x-ray scattering instrument
x-ray scattering instrument, Total:251 items.
The international standard classification for "x-ray scattering instrument" includes: Measuring instruments , Radiation measurements , Other standards related to optics and optical measurements , Chemical analysis of metals , Non-destructive testing , Radiation protection , Nuclear energy in general , Other standards related to analytical chemistry , Other standards related to nuclear energy , Iron ores , Particle size analysis. sieving , Non-destructive testing of metals , Chemical analysis , Radiographic equipment , Cement. Gypsum. Lime. Mortar , Occupational safety. Industrial hygiene , Electricity. Magnetism. General aspects .
The Chinese standard classification for "x-ray scattering instrument" includes: Optical Measurement , Length Measurement , Ionizating Radiation Measurement , Electron optics and other physical optics instrument , Optical instrument in general , X ray, magnetic powder, fluorescent light and other defectoscope , Radiological sanitation protection , Nuclear instrument and detector in general , General nuclear instrument , Iron ore , Metal physical property test method , Basic standards and general methods , Medical radiographic equipment , Cement , Material composition analysis instrument and environment detection instrument in general , Electromagnetic Measurement , chromatograph .
National Metrological Verification Regulations of the People's Republic of China
- JJG 810-1993 Wavelength Dispersive X-Ray Fluorescence Spectrometers
- JJG 480-1987 Verification Regulation of X-Ray Thickness Gauge
- JJG 629-1989 Polycrystalline X-ray Diffractometer
- JJG 629-2014 Polycrystalline X-Ray Diffractometers
- JJG(地质) 1014-1990 Verification Regulations for Polycrystalline X-ray Diffractometer
- JJG 1050-2009 X、gamma-ray Densitometry for Bone Mineral Density
- JJG 480-2007 Verification Regulation of X-Ray Thickness Gauge
Professional Standard - Machinery
- JB/T 11608-2013 Non-destructive testing instruments — lndustrial X-ray apparatus for radiographic testing
- JB/T 5482-2011 X-ray Orientation apparatus
- JB/T 9399-1999 Main parameter series for the X-ray analytical instrumentation
- JB/T 11145-2011 X-ray fluorescence spectrometer
- JB/T 12457-2015 Non-destructive testing instruments-Testing method of X-ray delector for circuit board detection
- JB/T 6215-2011 Non-destructive testing instruments —The series typal table to industrial X-ray tube
- JB/T 12456-2015 Non-destructive testintg instruments-Technical requirements of X-ray delector for circuit board detection
- JB/T 9399-2010 Main parameter series for the X-ray analytical instrumentation
- JB/T 8387-2010 Non-destructive testing instruments Main parameter for the industrial detection X-ray tube
- JB/T 9394-1999 Specifications for the X-ray stressometers
- JB/T 5453-2011 Non-destructive testing instruments —Industrial X-ray image intensifier imaging system
- JB/T 9394-2011 Non-destructive testing instruments — Specifications for the X-ray stressometers
- JB/T 9400-1999 Specification for X-ray diffractometer
- JB/T 11607-2013 Non-destructive testing instruments — Industrial X-ray tyre inspection system
- JB/T 11144-2011 X-ray diffractometer
- JB/T 5482-2004 The specification for X-ray Crystal Orientation apparatus
- JB/T 9400-2010 Specification of X-ray diffractometer
- JB/T 11234-2011 Non-destructive testing instruments — Industry soft X-ray apparatus
Professional Standard - Nuclear Industry
- EJ/T 1100-1999 Bore-hole apparatus for X-ray fluorescence analysis
- EJ/T 767-1993 X-ray fluorescence analyzer excited by radioactive sources
- EJ/T 684-2016 Portable energy dispersive X ray fluorescence analyzer
National Metrological Technical Specifications of the People's Republic of China
- JJF 1256-2010 Calibration Specification for X-ray Monocrystal Orientation Equipment
- JJF 1613-2017 Calibration Specification for Thin Film Thickness Measurement Instruments by Grazing Incidence X-Ray Reflectivity
- JJF 1275-2011 Calibration specification forx-ray security inspection equipment
- JJF 2024-2023 Calibration Specification for Energy Dispersive X-Ray Fluorescence Spectrometers
- JJF 1952-2021 Calibration Specification for Sulfur X-ray Fluorescence Spectrometry Analyzers
未注明发布机构
- JIS Z 8891:2023 Particle size analysis -- Small angle X-ray scattering (SAXS)
