semi-quantitative equipment
semi-quantitative equipment, Total:289 items.
The international standard classification for "semi-quantitative equipment" includes: Measuring instruments , Electrical equipment of ships and of marine structures , Plug-and-socket devices. Connectors , Optoelectronics. Laser equipment , Installations and equipment for waste disposal and treatment , Therapy equipment , Plants and equipment for the food industry , Electrical engineering in general , Software development and system documentation .
The Chinese standard classification for "semi-quantitative equipment" includes: Telecommunication power supply equipment , Telephone communication equipment , Electronic measurement and equipment in general , Electrical, observation/communication and navigation equipment for vessel in general , Connector , Dedicated processing equipment , Environmental protection equipment , Other food processing machinery , Length Measurement , Mechanics Measurement , Hygiene, safety and labor protection , Software engineering .
Professional Standard - Post and Telecommunication
- YD/T 940-1999 Semiconductor arrester for The over-voltage protection of telecommunications installations
- YD 576-1992 Semiconductor rectifier equipments For telecommunications
- YD/T 682-1994 Quality grading criteria of semiconductor rectifier installations for communication
Taiwan Provincial Standard of the People's Republic of China
- CNS 11900-1987 Fixed Ceramic Capacitors for Electronic Equipment (Semiconductor)
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 22193-2008 Electrical installations in ships - Equipment - Semiconductor convertors
- GB 10292-1988 Semiconductor rectifier equipments for telecommunicat-ions
- GB/T 24468-2009 Specification for definition and measurement of semiconductor equipment reliability availability and maintainability(RAM)
- GB/T 44375-2024 Requirements for load ports of 300mm semiconductor equipment
- GB/T 15872-2013 Power supply interface for semiconductor equipment
- GB/T 15872-1995 Power supply interface for semiconductor equipment
- GB/T 19229.2-2011 Coal-fired flue gas desulphurization equipment - Part 2: Coal-fired dry/semi - Dry flue gas desulphurization equipment
未注明发布机构
- DIN EN 62047-20 E:2012-07 Semiconductor devices - Micro-electromechanical devices - Part 20: Gyroscopes
- SEMI S22-1110b-2011 SAFETY GUIDELINE FOR THE ELECTRICAL DESIGN OF SEMICONDUCTOR MANUFACTURING EQUIPMENT
- SEMI E79-1106-2006 SPECIFICATION FOR DEFINITION AND MEASUREMENT OF EQUIPMENT PRODUCTIVITY
- IEEE Std 216-1960(R1980) IRE Standards on Solid-State Devices: Definitions of Semiconductor Terms
- SEMI S6-0707-2007 EHS GUIDELINE FOR EXHAUST VENTILATION OF SEMICONDUCTOR MANUFACTURING EQUIPMENT
Group Standards of the People's Republic of China
- T/QGCML 4494-2024 Quantitative sampling equipment
- T/ZACA 041-2022 Mixed signal semiconductor device test equipment
- T/CZSBDTHYXH 001-2023 Wafer defects Automatic optical inspection equipment
- T/ZZB Q041-2022 Mixed signal semiconductor device test equipment
- T/GVS 014-2024 Evaluation specification for cryogenic vacuum pumps used in semiconductor equipment
- T/ZZB Q063-2022 Intermittent working life test equipment for semiconductor devices
- T/ZSA 224-2024 Equipment front end module
- T/CI 334-2024 Design and technical requirements for isolation systems in semiconductor equipments
- T/IAWBS 019-2023 Equipment front end module
- T/CASME 929-2023 Technical requirements for precision structural components of semiconductor equipment
- T/ZAQ 10113-2022 Intermittent working life test equipment for semiconductor devices
Professional Standard - Medicine
- YY/T 0998-2015 Semiconductor heating and/or cooling therapy equipment
Professional Standard - Aerospace
- QJ 2004-1990 Electronic equipment quality assessment method
工业和信息化部/国家能源局
- JB/T 12799-2016 Semi-portable crushing and screening plants
工业和信息化部
- SJ/T 11763-2020 Specification for human interface for semiconductor manufacturing equipment
- SJ/T 11762-2020 Requirements for semiconductor equipment manufacturing information tagging
Professional Standard - Machinery
- JB/T 11646-2013 Special Equipment of Semi-dry Flue Gas Desulphurization System - Fluid Trough
- JB/T 11645-2013 Pulverization Equipment of Calcium Carbide Dreg for Semi-dry Flue Gas Desulphurization
Professional Standard - Electron
- SJ/T 11820-2022 Technology requirements and test methods for discrete semiconductor DC parameters test instruments
Professional Standard - Agriculture
- NY/T 3364-2018 Meat and poultry processing equipment. Pigs carcass splitting saw
- SB/T 10121-1992 Feed semi-automatic mechanical quantitative packing machine
农业农村部
- NY/T 3364-2019 Livestock and poultry slaughtering and processing equipme-Pig carcass splitting saw
