclear Industry
- EJ/T 1100-1999 Bore-hole apparatus for X-ray fluorescence analysis
British Standards Institution (BSI)
- BS EN 13925-3:2005 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Instruments
- BS EN 13925-3:2005(2009) Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Instruments
- BS ISO 22278:2020 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for crystalline quality of single-crystal thin film (wafer) using XRD method with parallel X-ray beam
Japanese Industrial Standards Committee (JISC)
- JIS H 7805:2005 Method for crystallite size determination in metal catalysts by X-ray diffractometry
- JIS Z 4328:1984 Radiation survey meters for X and gamma rays
VDI - Verein Deutscher Ingenieure
- VDI/VDE 5575 BLATT 8-2018 Roentgenoptische Systeme - Monochromatorkristalle
- VDI/VDE 5575 Blatt 8-2011 Roentgenoptische Systeme - Monochromatorkristalle
- VDI/VDE 5575 BLATT 8-2019 Roentgenoptische Systeme - Monochromatorkristalle
Association Francaise de Normalisation
- NF A09-280-3*NF EN 13925-3:2005 Non destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3 : instruments.
- NF C74-111:1985 Electromedical equipment. Radiology equipment. X radiation equipment. Radiodiagnostic X-ray tube assemblies. Construction and tests. Requirements.
German Institute for Standardization
- DIN EN 13925-3:2005-07 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments; German version EN 13925-3:2005
- DIN EN 13925-3:2005 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments; German version EN 13925-3:2005
Spanish Association for Standardization (UNE)
- UNE-EN 13925-3:2006 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
Danish Standards Foundation
- DS/EN 13925-3:2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
Lithuanian Standards Office
- LST EN 13925-3-2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
European Committee for Standardization (CEN)
- EN 13925-3:2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
SCC
- DANSK DS/EN 13925-3:2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
- NS-EN 13925-3:2005 Non destructive testing — X ray diffraction from polycrystalline and amorphous materials — Part 3: Instruments
- AENOR UNE-EN 13925-3:2006 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
RU-GOST R
- GOST 22091.4-1986 X-ray devices. The methods of measuring of the voltage of X-ray tube
- GOST 22091.5-1986 X-ray devices. The methods of measuring X-ray tube current
International Organization for Standardization (ISO)
- ISO 22278:2020 Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for crystalline quality of single-crystal thin film (wafer) using XRD method with parallel X-ray beam
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