Professional Standard - Agriculture
- 77药典 四部-2015 0451 X-ray diffraction method
- 57药典 四部-2020 0451 X-ray diffraction method
- JJG(教委) 016-1996 Verification rules for wavelength dispersive X-ray fluorescence spectrometer
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 26595-2011 Non-destructive testing instruments—Specification for panoramic X-ray tube
- GB/Z 41286-2022 Non-destructive testing instruments—X-ray pipeline crawlers
- GB/T 26838-2011 Non-destructive testing instruments - Portable industrial X-ray radiographic equipment
- GB/Z 41399-2022 Non-destructive testing instruments—Industrial digital X-ray imaging system
- GB/T 31364-2015 Test methods for main performance of energy dispersive X-ray fluorescence spectrometer
- GB/T 11685-2003 Measurement procedures for semiconductor X-ray detector system and semiconductor X-ray energy spectrometers
- GB/T 13221-1991 Ultrafine powder-Determination of particle size distribution-Small-angle X-ray scattering method
- GB/T 8362-1987 Retained austenite in steel; Quantitative determination; Method of X-ray diffractometer
- GB/T 13221-2004 Nanometer powder—Determinaiton of particle size distribution—Small angle X-ray
- GB 16355-1996 Radiation protection standards for X-ray diffraction and fluorescence analysis equipment
- GB/T 8360-1987 The lattice constant determination of metals--Method of X-ray diffractometer
- GB/T 26836-2011 Non-destructive testing instruments - Specification for metal ceramic X-ray tube
- GB/T 26838-2024 Non-destructive testing instruments—Portable industrial X-ray radiographic equipment
- GB/T 25184-2010 Verification method for X-ray photoelectron spectrometers
- GB/Z 42358-2023 Iron ores—Wavelength dispersive X-ray fluorescence spectrometers—Determination of precision
- GB/T 20726-2006 Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
工业和信息化部/国家能源局
- JB/T 12962.1-2016 Energy dispersive X-ray fluorescence spectrometer. Part 1: General specification
- JB/T 12962.3-2016 Energy dispersive X-ray fluorescence spectrometer. Part 3: Plating thickness analyzer
- JB/T 12962.2-2016 Energy dispersive X-ray fluorescence spectrometer. Part 2: Element analyzer
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会
- GB/T 36071-2018 Non-destructive testing instruments—technical requirements of X-ray real-time imaging system
- GB/T 36017-2018 Non-destructive testing instruments—X-ray fluorescence analysis tube
Group Standards of the People's Republic of China
- T/CAME 42-2022 Technical standard for X-ray skeletal age instrument
- T/CSCM 05-2020 Measurement of microvoids in fibers Small-angle X-ray scattering method
- T/ACEF 153-2024 Technical guidelines for radiation protection of X-ray stressometers
机械电子工业部
- JB/T 5982-1991 X-ray directional instrument technical conditions
Professional Standard - Building Materials
- JC/T 1085-2008 X-ray fluorescence analyzer for cement
工业和信息化部
- YB/T 5338-2019 Quantitative determination of austenite in steel X-ray diffractometer method
Professional Standard - Geology
- DZ 0029-1992 HYX-3 microcomputer X-ray fluorescence instrument
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 37983-2019 Testing methods of X-ray diffraction for determining the orientation of crystal materials by rotation
- GB/T 37929-2019 Non-destructive testing instruments—Testing methods for life of X-ray tubes
Occupational Health Standard of the People's Republic of China
- GBZ 115-2002 Radiological standards for X-ray Diffraction and fluorescence analysis equipment
国家能源局
- SY/T 7324-2016 X-ray fluorescence logging instrument calibration method
Professional Standard - Ferrous Metallurgy
- YB/T 5337-2006 The lattice constant determination of metals -- Method of X-ray diffractometer
- YB/T 5338-2006 Retained austenite in steel - Quantitative deternination - Method of X-ray diffractometer
Professional Standard - Public Safety Standards
- GA/T 1064-2013 Calibration specifications for X-ray generator aging testers
Professional Standard - Education
- JY/T 016-1996 General rules for wavelength dispersive X-ray fluorescence spectrometry
- JY/T 0569-2020 General rules for wavelength dispersive X-ray fluorescence spectrometry
SE-SIS
- SIS SS IEC 627:1986 X-ray equipment - Characteristics of anti-scatter grids used in X-ray equipment