Professional Standard - Business
- SB/T 10494-2008 Meat and poultry processing equipment - Pigs carcass splitting saw
National Metrological Technical Specifications of the People's Republic of China
- JJF 1130-2005 Guide to the Estimation of Uncertainty in Calibration of Geometrical Measuring Equipment
Professional Standard - Ferrous Metallurgy
- YBJ 242-1992 Quality inspection and evaluation standards for metallurgical machinery and equipment installation engineering (coking equipment)
- YB 9245-1992 Standards for quality inspection and evaluation of metallurgical machinery and equipment installation engineering (steel rolling equipment)
- YBJ 241-1992 Quality inspection and evaluation standards for metallurgical machinery and equipment installation engineering (sintering equipment)
- YBJ 240-1992 Quality inspection and evaluation standards for metallurgical machinery and equipment installation engineering (mineral processing equipment)
National Metrological Verification Regulations of the People's Republic of China
- JJG 974-2002 Verification Regulation of Measuring Instrument for Cement Bright Degumming Equipment
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会
- GB/T 5226.33-2017 Electrical safety of machinery―Electrical equipment of machines―Part 33:Requirements for semiconductor fabrication equipment
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 36646-2018 Software component management—Management information model
Professional Standard - Grain
- LS/T 3608-1992 Feed semi-automatic mechanical quantitative packing machine
SE-SIS
- SIS SS-IEC 747:1991 Semiconductor devices — Discrete devices
- SIS SEN 01 03 51-1976 Semiconductor devices Terminology
- SIS SEN 01 03 51-1966 Semiconductor devices Terminology
- SIS SS-IEC 748:1991 Semiconductor devices — Integrated circuits
- SIS SEN 47 10 03-1973 Radio interference. Limits and methods of measurement of interference voltage for regulating controls incorporating semiconductor devices
- SIS SS-ISO 10 012-1:1992 Quality assurance requirements for measuring equipment — Part 1: Metrological confirmation system for measuring equipment
- SIS SEN 27 06-1962 Polycrystalline semiconductor rectifier stacks and equipments
- SIS SS-ISO 4291:1991 Methods for the assessment of departure from roundness — Measurement of varia- tions in radius
- SIS SS-IEC 749:1991 Semiconductor devices - Mechanical and climatic test methods
- SIS SS IEC 443:1981 Electronic measuring equipment — Stabilized supply apparatus for measurement
German Institute for Standardization
- DIN 10113-2:1997 Determination of surface colony count on fitment and utensils in foodareas - Part 2: Semiquantitative swab method
- DIN 10113-3:1997 Determination of surface colony count on fitment and utensils in foodareas - Part 3: Semiquantitative method with culture media laminated taking up equipment (squeeze method)
- DIN 28128:2011 Half-pipe coil jackets for process equipment
- DIN 41752:1982 Static power convertors; semiconductor convertor equipment; rating code
- DIN 28128:1979 Half-pipe coil jackets for chemical equipment
- DIN 28128:2011-08 Half-pipe coil jackets for process equipment
CZ-CSN
- CSN 35 8756-1973 Semiconductor devices. Transistors Measurement of y-parameters
- CSN 35 8737-1975 Semiconductor devices. Diodes. Measurement of differential rosistanoe
- CSN 35 8742-1973 Semiconductor devices. Transistors. Measurement of cut-oíf currents
- CSN 35 8720 Cast.1-1987 Semiconductor devices. Dimensions
- CSN 35 8754-1973 Semiconductor devices. Transistors. Measurement of short-circuit output admittance
- CSN 35 8759-1977 Semiconductor devices. Transistors. Methods of measurement of switching times
- CSN 35 8731-1975 Semiconductor devices. Diodes Measurement of d. c. forward voltage
- CSN 35 8763-1973 Semiconductor devices. Diodes. Measurement o? reverse breakdown voltage
- CSN 35 8785-1975 Semiconductor devices. Varicaps. Measurement of thermal capacitance coefflcient.
- CSN 44 2642-1955 Mining equipment. semi-plastic steel arch
- CSN 35 8971 Cast.1-1984 Semiconductor devices. Substrates for masks and masks. Nomenclature and definitions
- CSN 35 8733-1975 Semiconductor devices. Diodes. Measurement of reverse voltago (working voltago)
- CSN 35 8765-1976 Semiconductor devices. Switching diodes. Measurement of reverse recovery charge.
- CSN 35 8764-1976 Semicoaductor devices. Switching diodes. Measurement o? reverse recovery time.
- CSN 44 2640-1955 Mining equipment. Semi-plastic steel elbow
- CSN 35 8762-1973 Semiconductor devices. Phototransistors photodiodes. Measurement of dark current
- CSN 35 8752-1976 Semiconductor devices. Transistors. Measuring methods for common base output capacitance.
