semi-quantitative spectrometer
semi-quantitative spectrometer, Total:193 items.
The international standard classification for "semi-quantitative spectrometer" includes: Optics and optical measurements , Analytical chemistry , Analytical chemistry in general , Chemical analysis , Nuclear energy in general , Other standards related to nuclear energy , Other standards related to analytical chemistry , Chemical laboratories. Laboratory equipment , Iron ores , Geology. Meteorology. Hydrology , Other standards related to optics and optical measurements , Dental materials , Ophthalmic equipment , Laboratory medicine , Steels .
The Chinese standard classification for "semi-quantitative spectrometer" includes: Optical Measurement , Chemical Measurement , Basic standards and general methods , Electrochemical, thermochemistry and optical profile type analyzer , Basic standards and general methods , Nuclear instrument and detector in general , General nuclear instrument , Electron optics and other physical optics instrument , Iron ore , Ionizating Radiation Measurement , Stomatologic device, equipment and material , Medical ultrasound, laser, high-frequency instrument and equipment , Medical laboratory equipment , Steel and iron alloy analysis method , Meteorology , Oceanographic instrumentation .
Professional Standard - Commodity Inspection
- SN/T 3377-2012 Determination of lead in paints-Semiquantitative screening by energy dispersive X-ray fluorescence spectrometric method
Taiwan Provincial Standard of the People's Republic of China
- CNS 13805-1997 Method of Measurement for Photoluminescence of Optoelectronic Semiconductor Wafers
- CNS 14341-1999 Optical spectrum analyzer
National Metrological Verification Regulations of the People's Republic of China
- JJG 867-1994 Spectrocolorimeter
- JJG(教委) 02-1992 Laser Raman Spectrometer Verification Regulations
- JJG 536-1998 Polarimeter and Saccharimeter
- JJG 1035-2022 Optical Spectrum Analyzers in Telecommunication
- JJG(教委) 01-1992 Verification Regulations for Fourier Transform Infrared Spectrometer
- JJG(地质) 1006-1990 Verification regulations for 3080E X-ray fluorescence spectrometer
- JJG 768-2005 Verification Regulation of Emission Spectrometer
- JJG 810-1993 Wavelength Dispersive X-Ray Fluorescence Spectrometers
- JJG 536-2015 Polarimeter and Polarimetric Saccharimeters
- JJG 916-1996 Verification Regulation of Gas-Sensitive Chromatograph for Measuring Trace Hydrogen
- JJG(地质) 1011-1990 Verification regulations for one-meter planar grating spectrograph
- JJG(地质) 1012-1990 Verification rules for two-meter planar grating spectrograph
- JJG(电子) 30901-2006 Verification Regulations for Spectrum Analyzers
- JJG 1035-2008 Verification Regulation of Optical Spectrum Analyzers in Telecommunication
- JJG 768-1994 Verification Regulation of Emission Spectrometer
Military Standard of the People's Republic of China-General Armament Department
- GJB 8662-2015 Calibration procedures for Fourier transform infrared spectrometers
- GJB 9726-2020 Specifications for spaceborne hyperspectral imagers
- GJB 8472-2015 Verification regulation for field spectrometer
Jilin Provincial Standard of the People's Republic of China
- DB22/T 2414-2015 Micro fiber optic spectrometer
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 25481-2010 On-line ultraviolet/visible spectrum analyzer
- GB/T 21186-2007 Fourier transform infrared spectrometer
- GB/T 31364-2015 Test methods for main performance of energy dispersive X-ray fluorescence spectrometer
- GB/T 11685-2003 Measurement procedures for semiconductor X-ray detector system and semiconductor X-ray energy spectrometers
- GB/T 21191-2007 Atomic fluorescence spectrometer
- GB/Z 42358-2023 Iron ores—Wavelength dispersive X-ray fluorescence spectrometers—Determination of precision
- GB/T 25184-2010 Verification method for X-ray photoelectron spectrometers
