X-ray tetracircle
X-ray tetracircle, Total:97 items.
The international standard classification for "X-ray tetracircle" includes: Other standards related to optics and optical measurements , Chemical analysis of metals , Non-destructive testing , Measuring instruments , Radiation measurements , Radiographic equipment , Radiation protection , Nuclear energy in general , Chemical analysis , Other standards related to analytical chemistry , Non-destructive testing of metals , Cement. Gypsum. Lime. Mortar , Electricity. Magnetism. General aspects , Occupational safety. Industrial hygiene .
The Chinese standard classification for "X-ray tetracircle" includes: Electron optics and other physical optics instrument , X ray, magnetic powder, fluorescent light and other defectoscope , Optical instrument in general , Mass spectrometer, liquid spectrometer, energy spectrometer and combined devices of them , Length Measurement , Ionizating Radiation Measurement , Medical radiographic equipment , Radiological sanitation protection , Nuclear instrument and detector in general , Basic standards and general methods , Metal physical property test method , Cement , Electromagnetic Measurement , Material composition analysis instrument and environment detection instrument in general .
Professional Standard - Machinery
- JB/T 12457-2015 Non-destructive testing instruments-Testing method of X-ray delector for circuit board detection
- JB/T 5482-2004 The specification for X-ray Crystal Orientation apparatus
- JB/T 9400-2010 Specification of X-ray diffractometer
- JB/T 11145-2011 X-ray fluorescence spectrometer
- JB/T 9394-1999 Specifications for the X-ray stressometers
- JB/T 9399-2010 Main parameter series for the X-ray analytical instrumentation
- JB/T 11144-2011 X-ray diffractometer
- JB/T 5482-2011 X-ray Orientation apparatus
- JB/T 9400-1999 Specification for X-ray diffractometer
- JB/T 11234-2011 Non-destructive testing instruments — Industry soft X-ray apparatus
- JB/T 9394-2011 Non-destructive testing instruments — Specifications for the X-ray stressometers
- JB/T 12456-2015 Non-destructive testintg instruments-Technical requirements of X-ray delector for circuit board detection
- JB/T 9399-1999 Main parameter series for the X-ray analytical instrumentation
Professional Standard - Education
- JY/T 008-1996 General rules for crystal and molecular structure determination of small molecules by four-circle single crystal X-ray diffractometer
Professional Standard - Nuclear Industry
- EJ/T 767-1993 X-ray fluorescence analyzer excited by radioactive sources
- EJ/T 1100-1999 Bore-hole apparatus for X-ray fluorescence analysis
- EJ/T 684-1992 Portable source excited X-ray fluorescence analyzer
- EJ/T 684-2016 Portable energy dispersive X ray fluorescence analyzer
National Metrological Verification Regulations of the People's Republic of China
- JJG(地质) 1014-1990 Verification Regulations for Polycrystalline X-ray Diffractometer
- JJG 480-1987 Verification Regulation of X-Ray Thickness Gauge
- JJG 480-2007 Verification Regulation of X-Ray Thickness Gauge
- JJG 1050-2009 X、gamma-ray Densitometry for Bone Mineral Density
- JJG 629-1989 Polycrystalline X-ray Diffractometer
- JJG(地质) 1006-1990 Verification regulations for 3080E X-ray fluorescence spectrometer
- JJG 629-2014 Polycrystalline X-Ray Diffractometers
机械电子工业部
- JB/T 5982-1991 X-ray directional instrument technical conditions
Group Standards of the People's Republic of China
- T/CAME 42-2022 Technical standard for X-ray skeletal age instrument
- T/CSTM 00901-2023 Calibration specification for handheld X-ray fluorescence spectrometer
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 8360-1987 The lattice constant determination of metals--Method of X-ray diffractometer
- GB/Z 41286-2022 Non-destructive testing instruments—X-ray pipeline crawlers
- GB/T 25184-2010 Verification method for X-ray photoelectron spectrometers
- GB/T 8362-1987 Retained austenite in steel; Quantitative determination; Method of X-ray diffractometer
- GB 16355-1996 Radiation protection standards for X-ray diffraction and fluorescence analysis equipment
- GB/T 20726-2006 Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
- GB/T 11685-2003 Measurement procedures for semiconductor X-ray detector system and semiconductor X-ray energy spectrometers