- SIS SS IEC 520:1989 X-ray equipment — Entrance fieldsizes of electrooptical X-ray image intensifiers
- SIS SS IEC 395:1983 Nuclear instrumentation - Portable X or gamma radiation exposure r?te meters and monitors for use in radiological protection
- SIS SS IEC 580:1986 X-ray equipment - Area exposure product meter
- SIS SS IEC 858:1987 X-ray equipment - Determination of the image distortion of electro-optical X-ray image intensifiers
- SIS SS IEC 572:1986 X-ray equipment - Determination ofthe luminance distribution of electro-optical X-ray image intensifiers
- SIS SS IEC 573:1986 X-ray equipment - Measurement of the conversion factor of electro-opticalX-ray image intensifiers
- SIS SS IEC 637:1986 X-ray equipment - Marking of and accompanying documents for X-ray tu bes and X-ray tube assemblies for medical use
- SIS SS IEC 522:1989 X-ray equipment — Inherent filtration of an X-ray tube assembly
Korean Agency for Technology and Standards (KATS)
- KS A 4816-1985 BACK SCATTERING X-RAY REDUCING PAINTS
- KS A 4816-1980(1995) BACK SCATTERING X-RAY REDUCING PAINTS
- KS A 4729-1997 Anti - scatter grids
- KS A 4816-2000 BACK SCATTERING X-RAY REDUCING PAINTS
- KS A 4902-1987 Resolution test charts for X- ray apparatus
- KS A 4902-1979 Resolution test charts for X- ray apparatus
- KS A 4901-2002 Characteristics of anti-scatter grids used in X-ray equipment
- KS C IEC 60627:2003 Diagnostic X-ray imaging equipment-Characteristics of general purpose and mammographic anti-scatter grids
- KS D ISO 15632:2012 Microbeam analysis-Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
- KS A IEC 61137-2003(2013) Radiation protection instrumentation-Installed personnel surface contamination monitoring assembly-Low energy X and gamma emitters
- KS A 4901-2002(2012) X-RAY GRIDS
- KS C IEC 60627:2019 Diagnostic X-ray imaging equipment — Characteristics of general purpose and mammographic anti-scatter grids
- KS A 4610-2006 Portable photon ambient dose equivalent ratemeters for radiation protection
- KS M 0043-2009 General rules for X-ray diffractometric analysis
Japanese Industrial Standards Committee (JISC)
- JIS Z 4910:1983 Anti-scatter grids
- JIS Z 4328:1984 Radiation survey meters for X and gamma rays
- JIS Z 4816:1975 Back scattering X-ray reducing paints
- JIS Z 4818:1984 Reducing materials for back scattering X-rays
- JIS Z 4606:2007 Industrial X-ray apparatus for radiographic testing
- JIS C 3407:1987 High tension cables for X-ray apparatus
- JIS Z 4324:1997 Area monitors for X and gamma rays
- JIS C 3407:2003 High voltage cables for X-ray apparatus
- JIS Z 4913:1981 Film hangers for X-ray films
- JIS M 8205:2000 Iron ores -- X-ray fluorescence spectrometric analysis
- JIS Z 4324:2009 Area monitors for X and Gamma rays
- JIS Z 4311:1978 Personal exposure alarm meters for X and gamma-rays
RU-GOST R
- GOST 22091.4-1986 X-ray devices. The methods of measuring of the voltage of X-ray tube
- GOST 22091.5-1986 X-ray devices. The methods of measuring X-ray tube current
- GOST R IEC 61953-2001 Diagnostic X-ray imaging equipment. Characteristics of mammographic anti-scatter grids
- GOST 22091.3-1984 X-ray devices. Methods of measuring radiation field and beam angle of X-radiation
- GOST 22091.7-1984 X-ray devices. The methods of the measuring of the uniformity of the distribution of the energe flyx density of the X-ray over the X-ray coverage
- GOST 25645.118-1984 Cosmic X-rays of the discrete sources. Energy spectra and angular coordinates
- GOST 20337-1974 X-ray devices. Terms and definitions
- GOST 22091.10-1984 X-ray devices. The method of measuring AL(CU) equivalent of X-ray device envelope
- GOST 22091.2-1984 X-ray devices. The methods of measuring of the current and the voltage of injection of X-ray betatrons
- GOST 22091.14-1986 X-ray devices. The method of measuring the energy flow density (photon flux density) of X-radiation
- GOST 29025-1991 Non-destructive testing. X-ray television flaw detectors with X-ray electronic optical transducers electric radiographic flaw detectors. General technical requirements
- GOST 22091.6-1984 X-ray devices. Methods of measuring X-radiation exposure dose power and X-radiation exposure dose per pulse
- GOST 22091.11-1980 X-ray devices. The method of the measuring of the time operation readiness of the device
- GOST R 53203-2008 Petroleum products. Determination of sulfur by method of wavelength dispersive X-ray fluorescence spectrometry