- GB/T 20726-2006 Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
- GB/T 42027-2022 Gas-phase molecular absorption spectrometer
- GB/T 32266-2015 Method of performance testing for atomic fluorescence spectrometer
Group Standards of the People's Republic of China
- T/CASME 698-2023 Semiconductor laser therapy apparatus
- T/CGWSTC 001-2022 Determination of various components in ceramic raw materials X-ray fluorescence spectrometry (powder compression)
- T/ZZB 0673-2018 Emission spectrometer
- T/JGXH 017-2024 Intelligent semiconductor laser therapy instrument
- T/QGCML 1522-2023 FLA Micro Fiber Spectrometer
- T/CHES 34-2020 Calibration specification for optical sediment concentration measuring apparatus
National Metrological Technical Specifications of the People's Republic of China
- JJF 1601-2016 Calibration Specification for Spectrophotometers for Diffuse Reflectance Measurement
- JJF 1544-2015 Calibration Specification for Raman Spectrometers
- JJF 1329-2011 Calibration Specification for Instantaneous Spectral Instruments
- JJF 2024-2023 Calibration Specification for Energy Dispersive X-Ray Fluorescence Spectrometers
- JJF 1133-2005 Calibration Specification of Gold Gauge Utilizing X-ray Fluorescence Spectrometry
Professional Standard - Military and Civilian Products
- WJ 1010-1994 Optical Instrument Parts Half Ear Handwheel
- WJ 2300-1995 Verification Regulations for Plane Grating Spectrograph
工业和信息化部/国家能源局
- JB/T 12962.3-2016 Energy dispersive X-ray fluorescence spectrometer. Part 3: Plating thickness analyzer
- JB/T 12962.2-2016 Energy dispersive X-ray fluorescence spectrometer. Part 2: Element analyzer
- JB/T 12962.1-2016 Energy dispersive X-ray fluorescence spectrometer. Part 1: General specification
Professional Standard - Machinery
- JB/T 5590-1991 Optical Filter of Optical Spectrum Instrument
- JB/T 9322-1999 Spectrum projector
- JB/T 9320-1999 Plane-gratings spectrographs
- JB/T 5478-1991 Manual Scanning Photoelectric Direct-reading Spectrometer
- JB/T 11145-2011 X-ray fluorescence spectrometer
- JB/T 9331-1999 Slits for optical spectrum instruments
Professional Standard - Agriculture
- JJG(教委) 016-1996 Verification rules for wavelength dispersive X-ray fluorescence spectrometer
- JJG(教委) 022-1996 Verification Regulations for Ultraviolet and Visible Absorption Spectrometers
- JJG(教委) 001-1996 Verification Regulations for Fourier Transform Infrared Spectrometer
- JJG(教委) 023-1996 Verification Regulations for Atomic Absorption Spectrometer
Professional Standard - Medicine
- YY/T 1174-2010 Semi-automatic chemiluminescence immunoassay analyzer
- YY/T 1807-2022 Dentistry―Rapid nondestructive testing of main components in metal materials for prosthodontics―Handheld energy dispersive X-Ray fluorescence spectrometric method (semiquantitative method)
- YY 1289-2016 Laser treating equipment―Ophthalmic semiconductor laser photocoagulators
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 40219-2021 General specification for Raman spectrometers
- GB/T 36226-2018 Stainless steel—Determination of manganse,nickel,chromium,molybdenum,copper and titanium—Handheld energy dispersive X-Ray fluorescence spectrometric method(semiquantitative method)
未注明发布机构
- DIN ISO 15632 E:2015-05 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
- DIN 5030-3 E:2020-11 Spectral measurement of radiation - Spectral isolation - Definitions and characteristics
- DIN ISO 15632 E:2022-03 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
- AS 2563:1996(R2016) Wavelength dispersive X-ray fluorescence spectrometers - Determination of precision
Heilongjiang Provincial Standard of the People's Republic of China
- DB23/T 1530-2013 Spectrum calibrator for food safety rapid testing equipment
Professional Standard - Meteorology
- QX/T 172-2012 Observation Method of Total Column Ozone with Brewer Spectrophotometer
中国气象局
- QX/T 532-2019 Specifications for Brewer spectrophotometer calibration
Professional Standard - Ocean