- CSN 35 8761-1973 Semiconductor devices. Phototransistors photodíodes. Measurement of photoelectric current
- CSN 35 8797 Cast.8 IEC 747-8 ZA1+A2:1996 Semiconductor devices. Discrete devices. Part 8: Field-effect transistore
- CSN 35 8749-1973 Semiconductor devices. Transistors. Measurement of absolute value of short-circuit forward transfer admittance
- CSN 34 0415-1973 Screwless terminals for connecting copper of eonductors
- CSN 26 0074-1987 Designation of quantities for transport equipment
- CSN IEC 747-10:1994 Semiconductor devices. Part 10: Generic specification for discrete devices and integrated circuits
- CSN IEC 749:1994 Semiconductor devices.Mechanical and climatic test methods
- CSN IEC 92-304:1993 Electrical installations in ships. Equipment. Semiconductor convertors
- CSN IEC 748-1:1993 Semiconductor devices. Integrated circuits. Part 1: General
- CSN IEC 747-3-2:1991 Semiconductor devices. Discrete devices. Part 3: Signal (including switching)and regulator diodes. Section two. Blank detail specification for voltage-regulator diodes and voltage-reference diodes, excluding temperature-compensated precision referenc
- CSN 65 6290-1966 S_mi-microdet-rmination of ulphur in petroleum roducts
CU-NC
- NC 91-40-1985 Load Handling Equipment. Sub-suspended Granes. Quality Specifications
Defense Logistics Agency
- DLA MIL-DTL-19491 H-2002 SEMICONDUCTOR DEVICES, PACKAGING OF
- DLA MIL-M-38510/600 VALID NOTICE 4-2012 Microcircuits, Digital, Bipolar, Semicustom (Gate Array) Devices, Monolithic Silicon
- DLA MIL-S-19500/173 A VALID NOTICE 3-2011 Semiconductor Device, Transistor, Types 2N389 and 2N424 (Navy)
BE-NBN
- NBN C 95-001-1977 Semiconductor equipment. the term
IEEE - The Institute of Electrical and Electronics Engineers@ Inc.
- IEEE 216-1960 STANDARDS ON SOLID STATE DEVICES: DEFINITIONS OF SEMICONDUCTOR TERMS
Institute of Electrical and Electronics Engineers (IEEE)
- IEEE Std 216-1960 IRE Standards on Solid-State Devices: Definitions of Semiconductor Terms
- IEEE 216*61 IRE 28 S1 IEEE Standards on Solid-State Devices: Definitions of Semiconductor Terms 1960
Korean Agency for Technology and Standards (KATS)
- KS C 6305-1985(2000) PRESET CERAMIC CAPACITORS (TYPE C) FOR ELECTRONIC EQUIPMENT
- KS C 6305-1985 PRESET CERAMIC CAPACITORS (TYPE C) FOR ELECTRONIC EQUIPMENT
- KS C IEC 62047-5:2015 Semiconductor devices - MEMS devices - Part 5: RF MEMS switches
- KS C IEC 60204-33-2010(2020) Safety guideline for semiconductor fabrication equipment
- KS C IEC 60204-33-2020 Safety guideline for semiconductor fabrication equipment
- KS V 8209-2007 Electrical installations in ships Part 304:Equipment-Semiconductor convertors
- KS B ISO 6420:2021 Hydrometry — Position fixing equipment for hydrometric boats
- KS M ISO 4642-1:2012 Rubber and plastics hoses, non-collapsible, for fire-fighting service-Part 1:Semi-rigid hoses for fixed systems
- KS E ISO 333-2018 Coal-Determination of nitrogen-Semi-micro Kjeldahl method
- KS C IEC 60119-2019 Recommendations for polycrystalline semiconductor rectifier stacks and equipments
- KS E ISO 333-2003(2013) Coal-Determination of nitrogen-Semi-micro Kjeldahl method
- KS C IEC 60204-33:2010 Safety guideline for semiconductor fabrication equipment
- KS E ISO 333:2003 Coal-Determination of nitrogen-Semi-micro Kjeldahl method
Danish Standards Foundation
- DS/EN 62047-9:2011 Semiconductor devices - Micro-electromechanical devices - Part 9: Wafer to wafer bonding strength measurement for MEMS
- DS/EN 62047-19:2013 Semiconductor devices - Micro-electromechanical devices - Part 19: Electronic compasses
- DS/EN 62047-5:2011 Semiconductor devices - Micro-electromechanical devices - Part 5: RF MEMS switches