GSO
- OS GSO ISO 17867:2017 Particle size analysis -- Small-angle X-ray scattering
- GSO ISO 17867:2017 Particle size analysis -- Small-angle X-ray scattering
- GSO IEC 61335:2014 Nuclear instrumentation - Bore-hole apparatus for X-ray fluorescence analysis
- BH GSO IEC 62495:2016 Nuclear instrumentation - Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube
- OS GSO IEC 62495:2014 Nuclear instrumentation - Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube
- OS GSO IEC 60627:2014 Diagnostic X-ray imaging equipment - Characteristics of general purpose and mammographic anti-scatter grids
- BH GSO ISO/TR 18231:2022 Iron ores — Wavelength dispersive X-ray fluorescence spectrometers — Determination of precision
- GSO ISO/TR 18231:2021 Iron ores — Wavelength dispersive X-ray fluorescence spectrometers — Determination of precision
- GSO ASTM F3094:2021 Standard Test Method for Determining Protection Provided by X-ray Shielding Garments Used in Medical X-ray Fluoroscopy from Sources of Scattered X-Rays
- BH GSO ASTM F3094:2022 Standard Test Method for Determining Protection Provided by X-ray Shielding Garments Used in Medical X-ray Fluoroscopy from Sources of Scattered X-Rays
- GSO IEC 60627:2014 Diagnostic X-ray imaging equipment - Characteristics of general purpose and mammographic anti-scatter grids
- GSO IEC 62495:2014 Nuclear instrumentation - Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube
- GSO 806:1997 PETROLEUM PRODUCTS – DETERMINATION OF SULPHUR CONTENT BY NON-DISPERSIVE X-RAY FLUORESCENCE METHOD
- BH GSO IEC 61335:2016 Nuclear instrumentation - Bore-hole apparatus for X-ray fluorescence analysis
- OS GSO IEC 61335:2014 Nuclear instrumentation - Bore-hole apparatus for X-ray fluorescence analysis
International Organization for Standardization (ISO)
- ISO 17867:2015 Particle size analysis - Small-angle X-ray scattering
- ISO 17867:2020 Particle size analysis — Small angle X-ray scattering (SAXS)
- ISO 15632:2012 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
- ISO 15632:2021 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA)
- ISO 15632:2002 Microbeam analysis - Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
- ISO/TR 18231:2016 Iron ores - Wavelength dispersive X-ray fluorescence spectrometers - Determination of precision
- ISO/FDIS 23484 Determination of particle concentration by small-angle X-ray scattering (SAXS)
- ISO 23484:2023 Determination of particle concentration by small-angle X-ray scattering (SAXS)
British Standards Institution (BSI)
- BS ISO 17867:2015 Particle size analysis. Small-angle X-ray scattering
- DD ISO/TS 13762:2001 Particle size analysis. Small angle X-ray scattering method
- BS ISO 17867:2020 Particle size analysis. Small angle X-ray scattering (SAXS)
- BS DD ISO/TS 13762:2002 Particle size analysis - Small angle X-ray scattering method
- BS EN 61953:1998 Diagnostic X-ray imaging equipment. Characteristics of mammographic anti-scatter grids
- BS EN 13925-3:2005 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Instruments
- BS EN 13925-3:2005(2009) Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Instruments
- BS ISO 23484:2023 Determination of particle concentration by small-angle X-ray scattering (SAXS)
- PD ISO/TR 18231:2016 Iron ores. Wavelength dispersive X-ray fluorescence spectrometers. Determination of precision
- BS PD ISO/TR 18231:2016 Iron ores. Wavelength dispersive X-ray fluorescence spectrometers. Determination of precision
- 22/30441138 DC BS ISO 23484. Determination of particle concentration by smallangle X-ray scattering (SAXS)
- BS IEC 62709:2024 Radiation protection instrumentation. Security screening of humans. Measuring the imaging performance of X-ray systems
- 22/30451246 DC BS IEC 62463. Radiation protection instrumentation. X-ray systems for the security screening of persons
- BS IEC 62709:2014 Radiation protection instrumentation. Security screening of humans. Measuring the imaging performance of X-ray systems
VN-TCVN
- TCVN 6596-2000 X ray diagnostic radiography and fluoroscopy.Generator, X ray tube, collimator.Test procedure
Association Francaise de Normalisation
- NF C74-111:1985 Electromedical equipment. Radiology equipment. X radiation equipment. Radiodiagnostic X-ray tube assemblies. Construction and tests. Requirements.