- HY/T 175-2014 Optical suspended sediment particle size analyzer
Professional Standard - Traffic
- JT/T 3156-1992 Photoelectric bitumen content tester
Professional Standard - Electricity
- DL/T 386-2010 Calibration for second derivative flame atomic emission spectrometer
IN-BIS
- IS 12737-1988 Standard test procedures for semiconductor X-ray energy spectrometers
- IS 6471-1971 Spectrometer specifications (student type)
GSO
- GSO IEC 61976:2014 Nuclear instrumentation - Spectrometry - Characterization of the spectrum background in HPGe gamma-ray spectrometry
- OS GSO IEC 61976:2014 Nuclear instrumentation - Spectrometry - Characterization of the spectrum background in HPGe gamma-ray spectrometry
- BH GSO IEC 61976:2016 Nuclear instrumentation - Spectrometry - Characterization of the spectrum background in HPGe gamma-ray spectrometry
- GSO IEC 60747-5-4:2014 Semiconductor devices - Discrete devices - Part 5-4: Optoelectronic devices - Semiconductor lasers
- GSO ISO 15774:2008 Animal and vegetable fats and oils- Determination of cadmium content by direct graphite furnace atomic absorption spectrometry
- GSO ISO 8577:2015 Optics and optical instruments -- Microscopes -- Spectral filters
- BH GSO ISO 8577:2016 Optics and optical instruments -- Microscopes -- Spectral filters
- OS GSO ISO 8577:2015 Optics and optical instruments -- Microscopes -- Spectral filters
- GSO ISO/TR 18231:2021 Iron ores — Wavelength dispersive X-ray fluorescence spectrometers — Determination of precision
- BH GSO ISO/TR 18231:2022 Iron ores — Wavelength dispersive X-ray fluorescence spectrometers — Determination of precision
- GSO ISO 4945:2015 Steel -- Determination of nitrogen content -- Spectrophotometric method
British Standards Institution (BSI)
- BS EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments. Optical spectrum analyzers
- BS EN ISO 8599:1997 Optics and optical instruments — Contact lenses — Determination ofthe spectral and luminous transmittance
- BS EN ISO 20884:2011 Petroleum products. Determination of sulfur content of automotive fuels. Wavelength-dispersive X-ray fluorescence spectrometry
- BS EN 62129:2006 Calibration of optical spectrum analyzers
- 18/30352698 DC BS IEC 63085. Radiation protection instrumentation. System of spectral identification of liquids in transparent and semitransparent containers
- BS PD ISO/TR 18231:2016 Iron ores. Wavelength dispersive X-ray fluorescence spectrometers. Determination of precision
- PD ISO/TR 18231:2016 Iron ores. Wavelength dispersive X-ray fluorescence spectrometers. Determination of precision
SCC
- BS ISO 15632:2002 Microbeam analysis. Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
- CEI 45-35:1997 Standardized test methods of semiconductor X-ray spectrometers
- DIN IEC 61976:2001 Nuclear instrumentation - Spectrometry - Characterization of the spectrum background in HPGe gamma-ray spectrometry (IEC 61976:2000)
- BS EN 61290-1-1:1998 Optical spectrum analyzer
- CEI EN 62129-1:2016 Calibration of wavelength/optical frequency measurement insturments Part 1: Optical spectrum analyzers
- DANSK DS/EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments – Part 1: Optical spectrum analyzers
- CIE 214:2014 Effect of Instrumental Bandpass Function and Measurement Interval on Spectral Quantities
- BS PD IEC PAS 62129:2004 Calibration of optical spectrum analyzers
- CEI EN 62129:2006 Calibration of optical spectrum analyzers
- DANSK DS/EN 62129:2006 Calibration of optical spectrum analyzers
- DIN EN 62129-1 E:2014 Draft Document - Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers (IEC 86/468/CD:2014)
- NS-EN ISO 8599:1996 Optics and optical instruments — Contact lenses — Determination of the spectral and luminous transmittance (ISO 8599:1994)
- UNE-EN ISO 8599:1997 OPTICS AND OPTICAL INSTRUMENTS. CONTACT LENSES. DETERMINATION OF THE SPECTRAL AND LUMINOUS TRANSMITTANCE. (ISO 8599:1994).
