Semiconductor Instruments

Semiconductor Instruments, Total:38 items.

The international standard classification for "Semiconductor Instruments" includes: Other standards related to analytical chemistry , Nuclear energy in general , Semiconductor devices in general .

The Chinese standard classification for "Semiconductor Instruments" includes: Electron optics and other physical optics instrument , Nuclear instrument and detector in general , Technical management .

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Group Standards of the People's Republic of China

• T/CASME 698-2023 Semiconductor laser therapy apparatus

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

• GB/T 11685-2003 Measurement procedures for semiconductor X-ray detector system and semiconductor X-ray energy spectrometers
• GB/T 20726-2006 Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors

Professional Standard - Electron

• SJ/T 10229-1991 Graphic instrument for characteristics of semiconductor tubes for Type XJ4810

GSO

• GSO IEC 60747-15:2014 Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices
• GSO IEC 60747-5-4:2014 Semiconductor devices - Discrete devices - Part 5-4: Optoelectronic devices - Semiconductor lasers
• GSO IEC 60747-14-5:2015 Semiconductor devices - Part 14-5: Semiconductor sensors - PN-junction semiconductor temperature sensor
• OS GSO IEC 60333:2009 Nuclear instrumentation - Semiconductor charged-particle detectors - Test procedures
• GSO IEC 60747-4:2014 Semiconductor devices - Discrete devices - Part 4: Microwave diodes and transistors
• BH GSO IEC 62047-20:2022 Semiconductor devices - Micro-electromechanical devices - Part 20: Gyroscopes
• GSO IEC 62047-20:2021 Semiconductor devices - Micro-electromechanical devices - Part 20: Gyroscopes

British Standards Institution (BSI)

• BS IEC 60747-14-5:2010 Semiconductor devices - Semiconductor sensors - PN-junction semiconductor temperature sensor
• BS EN 62047-20:2014 Semiconductor devices. Micro-electromechanical devices. Gyroscopes
• BS IEC 60747-14-4:2011 Semiconductor devices. Discrete devices. Semiconductor accelerometers
• BS IEC 60747-5-4:2022 Semiconductor devices - Optoelectronic devices. Semiconductor lasers
• BS EN 61207-7:2014 Expression of performance of gas analyzers. Tuneable semiconductor laser gas analyzers
• BS IEC 60747-14-3:2009 Semiconductor devices - Semiconductor sensors - Pressure sensors
• BS IEC 60747-14-2:2001 Discrete semiconductor devices and integrated circuits - Semiconductor devices - Semiconductor sensors - Hall elements
• BS IEC 60747-14-2:2000 Discrete semiconductor devices and integrated circuits - Semiconductor devices - Semiconductor sensors - Hall elements
• BS IEC 60747-14-1:2001 Discrete semiconductor devices and integrated circuits - Semiconductor devices - Semiconductor sensors - General and classification - Sensor generals and classification for semiconductor sensors
• BS IEC 60747-5-4:2006 Semiconductor devices - Discrete devices - Optoelectronic devices - Semiconductor lasers
• BS EN 60747-15:2004 Discrete semiconductor devices. Isolated power semiconductor devices

RU-GOST R

• GOST 29283-1992 Semiconductor devices. Discrete devices and integrated circuits. Part 5. Optoelectronic devices

CZ-CSN

• CSN 35 8701-1975 Terminology of semiconductors and semiconductor devices

Spanish Association for Standardization (UNE)

• UNE-EN 62047-20:2014 Semiconductor devices - Micro-electromechanical devices - Part 20: Gyroscopes (Endorsed by AENOR in November of 2014.)

SCC

• CEI EN 62258-1:2011 Semiconductor devices - Semiconductor die products Part 1: Procurement and use
• CEI EN 62047-20:2016 Semiconductor devices - Micro-electromechanical devices Part 20: Gyroscopes
• DANSK DS/EN 62047-20:2014 Semiconductor devices - Micro-electromechanical devices - Part 20: Gyroscopes
• BS IEC 60747-14-3:2001 Discrete semiconductor devices and integrated circuits. Semiconductor devices. Semiconductor sensors-Pressure sensors
• DIN IEC 60333:1995 Nuclear instrumentation - Semiconductor charged-particle detectors - Test procedures (IEC 60333:1993)
• BS IEC 60747-14-1:2000 Discrete semiconductor devices and integrated circuits. Semiconductor devices. Semiconductor sensors-General and classification-Sensor generals and classification for semiconductor sensors

Standard Association of Australia （SAA）

• AS 1955.2:1978 Semiconductor convertors - Semiconductor self-commutated convertors

(U.S.) Joint Electron Device Engineering Council Soild State Technology Association

• JEDEC JESD22-B108A-2003 Coplanarity Test for Surface-Mount Semiconductor Devices

Association Francaise de Normalisation

• NF EN 62047-20:2014 Dispositifs à semiconducteurs - Dispositifs microélectromécaniques - Partie 20 : gyroscopes

International Electrotechnical Commission (IEC)

• IEC 60333:1993 Nuclear instrumentation; semiconductor charged-particle detectors; test procedures
• IEC 60747-14-5:2010 Semiconductor devices - Part 14-5: Semiconductor sensors - PN-junction semiconductor temperature sensor

German Institute for Standardization

• DIN IEC 60747-11:1992 Semiconductor devices; sectional specification for semiconductor devices; identical with IEC 60747-11:1985
• DIN 28058-2:1989-01 Lead used in apparatus engineering; lead of semi-finished product designs

Others: Semiconductor Test Instruments,Semiconductor Instruments,Semiconductor Instruments,Semiconductor equipment,Semiconductor Measuring Instruments,Semiconductor Instruments,Semiconductor Instruments