Oxford x-max energy spectrum detection limit
Oxford x-max energy spectrum detection limit, Total:28 items.
The international standard classification for "Oxford x-max energy spectrum detection limit" includes: Non-destructive testing , Measurement of electrical and magnetic quantities , Other standards related to analytical chemistry , Nuclear energy in general , Chemical analysis , Protection against crime .
The Chinese standard classification for "Oxford x-max energy spectrum detection limit" includes: X ray, magnetic powder, fluorescent light and other defectoscope , Basic standards and general methods , Integrated test system , Electron optics and other physical optics instrument , Nuclear instrument and detector in general , Basic standards and general methods , Crime judging technology .
Professional Standard - Machinery
- JB/T 11602.3-2013 Non-destructive testing instruments — Measurement and evaluation of the X-ray tube voltage — Part 2：constancy check by the thick filter method
- JB/T 6215-2011 Non-destructive testing instruments —The series typal table to industrial X-ray tube
- JB/T 12457-2015 Non-destructive testing instruments-Testing method of X-ray delector for circuit board detection
Professional Standard - Aviation
- HB 20094.3-2012 Test method for determination of wear metals in operating liquid for aviation.Part 3: Energy dispersion X-ray fluorescence spectrometry
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 41105.3-2021 Non-destructive testing―Measurement and evaluation of the X-ray tube voltage―Part 3:Spectrometric method
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 29556-2013 Surface chemical analysis—Auger electron spectroscopy and X-ray photoelectron spectroscopy—Determination of lateral resolution,analysis area, and sample area viewed by the analyser
- GB/T 20726-2006 Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
- GB/T 11685-2003 Measurement procedures for semiconductor X-ray detector system and semiconductor X-ray energy spectrometers
- GB/T 31470-2015 Standard practice for determination of the specimen area contributing to the detected signal in Auger electron spectrometers and some X-ray photoelectron spectrometers
Professional Standard - Judicatory
- SF/T 0139-2023 Examination of soil—Scanning electron microscope/X-ray energy dispersive spectrometry
工业和信息化部
- HG/T 6114-2022 Rapid determination method of heavy metals in waste acidenergy-dispersive X-ray fluorescence spectrometry
Fujian Provincial Standard of the People's Republic of China
- DB35/T 110-2000 Electron probe and scanning electron microscope X-ray energy spectrum analysis method for paint physical evidence detection
- DB35/T 75-1996 Determination of gold content in gold jewelry (X-fluorescence spectroscopy)
Professional Standard - Electron
- SJ/T 10714-1996 Standard practice for checking the operation characteristics of X-ray photoelectron spectrometers
Professional Standard - Public Safety Standards
- GA/T 1937-2021 Forensic sciences-Examination methods for rubber- Scanning electron microscope/energy dispersive X-ray spectrometry
- GA/T 1938-2021 Forensic sciences- Examination methods for metal-Scanning electron microscope/energy dispersive X-ray spectrometry
- GA/T 1939-2021 Forensic sciences-Examination methods for electric marks-Scanning electron microscopy/energy dispersive X-ray spectrometry
Qinghai Provincial Standard of the People's Republic of China
- DB63/T 1678-2018 Determination of mineral pigments in thangka X-ray fluorescence spectrometry (energy spectroscopy)
Group Standards of the People's Republic of China
- T/LNWTA 003-2019 Determination of elements in the pipe for drinking water —Energy dispersive X-ray fluorescence spertroscopy (EDXRF) method
SE-SIS
- SIS SS IEC 759:1986 Nuclear instrumentation —Test procedures for semiconductor X-ray energy spectrometers
British Standards Institution (BSI)
- BS ISO 19668:2017 Surface chemical analysis. X-ray photoelectron spectroscopy. Estimating and reporting detection limits for elements in homogeneous materials
International Organization for Standardization (ISO)
- ISO 19668:2017 Surface chemical analysis — X-ray photoelectron spectroscopy — Estimating and reporting detection limits for elements in homogeneous materials
Korean Agency for Technology and Standards (KATS)
- KS C IEC 60759-2019 Standard test procedures for semiconductor X-ray energy spectrometers
- KS C IEC 60759-2009(2019) Standard test procedures for semiconductor X-ray energy spectrometers
GSO
- GSO IEC 60759:2015 Standard test procedures for semiconductor X-ray energy spectrometers
- OS GSO IEC 60759:2015 Standard test procedures for semiconductor X-ray energy spectrometers
CZ-CSN
- CSN 35 6575 Z1-1997 Standard test procedureds for semiconductor X-ray energy spectrometers
American Society for Testing and Materials (ASTM)
- ASTM E902-94(1999) Standard Practice for Checking the Operating Characteristics of X-Ray Photoelectron Spectrometers
