x-ray energy

x-ray energy, Total:31 items.

The international standard classification for "x-ray energy" includes: Other standards related to analytical chemistry , Optical equipment , Optical measuring instruments , Nuclear energy in general , Protection against crime , Paper and board .

The Chinese standard classification for "x-ray energy" includes: Electron optics and other physical optics instrument , Electrochemical, thermochemistry and optical profile type analyzer , Nuclear instrument and detector in general , Basic standards and general methods , Crime judging technology , Papermaking in general , Paper .

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 18873-2002 General specification of transmission electron microscope(TEM)-X-ray energy dispersive spectrum(EDS) quantitative microanalysis for thin biological specimens
GB/T 17507-2008 General specification of thin biological standards for X-ray EDS microanalysis in transmission electron microscope
GB/T 2679.11-2008 Paper and board - qualitative analysis of mineral filler and mineral coating - SEM/EDAX method
GB/T 17362-1998 Nondestructive method of X-ray EDS analysis with SEM for gold jewelry
GB/T 17359-1998 General specification of X-ray EDS quantitative analysis for EPMA and SEM
GB/T 19267.6-2008 Physical and chemical examination of trace evidence in forensic sciences - Part 6:Scanning electron microscope/ X ray energy dispersive spectrometry
GB/T 20726-2006 Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
GB/T 2679.11-1993 Paper and board―Qualitative analysis of mineral filler and mineral coating―SEM/EDAX method
GB/T 20726-2015 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy dispersive X-ray spectrometers for use in electron probe microanalysis
GB/T 17361-1998 Identification method of authigenic clay mineral in sedimentary rock by SEM and XEDS
GB/T 11685-2003 Measurement procedures for semiconductor X-ray detector system and semiconductor X-ray energy spectrometers
GB/T 17507-1998 General specification of thin biological STANDARDs for X-ray EDS microanalysis in electron microscope
GB/T 17362-2008 Analysis method for gold products with X-ray EDS in SEM
GB/T 18873-2008 General guide of transmission electron microscope (TEM)-X - Ray energy dispersive spectrometry(EDS)quantitative microanalysis for thin biological specimens
GB/T 17723-1999 Surface composition analysis method of gold-plated products by EDX

Professional Standard - Judicatory

SF/T 0139-2023 Examination of soil—Scanning electron microscope/X-ray energy dispersive spectrometry

Professional Standard - Public Safety Standards

GA/T 1938-2021 Forensic sciences- Examination methods for metal-Scanning electron microscope/energy dispersive X-ray spectrometry
GA/T 1939-2021 Forensic sciences-Examination methods for electric marks-Scanning electron microscopy/energy dispersive X-ray spectrometry
GA/T 1937-2021 Forensic sciences-Examination methods for rubber- Scanning electron microscope/energy dispersive X-ray spectrometry

Guangdong Provincial Standard of the People's Republic of China

DB44/T 1216-2013 Characterization of graphene using scanning electron microscopy and X-ray spectroscopy
DB44/T 1215-2013 Characterization of Single-Walled Carbon Nanotubes Using Scanning Electron Microscopy and Energy Spectroscopy

RU-GOST R

GOST 22091.14-1986 X-ray devices. The method of measuring the energy flow density (photon flux density) of X-radiation

CZ-CSN

CSN 35 6575 Z1-1997 Standard test procedureds for semiconductor X-ray energy spectrometers

GSO

GSO IEC 60759:2015 Standard test procedures for semiconductor X-ray energy spectrometers
OS GSO IEC 60759:2015 Standard test procedures for semiconductor X-ray energy spectrometers

Korean Agency for Technology and Standards (KATS)

KS C IEC 60759-2019 Standard test procedures for semiconductor X-ray energy spectrometers
KS C IEC 60759:2009 Standard test procedures for semiconductor X-ray energy spectrometers
KS C IEC 60759-2009(2019) Standard test procedures for semiconductor X-ray energy spectrometers

International Electrotechnical Commission (IEC)

IEC 60759:1983 Standard test procedures for semiconductor X-ray energy spectrometers

Institute of Electrical and Electronics Engineers (IEEE)

IEEE 759-1984 Test procedures for semiconductor X-ray energy spectrometers
ANSI/IEEE Std 759-1984 IEEE Standard Test Procedures for Semiconductor X-Ray Energy Spectrometers

Others: x-ray spectroscopy,x-ray spectroscopy,X-ray spectrometer,X-ray energy spectrum processing,x-ray electron spectroscopy,Measuring x-ray energy spectrum,X-ray spectroscopy,x-ray electron energy,x-ray spectroscopy,x-ray electron spectroscopy,x-ray spectroscopy,energy spectrum of x-rays,x-ray spectroscopy,x-ray tube spectroscopy,energy spectrometer x-ray,x-ray spectroscopy,energy spectrum x-ray,x-ray energy,Energy X-ray Spectroscopy and X-ray Spectroscopy