Professional Standard - Building Materials
- JC/T 1085-2008 X-ray fluorescence analyzer for cement
Professional Standard - Geology
- DZ 0029-1992 HYX-3 microcomputer X-ray fluorescence instrument
National Metrological Technical Specifications of the People's Republic of China
- JJF 1952-2021 Calibration Specification for Sulfur X-ray Fluorescence Spectrometry Analyzers
- JJF 1306-2011 Calibration Specification for X-Ray Fluorescence Coating Thickness Instruments
- JJF 1613-2017 Calibration Specification for Thin Film Thickness Measurement Instruments by Grazing Incidence X-Ray Reflectivity
- JJF 1275-2011 Calibration specification forx-ray security inspection equipment
- JJF 1256-2010 Calibration Specification for X-ray Monocrystal Orientation Equipment
国家能源局
- SY/T 7324-2016 X-ray fluorescence logging instrument calibration method
工业和信息化部
- YB/T 5338-2019 Quantitative determination of austenite in steel X-ray diffractometer method
Professional Standard - Public Safety Standards
- GA/T 1064-2013 Calibration specifications for X-ray generator aging testers
Occupational Health Standard of the People's Republic of China
- GBZ 115-2002 Radiological standards for X-ray Diffraction and fluorescence analysis equipment
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会
- GB/T 36017-2018 Non-destructive testing instruments—X-ray fluorescence analysis tube
Professional Standard - Ferrous Metallurgy
- YB/T 5338-2006 Retained austenite in steel - Quantitative deternination - Method of X-ray diffractometer
- YB/T 5337-2006 The lattice constant determination of metals -- Method of X-ray diffractometer
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 37983-2019 Testing methods of X-ray diffraction for determining the orientation of crystal materials by rotation
Professional Standard - Medicine
- YY/T 0724-2009 Particular specifications for dual energy X-ray bone densitometer
国家药监局
- YY/T 0724-2021 Particular specifications for dual-energy X-ray absorptiometry
RU-GOST R
- GOST 22091.4-1986 X-ray devices. The methods of measuring of the voltage of X-ray tube
- GOST 22091.5-1986 X-ray devices. The methods of measuring X-ray tube current
- GOST 20337-1974 X-ray devices. Terms and definitions
- GOST 22091.3-1984 X-ray devices. Methods of measuring radiation field and beam angle of X-radiation
- GOST 22091.10-1984 X-ray devices. The method of measuring AL(CU) equivalent of X-ray device envelope
- GOST 22091.14-1986 X-ray devices. The method of measuring the energy flow density (photon flux density) of X-radiation
- GOST 22091.7-1984 X-ray devices. The methods of the measuring of the uniformity of the distribution of the energe flyx density of the X-ray over the X-ray coverage
- GOST 22091.2-1984 X-ray devices. The methods of measuring of the current and the voltage of injection of X-ray betatrons
- GOST 22091.6-1984 X-ray devices. Methods of measuring X-radiation exposure dose power and X-radiation exposure dose per pulse
- GOST 22091.11-1980 X-ray devices. The method of the measuring of the time operation readiness of the device
- GOST 29025-1991 Non-destructive testing. X-ray television flaw detectors with X-ray electronic optical transducers electric radiographic flaw detectors. General technical requirements
- GOST 22091.15-1986 X-ray devices. The method of electric strenght test
- GOST 22091.0-1984 X-ray devices. General requirements for measuring of parameters
- GOST 22091.13-1984 X-ray devices. The method of measuring of grid-cathode capacity
- GOST 22091.9-1986 X-ray devices. The methods of measuring effective focus spot size
- GOST 22091.1-1984 X-ray devices. The methods of measuring of heater current and heater voltage
Japanese Industrial Standards Committee (JISC)
- JIS Z 4328:1984 Radiation survey meters for X and gamma rays
- JIS Z 4606:2007 Industrial X-ray apparatus for radiographic testing
- JIS C 3407:1987 High tension cables for X-ray apparatus
- JIS Z 4324:1997 Area monitors for X and gamma rays
- JIS C 3407:2003 High voltage cables for X-ray apparatus
- JIS M 8205:2000 Iron ores -- X-ray fluorescence spectrometric analysis
Association Francaise de Normalisation
- NF C74-111:1985 Electromedical equipment. Radiology equipment. X radiation equipment. Radiodiagnostic X-ray tube assemblies. Construction and tests. Requirements.
