Semi-quantitative analysis by energy spectrometer

Semi-quantitative analysis by energy spectrometer, Total:219 items.

The international standard classification for "Semi-quantitative analysis by energy spectrometer" includes: Other standards related to analytical chemistry , Chemical analysis , Physicochemical methods of analysis , Nuclear energy in general , IT applications in science , Analytical chemistry , Protection against crime , Electricity. Magnetism. Electrical and magnetic measurements , Optics and optical measurements , Measuring instruments , Laboratory medicine , Measurement of electrical and magnetic quantities , Radiation protection .

The Chinese standard classification for "Semi-quantitative analysis by energy spectrometer" includes: Electrochemical, thermochemistry and optical profile type analyzer , Basic standards and general methods , Electron optics and other physical optics instrument , Nuclear instrument and detector in general , Computer application , Basic standards and general methods , Crime judging technology , Electronic measurement and equipment in general , Radio Measurement , Optical Measurement , Machinery and instrument manufacturing industry engineering , Medical laboratory equipment , Technical management , Radiological sanitation protection .

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 29731-2013 Surface chemical analysis—High-resolution Auger electron spectrometers—Calibration of energy scales for elemental and chemical-state analysis
GB/T 17359-2012 Microbeam analysis - Quantitative analysis using energy dispersive spectrometry
GB/T 21006-2007 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
GB/T 20726-2006 Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
GB/T 17359-2023 Microbeam analysis—Quantitative analysis using energy-dispersive spectrometry (EDS) for elements with an atomic number of 11 (Na) or above
GB/T 19267.6-2008 Physical and chemical examination of trace evidence in forensic sciences - Part 6:Scanning electron microscope/ X ray energy dispersive spectrometry
GB/T 22571-2008 Surface chemical analysis ? X-ray photoelectron spectrometers ? Calibration of energy scales
GB/T 11461-2013 General Specification for Spectrum Analyzer
GB/T 25189-2010 Microbeam analysis—Determination method for quantitative analysis parameters of SEM-EDS
GB/T 22571-2017 Surface chemical analysis--X-ray photoelectron spectrometers--Calibration of energy scales
GB/T 46223-2025 Microbeam analysis—Analytical electron microscopy—Method for the determination of energy resolution for electron energy loss spectrum analysis
GB/T 11685-2003 Measurement procedures for semiconductor X-ray detector system and semiconductor X-ray energy spectrometers
GB/T 29732-2013 Surface chemical analysis—Medium resolution Auger electron spectrometers—Calibration of energy scales for elemental analysis
GB/T 15244-2013 Microbeam analysis—Quantitative analysis of silicate glass by wavelength dispersive X-ray spectrometry and energy dispersive X-ray spectrometry
GB/T 11462-1989 Test methods of spectrum analyzers
GB/T 29732-2021 Surface chemical analysis—Medium resolution auger electron spectrometers—Calibration of energy scales for elemental analysis
GB/T 32267-2015 Terminology of performance testing for analytical instrument

Professional Standard - Machinery

JB/T 12962.3-2016 Energy dispersive X-ray fluorescence spectrometer. Part 3: Plating thickness analyzer
JB/T 12962.2-2016 Energy dispersive X-ray fluorescence spectrometer. Part 2: Element analyzer

National Metrological Verification Regulations of the People's Republic of China

JJG 1035-2022 Optical Spectrum Analyzers in Telecommunication
JJG(电子) 07005-1988 QF4021 High Frequency Spectrum Analyzer Trial Verification Regulations
JJG(电子) 30901-2006 Verification Regulations for Spectrum Analyzers
JJG(电子) 07008-1991 Verification Regulations for SWOF Video Swept Spectrum Analyzer
JJG(航天) 9-1985 2107 Verification Regulations for Spectrum Analyzers
JJG(电子) 31010-2007 Verification Regulations for Precision Analyzer of Semiconductor Parameters
JJG(电子) 07010-1991 Specification for verification of YH4032 model panoramic spectrum analyzers
JJG 1035-2008 Verification Regulation of Optical Spectrum Analyzers in Telecommunication
JJG 464-2011 Semiautomatic Clinical Chemistry Analyzers
JJG(航天) 10-1985 2112 Verification Regulations for Spectrum Analyzers
JJG(电子) 07007-1989 141T/8554B/8552B Spectrum Analyzer Verification Regulations
JJG 501-2000 Spectrum Analyzer
JJG(教委) 021-1996 Verification Regulations for Analytical Gas Chromatograph