- DS/EN 62047-4:2010 Semiconductor devices - Micro-electromechanical devices - Part 4: Generic specification for MEMS
- DS/IEC 92-304:1994 Electrical installations in ships - Part 304: Equipment - Semiconductor converters
- DS 2364:1993 Measuring equipment. Requirements for inspection equipment in dimensional metrology. Auxilliary equipment
- DS 2364:1994 Measuring equipment. Requirements for inspection equipment in dimensional metrology. Auxilliary equipment
- DS/EN 957-5:2009 Stationary training equipment - Part 5: Stationary exercise bicycles and upper body crank training equipment, additional specific safety requirements and test methods
- DS/EN 60204-33:2011 Safety of machinery - Electrical equipment of machines - Part 33: Requirements for semiconductor fabrication equipment
Lithuanian Standards Office
- LST EN 62047-1-2006 Semiconductor devices - Micro-electromechanical devices - Part 1: Terms and definitions (IEC 62047-1:2005)
- LST EN 62047-5-2011 Semiconductor devices - Micro-electromechanical devices -- Part 5: RF MEMS switches (IEC 62047-5:2011)
- LST EN 957-5-2009 Stationary training equipment - Part 5: Stationary exercise bicycles and upper body crank training equipment, additional specific safety requirements and test methods
- LST EN IEC 60747-5-5:2020 Semiconductor devices - Part 5-5: Optoelectronic devices - Photocouplers (IEC 60747-5-5:2020)
SCC
- AS 1054:1973 Electromagnetic interference limits and measurements for semiconductor control devices
- BS 4417:1969 Specification for semiconductor rectifier equipments
- DANSK DS/IEC 60092-304 ED4:2022 Electrical installations in ships – Part 304: Equipment – Semiconductor converters
- AENOR UNE 81240:1985 SEMI-AUTONOMOUS FRESH AIR EQUIPMENT. LOAD LOSS
- VDI/VDE/DGQ/DKD 2622 BLATT 2-2021 Calibrating measuring equipment for electrical quantities - methods for determining measurement uncertainty
- AENOR UNE 81237:1983 INDEPENDENT SEMI-AUTONOMOUS FRESH AIR EQUIPMENT. AIR TIGHTNESS
- VDI/VDE/DGQ 2618 BLATT 1.2:2003 Inspection of measuring and test equipment — Instructions for the inspection of measuring and test equipment for geometrical quantities — Uncertainty of measurement
- VDI/VDE/DGQ/DKD 2622 BLATT 9.1:2019 Calibration of measuring instruments for electrical quantities — Test equipment for determining electrical safety — Electrical equipment according to DIN VDE 0701-0702
- 12/30258683 DC BS EN 62779-1. Semiconductor devices. Semiconductor interface for human body communication. General requirements
- BS IEC 60092-304:1980 Electrical installation in ships-Equipment. Semiconductor convertors
- CEI EN 60204-33:2012 Safety of machinery - Electrical equipment of machines Part 33: Requirements for semiconductor fabrication equipment
- BS ISO 20957-2:2005 Stationary training equipment-Strength training equipment. Additional specific safety requirements and test methods
- DIN 28128 E:2010 Draft Document - Half-pipe coil jackets for process equipment
- DANSK DS/EN 60204-33:2011 Safety of machinery - Electrical equipment of machines - Part 33: Requirements for semiconductor fabrication equipment
- BS 4889:1973 Method for specifying the performance of electronic measuring equipment
- MIL MIL-STD-989-1991 CERTIFICATION REQUIREMENTS FOR JAN SEMICONDUCTOR DEVICES (NO S/S DOCUMENT)
- AENOR UNE 81239:1983 INDEPENDENT SEMI-AUTONOMOUS FRESH AIR EQUIPMENT. HOSE PERMEABILITY
- MIL MIL-DTL-62049G-2010 Semitrailer, Van: for Installation of Special Equipment, Military Design
- AENOR UNE-EN ISO 20957-5:2017 Fixed equipment for training. Part 5: Stationary bicycles and upper body training equipment. Specific safety requirements and additional test methods. (ISO 20957-5:2016).