Indonesia Standards
- SNI 18-6938-2002 Specification of X-rays or Y-rays radiation portable surveymeter
VN-TCVN
- TCVN 6596-2000 X ray diagnostic radiography and fluoroscopy.Generator, X ray tube, collimator.Test procedure
Korean Agency for Technology and Standards (KATS)
- KS A 4902-1987 Resolution test charts for X- ray apparatus
- KS A 4902-1979 Resolution test charts for X- ray apparatus
- KS A 4610-2006 Portable photon ambient dose equivalent ratemeters for radiation protection
SCC
- 10/30156853 DC BS EN 62495. Nuclear instrumentation. Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube
GSO
- BH GSO IEC 62495:2016 Nuclear instrumentation - Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube
- OS GSO IEC 62495:2014 Nuclear instrumentation - Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube
- GSO IEC 61335:2014 Nuclear instrumentation - Bore-hole apparatus for X-ray fluorescence analysis
- GSO IEC 62495:2014 Nuclear instrumentation - Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube
SE-SIS
- SIS SS IEC 580:1986 X-ray equipment - Area exposure product meter
- SIS SS IEC 759:1986 Nuclear instrumentation —Test procedures for semiconductor X-ray energy spectrometers
American Society for Testing and Materials (ASTM)
- ASTM F1467-18 Standard Guide for Use of an X-Ray Tester (≈10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
International Electrotechnical Commission (IEC)
- IEC 62495:2011 Nuclear instrumentation - Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube
German Institute for Standardization
- DIN IEC 62495:2011 Nuclear instrumentation - Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube (IEC 62495:2011)
VDE - VDE Verlag GmbH@ Berlin@ Germany
- VDE 0412-20-2011 Strahlungsmessgeraete - Tragbare Roentgenfluoreszenz-Analysegeraete mit Kleinstroentgenroehre (IEC 62495:2011)
American National Standards Institute (ANSI)
- ANSI/ASTM E915:1996 Method for Verifying the Alignment of X-Ray Diffraction Instrumentation for Residual Stress Measurement
VDI - Verein Deutscher Ingenieure
- VDI/VDE 5575 Blatt 3-2009 X-Ray optical systems - Cappilary x-ray optics
- VDI/VDE 5575 BLATT 4-2018 X-ray optical systems - X-ray mirrors and X-ray mirror systems - Total reflection mirrors and multilayer mirrors
- VDI/VDE 5575 BLATT 4-2017 X-ray optical systems - X-ray mirrors and X-ray mirror systems - Total reflection mirrors and multilayer mirrors
British Standards Institution (BSI)
- BS EN 13925-3:2005 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Instruments
- BS EN 13925-3:2005(2009) Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Instruments
x-ray strain gauge,x-ray diffractometer,X-ray machine,Four-circle single crystal X-ray diffractometer,scatter x-ray instrument,Scattering+x-ray+meter,x-ray stress gauge,X-ray protective device,x-ray diffractometer,X-ray deposition instrument,X-ray Sensitizer,x-ray strain gauge,handheld x-ray machine,x-ray gravimeter,x-ray diffractometer,x-ray imager,Four-circle X-ray single crystal diffractometer,x-ray ash analyzer,X-ray tetracircle