Taiwan Provincial Standard of the People's Republic of China

CNS 14341-1999 Optical spectrum analyzer

Professional Standard - Petroleum

SY/T 6189-2018 Quantitative analysis method for rock minerals by X-ray energy spectrum (EDS)
SY/T 6189-1996 Quantitative Analysis of Energy Spectra for Minerals in Rocks

Professional Standard - Energy and Power Planning

DL/T 1028-2006 Verification code for power quality analyzer
DL/T 386-2010 Calibration for second derivative flame atomic emission spectrometer

Professional Standard - Medicine

YY/T 0014-2005 Semiautomatic biochemistry analyzer
YY/T 0658-2008 Semi-automated coagulation analyzer

Group Standards of the People's Republic of China

T/ZPP 017-2023 Mass Cytometry Analyzer
T/CSTM 00964-2022 General rules for performance evaluation of atomic spectrometer

Military Standard of the People's Republic of China-Commission of Science,Technology and Industry for National Defence

GJB/J 5859-2006 Verification regulation for broadband spectrum analyzer

Military Standard of the People's Republic of China-General Armament Department

GJB 8805-2015 Calibration procedures for wideband spectrum analyzers

Professional Standard - Electron

SJ/T 10234-1991 Spectrum analyzer for QF4031
SJ 20249-1993 Verification reguation of model BP28A LF spectrum analyzers
SJ 20234-1993 Verification regulation of model HP4145A semiconductor parameter analyzer
SJ 20914-2004 General specification for spectrum analyzer
SJ 20251-1993 Verification reguation of model YH4020/YH4021/YH4022 spectrum analyzers
SJ/Z 3206.3-1989 Instrument and its performance requirements for determination of emision spectrum
SJ 20250-1993 Verification reguation of model HP8590A RF spectrum analyzers

Shaanxi Provincial Standard of the People's Republic of China

DB61/T 1520-2021 Specification for performance evaluation of real-time fluorescence quantitative PCR analyzer

National Metrological Technical Specifications of the People's Republic of China

JJF 1396-2013 Calibration Specification for Spectrum Analyzer

Professional Standard - Ferrous Metallurgy

YB/T 6191.1-2024 Ferrous Scrap Analysis Part 1: Determination of Manganese, Nickel, Chromium, Molybdenum, Copper and Titanium Content by Portable Energy Dispersive X-Ray Fluorescence Spectrometry (Semiquantitative Method)

National Health Commission of the People's Republic of China

GB/T 11713-1989 Standard methods of analyzing low specific gamma radioactivity samples by semiconductor gamma spectrometers

International Organization for Standardization (ISO)

ISO 22309:2006 Microbeam analysis - Quantitative analysis using energy-dispersive spectrometry (EDS)
ISO/CD 17973 Surface chemical analysis — Medium-resolution Auger electron spectrometers — Calibration of energy scales for elemental analysis
ISO 15632:2021 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA)
ISO 17973:2024 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
ISO 15632:2012 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
ISO 15632:2002 Microbeam analysis - Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
ISO 15472:2001 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
ISO 15472:2010 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
ISO 15472:2001/DAmd 1 Chemical analysis of surfaces — X-ray photoelectron spectrometers — Energy calibration — Amendment 1
ISO 23420:2021 Microbeam analysis — Analytical electron microscopy — Method for the determination of energy resolution for electron energy loss spectrum analysis
ISO 17973:2016 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
ISO 21270:2004 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
ISO 17973:2002 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
ISO/DIS 17973:2023 Surface chemical analysis — Medium-resolution Auger electron spectrometers — Calibration of energy scales for elemental analysis