- 08/30158311 DC BS 6222-2. Domestic kitchen equipment. Part 2. Fitted kitchen units, peninsular units, island units and breakfast bars. Performance requirements and test methods
- BS EN 30012-1:1994 Quality assurance requirements for measuring equipment.-Metrological confirmation system for measuring equipment
YU-JUS
- JUS N.A3.500-1980 Semiconductor devices. Graphical symbols
- JUS N.A0.301-1994 Electrical measurement - Terms and definitions
- JUS N.N6.261-1982 Radiocommunications. Eguipment used in the mobile servkes. Signal I ing equipm*nts. Saiactivm tm/Ung eguipments. Methods ofmeasurement Terms,definitions and conditions of measumment
RO-ASRO
- STAS 12018-1981 Mining equipment SEMI-COUPLING JOINT
- STAS 10803-1976 FILTER PAPER FOR SEMIQUANTATIVE AND QUANTATIVE ANALYSIS
- STAS 6360-1974 SEMICONDUCTOR MATERIALS AND DEVICES Terminology
- STAS 8473-1988 Petroleum equipment JUMPERS OF HOISTING EQUIPMENT Radii of contact surfaces
- STAS 12123/4-1984 Semiconductor devices VARIABLE-CAPACITANCE DIODES Measuring methodes for electrical characteristics
- STAS 12561-1987 Geological investigation equipment JUMPERS FOR HOISTING EQUIPMENT Radii of contact'surfaces
- STAS 12124/1-1982 Semiconductor devices BIPOLAR TRANZISTORS Methods for measuring electrical static parameters
- STAS 4635-1990 Kqnipment for Chemical industry RECIPIENTS Nominal capacities
- STAS 12124/4-1983 Semiconductor devices FIELD-EFECT TRANZISTORS Methods for measuring electrical static parameters
- STAS 12124/3-1983 Semiconductor devices FIFL D-EFFECT TRANZISTORS Methods for measuring electrical static parameters
- STAS 11715-1987 MIG/MAG SEMIMECHANIZED "WELDING EQUIPMENT Basic parameters
- STAS 11071/17-1983 Legal mc Lrology BLOCK DIAGRAM OF [UERAKCH V OF MEASURING INSTRUMENTS FOR ELECTRICAL CAPACITANCE
- STAS 3137-1979 Compressed-air installations for railway vehicles SEMI-COUPLING
- STAS 9621-1974 COKE AND SEMICOKE Determination of phosphorus content
- STAS 9621-1982 COKE AND SEMICOKE Determination of phosphorus content
- STAS 7011-1976 Petroleum. equipment CERAMIC BEANS
British Standards Institution (BSI)
- BS IEC 60747-14-3:2009 Semiconductor devices - Semiconductor sensors - Pressure sensors
- BS EN 60747-15:2012 Semiconductor devices. Discrete devices. Isolated power semiconductor devices
- BS EN 60204-33:2011 Safety of machinery. Electrical equipment of machines. Requirements for semiconductor fabrication equipment
- BS ISO 6420:2016 Hydrometry. Position fixing equipment for hydrometric boats
- BS 3680-8H:1996 Measurement of liquid flow in open channels. Measuring instruments and equipment. Method of specifying the performance of hydrometric equipment
- BS IEC 60092-304:2022 Electrical installations in ships. Equipment. Semiconductor converters
- BS 6222-2:2009+A1:2017 Domestic kitchen equipment Part 2:Fitted kitchen units,peninsular units,island units and breakfast bars-Performance requirements and test methods
- BS EN 60747-2:2016 Semiconductor devices. Discrete devices. Rectifier diodes
- BS IEC 60092-304:2002 Electrical installation in ships - Equipment - Semiconductor convertors
- BS EN 60645-5:2005 Electroacoustics - Audiometric equipment - Instruments for the measurement of aural acoustic impedance/admittance
- 23/30476409 DC BS IEC 60947-10. Low-voltage switchgear and controlgear. Part 10. Semiconductor Circuit-Breakers
- 22/30430766 DC BS EN 60947-10. Low-voltage switchgear and controlgear - Part 10. Semiconductor Circuit-Breakers
Association Francaise de Normalisation
- NF S61-703:1990 Firefighting equipment - Fixed, symmetrical half-connector with bead - Characteristics
- NF C96-005-5/A1*NF EN 60747-5-5/A1:2015 Semiconductor devices - Discrete devices - Part 5-5 : optoelectronic devices - Photocouplers
- NF C96-005-5*NF EN IEC 60747-5-5:2020 Semiconductor devices - Part 5-5 : optoelectronic devices - Photocouplers
- NF EN 61029-2-5/A11:2017 Sécurité des machines-outils électriques semi-fixes - Partie 2-5 : règles particulières pour les scies à ruban
- NF C63-244-1*NF EN IEC 63244-1:2021 Semiconductor devices - Semiconductor devices for wireless power transfer and charging - Part 1 : general requirements and specifications
- NF S74-105:1985 Personal equipment for protection against heat. A method of measuring the total absorptivity of hemispherical radiation of the constituent materials.
- NF S52-329-5*NF EN ISO 20957-5:2017 Stationary training equipment - Part 5 : stationary exercise bicycles and upper body crank training equipment, additional specific safety requirements and test methods
- NF EN 60204-33:2012 Safety of machinery - Electrical equipment of machines - Part 33: requirements for semiconductor manufacturing equipment
- NF S61-706:1966 Fire fighting equipment. Positioning of the lugs or jaws on guillemin-type and self-sealing symmetrical couplings.
- NF C74-102:1973 RADIOLOGICAL EQUIPMENT. X-RAY APPARATUS PORTABLE OR SEMI-STATIONARY X-RAY GENERATORS FOR DIAGNOSTIC PURPOSES. PARTICULAR REQUIREMENTS.