- NF X21-008:2012 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive ray spectrometers for use in electron probe microanalysis
- NF M60-522:1998 X and gamma radiation. Indirect- or direct-reading capacitor-type pocket dosemeters.
- NF A09-280-3*NF EN 13925-3:2005 Non destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3 : instruments.
- NF EN 60627:2015 X-ray imaging diagnostic equipment - Characteristics of anti-scattering grids for general use and mammography
- NF C74-121:2002 Diagnostic X-ray imaging equipment - Characteristics of general purpose and mammographic anti-scatter grids.
American Society for Testing and Materials (ASTM)
- ASTM E1172-87(2003) Standard Practice for Describing and Specifying a Wavelength-Dispersive X-Ray Spectrometer
- ASTM F3094-14(2022) Standard Test Method for Determining Protection Provided By X-ray Shielding Garments Used in Medical X-ray Fluoroscopy from Sources of Scattered X-Rays
- ASTM E1172-87(2001) Standard Practice for Describing and Specifying a Wavelength-Dispersive X-Ray Spectrometer
- ASTM F3094-14 Standard Test Method for Determining Protection Provided by X-ray Shielding Garments Used in Medical X-ray Fluoroscopy from Sources of Scattered X-Rays
- ASTM E1931-97(2003) Standard Guide for X-Ray Compton Scatter Tomography
- ASTM E1931-09 Standard Guide for X-Ray Compton Scatter Tomography
- ASTM E1931-16(2022) Standard Guide for Non-computed X-Ray Compton Scatter Tomography
- ASTM E1931-97 Standard Guide for X-Ray Compton Scatter Tomography
- ASTM E1172-87(1996) Standard Practice for Describing and Specifying a Wavelength-Dispersive X-Ray Spectrometer
- ASTM E1621-05 Standard Guide for X-Ray Emission Spectrometric Analysis
- ASTM E1931-16 Standard Guide for Non-computed X-Ray Compton Scatter Tomography
- ASTM E1172-22 Standard Practice for Describing and Specifying a Wavelength Dispersive X-Ray Spectrometer
- ASTM E1172-16 Standard Practice for Describing and Specifying a Wavelength Dispersive X-Ray Spectrometer
- ASTM E1172-87(2011) Standard Practice for Describing and Specifying a Wavelength-Dispersive X-Ray Spectrometer
- ASTM F1467-18 Standard Guide for Use of an X-Ray Tester (≈10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
Standard Association of Australia (SAA)
- AS 2563:1996(R2016) Wavelength dispersive X-ray fluorescence spectrometers - Determination of precision
- AS 2563:1996 Wavelength dispersive X-ray fluorescence spectrometers - Determination of precision
- AS 2563:1982 Wavelength dispersive X-ray fluorescence spectrometers - Methods of test for determination of precision
- AS 2563:2019 Iron ores — Wavelength dispersive X-ray fluorescence spectrometers — Determination of precision
SCC
- DANSK DS/ISO 17867:2020 Particle size analysis – Small angle X-ray scattering (SAXS)
- BS DD ISO/TS 13762:2001 Particle size analysis. Small angle X-ray scattering method
- BS ISO 15632:2002 Microbeam analysis. Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
- 10/30156853 DC BS EN 62495. Nuclear instrumentation. Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube
- DANSK DS/EN 60627:2015 Diagnostic X-ray imaging equipment - Characteristics of general purpose and mammographic anti-scatter grids
- DANSK DS/ISO 23484:2023 Determination of particle concentration by small-angle X-ray scattering (SAXS)
- DIN IEC 62495 E:2010 Draft Document - Nuclear instrumentation - Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube (IEC 45/702/CDV:2010)
- DIN IEC 60627 E:2011 Draft Document - Diagnostic X-ray imaging equipment - Characteristics of general purpose and mammographic anti-scatter grids (IEC 62B/823/CD:2011)
- DANSK DS/EN 13925-3:2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
- NS-EN 13925-3:2005 Non destructive testing — X ray diffraction from polycrystalline and amorphous materials — Part 3: Instruments
