determination of crystallinity x-ray

determination of crystallinity x-ray, Total:68 items.

The international standard classification for "determination of crystallinity x-ray" includes: Pigments and extenders , Other standards related to optics and optical measurements , Semiconducting materials , Testing of metals , Other standards related to analytical chemistry , Inorganic chemicals in general , Salts , Materials for aerospace construction , Metrology and measurement in general .

The Chinese standard classification for "determination of crystallinity x-ray" includes: Metal chemical property test method , X ray, magnetic powder, fluorescent light and other defectoscope , Electron optics and other physical optics instrument , Semimetal and semiconductor material in general , Metal physical property test method , Material composition analysis instrument and environment detection instrument in general , Inorganic chemicals in general , Inorganic salt , Mass spectrometer, liquid spectrometer, energy spectrometer and combined devices of them , Basic standards for aviation and aerospace materials , Measurement in general .

Professional Standard - Petrochemical Industry

SH/T 1827-2019 Plastics - Determination of crystallinity - X-ray diffractometry

Professional Standard - Energy

NB/SH/T 0972-2018 Standard test method for determination of lattice parameters of zeolite SAPO一11 by powder X-ray diffractometry
NB/SH/T 0339-2021 Standard test method for determination of the unit cell dimension of faujasite-type zeolite by X-ray diffraction
NB/SH/T 6058-2022 Standard test method for determination of the relative crystallinity of zeolite ZSM-22 X-ray diffraction
NB/SH/T 0971-2018 Standard test method for relative crystallinity of zeolite SAPO一11 by powder X-ray diffractometry
NB/SH/T 0340-2022 Standard test method for determination of the relative crystallinity of faujasite-type zeolite-X-ray diffraction
NB/SH/T 6024-2021 Standard test method for determination of relative crystallinity of zeolite ZSM-5 X-ray diffraction
NB/SH/T 6015-2020 Standard test method for determination of lattice parameters of zeolite ZSM-23 by X-ray diffraction
NB/SH/T 6033-2021 Standard test method for determination of the unit cell dimension of zeolite ZSM-22 X-ray Diffraction

Professional Standard - Non-ferrous Metal

YS/T 785-2012 Determination of Relative Crystallinity of Zeolite Sodium A by X-ray Diffraction

Professional Standard - Machinery

JB/T 5482-2011 X-ray Orientation apparatus
JB/T 5482-2004 The specification for X-ray Crystal Orientation apparatus

National Metrological Verification Regulations of the People's Republic of China

JJG 629-2014 Polycrystalline X-Ray Diffractometers
JJG(地质) 1014-1990 Verification Regulations for Polycrystalline X-ray Diffractometer
JJG 629-1989 Polycrystalline X-ray Diffractometer

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 37983-2019 Testing methods of X-ray diffraction for determining the orientation of crystal materials by rotation
GB/T 13388-1992 Method for measuring crystallographic orientation of flats on single crystal silicon slices and wafers by X-ray techniques
GB/T 34612-2017 Measurement method for X-ray double crystal diffraction rocking curve of sapphire crystals
GB/T 42676-2023 Test method for crystalline quality of semiconductive single crystal―X-ray diffraction method
GB/T 13388-2009 Method for measuring crystallographic orientation of flats on single-crystal silicon slices and wafers by X-ray techniques
GB/T 30904-2014 Inorganic chemicals for industrial use―Crystal form analysis―X-ray diffraction method
GB/T 46514-2025 Detection Methods for Lithium-ion Battery Cathode Materials: Determination of Crystal Structure by X-ray Diffraction
GB/T 19421.1-2003 Test methods of crystalline layered sodium disilicate―Qualitative analysis of delta-crystalline layered sodium disilicate―Method of X-ray diffractometer

Professional Standard - Education

JY/T 0588-2020 General rules for crystal and molecular structure determinationof small molecules by single crystal X-ray diffractometer
JY/T 008-1996 General rules for crystal and molecular structure determination of small molecules by four-circle single crystal X-ray diffractometer

Professional Standard - Aviation

HB 6742-1993 Determination of Crystal Orientation for Monocrystal Blade - X-ray Back-reflection Laue Photograph Method

Professional Standard - Electron

SJ 20719-1998 Method of determination X value for mercury cadmium telluride for use in X-ray fluorimetry

Professional Standard - Nuclear Industry

EJ/T 553-1991 Determination of Mineral Cell Parameters Powder X-ray Diffraction Method

Professional Standard - China Metal Association

CSM 01010108-2006 Specification for Uncertainty Evaluation of X-ray Fluorescence Spectrometry Measurement Results
CSM 01 01 01 08-2006 CSM 01 01 01 08-2006 Uncertainty assessment specification of measurement result of X-ray fluorescent spectrometry

Fujian Provincial Standard of the People's Republic of China

DB35/T 1914-2020 Determination of β-crystal content in β-crystal polypropylene pipes and fittings (X-ray diffraction method)

National Metrological Technical Specifications of the People's Republic of China

JJF 1256-2010 Calibration Specification for X-ray Monocrystal Orientation Equipment

American Society for Testing and Materials (ASTM)