- NF C79-130-33*NF EN 60204-33:2012 Safety of machinery - Electrical equipment of machines - Part 33 : requirements for semiconductor fabrication equipment.
- NF C96-069-3*NF EN IEC 62969-3:2018 Semiconductor devices - Semiconductor interface for automotive vehicles - Part 3 : shock driven piezoelectric energy harvesting for automotive vehicle sensors
- NF X10-303*NF ISO 6420:2017 Hydrometry - Position fixing equipment for hydrometric boats
Japanese Industrial Standards Committee (JISC)
- JIS C 6442:1976 Cut cores for electronic equipment
- JIS B 9960-33:2012 Safety of machinery -- Electrical equipment of machines -- Part 33: Requirements for semiconductor fabrication equipment
AENOR
- UNE 73350-1:2003 Procedure for the determination of ambient radioactivity. Measurement equipment. Part 1: Gamma spectrometry by semiconductor sensors.
- UNE 73350-2:2003 Procedure for the determination of ambient radioactivity. Measurement equipment. Part 2: Alpha spectrometry by semiconductor sensors.
- UNE 21135-304:1993 ELECTRICAL INSTALLATIONS IN SHIPS. EQUIPMENT. SEMICONDUCTOR CONVERTORS
- UNE 32013:1995 COAL. DETERMINATION OF NITROGEN. SEMI-MICRO KJELDAHL METHOD.
AIA/NAS - Aerospace Industries Association of America Inc.
- NAS4118-1996 Heat Sink@ Electrical- Electronic Component@ Semiconductor Devices@ Retainer Clip Type
European Committee for Electrotechnical Standardization(CENELEC)
- EN 62047-20:2014 Semiconductor devices - Micro-electromechanical devices - Part 20: Gyroscopes
- EN 62047-19:2013 Semiconductor devices - Micro-electromechanical devices - Part 19: Electronic compasses
- EN 62047-5:2012 Semiconductor devices - Micro-electromechanical devices - Part 5: RF MEMS switches
- EN 62047-5:2011 Semiconductor devices - Micro-electromechanical devices - Part 5: RF MEMS switches
- EN 62047-1:2016 Semiconductor devices - Micro-electromechanical devices - Part 1: Terms and definitions
- EN 62047-4:2010 Semiconductor devices - Micro-electromechanical devices - Part 4: Generic specification for MEMS
- EN IEC 62969-3:2018 Semiconductor devices - Semiconductor interface for automotive vehicles - Part 3: Shock driven piezoelectric energy harvesting for automotive vehicle sensors
- EN IEC 63244-1:2021 Semiconductor devices - Semiconductor devices for wireless power transfer and charging - Part 1: General requirements and specifications
- EN 62047-1:2006 Semiconductor devices - Micro-electromechanical devices Part 1: Terms and definitions
NEMA - National Electrical Manufacturers Association
- NEMA RI 6-1959 ELECTROCHEMICAL PROCESSING SEMICONDUCTOR RECTIFIER EQUIPMENT
Aerospace Industries Association
- AIA NAS 4118-1996 Heat Sink, Electrical- Electronic Component, Semiconductor Devices, Retainer Clip Type
IET - Institution of Engineering and Technology
- SEMICUST IC DES VLSI-1983 Semi-custom IC Design and VLSI
(U.S.) Joint Electron Device Engineering Council Soild State Technology Association
- JEDEC JEP116-1991 CMOS Semicustom Design Guidelines
- JEDEC JESD30E-2008 Descriptive Designation System for Semiconductor-device Packages
- JEDEC JESD57-1996 Test Procedures for the Measurement of Single-Event Effects in Semiconductor Devices from Heavy Ion Irradiation
- JEDEC JEP104C.01-2003 Reference Guide to Letter Symbols for Semiconductor Devices
VDI - Verein Deutscher Ingenieure
- VDI/VDE/DGQ 2618 Blatt 1.2-1999 Checking gauges and measuring tools - Instructions for testing measuring tools for geometrical quantities - Uncertainty of measurement
- VDI/VDE/DGQ/DKD 2622 BLATT 2-2019 Kalibrieren von Messmitteln fuer elektrische Groessen - Methoden zur Ermittlung der Messunsicherheit
- VDI/VDE/DGQ/DKD 2622 BLATT 9.3-2019 Calibration of measuring equipment for electrical quantities - Test equipment for the determination of the electrical safety - Electrical equipment according to DIN VDE 0100 and DIN VDE 0105
- VDI/VDE/DGQ/DKD 2622 Blatt 9.1-2008 Calibration for measuring equipment for electrical quantities - Testing equipment for checking the safety of electrical devices - Electrical devices according to DIN VDE 0701 and DIN VDE 0702
GSO
- GSO OIML R90:2005 ELECTROCARDIOGRAPHS — METROLOGICAL CHARACTERISTICS — METHODS AND EQUIPMENT FOR VERIFICATION
- OS GSO OIML D23:2009 Principles for metrological control of equipment used for verification