- AENOR UNE-EN 13925-3:2006 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
- BS 5913:1980 Method of measuring and defining the characteristics of anti-scatter grids used in X-ray equipment
- VDI/VDE 5575 BLATT 4:2018 X-ray optical systems — X-ray mirrors and X-ray mirror systems — Total reflection and multilayer mirrors
- VDI/VDE 5575 BLATT 7-2019 X-ray optical systems - Refractive X-ray lenses
- CEI 45-20:1997 Exposure rate meters, indicators and exposure rate monitors installed for X-ray radiation or energy range between 80 keV and 3 MeV
- JIS Z 4716:2018 Measurement methods of leakage X-ray from X-ray examination rooms
International Electrotechnical Commission (IEC)
- IEC 61953:1997 Diagnostic X-ray imaging equipment - Characteristics of mammographic anti-scatter grids
- IEC 61335:1997 Nuclear instrumentation - Bore-hole apparatus for X-ray fluorescence analysis
- IEC 60627:1978 Characteristics of anti-scatter grids used in X-ray equipment
- IEC 62495:2011 Nuclear instrumentation - Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube
- IEC 62709:2014 Radiation protection instrumentation - Security screening of humans - Measuring the imaging performance of X-ray systems
Indonesia Standards
- SNI 18-6938-2002 Specification of X-rays or Y-rays radiation portable surveymeter
German Institute for Standardization
- DIN 51418-1:2008 X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: Definitions and basic principles
- DIN ISO 15632 E:2015-05 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
- DIN ISO 15632 E:2022-03 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
- DIN 51418-1:1996 X-ray spectrometry - X-ray emission- and X-ray fluorescence analysis (XRF) - Part 1: Definitions and basic principles
- DIN EN 60627:2006 Diagnostic X-ray imaging equipment - Characteristics of general purpose and mammographic anti-scatter grids (IEC 60627:2001); German version EN 60627:2001
- DIN IEC 62495:2011 Nuclear instrumentation - Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube (IEC 62495:2011)
- DIN ISO 15632:2015 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis (ISO 15632:2012)
- DIN 51418-2:2015 X-ray spectrometry - X-ray emission and X-ray fluorescence analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results
- DIN 51418-2:1996 X-ray spectrometry - X-ray emission- and X-ray fluorescense analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results
- DIN 6836:1963 X-ray tubes and single tank X-ray generators; holders for X-ray application tables and stands, dimensions for assembling
- DIN ISO 15632:2022-09 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA) (ISO 15632:2...
- DIN EN 60627:2016-08 Diagnostic X-ray imaging equipment - Characteristics of general purpose and mammographic anti-scatter grids (IEC 60627:2013); German version EN 60627:2015
- DIN EN 13925-3:2005-07 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments; German version EN 13925-3:2005
- DIN EN 13925-3:2005 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments; German version EN 13925-3:2005
- DIN 6868-4:1987 Image quality assurance in X-ray diagnosis; constancy checking in radioscopy with an X-ray image intensifier and photography from the X-ray image intensifier output screen
- DIN 51418-2 Bb.1:2000 X-ray spectrometry - X-Ray Emission- and X-ray Fluorescence analysis (XRF) - Part 2: Definitions and basic principles for measurements, calibration and evaluation of results; additional information and examples of calculation
- DIN 51577-4:1994 Testing of mineral oil hydrocarbons and similar products; determination of chlorine and bromine content; analysis by energy dispersive X-ray spectrometry with low cost instruments
Spanish Association for Standardization (UNE)
- UNE-EN 60627:2015 Diagnostic X-ray imaging equipment - Characteristics of general purpose and mammographic anti-scatter grids (Endorsed by AENOR in July of 2015.)