British Standards Institution (BSI)

BS ISO 15632:2002 Microbeam analysis. Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
BS EN 61207-7:2014 Expression of performance of gas analyzers. Tuneable semiconductor laser gas analyzers
BS ISO 17973:2016 Surface chemical analysis. Medium-resolution Auger electron spectrometers. Calibration of energy scales for elemental analysis
BS ISO 22309:2006 Microbeam analysis. Quantitative analysis using energy-dispersive spectrometry (EDS)
BS ISO 17973:2002 Surface chemical analysis. Medium-resolution Auger electron spectrometers. Calibration of energy scales for elemental analysis
BS EN 61290-1-1:1998 Optical spectrum analyzer
BS EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments. Optical spectrum analyzers
BS EN 61207-7:2013(2015) Expression of performance of gas analyzers Part 7 : Tuneable semiconductor laser gas analyzers
BS ISO 17973:2024 Surface chemical analysis. Medium-resolution Auger electron spectrometers. Calibration of energy scales for elemental analysis
BS ISO 15472:2001 Surface chemical analysis. X-ray photoelectron spectrometers. Calibration of energy scales
BS ISO 23420:2021 Microbeam analysis. Analytical electron microscopy. Method for the determination of energy resolution for electron energy loss spectrum analysis
23/30469291 DC BS ISO 17973. Surface chemical analysis. Medium-resolution Auger electron spectrometers. Calibration of energy scales for elemental analysis
BS PD ISO/TR 19319:2003 Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolution, analysis area, and sample area viewed by the analyser
11/30199190 DC BS ISO 15632. Microbeam analysis. Instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
19/30394914 DC BS ISO 15632. Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energydispersive X-ray spectrometers for use in electron probe microscope or an electron probe microanalyser (EPMA)
BS ISO 15632:2021 Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA)
BS ISO 15632:2012 Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
BS 6438-2:1984 Electrochemical analyzers-Method for specifying performance of pH value analyzers
BS 6438-1:1984 Electrochemical analyzers-Method for specifying performance common to all analyzers
BS PD IEC PAS 62129:2004 Calibration of optical spectrum analyzers
BS ISO 17973:2003 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
20/30380369 DC BS ISO 23420. Microbeam analysis. Analytical electron microscopy. Method for the determination of energy resolution for electron energy loss spectrum analysis
BS EN 62129:2006 Calibration of optical spectrum analyzers
BS ISO 21270:2004(2010) Surface chemical analysis — X - ray photoelectron and Auger electron spectrometers — Linearity of intensity scale
BS ISO 21270:2004 Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale
BS 6438-3:1986 Electrochemical analyzers-Method for specifying performance of electrolytic conductivity analyzers
BS 6329:1982 Method of expression of the properties of spectrum analyzers

Bureau of Indian Standards

IS 11148-1984 Spectrum Analyzer Performance
IS 12737-1988 Standard test procedures for semiconductor X-ray energy spectrometers

Korean Agency for Technology and Standards (KATS)