- GSO OIML D23:2009 Principles for metrological control of equipment used for verification
- GSO IEC 60204-33:2017 Safety of machinery - Electrical equipment of machines - Part 33: Requirements for semiconductor fabrication equipment
- OS GSO IEC 60204-33:2017 Safety of machinery - Electrical equipment of machines - Part 33: Requirements for semiconductor fabrication equipment
Standard Association of Australia (SAA)
- AS 3778.6.8:1992(R2009) Open channel water flow measurement Measuring devices, instruments and equipment Water measurement marine positioning equipment
- AS 3778.6.8:1992 Measurement of water flow in open channels - Measuring devices, instruments and equipment - Position fixing equipment for hydrometric boats
International Electrotechnical Commission (IEC)
- IEC 60747-5-6:2016 Semiconductor devices - Part 5-6: Optoelectronic devices - Light emitting diodes
- IEC 60747-5-6:2021 Semiconductor devices - Part 5-6: Optoelectronic devices - Light emitting diodes
- IEC 63244-1:2021 Semiconductor devices - Semiconductor devices for wireless power transfer and charging - Part 1: General requirements and specifications
- IEC 60092-304:1980 Electrical installations in ships. Part 304 : Equipment - Semiconductor convertors
- IEC 60204-33:2009 Safety of machinery - Electrical equipment of machines - Part 33: Requirements for semiconductor fabrication equipment
- IEC 60747-5-7:2016 Semiconductor devices - Part 5-7: Optoelectronic devices - Photodiodes and phototransistors
SAE - SAE International
- SAE EIA-4900-2016 Use of Semiconductor Devices Outside Manufacturers' Specified Temperature Ranges
- SAE J3005-2014 Permanently or Semi-Permanently Installed Diagnostic Communication Devices
- SAE J3005-2-2020 Permanently or Semi-Permanently Installed Diagnostic Communication Devices
- SAE J3005-2021 Permanently or Semi-Permanently Installed Diagnostic Communication Devices
- SAE J3005-1-2019 Permanently or Semi-Permanently Installed Diagnostic Communication Devices
IN-BIS
- IS 3136-1965 Polycrystalline Semiconductor Rectifier Equipment Specification
- IS 6619-1972 Safety Specifications for Semiconductor Rectifier Equipment
- IS 5000 OC.5-1969 Dimensions of Semiconductor Equipment Case Outline OC5
- IS 5000 OC.1-1969 Dimensions of Semiconductor Equipment Case Outline OC1
- IS 5000 OC.3-1969 Dimensions of Semiconductor Equipment Case Outline OC3
- IS 4540-1968 Specification for monocrystalline semiconductor rectifier components and equipment
HU-MSZT
- MNOSZ 15634-1954 Automatic shower equipment, shower head (half head shower head)
- MSZ 16051/15-1971 Shearing equipment measurement and testing. Antimony content definition
- MSZ 16150-1984 M Semi-finished products and finished products movable pressure equipment. Manual semi-active state
- MSZ 12660/33-1982 Thermal equipment. Chemical testing of water and steam equipment. Ammonium content determination
- MSZ 12660/32-1982 Thermal equipment. Chemical testing of water and steam equipment. Sodium content determination
- MNOSZ 10471-1952 Surgical equipment. Pool metering equipment
- MSZ 12660/19-1979 Thermal equipment. Chemical testing of water and steam equipment. Determination of hydrazine content
- MSZ 12660/14-1981 Thermal equipment. Chemical testing of water and steam equipment. Chloride ion content determination
- MSZ 18587-1965 Mineral preservation and transportation equipment content definition
- MSZ 12660/8-1979 Thermal equipment. Chemical testing of water and steam equipment, determination of dissolved oxygen content
- MSZ 11194-1988 measuring equipment
- MSZ 16050/12.lap-1969 Comprehensive inspection of metal equipment. Aluminum content definition
- MSZ 16050/6.lap-1969 Comprehensive inspection of metal equipment. Potassium content definition
- MSZ 16050/15.lap-1969 Definition of silver content for comprehensive detection of metal equipment
- MSZ 16050/9.lap-1969 Comprehensive inspection of metal equipment. Potassium content definition
American National Standards Institute (ANSI)
- ANSI/NFPA 318-2011 Standard for the Protection of Semiconductor Fabrication Facilities
ZA-SANS
- SANS 333:1996 Coal - Determination of nitrogen - Semi-micro Kjeldahl method
International Organization for Standardization (ISO)