- UNE 20617:1981 CHARACTERISTICS OF ANTI-SCATTER GRIDS USED IN X-RAY EQUIPMENT
- UNE-EN 60627:2002 Diagnostic X-ray imaging equipment - Characteristics of general purpose and mammographic anti-scatter grids.
- UNE-EN 13925-3:2006 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
European Committee for Electrotechnical Standardization(CENELEC)
- EN 61953:1998 Diagnostic X-Ray Imaging Equipment Characteristics of Mammographic Anti-Scatter Grids
- EN 60627:2015 Diagnostic X-ray imaging equipment - Characteristics of general purpose and mammographic anti-scatter grids
VDE - VDE Verlag GmbH@ Berlin@ Germany
- VDE 0412-20-2011 Strahlungsmessgeraete - Tragbare Roentgenfluoreszenz-Analysegeraete mit Kleinstroentgenroehre (IEC 62495:2011)
American National Standards Institute (ANSI)
- ANSI N42.26-1995 Radiation Protection Instrumentation - Monitoring Equipment - Personal Warning Devices for X and Gamma Radiations
- ANSI/ASTM E915:1996 Method for Verifying the Alignment of X-Ray Diffraction Instrumentation for Residual Stress Measurement
Association of German Mechanical Engineers
- VDI/VDE 5575 Blatt 9-2012 X-ray optical systems - X-ray filters
- VDI/VDE 5575 Blatt 7-2011 X-Ray optical systems - Refractive X-ray lenses
VDI - Verein Deutscher Ingenieure
- VDI/VDE 5575 BLATT 4-2018 X-ray optical systems - X-ray mirrors and X-ray mirror systems - Total reflection mirrors and multilayer mirrors
- VDI/VDE 5575 BLATT 4-2017 X-ray optical systems - X-ray mirrors and X-ray mirror systems - Total reflection mirrors and multilayer mirrors
- VDI/VDE 5575 Blatt 3-2009 X-Ray optical systems - Cappilary x-ray optics
- VDI/VDE 5575 Blatt 7-2007 X-Ray optical systems - Refractive X-ray optics - Definition of parameters
- VDI/VDE 5575 BLATT 3-2019 Roentgenoptische Systeme - Roentgenkapillaren
- VDI/VDE 5575 BLATT 7-2018 Roentgenoptische Systeme - Refraktive Roentgenlinsen
CZ-CSN
- CSN 36 4710-1974 X-ray medical apparatus
KR-KS
- KS C IEC 60627-2019 Diagnostic X-ray imaging equipment — Characteristics of general purpose and mammographic anti-scatter grids
BE-NBN
- NBN 400-2-1969 Radiation equipment: medical X-ray generators and accessories. ray tube
- NBN 400-4-1969 Radiation equipment: medical X-ray generators and accessories. Structural features that prevent X-ray radioactivity
Lithuanian Standards Office
- LST EN 13925-3-2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
- LST EN 60627+AC-2003 Diagnostic X-ray imaging equipment - Characteristics of general purpose and mammographic anti-scatter grids (IEC 60627:2001)
Danish Standards Foundation
- DS/EN 13925-3:2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
European Committee for Standardization (CEN)
- EN 13925-3:2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
PT-IPQ
- E E 14-1971 X-ray diffraction analysis
x-ray scattering,x-ray scatterometer,scatter x-ray instrument,Scattering+x-ray+meter,x-ray scattering,x-ray small angle scattering,x-ray scattering instrument,small angle x-ray scattering,energy dispersive x-ray,x-ray scattering,x-ray energy scatter,x-ray scattering instrument,Principles of X-ray Scattering,small angle x-ray scattering,Ray Scattering Instruments,x-ray scattering,High Energy X-ray Scattering Instrument,x-ray backscatter,x-ray scatter,small x-ray scattering instrument