KS D ISO 15632-2018 Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
KS D ISO 15632:2018 Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
KS D ISO 22309-2011(2016) Microbeam analysis－Quantitative analysis using energy-dispersive spectrometry(EDS)
KS D ISO 22309-2011(2021) Microbeam analysis－Quantitative analysis using energy-dispersive spectrometry(EDS)
KS D ISO 15472-2025 Surface chemical analysis ― X-ray photoelectron spectrometers — Calibration of energy scales
KS D ISO 22309-2021 Microbeam analysis－Quantitative analysis using energy-dispersive spectrometry(EDS)
KS D ISO 15472-2003(2023) Surface chemical analysis - X-ray photoelectron spectroscopy - Calibration of energy scale
KS D ISO 15632:2012 Microbeam analysis－Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
KS D ISO 19319-2005(2020) Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
KS D ISO 15472:2003 Surface chemical analysis-X-ray photoelectron spectrometers-Calibration of energy scales
KS D ISO 19319-2020 Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
KS D ISO 21270:2005 Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
KS D ISO 17973:2011 Surface chemical analysis－Medium-resolution Auger electron spectrometers－Calibration of energy scales for elemental analysis
KS D ISO 15471-2005(2020) Surface chemical analysis－Auger electron spectroscopy－Description of selected instrumental performance parameters
KS D ISO 17973-2021 Surface chemical analysis－Medium-resolution Auger electron spectrometers－Calibration of energy scales for elemental analysis
KS D ISO 21270-2005(2020) Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
KS C IEC 60759-2024 Standard test procedures for semiconductor X-ray energy spectrometers
KS C 6918-1995 Test methods of fiber-optic spectrum analyzer
KS D ISO 17973-2011(2016) Surface chemical analysis－Medium-resolution Auger electron spectrometers－Calibration of energy scales for elemental analysis
KS C IEC 60759-2009(2024) Standard test procedures for semiconductor X-ray energy spectrometers
KS C IEC 60759-2019 Standard test procedures for semiconductor X-ray energy spectrometers
KS C IEC 60759:2009 Standard test procedures for semiconductor X-ray energy spectrometers
KS C IEC 60759-2009(2019) Standard test procedures for semiconductor X-ray energy spectrometers
KS D ISO 15632-2023 Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers(EDS) for use with a scanning electron microscope(SEM) or a

The Directorate General of Specifications and Metrology (DGSM)

OS GSO ISO 15632:2015 Microbeam analysis -- Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
OS GSO ISO 21270:2014 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
OS GSO ISO 17973:2013 Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis
OS GSO IEC 60759:2015 Standard test procedures for semiconductor X-ray energy spectrometers

Kingdom of Bahrain Testing and Metrology Directorate

BH GSO ISO 15632:2017 Microbeam analysis -- Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
BH GSO ISO 15472:2016 Surface chemical analysis -- X-ray photoelectron spectrometers -- Calibration of energy scales
BH GSO ISO 17973:2016 Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis
BH GSO ISO 21270:2016 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale

German Institute for Standardization

DIN ISO 15632:2022-09 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA) (ISO 15632:2...
DIN ISO 15632 E:2022-03 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
DIN EN 61207-7:2015-07 Expression of performance of gas analyzers - Part 7: Tuneable semiconductor laser gas analyzers (IEC 61207-7:2013); German version EN 61207-7:2013 / Note: Applies in conjunction with DIN EN 61207-1 (2011-04).
DIN ISO 15632 E:2015-05 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
DIN ISO 15472:2020-05 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English
DIN ISO 15632:2015 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis (ISO 15632:2012)
DIN ISO 15632:2022 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA) (ISO 15632:2...
DIN ISO 15632:2022-02 Draft Document - Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (E...
DIN ISO 15632 E:2015 Draft Document - Microbeam analysis - Instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis (ISO 15632:2012); Text in German and English
DIN ISO 15472:2019-09 Draft Document - Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English
DIN ISO 15472 E:2019-09 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
DIN ISO 15632:2015-10 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis (ISO 15632:2012)
DIN ISO 15632 E:2022-02 Draft Document - Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (E...
DIN IEC 714:1986 Expressing the characteristics of a spectrum analyzer

U.S. Air Force

AIR FORCE A-A-59684 A-2009 OPTICAL SPECTRUM ANALYZER
AIR FORCE A-A-59684-2004 OPTICAL SPECTRUM ANALYZER
AIR FORCE A-A-59130 VALID NOTICE 1-2012 Analyzer, Spectrum 10 KHZ to 50 GHZ
AIR FORCE A-A-59112 A VALID NOTICE 1-2012 Spectrum Analyzer 100 HZ to 1.8 GHZ