- ISO 4642-1:2009 Rubber and plastics hoses, non-collapsible, for fire-fighting service - Part 1: Semi-rigid hoses for fixed systems
- ISO 4642-1:2015 Rubber and plastics hoses, non-collapsible, for fire-fighting service - Part 1: Semi-rigid hoses for fixed systems
- ISO 6420:2016 Hydrometry - Position fixing equipment for hydrometric boats
- ISO 333:1996 Coal - Determination of nitrogen - Semi-micro Kjeldahl method
- ISO 333:1983 Coal; Determination of nitrogen; Semi-micro Kjeldahl method
KR-KS
- KS B ISO 6420-2021 Hydrometry — Position fixing equipment for hydrometric boats
BR-ABNT
- ABNT NBR 9188-2012 Road equipment - vertical support for semitrailers - Requirements
(U.S.) Ford Automotive Standards
- FORD M5J3-A-1990 GRAY METALLIC OFFICE EQUIPMENT SEMIGLOSS ENAMEL
AT-ON
- ONORM M 1349-1997 Verification of measuring and test equipment - Testing Instruction for measuring tapes
- ONORM M 1349/AC1-1999 Verification of measuring and test equipment - Testing Instruction for measuring tapes (Corrigendum)
Association of German Mechanical Engineers
- VDI/VDE/DGQ/DKD 2622 Blatt 2-2015 Calibration of measuring equipment for electrical quantities - Methods for the determination of the uncertainty of measurement
- VDI/VDE/DGQ 2618 Blatt 1.2-2003 Inspection of measuring and test equipment - Instructions for the inspection of measuring and test equipment for geometrical quantities - Uncertainty of measurement
IEC - International Electrotechnical Commission
- PAS 62240-2001 Use of Semiconductor Devices Outside Manufacturer's Specified Temperature Ranges (Edition 1.0)
European Committee for Standardization (CEN)
- EN 671-3:2000 Fixed Firefighting Systems - Hose Systems - Part 3: Maintenance of Hose Reels with Semi-Rigid Hose and Hose Systems with Lay-Flat Hose
IPC - Association Connecting Electronics Industries
- IPC TM-650 2.1.1.2A-2004 Microsectioning-Semi or Automatic Technique Microsection Equipment (Alternate)
US-ACEI
- IPC TM-650 2.1.1.2-1993 Microsectioning-Semi or Automatic Technique Microsection Equipment (Alternate)
International Telecommunication Union (ITU)
- ITU-T Q.101 FRENCH-1988 FACILITIES PROVIDED IN INTERNATIONAL SEMI-AUTOMATIC WORKING
- ITU-T Q.101 SPANISH-1988 FACILITIES PROVIDED IN INTERNATIONAL SEMI-AUTOMATIC WORKING
TR-TSE
- TS 362-1966 DETERMINAT?ON OF NITROGEN ?N COAL BY THE SEMI ■ M?KRO KJELDAHL METHOD
US-FCR
- FCR COE RPMAS 51250-1978 FLOW MEASUREMENT DEVICES
- FCR FED FCGS 13625-1978 FLOW MEASURING EQUIPMENT
ITU-T - International Telecommunication Union/ITU Telcommunication Sector
- ITU-T O.171-1992 Timing Jitter Measuring Equipment for Digital Systems - Specifications for Measuring Equipment (Study Group IV; 13 pp)
PL-PKN
- PN H54215-1969 Castings and foundry pattemn equipment Techniologica? radii of follets
CENELEC - European Committee for Electrotechnical Standardization
- EN 60204-33:2011 Safety of machinery - Electrical equipment of machines - Part 33: Requirements for semiconductor fabrication equipment
ES-UNE
- UNE-EN 60204-33:2011 Safety of machinery - Electrical equipment of machines -- Part 33: Requirements for semiconductor fabrication equipment (Endorsed by AENOR in December of 2011.)
BELST
- STB 2340-2013 Cooling radiators of semiconductor devices. General specifications
- STB 2365-2014 Cooling radiators of semiconductor devices. Methods of calculation
U.S. Military Regulations and Norms
- ARMY MIL-DTL-62164 D-1998 SEMITRAILER, LOWBED, HEAVY EQUIPMENT TRANSPORTER, 60-TON, M747
Electronic Components, Assemblies and Materials Association
- ECA CB 5-1969 Recommended Test Procedure for Semiconductor Thermal Dissipating Devices
RU-GOST R
- GOST 7619.5-1981 Fluorite. Method for the determination of sesquioxides
semi-quantitative test,Fluorescence semi-quantitative,semi-quantitative examination,semi-quantitative activity,icp semi-quantitative,semi-quantitative pcr,semi-quantitative infrared,semiquantitative mass spectrometry,semi-quantitative score,semi-quantitative items,semi-quantitative equipment,semi-quantitative evaluation,semi-quantitative research,Infrared semi-quantitative,Infrared + semi-quantitative,semi-qualitative semi-quantitative,Quantitative and semi-quantitative data,Infrared quantitative semi-quantitative,semi-quantitative full quantitative