ASTM D5758-01(2007)e1 Standard Test Method for Determination of Relative Crystallinity of Zeolite ZSM-5 by X-Ray Diffraction
ASTM D5758-01 Standard Test Method for Determination of Relative Crystallinity of Zeolite ZSM-5 by X-Ray Diffraction
ASTM D5357-98 Standard Test Method for Determination of Relative Crystallinity of Zeolite Sodium A by X-Ray Diffraction
ASTM D8352-25 Standard Test Method for Determination of Relative Crystallinity of Zeolite Beta by X-Ray Diffraction
ASTM D5357-03(2013) Standard Test Method for Determination of Relative Crystallinity of Zeolite Sodium A by X-ray Diffraction
ASTM D8352-20 Standard Test Method for Determination of Relative Crystallinity of Zeolite Beta by X-Ray Diffraction
ASTM D5357-03(2008)e1 Standard Test Method for Determination of Relative Crystallinity of Zeolite Sodium A by X-ray Diffraction
ASTM D5758-01(2021) Standard Test Method for Determination of Relative Crystallinity of Zeolite ZSM-5 by X-Ray Diffraction
ASTM D5357-03 Standard Test Method for Determination of Relative Crystallinity of Zeolite Sodium A by X-Ray Diffraction
ASTM D5357-25 Standard Test Method for Determination of Relative Crystallinity of Zeolite Sodium A by X-ray Diffraction
ASTM D5357-19 Standard Test Method for Determination of Relative Crystallinity of Zeolite Sodium A by X-ray Diffraction
ASTM RR-D32-1036 1993 D5357-Standard Test Method for Determination of Relative Crystallinity of Zeolite Sodium A by X-ray Diffraction
ASTM D5758-01(2011)e1 Standard Test Method for Determination of Relative Crystallinity of Zeolite ZSM-5 by X-Ray Diffraction
ASTM D5758-01(2015) Standard Test Method for Determination of Relative Crystallinity of Zeolite ZSM-5 by X-Ray Diffraction
ASTM D5187-91(2002) Standard Test Method for Determination of Crystallite Size (L _c ) of Calcined Petroleum Coke by X-Ray Diffraction
ASTM D5187-91(2007) Standard Test Method for Determination of Crystallite Size (L c of Calcined Petroleum Coke by X-Ray Diffraction
ASTM D5187-91(1997) Standard Test Method for Determination of Crystallite Size (L _c ) of Calcined Petroleum Coke by X-Ray Diffraction
ASTM F847-94(1999) Standard Test Methods for Measuring Crystallographic Orientation of Flats on Single Crystal Silicon Wafers by X-Ray Techniques
ASTM D5187-10(2015)e1 Standard Test Method for Determination of Crystallite Size (L c ) of Calcined Petroleum Coke by X-Ray Diffraction
ASTM E975-03(2008) Standard Practice for X-Ray Determination of Retained Austenite in Steel with Near Random Crystallographic Orientation
ASTM E975-03 Standard Practice for X-Ray Determination of Retained Austenite in Steel with Near Random Crystallographic Orientation
ASTM E975-13 Standard Practice for X-Ray Determination of Retained Austenite in Steel with Near Random Crystallographic Orientation
ASTM D5380-93(2003) Standard Test Method for Identification of Crystalline Pigments and Extenders in Paint by X-Ray Diffraction Analysis
ASTM D5380-93(2021) Standard Test Method for Identification of Crystalline Pigments and Extenders in Paint by X-Ray Diffraction Analysis

British Standards Institution (BSI)

BS ISO 22278:2020 Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for crystalline quality of single-crystal thin film (wafer) using XRD method with parallel X-ray beam
BS PD ISO/TS 23361:2024 Nanotechnologies. Crystallinity of cellulose nanomaterials by powder X-ray diffraction (Rietveld analysis)
PD ISO/TS 23361:2024 Nanotechnologies. Crystallinity of cellulose nanomaterials by powder X-ray diffraction (Rietveld analysis)
20/30360821 DC BS ISO 22278. Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for crystalline quality of single-crystal thin film (wafer) using XRD method with parallel X-ray beam

International Organization for Standardization (ISO)

ISO/TS 23361:2024 Nanotechnologies — Crystallinity of cellulose nanomaterials by powder X-ray diffraction (Rietveld analysis)
ISO 22278:2020 Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for crystalline quality of single-crystal thin film (wafer) using XRD method with parallel X-ray beam

Association Francaise de Normalisation

NF A09-020-11*NF EN 1330-11:2007 Non-destructive testing - Terminology - Part 11 : Terms used in X-ray diffraction from polycrystalline and amorphous materials.

Japanese Industrial Standards Committee (JISC)

JIS H 7805:2005 Method for crystallite size determination in metal catalysts by X-ray diffractometry

Danish Standards Foundation

DANSK DS/ISO/TS 23361:2024 Nanotechnologies – Crystallinity of cellulose nanomaterials by powder X-ray diffraction (Rietveld analysis)

Ente Nazionale Italiano di Unificazione

UNI 10568:1997 Emissions measurement. Determination of silica in conveyed gas flows. X-ray diffraction method.

Swedish Institute for Standards

SIS SS IEC 572:1986 X-ray equipment - Determination ofthe luminance distribution of electro-optical X-ray image intensifiers

German Institute for Standardization

DIN 51418-2:2015-03 X-ray spectrometry - X-ray emission and X-ray fluorescence analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results