Association Francaise de Normalisation

NF ISO 17973:2006 Surface Chemical Analysis - Medium Resolution Auger Electron Spectrometers - Calibration of Energy Scales for Elemental Analysis
NF X21-008:2012 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive ray spectrometers for use in electron probe microanalysis
NF C46-251-7*NF EN 61207-7:2014 Expression of performance of gas analyzers - Part 7 : tunable semiconductor laser gas analyzers
NF EN 61207-7:2014 Gas analyzer performance expression - Part 7: Tunable semiconductor laser gas analyzers
NF X21-055:2006 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales.
NF C93-845:2006 Calibration of optical spectrum analyzers.
NF X21-054*NF ISO 17973:2006 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis.
NF C93-846-1*NF EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1 : optical spectrum analyzers
NF ISO 17974:2009 Chemical Analysis of Surfaces - High Resolution Auger Electron Spectrometers - Calibration of Energy Scales for Elemental and Chemical State Analysis

American Society for Testing and Materials (ASTM)

ASTM E1508-98(2003) Standard Guide for Quantitative Analysis by Energy-Dispersive Spectroscopy
ASTM E1508-98 Standard Guide for Quantitative Analysis by Energy-Dispersive Spectroscopy
ASTM E1508-12a(2019) Standard guide for quantitative analysis using energy dispersive spectroscopy
ASTM E1508-12 Standard Guide for Quantitative Analysis by Energy-Dispersive Spectroscopy
ASTM E1508-98(2008) Standard Guide for Quantitative Analysis by Energy-Dispersive Spectroscopy
ASTM E137-82(1987) Method for evaluating mass spectrometers for quantitative analysis of batch samples
ASTM E1508-12a Standard Guide for Quantitative Analysis by Energy-Dispersive Spectroscopy
ASTM D8340-20a Standard Practice for Performance-Based Qualification of Spectroscopic Analyzer Systems
ASTM D8340-20 Standard Practice for Performance-Based Qualification of Spectroscopic Analyzer Systems
ASTM D8340-22 Standard Practice for Performance-Based Qualification of Spectroscopic Analyzer Systems
ASTM D8340-21 Standard Practice for Performance-Based Qualification of Spectroscopic Analyzer Systems

Comitato Elettrotecnico Italiano

CEI EN 61207-7:2014 Expression of performance of gas analyzers Part 7: Tunable semiconductor laser gas analyzers
CEI EN 61207-7/EC:2014 Expression of performance of gas analyzers Part 7: Tunable semiconductor laser gas analyzers
CEI EN 62129:2006 Calibration of optical spectrum analyzers
CEI EN 62129-1:2016 Calibration of wavelength/optical frequency measurement insturments Part 1: Optical spectrum analyzers

Association of German Mechanical Engineers

VDI/VDE/DGQ/DKD 2622 BLATT 11:2003 Calibration of measuring instruments for electrical quantities — spectrum analyzers
VDI/VDE/DGQ/DKD 2622 Blatt 11-1999 Kalibrieren von Messmitteln fuer elektrische Groessen - Spektrumanalysatoren
VDI/VDE/DGQ/DKD 2622 Blatt 11-2003 Calibration of measurement equipments for electrical quantities - Spectrum analyzers
VDI VDE DGQ DKD 2622 Blatt 11-2022 Calibration of measuring equipment for electrical quantities - Spectrum analysers
VDI VDE DGQ DKD 2622 Blatt-11 E:2019-11 Calibration of spectrum analyzers

Spanish Association for Standardization (UNE)

UNE-EN 61207-7:2013 Expression of performance of gas analyzers - Part 7: Tuneable semiconductor laser gas analyzers (Endorsed by AENOR in January of 2014.)
UNE-EN 61207-7:2013/AC:2015 Expression of performance of gas analyzers - Part 7: Tuneable semiconductor laser gas analyzers (Endorsed by AENOR in September of 2015.)
UNE-EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers (Endorsed by AENOR in July of 2016.)