- AS 2563:1982 Wavelength dispersive X-ray fluorescence spectrometers - Methods of test for determination of precision
- DIN 5030-3 E:2020 Draft Document - Spectral measurement of radiation - Spectral isolation - Definitions and characteristics
- DANSK DS/EN 15483:2008 Ambient air quality - Atmospheric measurements near ground with FTIR spectroscopy
- NS-EN 15483:2008 Ambient air quality — Atmospheric measurements near ground with FTIR spectroscopy
Korean Agency for Technology and Standards (KATS)
- KS D ISO 10701:2002 Steel and iron-Determination of sulfur content-Methylene blue spectrophotometric method
- KS E ISO 15247:2012 Zinc sulfide concentrates-Determination of silver content-Acid dissolution and flame atomic absorption spectrometric method
- KS B ISO 8599-2014(2019) Optics and optical instruments — Contact lenses — Determination of the spectral and luminous transmittance
- KS B ISO 8599:2004 Optics and optical instruments-Contact lenses-Determination of the spectral and luminous transmittance
- KS B ISO 8599:2014 Optics and optical instruments — Contact lenses — Determination of the spectral and luminous transmittance
- KS B ISO 8599-2019 Optics and optical instruments — Contact lenses — Determination of the spectral and luminous transmittance
- KS D ISO 15632:2012 Microbeam analysis-Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
- KS C 6918-2020 Test methods of fiber-optic spectrum analyzer
- KS C 6918-1995 Test methods of fiber-optic spectrum analyzer
- KS D ISO 15472:2003 Surface chemical analysis-X-ray photoelectron spectrometers-Calibration of energy scales
RU-GOST R
- GOST 27176-1986 Spectroscopic optical instruments. Terms and definitions
- GOST 14828-1969 Instruments for physical-chemical quantities measurement. Radiospectrometers. Terms
- GOST 26874-1986 Ionizing radiation power spectrometers. Methods of basic parameters measurement
- GOST 22091.8-1984 X-ray devices. Method of measuring spectral structure and relative spectrum contamination
- GOST 19834.3-1976 Semiconductor emitters. Methods for measuring of relative spectral energy distribution and spectral bandwidth
- GOST R EN ISO 14596-2008 Petroleum products. Determination of sulfur content by method of wavelength-dispersive X-ray fluorescence spectrometry
- GOST 16274.10-1977 Bismuth. Spectral method for determination of mercury content
RO-ASRO
- STAS 10837/2-1977 SELENIUM Semiquantitative spectral determination of iron, silicon, silver, copper, magnesium, lead, tin, stibium and arsenic impurities
- STAS 12814-1990 ALUMINIUM AND ALUMINIUM ALLOYS Analysis by optical emission spectro- metry
U.S. Air Force
- AIR FORCE A-A-59684 A-2009 OPTICAL SPECTRUM ANALYZER
- AIR FORCE A-A-59684-2004 OPTICAL SPECTRUM ANALYZER
International Electrotechnical Commission (IEC)
- IEC 61976:2000 Nuclear instrumentation - Spectrometry - Characterization of the spectrum background in HPGe nuclear gamma-ray spectrometry
- IEC 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers
- IEC PAS 62129:2004 Calibration of optical spectrum analyzers
- IEC 62129:2006 Calibration of optical spectrum analyzers
American Society for Testing and Materials (ASTM)
- ASTM E1507-98 Standard Guide for Describing and Specifying the Spectrometer of an Optical Emission Direct-Reading Instrument
- ASTM E356-78(1996) Practices for Describing and Specifying the Spectrograph
- ASTM E3029-15(2023) Standard Practice for Determining Relative Spectral Correction Factors for Emission Signal of Fluorescence Spectrometers
- ASTM E3029-15 Standard Practice for Determining Relative Spectral Correction Factors for Emission Signal of Fluorescence Spectrometers
- ASTM E1217-11 Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
- ASTM E1217-05 Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
- ASTM E1217-00 Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
- ASTM E388-04(2023) Standard Test Method for Wavelength Accuracy and Spectral Bandwidth of Fluorescence Spectrometers
European Committee for Electrotechnical Standardization(CENELEC)
- EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers
ES-UNE
- UNE-EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers (Endorsed by AENOR in July of 2016.)
Association Francaise de Normalisation
- NF C93-846-1*NF EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1 : optical spectrum analyzers
- NF S11-687:1997 Optics and optical instruments. Contact lenses. Determination of the spectral and luminous transmittance.
- NF C93-845:2006 Calibration of optical spectrum analyzers.
- NF X21-008:2012 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive ray spectrometers for use in electron probe microanalysis
- NF A06-555:2010 Steel - Determination of nitrogen content - Spectrophotometric method.
