"General Rules for Semiconductor Detector X-ray Spectrometer"
"General Rules for Semiconductor Detector X-ray Spectrometer", Total:21 items.
The international standard classification for ""General Rules for Semiconductor Detector X-ray Spectrometer"" includes: Other standards related to analytical chemistry , Nuclear energy in general .
The Chinese standard classification for ""General Rules for Semiconductor Detector X-ray Spectrometer"" includes: Electron optics and other physical optics instrument , Nuclear instrument and detector in general , Basic standards and general methods .
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 11685-2003 Measurement procedures for semiconductor X-ray detector system and semiconductor X-ray energy spectrometers
- GB/T 20726-2006 Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
- GB/T 20726-2015 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy dispersive X-ray spectrometers for use in electron probe microanalysis
未注明发布机构
- DIN ISO 15632 E:2022-03 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
- DIN ISO 15632 E:2015-05 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
SCC
- BS ISO 15632:2002 Microbeam analysis. Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
SE-SIS
- SIS SS IEC 759:1986 Nuclear instrumentation —Test procedures for semiconductor X-ray energy spectrometers
GSO
- GSO IEC 60759:2015 Standard test procedures for semiconductor X-ray energy spectrometers
- OS GSO IEC 60759:2015 Standard test procedures for semiconductor X-ray energy spectrometers
CZ-CSN
- CSN 35 6575 Z1-1997 Standard test procedureds for semiconductor X-ray energy spectrometers
Korean Agency for Technology and Standards (KATS)
- KS C IEC 60759-2019 Standard test procedures for semiconductor X-ray energy spectrometers
- KS C IEC 60759-2009(2019) Standard test procedures for semiconductor X-ray energy spectrometers
- KS C IEC 60759:2009 Standard test procedures for semiconductor X-ray energy spectrometers
- KS D ISO 15632:2012 Microbeam analysis－Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
Institute of Electrical and Electronics Engineers (IEEE)
- ANSI/IEEE Std 759-1984 IEEE Standard Test Procedures for Semiconductor X-Ray Energy Spectrometers
IN-BIS
- IS 12737-1988 Standard test procedures for semiconductor X-ray energy spectrometers
International Organization for Standardization (ISO)
- ISO 15632:2021 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA)
- ISO 15632:2012 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
- ISO 15632:2002 Microbeam analysis - Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
International Electrotechnical Commission (IEC)
- IEC 60759:1983 Standard test procedures for semiconductor X-ray energy spectrometers
Association Francaise de Normalisation
- NF X21-008:2012 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive ray spectrometers for use in electron probe microanalysis
"General Rules for Semiconductor Detector X-ray Spectrometer",General rules for X-ray spectrometers with semiconductor detectors,General Rules for Semiconductor Detector X-ray Spectrometer