Swedish Institute for Standards

SS-EN 61207-7:2014 Expression of performance of gas analyzers - Part 7: Tunable semiconductor laser gas analyzers
SIS SS IEC 759:1986 Nuclear instrumentation —Test procedures for semiconductor X-ray energy spectrometers
SS-EN 62129:2006 Calibration of optical spectrum analyzers
SIS SS IEC 714:1983 Electronic measurement equipment - Expression of the properties of spectrum analyzers
SS-EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers

Danish Standards Foundation

DANSK DS/EN 61207-7:2013 Expression of performance of gas analyzers - Part 7: Tuneable semiconductor laser gas analyzers
DANSK DS/EN 61207-7/AC:2013 Expression of performance of gas analyzers - Part 7: Tuneable semiconductor laser gas analyzers
DS/EN 62129:2006 Calibration of optical spectrum analyzers
DANSK DS/EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments – Part 1: Optical spectrum analyzers
DS/EN 62129/Corr. 1:2007 Calibration of optical spectrum analyzers
DANSK DS/EN 62129:2006 Calibration of optical spectrum analyzers

Gosstandart of Russia

GOST 4.361-1985 Product-quality index system. Mass-spectrometric analysers. Index nomenclature

National Standardisation Body (ASRO)

STAS 10803-1976 FILTER PAPER FOR SEMIQUANTATIVE AND QUANTATIVE ANALYSIS

European Committee for Electrotechnical Standardization（CENELEC）

EN 61207-7:2013 Expression of performance of gas analyzers - Part 7: Tuneable semiconductor laser gas analyzers
EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers

Society of Automotive Engineers (SAE)

SAE AIR1255 Spectrum Analyzers for Electromagnetic Interference Measurements
SAE AIR1255-1971 Spectrum Analyzers for Electromagnetic Interference Measurements
SAE AIR1255-2009 Spectrum Analyzers for Electromagnetic Interference Measurements

European Committee for Standardization (CEN)

CEN EN 62129-2006 Calibration of optical spectrum analyzers
CEN EN 62129-2006_ Calibration of optical spectrum analyzers

Institute of Electrical and Electronics Engineers (IEEE)

IEEE 748-1979 STANDARD FOR SPECTRUM ANALYZERS
IEEE 759-1984 Test procedures for semiconductor X-ray energy spectrometers
IEEE Std 748-1979 IEEE Standard for Spectrum Analyzers

International Electrotechnical Commission (IEC)

IEC 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers
IEC 61207-7:2013/COR1:2015 Expression of performance of gas analyzers - Part 7: Tuneable semiconductor laser gas analyzers; Corrigendum 1
IEC PAS 62129:2004 Calibration of optical spectrum analyzers
IEC 62129:2006 Calibration of optical spectrum analyzers
IEC 61455:1995 Nuclear instrumentation - MCA histogram data interchange format for nuclear spectroscopy
IEC 60759:1983 Standard test procedures for semiconductor X-ray energy spectrometers

Japanese Industrial Standards Committee (JISC)

JIS K 0165:2011 Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis
JIS C 6192:2008 Calibration of optical spectrum analyzers
JIS K 0127:1992 General rules for ion chromatographic analysis

European Telecommunications Standards Institute (ETSI)

ETSI TR 103 977-2024 RFID Measurement methods for transmit spectrum using modern spectrum analysers
ETSI TR 103 977 V1.1.1 (2024-04)-2024 RFID Measurement methods for transmit spectrum using modern spectrum analysers

Czech Standards Institute (UNMZ)

CSN 35 6535-1983 Electronic measuring instruments. Succesive process spectra analyzers. Nomenclature of pnrameters
CSN 35 6575 Z1-1997 Standard test procedureds for semiconductor X-ray energy spectrometers

GCC Standardization Organization

GSO ISO 17973:2013 Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis
GSO ISO 21270:2014 Surface chemical analysis -- X-ray photoelectron and Auger electron spectrometers -- Linearity of intensity scale
GSO ISO 15632:2015 Microbeam analysis -- Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
GSO IEC 60759:2015 Standard test procedures for semiconductor X-ray energy spectrometers

Others: semi-quantitative analysis spectrometry,Method for Determination of Quantitative Analysis Parameters of Scanning Electron Microscope Energy Spectrometer,Quantitative analysis by energy spectrometer,semi-quantitative analysis,Semi-quantitative analysis by energy spectrometer,semi-quantitative analysis,Quantitative analysis by energy spectrometer