GB/T 39123-2020 in English
VALIDSpecification for cadmium-zinc telluride single crystal material for X-ray and γ-ray detector
- Issued on:2020-10-11
- Implemented on:2021-09-01
- File Format:PDF
- Delivery:Via email within 1~3 business days
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《GB/T 39123-2020X射线和γ射线探测器用碲锌镉单晶材料规范》由TC461（全国人工晶体标准化技术委员会）归口，主管部门为中国建筑材料联合会。
Introduction
Interpretation of the core content of the standard
GB/T 39123-2020 specifies the technical specifications of cadmium zinc telluride (Cd1-xZnxTe) single crystal materials used for X-ray detectors and γ-ray detectors. Its core indicators include:
| Technical parameters | Standard requirements | Test methods |
|---|---|---|
| Component x value | 0.100±0.004 | GB/T 24576 High resolution X-ray diffraction |
| Resistivity | ≥1010 Ω·cm | Four-probe method (Chapter 5.9) |
| Dislocation density | ≤104pcs/mm2 | Eversion corrosion method (Chapter 5.8) |
Detailed explanation of key technical requirements
1. Crystal structure characteristics
The standard definition of CdZnTe single crystal is a zinc blende structure solid solution with space group F43m. Its lattice constant varies with the Zn content x value (0<x<1). Typical applications include:
- Room temperature radiation detectors: utilizing the strong photoelectric effect brought by its high atomic number
- Infrared optical devices: benefiting from the wide bandgap characteristics (1.4-2.2eV)
2. Micro-precipitation phase control
The standard strictly limits the size (≤100μm) and distribution density of Cd/Te micro-precipitation phase:
Actual cases show that when the precipitate phase density exceeds the standard limit, the detector energy resolution will decrease by 15-20%, mainly due to the carrier trap effect.
Innovative points of test method
1. Double crystal diffraction half-peak width test
GB/T 32188 method is adopted, requiring (111) crystal plane FWHM≤60 arcsec. This indicator directly reflects:
- Lattice integrity
- Stress distribution uniformity
2. Leakage current test specification
The standard innovatively stipulates the thickness-voltage correspondence:
| Thickness (mm) | Maximum test voltage (V) |
|---|---|
| ≤5 | Thickness×200 |
| >5 | 1000 |
Implementation suggestions
1. Key points of production process control
- When growing by the vertical Bridgman method, the temperature gradient should be controlled at 15-20℃/cm
- The segregation coefficient of the Zn component needs to be compensated by the accelerated crucible rotation technology (ACRT)
2. Quality inspection optimization plan
It is recommended to increase the frequency of infrared microscopic imaging inspection to identify the micro-precipitation phase aggregation area in advance. Typical defect spectrum features include:
- Te precipitation: triangular dark spots
- Cd precipitation: circular bright spots
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