- NF EN 15111:2007 Food products - Determination of trace elements - Determination of iodine by emission spectrometry with high frequency induced plasma and mass spectrometer (ICP-MS)
- NF EN 62129-1:2016 Calibration of wavelength measuring devices/optical frequency measuring devices - Part 1: optical spectrum analyzers
International Organization for Standardization (ISO)
- ISO 22309:2006 Microbeam analysis - Quantitative analysis using energy-dispersive spectrometry (EDS)
- ISO 8599:1994 Optics and optical instruments - Contact lenses - Determination of the spectral and luminous transmittance
- ISO 15632:2021 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA)
- ISO 15632:2012 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
- ISO 15632:2002 Microbeam analysis - Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
- ISO/TR 18231:2016 Iron ores - Wavelength dispersive X-ray fluorescence spectrometers - Determination of precision
- ISO 5398-4:2007 | IULTCS/IUC 8-4 Leather — Chemical determination of chromic oxide content — Part 4: Quantification by inductively coupled plasma - optical emission spectrometer (ICP-OES)
Standard Association of Australia (SAA)
- AS 2563:1996 Wavelength dispersive X-ray fluorescence spectrometers - Determination of precision
- AS 2563:2019 Iron ores — Wavelength dispersive X-ray fluorescence spectrometers — Determination of precision
CZ-CSN
- CSN 35 6535-1983 Electronic measuring instruments. Succesive process spectra analyzers. Nomenclature of pnrameters
- CSN 75 7554-1998 Water quality - Determination of selected polynuclear aromatic hydrocarbons (PAH) - HPLC (FLD) and GC (MSD) methods
European Committee for Standardization (CEN)
- CEN EN 62129-2006 Calibration of optical spectrum analyzers
- EN ISO 8599:1996 Optics and Optical Instruments - Contact Lenses - Determination of the Spectral and Luminous Transmittance ISO 8599 : 1994
- CEN EN 62129-2006_ Calibration of optical spectrum analyzers
German Institute for Standardization
- DIN 5030-3:2021-09 Spectral measurement of radiation - Spectral isolation - Definitions and characteristics
- DIN 5030-3:2021 Spectral measurement of radiation - Spectral isolation - Definitions and characteristics
- DIN 5030-3:1984 Spectral measurement of radiation; spectral isolation; definitions and characteristics
- DIN ISO 15632:2015 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis (ISO 15632:2012)
- DIN EN 12938:2000 Methods for the analysis of pewter - Determination of alloying and impurity element contents by atomic spectrometry (includes AC:2000); German version EN 12938:1999 + AC:2000
- DIN ISO 15632:2022-09 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA) (ISO 15632:2...
SE-SIS
- SIS SS IEC 714:1983 Electronic measurement equipment - Expression of the properties of spectrum analyzers
- SIS SS IEC 759:1986 Nuclear instrumentation —Test procedures for semiconductor X-ray energy spectrometers
IEEE - The Institute of Electrical and Electronics Engineers@ Inc.
- IEEE 1131-1987 STANDARD CRYOSTAT END-CAP DIMENSIONS FOR GERMANIUM SEMICONDUCTOR GAMMA-RAY SPECTROMETERS
Japanese Industrial Standards Committee (JISC)
- JIS B 7451:1997 Instruments for the assessment of departure from roundness -- Measurement of variations in radius
- JIS C 6192:2008 Calibration of optical spectrum analyzers
- JIS M 8205:2000 Iron ores -- X-ray fluorescence spectrometric analysis
International Commission on Illumination (CIE)
- CIE 214-2014 Effect of Instrumental Bandpass Function and Measurement Interval on Spectral Quantities
Danish Standards Foundation
- DS/EN 62129:2006 Calibration of optical spectrum analyzers
- DS/EN 62129/Corr. 1:2007 Calibration of optical spectrum analyzers
- DS/EN ISO 5398-4:2007 Leather - Chemical determination of chromic oxide content - Part 4: Quantification by inductively coupled plasma - optical emission spectrometer (ICP-OES)
- DS/EN 15483:2009 Ambient air quality - Atmospheric measurements near ground with FTIR spectroscopy
PL-PKN
- PN M53396-1987 Measuring instruments Radius gauges
HU-MSZT
- MSZ 2446-1958 Hemispherical precision luminous instrument nut
BE-NBN
- NBN EN 1137-1995 Fruit and vegetable juices - Enzymatic determination of citric acid (citrate) content - NADH spectrometric methodQ
Indonesia Standards
- SNI 06-6989.54-2005 Water and waste water - Part 54: Test methods of arsenic (As) content with atomic absorption spectrophotometers (AAS) by carbon stoves
American National Standards Institute (ANSI)
- ANSI/ASTM D6645:2001 Test Methods for Methyl (Comonomer) Content in Polyethylene by Infrared Spectrophotometry
AENOR
- UNE-EN 15483:2009 Ambient air quality - Atmospheric measurements near ground with FTIR spectroscopy
Lithuanian Standards Office
- LST EN 15483-2009 Ambient air quality - Atmospheric measurements near ground with FTIR spectroscopy
Institute of Electrical and Electronics Engineers (IEEE)
- ANSI/IEEE Std 1131-1987 IEEE Standard Cryostat End-Cap Dimensions for Germanium Semiconductor Gamma-Ray Spectometers
ZA-SANS
- SANS 62129:2008 Calibration of optical spectrum analyzers
GM Daewoo
- GMKOREA EDS-T-7826-2006 FTIR ? ??? ????,???? ???? ????
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